經濟部智慧財產局員工消費合作社印製 515897 A7 B7 五、發明說明（i ) 發明背景 發明領域 本發明有關一種直流高壓測試系統待測物之偵測方法 及其裝置，且更特別地，有關一種用於待測物是否完全 地連接或未連接於直流高壓測試系統之測試電路上之偵 測方法及其裝置。 習知技術說明 一般而言，直流高壓測試系統其主要之功能在於利用 直流高電壓來測量待測物，以期能夠提前發現該待測物 於應用時所可能產生的潛在危險。 習知上，當執行直流高壓測試且當待測物爲諸如電容 性阻抗之非電阻性阻抗之負載時，經常因爲該非電阻1生 阻抗之待測物會因具有極高之阻抗，亦即例如高壓電容 器之容抗，所產生之直流電流極低，甚至所產生之該直 流電流値常趨近於零，造成無法藉由該近乎零之直流電 流値來判斷出是否該待測物已完全地連接於直流高壓測 試系統之偵試電路上，或未連接上之問題，因而常導致 測試上之失誤，同時，由於上述問題及失誤無法達成提 早發現該待測物可能產生之潛在危險，例如高壓電容器 耐壓絕緣之不足等，對於測試時該高壓測試系統之使用 者及日後應用該待測物之使用者本身常造成極大的危險 〇 如上述，在習知技術之直流高壓測試系統所使用之偵 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐） ----^ —：-------------^---------^ AW (請先閱讀背面之注意事項再填寫本頁) 515897Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives 515897 A7 B7 V. Description of the Invention (i) Background of the Invention The present invention relates to a method and device for detecting a test object of a DC high voltage test system, and more particularly, to a method Detection method and device for detecting whether the object to be tested is completely connected or not connected to a test circuit of a DC high voltage test system. Known technical description Generally speaking, the main function of a DC high-voltage test system is to use DC high voltage to measure the object under test, in order to be able to discover in advance the potential danger that the object under test may have during application. Conventionally, when a DC high voltage test is performed and when the object to be measured is a non-resistive impedance load such as capacitive impedance, the object to be measured often has an extremely high impedance because of the non-resistance, that is, for example, The capacitive reactance of the high-voltage capacitor, the DC current generated is extremely low, and even the DC current generated often approaches zero, which makes it impossible to determine whether the DUT is completely based on the near-zero DC current. Problems connected to the test circuit of the DC high-voltage test system, or not connected, often lead to test errors. At the same time, due to the above problems and errors, it is not possible to reach the potential danger that the DUT may detect early, such as high voltage. Insufficient voltage resistance and insulation of capacitors, etc., often cause great danger to the users of the high-voltage test system during testing and the users who use the test object in the future. As mentioned above, the DC high-voltage test systems used in conventional technology The paper size of the paper is applicable to China National Standard (CNS) A4 (210 X 297 mm) ---- ^ —: ------------- ^ --------- ^ AW (please first Note read the back of this page and then fill in) 515 897
五、 發明說明 ( 3) j \ w 需 在正常 測 試模 式下先行設定 — 預 定之充 電電流 下 限値， 而 是 利用 該 充 電電 流之初始電流 値 大於 後續 電流値 來 進行該 待 測 物之 連 接 狀態 的判斷 步驟， 其中 i 爲筒 壓電流 5 R爲限 流 電 阻， c爲電容 ’ t爲充電時間 ;以及根據該判斷步驟之 充 電 電流 之初始電 流値是 否大於 後 續 電 流値 來確定 該 電容性 待 測 物是 否 完成正 確之高 壓測試 連 接 y 否則切斷該 直 流高壓 之 輸 出。 爲 達成本 發 明之 目的， 根據本 發 明所 提供之一種 直 流局壓 測 試 系統 待 測 物之 偵測裝 置，包含 ； --- 高壓 產 生 器， 用於產 生一直 流 局 壓 施加於一待 測 物之上 供 測 試該 待 測 物之 耐壓及 漏電流 用 j — 分壓 電 路 ，用 於取出 該高壓 產 生 器 所產 生之咅β 分 該 直 流 高壓 作 爲 第一 電位及取出該 待 測 物 上所 產生之 部 分 充 電 電壓 作 爲 第二 電位； 一 差動 電 路 ，用於確定 該第一 電 位 與 該第 二電位 間 之 差 動 操作 電 位 > -- 電流 偵 測 器， 用於偵 測是否有 電 流 自該 偵測裝 置 中輸 出 > — 類比/ 數 位轉 換器， 用於轉 換 該 類 比式 差動操 作 電位爲 一 數 位式 差 動 操作 値； — 中央 處 理 器， 用於根 據該差 動 操 作 値輸 出一高 壓 切斷信 號 於 該局 壓 產 生器 或一測 試結果 値 > 以及 — 輸入 / 輸 出單 元，用 於輸入 該 直 流 高壓 測試系 統 用之設 定 參 數及 輸 出 該測 試結果 値， 其 φ Μ 1 j \\\ 需 在正常 測試模 式下先行 -5- 設 定 一預 定之充 電 電流下 515897 五、發明說明（4) 限値，而是利用該充電電壓之電流波形中之初始電流値大於 後續電流値，在該差動電路中產生一差動操作値而確定高壓 測試之連接正確’否則藉該中央處理器切斷高壓產生器之高 壓輸出。 進一步地，該待測物包含電容性負載，正溫度係數（PTC) 電阻性負載，電纜線，及變壓器。 圖式簡單說明 本發明之上述與其他目的，特性及優點將從下文結合附圖 之詳細說明中呈更明顯，其中 第1圖係一流程圖，描繪根據本發明直流高壓測試系統待 測物之偵測方法； 第2圖係一方塊圖，描繪根據本發明直流高壓測試系統待 測物之偵測裝置；以及 第3圖係一槪略圖示，描繪—RC充電電路及其電壓與電流 波形。 發明詳細說明 參閱第1圖，在第1圖中描繪根據本發明，直流高壓測 試系統待測物之偵測方法的流程圖。在步驟s丨〇丨中，設定 該測試系統之測試參數，例如測試用之高壓値，用於控制 高壓產生器產生高壓’其中該高壓產生器將於稍後描述； 在步驟S102中’產生直流高壓施加於待測物；在步驟S1 〇3 中’讀取該高壓電壓値及所產生之電流値， 同時記錄所產生之瞬間最大電流値；在步驟s丨〇4中， 檢查該高壓電壓値是否到達設定値，若電壓尙未到達高壓 經濟部智慧財產局員工消費合作社印製 515897 A7 B7 五、發明說明（$ )V. Description of the invention (3) j \ w need to be set in the normal test mode first-the predetermined lower limit of the charging current 値, but the initial current of the charging current 値 is greater than the subsequent current 値 to perform the connection status of the DUT Judging steps, where i is the barrel voltage current 5 R is the current limiting resistor, c is the capacitor 't is the charging time; and the capacitive current to be tested is determined according to whether the initial current 充电 of the charging current in this judging step is greater than the subsequent current 値Whether the correct high voltage test connection is completed. Otherwise, cut off the DC high voltage output. In order to achieve the purpose of the present invention, a detection device for a test object of a DC partial voltage test system according to the present invention includes: --- a high-voltage generator for generating a DC partial pressure applied to a test object The j-division voltage circuit is used to test the withstand voltage and leakage current of the DUT. It is used to take out the 咅 β generated by the high-voltage generator. The DC high voltage is used as the first potential and the voltage generated from the DUT is taken out. Part of the charging voltage is used as the second potential; a differential circuit is used to determine the differential operating potential between the first potential and the second potential >-a current detector for detecting whether there is a current from the detection Output in the measuring device> — Analog / digital converter for converting the analog differential operation potential into a digital differential operation; — Central processing unit for outputting a high-voltage cutoff according to the differential operation Signal in the game Generator or a test result 値 > and — an input / output unit for inputting the setting parameters for the DC high voltage test system and outputting the test result 其, which φ Μ 1 j \\\ needs to be first in the normal test mode -5- Set a predetermined charging current 515897 V. Description of the invention (4) Limit 値, but use the initial current 値 greater than the subsequent current 中 in the current waveform of the charging voltage to generate a differential in the differential circuit Make sure that the high-voltage test connection is correct. Otherwise, use the CPU to cut off the high-voltage output of the high-voltage generator. Further, the DUT includes a capacitive load, a positive temperature coefficient (PTC) resistive load, a cable, and a transformer. The drawings briefly explain the above and other objects, features and advantages of the present invention will be more apparent from the following detailed description with reference to the accompanying drawings. Among them, FIG. 1 is a flow chart depicting the objects to be tested in the DC high voltage test system according to the present invention. Detection method; Figure 2 is a block diagram depicting the detection device of the object to be tested in the DC high voltage test system according to the present invention; and Figure 3 is a schematic diagram depicting the RC charging circuit and its voltage and current waveforms . Detailed description of the invention Referring to Fig. 1, a flowchart of a method for detecting a test object of a DC high voltage test system according to the present invention is depicted in Fig. 1. In step s 丨 〇 丨, set the test parameters of the test system, such as the high voltage used for testing, to control the high voltage generator to generate high voltage 'where the high voltage generator will be described later; in step S102' to generate DC A high voltage is applied to the object to be measured; in step S103, 'read the high-voltage voltage 値 and the generated current 値, while recording the instantaneous maximum current 値; in step s 〇 04, check the high-voltage 値Whether it has reached the setting 値, if the voltage 尙 does not reach the high-voltage Intellectual Property Bureau of the Ministry of Economic Affairs, printed by the employee consumer cooperative 515897 A7 B7 V. Description of the invention ($)
設定値，則回到步驟S103，若電壓已到達設定値時，貝〖J 進行至步驟S1 05 ;且在該步驟S1 05中讀取所產生之電壓 値及電流値：然後在步驟S106中，檢查該電流値是否小 於最大電流値，若該電流値並未小於最大電流値時，則 顯示高壓與待測物間之連接不正常，且同時切斷高壓輸 出，若該電流値小於於最大電流値時，則在步驟S108中 根據該測試系統之其他測試資料判斷待測物是否爲良品 〇 參閱第2圖，在第2圖中描繪根據本發明直流高壓測 試系統待測物之偵測裝置之方塊圖。根據本發明之直流 高壓測試系統包含一高壓產生器3,用於產生一直流高壓 施加於一諸如電阻性阻抗之待測物4之上以用於測試該 待測物4之耐壓及漏電流；一分壓電路5,用於取出該高 壓產生器3所產生之部分該直流高壓作爲第一電位及取 出該待測物4上所產生之部分充電電壓作爲第二電位； 一差動電路6,用於確定該第一電位與該第二電位間之差 動操作電位：一電流偵測器，用於偵測是否有電流自該 偵測裝置中輸出；一類比/數位轉換器7,用於轉換該類 比式之差動操作電位爲一數位式差動操作値；一中央處 理器2,用於根據該差動操作値輸出一高壓切斷信號於該 高壓產生器3以切斷高壓輸出，或產生一測試結果値； 以及一輸入/輸出單元1，用於輸入該直流高壓測試系統 用之設定參數及輸出該結果値。 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐） -----—·--------------訂---------線 (請先閱讀背面之注意事項再填寫本頁) 515897 A7 B7 五、發明說明（l) (請先閱讀背面之注音？事項再填寫本頁) 如上述，根據本發明之直流高壓測試系統待測物之測 試方法，係利用該電容性阻抗之待測物4之充電電流之 初始電流値是否大於後續電流値來確定該電容性待測物 是否完成正確之高壓測試連接，否則切斷該直流高壓之 輸出，藉此可保護使用者之安全。又根據本發明之直流 高壓測試系統待測物之測試裝置，係利用該充電電壓之 充電電流波形中初始電流値大於後續電流値，在該差動 電路6中產生一差動操作値而確定高壓測試之連接正確 ，否則藉該中央處理器2切斷高壓產生器3之高壓輸出 ，藉此可保護使用者之安全。 參閱第3圖，描繪一 RC充電電路及其電壓及電流波形 ，如圖示該電容性阻抗待測物所產生之電流波形係如本 發明原理，即電流波形中初始電流値大於後續電流値。 熟習於本項技術者將理解的是，本發明並未受限於上 述說明，而是可允許種種修飾及變化，然而，本發明將 以下文所附錄之申請專利範圍涵蓋所有本發明之精神及 範圍。 符號之說明 經濟部智慧財產局員工消費合作社印製 1 ......輸入/輸出單元 2 ......中央處理器 3 ......高壓產生器 4 ......待測物 5 ......分壓電路 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐） 515897 A7 _B7 五、發明說明（Ί) 6 ......差動電路 7 ......類比/數位轉換器 8 ......電流偵測器 R......限流電阻 c......待測物 v......直流高壓 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 9 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐）Set 値, then go back to step S103. If the voltage has reached the set 値, go to step S1 05; and read the generated voltage 値 and current 値 in step S1 05: then in step S106, Check whether the current 値 is less than the maximum current 値. If the current 値 is not less than the maximum current ，, it indicates that the connection between the high voltage and the object to be measured is abnormal and the high voltage output is cut off at the same time. If the current 値 is less than the maximum current When it is too short, in step S108, it is judged whether the test object is a good product according to other test data of the test system. Referring to FIG. 2, FIG. 2 depicts the detection device of the test object of the DC high voltage test system according to the present invention. Block diagram. The DC high voltage test system according to the present invention includes a high voltage generator 3 for generating a DC high voltage applied to a test object 4 such as a resistive impedance for testing the withstand voltage and leakage current of the test object 4 A voltage dividing circuit 5 for taking out a part of the DC high voltage generated by the high voltage generator 3 as a first potential and taking out a part of the charging voltage generated on the DUT 4 as a second potential; a differential circuit 6, for determining a differential operating potential between the first potential and the second potential: a current detector for detecting whether a current is output from the detection device; an analog / digital converter 7, It is used to convert the analog differential operation potential into a digital differential operation. A central processing unit 2 is used to output a high-voltage cut-off signal to the high-voltage generator 3 to cut off the high voltage according to the differential operation. Output, or generate a test result 値; and an input / output unit 1 for inputting the setting parameters for the DC high voltage test system and outputting the result 値. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) --------------------- Order --------- (Please read the notes on the back before filling this page) 515897 A7 B7 V. Description of the invention (l) (Please read the note on the back? Matters before filling this page) As mentioned above, according to the DC high voltage test system of the present invention, The test method of the test object is to determine whether the capacitive test object has completed the correct high-voltage test connection by using the initial current 値 of the charging current of the test object 4 of the capacitive impedance to be greater than the subsequent current. The high voltage output can protect the safety of the user. According to the test device of the DC high-voltage test system of the present invention, the high voltage is determined by using the initial current 値 greater than the subsequent current 中 in the charging current waveform of the charging voltage to generate a differential operation 该 in the differential circuit 6. The test connection is correct, otherwise the high-voltage output of the high-voltage generator 3 is cut off by the central processing unit 2, thereby protecting the safety of the user. Referring to FIG. 3, a RC charging circuit and its voltage and current waveforms are depicted. As shown in the figure, the current waveform generated by the capacitive impedance DUT is according to the principle of the present invention, that is, the initial current in the current waveform is greater than the subsequent current. Those skilled in the art will understand that the present invention is not limited to the above description, but can allow various modifications and changes. However, the present invention covers all the spirit and range. Explanation of Symbols Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1 ... I / O Unit 2 ... Central Processing Unit 3 ... High Voltage Generator 4 ... .DUT 5 ... Voltage divider circuit The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 515897 A7 _B7 V. Description of the invention (Ί) 6 ..... .Differential circuit 7 ... Analog / digital converter 8 ... Current detector R ... Current limiting resistor c ... DUT v .. .... DC high voltage (please read the notes on the back before filling this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 9 This paper size applies to China National Standard (CNS) A4 (210 X 297 mm)