TWI435679B - 形成具有複數個隔離式電導通接觸之外殼元件之方法及藉此形成之外殼元件 - Google Patents
形成具有複數個隔離式電導通接觸之外殼元件之方法及藉此形成之外殼元件 Download PDFInfo
- Publication number
- TWI435679B TWI435679B TW097118537A TW97118537A TWI435679B TW I435679 B TWI435679 B TW I435679B TW 097118537 A TW097118537 A TW 097118537A TW 97118537 A TW97118537 A TW 97118537A TW I435679 B TWI435679 B TW I435679B
- Authority
- TW
- Taiwan
- Prior art keywords
- opening
- forming
- sidewall
- substrate
- electrically
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 29
- 239000000758 substrate Substances 0.000 claims description 54
- 229910052751 metal Inorganic materials 0.000 claims description 21
- 239000002184 metal Substances 0.000 claims description 21
- 239000004020 conductor Substances 0.000 claims description 20
- 229910052782 aluminium Inorganic materials 0.000 claims description 11
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 11
- 238000004140 cleaning Methods 0.000 claims description 8
- 238000002048 anodisation reaction Methods 0.000 claims description 6
- 239000011231 conductive filler Substances 0.000 claims description 5
- 238000005229 chemical vapour deposition Methods 0.000 claims description 4
- 239000003822 epoxy resin Substances 0.000 claims description 4
- 229920000647 polyepoxide Polymers 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 2
- 239000002105 nanoparticle Substances 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 238000005553 drilling Methods 0.000 claims 1
- 239000000463 material Substances 0.000 description 9
- 239000000976 ink Substances 0.000 description 5
- 239000003989 dielectric material Substances 0.000 description 4
- 239000004593 Epoxy Substances 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000000427 thin-film deposition Methods 0.000 description 2
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000007743 anodising Methods 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000007736 thin film deposition technique Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/44—Manufacturing insulated metal core circuits or other insulated electrically conductive core circuits
- H05K3/445—Manufacturing insulated metal core circuits or other insulated electrically conductive core circuits having insulated holes or insulated via connections through the metal core
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K5/00—Casings, cabinets or drawers for electric apparatus
- H05K5/02—Details
- H05K5/0247—Electrical details of casings, e.g. terminals, passages for cables or wiring
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/05—Insulated conductive substrates, e.g. insulated metal substrate
- H05K1/053—Insulated conductive substrates, e.g. insulated metal substrate the metal substrate being covered by an inorganic insulating layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0179—Thin film deposited insulating layer, e.g. inorganic layer for printed capacitor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09581—Applying an insulating coating on the walls of holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/09827—Tapered, e.g. tapered hole, via or groove
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0315—Oxidising metal
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0323—Working metal substrate or core, e.g. by etching, deforming
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
- H05K3/4053—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques
- H05K3/4061—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques for via connections in inorganic insulating substrates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
- Y10T29/49165—Manufacturing circuit on or in base by forming conductive walled aperture in base
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/753,996 US7886437B2 (en) | 2007-05-25 | 2007-05-25 | Process for forming an isolated electrically conductive contact through a metal package |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200913850A TW200913850A (en) | 2009-03-16 |
| TWI435679B true TWI435679B (zh) | 2014-04-21 |
Family
ID=40071052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097118537A TWI435679B (zh) | 2007-05-25 | 2008-05-20 | 形成具有複數個隔離式電導通接觸之外殼元件之方法及藉此形成之外殼元件 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7886437B2 (enExample) |
| JP (2) | JP2010528491A (enExample) |
| KR (1) | KR20100023804A (enExample) |
| CN (1) | CN101681818B (enExample) |
| TW (1) | TWI435679B (enExample) |
| WO (1) | WO2008147695A1 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7886437B2 (en) * | 2007-05-25 | 2011-02-15 | Electro Scientific Industries, Inc. | Process for forming an isolated electrically conductive contact through a metal package |
| US8220142B2 (en) * | 2007-10-03 | 2012-07-17 | Apple Inc. | Method of forming a housing component |
| US8687359B2 (en) | 2008-10-13 | 2014-04-01 | Apple Inc. | Portable computer unified top case |
| KR20100045857A (ko) * | 2008-10-24 | 2010-05-04 | 삼성전자주식회사 | 반도체 칩, 스택 모듈, 메모리 카드 및 반도체 칩의 제조 방법 |
| CH704884B1 (fr) * | 2011-04-29 | 2015-04-30 | Suisse Electronique Microtech | Substrat destiné à recevoir des contacts électriques. |
| TWI454320B (zh) * | 2011-08-19 | 2014-10-01 | Jieng Tai Internat Electric Corp | 填補穿孔的方法 |
| JP2013045804A (ja) * | 2011-08-22 | 2013-03-04 | Shinko Electric Ind Co Ltd | 基材 |
| US8894868B2 (en) * | 2011-10-06 | 2014-11-25 | Electro Scientific Industries, Inc. | Substrate containing aperture and methods of forming the same |
| JP2015531906A (ja) | 2012-07-12 | 2015-11-05 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | 双方向制御システム、その製造方法、及びそれを組み込んだデバイス |
| US9685414B2 (en) | 2013-06-26 | 2017-06-20 | Intel Corporation | Package assembly for embedded die and associated techniques and configurations |
| WO2015076802A1 (en) * | 2013-11-21 | 2015-05-28 | Hewlett Packard Development Company, L.P. | Oxidized layer and light metal layer on substrate |
| KR102134296B1 (ko) * | 2014-09-23 | 2020-07-15 | (주)포인트엔지니어링 | 안테나 |
| US10732085B2 (en) | 2015-03-24 | 2020-08-04 | Bell Helicopter Textron Inc. | Notch treatment methods for flaw simulation |
| US10989640B2 (en) | 2015-03-24 | 2021-04-27 | Bell Helicopter Textron Inc. | Method for defining threshold stress curves utilized in fatigue and damage tolerance analysis |
| CN107872936B (zh) | 2016-09-28 | 2020-10-23 | 华为机器有限公司 | 一种移动设备的金属壳及其制备方法、移动设备 |
| EP3428955A1 (en) * | 2017-07-10 | 2019-01-16 | Murata Manufacturing Co., Ltd. | Substrates employing surface-area amplification, for use in fabricating capacitive elements and other devices |
Family Cites Families (53)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3296099A (en) * | 1966-05-16 | 1967-01-03 | Western Electric Co | Method of making printed circuits |
| US4155972A (en) | 1977-09-06 | 1979-05-22 | Keystone Consolidated Industries, Inc. | Multiple-shot method of molding plastic products |
| JPS59159595A (ja) * | 1983-03-03 | 1984-09-10 | オ−ケ−プリント配線株式会社 | 金属プリント基板の製造方法 |
| US5293025A (en) | 1991-08-01 | 1994-03-08 | E. I. Du Pont De Nemours And Company | Method for forming vias in multilayer circuits |
| JPH07201260A (ja) | 1993-12-29 | 1995-08-04 | Yamatake Honeywell Co Ltd | 電子スイッチの表示窓形成方法 |
| US5518964A (en) | 1994-07-07 | 1996-05-21 | Tessera, Inc. | Microelectronic mounting with multiple lead deformation and bonding |
| US5614114A (en) | 1994-07-18 | 1997-03-25 | Electro Scientific Industries, Inc. | Laser system and method for plating vias |
| US5593606A (en) | 1994-07-18 | 1997-01-14 | Electro Scientific Industries, Inc. | Ultraviolet laser system and method for forming vias in multi-layered targets |
| TW309654B (enExample) * | 1995-03-29 | 1997-07-01 | Olin Corp | |
| US5699613A (en) | 1995-09-25 | 1997-12-23 | International Business Machines Corporation | Fine dimension stacked vias for a multiple layer circuit board structure |
| US5757079A (en) | 1995-12-21 | 1998-05-26 | International Business Machines Corporation | Method for repairing defective electrical connections on multi-layer thin film (MLTF) electronic packages and the resulting MLTF structure |
| AU3301197A (en) | 1996-06-05 | 1998-01-05 | Larry W. Burgess | Blind via laser drilling system |
| US6631558B2 (en) | 1996-06-05 | 2003-10-14 | Laservia Corporation | Blind via laser drilling system |
| US5787578A (en) | 1996-07-09 | 1998-08-04 | International Business Machines Corporation | Method of selectively depositing a metallic layer on a ceramic substrate |
| US5718326A (en) | 1996-07-22 | 1998-02-17 | Delco Electronics Corporation | Backlit button/switchpad assembly |
| US6541709B1 (en) | 1996-11-01 | 2003-04-01 | International Business Machines Corporation | Inherently robust repair process for thin film circuitry using uv laser |
| WO1998020557A1 (en) | 1996-11-08 | 1998-05-14 | W.L. Gore & Associates, Inc. | Method for reducing via inductance in an electronic assembly and device |
| DE19758496A1 (de) | 1997-04-25 | 1999-03-25 | Trw Automotive Electron & Comp | Verfahren zur Herstellung eines Elements mit Funktionssymbolen für die Beleuchtung mit Durchlicht, insbesondere eines Blendenteils oder Betätigungsteils |
| JPH11298104A (ja) * | 1998-04-16 | 1999-10-29 | Sumitomo Metal Electronics Devices Inc | 半導体搭載用回路基板 |
| GB9811328D0 (en) | 1998-05-27 | 1998-07-22 | Exitech Ltd | The use of mid-infrared lasers for drilling microvia holes in printed circuit (wiring) boards and other electrical circuit interconnection packages |
| US6400018B2 (en) | 1998-08-27 | 2002-06-04 | 3M Innovative Properties Company | Via plug adapter |
| US6235544B1 (en) | 1999-04-20 | 2001-05-22 | International Business Machines Corporation | Seed metal delete process for thin film repair solutions using direct UV laser |
| US6713719B1 (en) | 1999-09-30 | 2004-03-30 | Siemens Aktiengesellschaft | Method and device for laser drilling laminates |
| JP2001237512A (ja) * | 1999-12-14 | 2001-08-31 | Nitto Denko Corp | 両面回路基板およびこれを用いた多層配線基板ならびに両面回路基板の製造方法 |
| JP3330925B2 (ja) | 2000-04-05 | 2002-10-07 | 株式会社日鉱マテリアルズ | レーザー穴開け用銅箔 |
| DE10125397B4 (de) * | 2001-05-23 | 2005-03-03 | Siemens Ag | Verfahren zum Bohren von Mikrolöchern mit einem Laserstrahl |
| JP2003101177A (ja) * | 2001-09-25 | 2003-04-04 | Hitachi Aic Inc | メタルコア配線板とその製造方法、及び、かかるメタルコア配線板を利用した回路部品 |
| US20030066679A1 (en) | 2001-10-09 | 2003-04-10 | Castro Abram M. | Electrical circuit and method of formation |
| US6627844B2 (en) | 2001-11-30 | 2003-09-30 | Matsushita Electric Industrial Co., Ltd. | Method of laser milling |
| US6541712B1 (en) | 2001-12-04 | 2003-04-01 | Teradyhe, Inc. | High speed multi-layer printed circuit board via |
| US6863926B2 (en) * | 2002-01-15 | 2005-03-08 | David Mark Lynn | Corrosive-resistant coating over aluminum substrates for use in plasma deposition and etch environments |
| TW558823B (en) | 2002-04-10 | 2003-10-21 | Via Tech Inc | Through-hole process of integrated circuit substrate |
| US20040112881A1 (en) | 2002-04-11 | 2004-06-17 | Bloemeke Stephen Roger | Circle laser trepanning |
| TWI271131B (en) | 2002-04-23 | 2007-01-11 | Via Tech Inc | Pattern fabrication process of circuit substrate |
| TW561803B (en) | 2002-10-24 | 2003-11-11 | Advanced Semiconductor Eng | Circuit substrate and manufacturing method thereof |
| TW587322B (en) | 2002-12-31 | 2004-05-11 | Phoenix Prec Technology Corp | Substrate with stacked via and fine circuit thereon, and method for fabricating the same |
| US6867121B2 (en) | 2003-01-16 | 2005-03-15 | International Business Machines Corporation | Method of apparatus for interconnecting a relatively fine pitch circuit layer and adjacent power plane(s) in a laminated construction |
| US20050137942A1 (en) * | 2003-09-17 | 2005-06-23 | Lafleur Bernard B. | Rapid depolyment portable interactive kiosk |
| US7345350B2 (en) * | 2003-09-23 | 2008-03-18 | Micron Technology, Inc. | Process and integration scheme for fabricating conductive components, through-vias and semiconductor components including conductive through-wafer vias |
| US7402758B2 (en) | 2003-10-09 | 2008-07-22 | Qualcomm Incorporated | Telescoping blind via in three-layer core |
| US8084866B2 (en) * | 2003-12-10 | 2011-12-27 | Micron Technology, Inc. | Microelectronic devices and methods for filling vias in microelectronic devices |
| US7018219B2 (en) | 2004-02-25 | 2006-03-28 | Rosenau Steven A | Interconnect structure and method for connecting buried signal lines to electrical devices |
| US20050189656A1 (en) | 2004-02-26 | 2005-09-01 | Chun Yee Tan | Micro-vias for electronic packaging |
| US20060091023A1 (en) | 2004-10-28 | 2006-05-04 | Ahsan Bukhari | Assessing micro-via formation PCB substrate manufacturing process |
| KR100688768B1 (ko) * | 2004-12-30 | 2007-03-02 | 삼성전기주식회사 | 칩 내장형 인쇄회로기판 및 그 제조 방법 |
| US7884315B2 (en) | 2006-07-11 | 2011-02-08 | Apple Inc. | Invisible, light-transmissive display system |
| US7527872B2 (en) * | 2005-10-25 | 2009-05-05 | Goodrich Corporation | Treated aluminum article and method for making same |
| US20070275540A1 (en) * | 2006-05-24 | 2007-11-29 | Hackitt Dale A | Backside via formation prior to die attachment |
| US7968820B2 (en) | 2006-06-02 | 2011-06-28 | Electro Scientific Industries, Inc. | Method of producing a panel having an area with light transmissivity |
| US8394301B2 (en) | 2006-06-02 | 2013-03-12 | Electro Scientific Industries, Inc. | Process for forming panel with an optically transmissive portion and products related thereto |
| US7655292B2 (en) * | 2007-04-11 | 2010-02-02 | Kaylu Industrial Corporation | Electrically conductive substrate with high heat conductivity |
| US8134235B2 (en) * | 2007-04-23 | 2012-03-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Three-dimensional semiconductor device |
| US7886437B2 (en) * | 2007-05-25 | 2011-02-15 | Electro Scientific Industries, Inc. | Process for forming an isolated electrically conductive contact through a metal package |
-
2007
- 2007-05-25 US US11/753,996 patent/US7886437B2/en not_active Expired - Fee Related
-
2008
- 2008-05-14 JP JP2010510407A patent/JP2010528491A/ja active Pending
- 2008-05-14 KR KR1020097023952A patent/KR20100023804A/ko not_active Abandoned
- 2008-05-14 WO PCT/US2008/063609 patent/WO2008147695A1/en not_active Ceased
- 2008-05-14 CN CN2008800165914A patent/CN101681818B/zh not_active Expired - Fee Related
- 2008-05-20 TW TW097118537A patent/TWI435679B/zh not_active IP Right Cessation
-
2011
- 2011-02-14 US US13/027,167 patent/US8117744B2/en not_active Expired - Fee Related
-
2014
- 2014-02-20 JP JP2014030950A patent/JP2014143423A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010528491A (ja) | 2010-08-19 |
| CN101681818B (zh) | 2011-11-23 |
| US8117744B2 (en) | 2012-02-21 |
| WO2008147695A1 (en) | 2008-12-04 |
| KR20100023804A (ko) | 2010-03-04 |
| CN101681818A (zh) | 2010-03-24 |
| US20080289178A1 (en) | 2008-11-27 |
| US20110131807A1 (en) | 2011-06-09 |
| US7886437B2 (en) | 2011-02-15 |
| TW200913850A (en) | 2009-03-16 |
| JP2014143423A (ja) | 2014-08-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI435679B (zh) | 形成具有複數個隔離式電導通接觸之外殼元件之方法及藉此形成之外殼元件 | |
| JP2010528491A5 (enExample) | ||
| JP2013509718A (ja) | 金属の付着 | |
| US20110198018A1 (en) | Method for integrating an electronic component into a printed circuit board | |
| TW201121378A (en) | Metal deposition | |
| JP2013509719A (ja) | 金属の付着 | |
| JP3779745B2 (ja) | プリント回路基板とフィルム回路基板の製造方法 | |
| KR101435239B1 (ko) | 액체 토출 헤드 기재를 제조하는 프로세스 | |
| TW200934325A (en) | Method for forming circuit | |
| CN109719404A (zh) | 一种ic载板激光钻孔的方法 | |
| CN115497923A (zh) | 玻璃基底中的电容器 | |
| CN102593086B (zh) | 半导体装置和用于制造半导体装置的方法 | |
| US20190208645A1 (en) | Laminate structures with hole plugs and methods of forming laminate structures with hole plugs | |
| TWI291382B (en) | Method of forming a metal thin film with micro holes by ink-jet printing | |
| JP2001308480A (ja) | 金属インターロック構造を含む電子構造及びその形成 | |
| JP4199206B2 (ja) | 半導体装置の製造方法 | |
| Mościcki et al. | Interconnection process by ink jet printing method | |
| ES2324355T3 (es) | Arquitectura microfluidica. | |
| US20140174794A1 (en) | Heat radiating substrate and manufacturing method thereof | |
| JP7444885B2 (ja) | 蓋をされ金属化されたビアの形成方法 | |
| US20120138339A1 (en) | Method of producing an electrically conducting via in a substrate | |
| KR102594179B1 (ko) | 얇은 라미네이트를 위한 홀 플러그 | |
| JP2004307924A (ja) | 電子部品のめっき方法 | |
| JP2005136052A (ja) | 配線基板及び電気装置並びにその製造方法 | |
| JP2019059163A (ja) | 液体吐出ヘッド及びその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |