TWI429923B - 使用接觸滾筒以測試電子組件之裝置及方法 - Google Patents

使用接觸滾筒以測試電子組件之裝置及方法 Download PDF

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Publication number
TWI429923B
TWI429923B TW096143998A TW96143998A TWI429923B TW I429923 B TWI429923 B TW I429923B TW 096143998 A TW096143998 A TW 096143998A TW 96143998 A TW96143998 A TW 96143998A TW I429923 B TWI429923 B TW I429923B
Authority
TW
Taiwan
Prior art keywords
test
electronic component
predetermined force
force
contact roller
Prior art date
Application number
TW096143998A
Other languages
English (en)
Chinese (zh)
Other versions
TW200834093A (en
Inventor
Mark Kosmowski
Original Assignee
Electro Scient Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc filed Critical Electro Scient Ind Inc
Publication of TW200834093A publication Critical patent/TW200834093A/zh
Application granted granted Critical
Publication of TWI429923B publication Critical patent/TWI429923B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
TW096143998A 2006-11-30 2007-11-20 使用接觸滾筒以測試電子組件之裝置及方法 TWI429923B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/565,406 US7443179B2 (en) 2006-11-30 2006-11-30 Zero motion contact actuation

Publications (2)

Publication Number Publication Date
TW200834093A TW200834093A (en) 2008-08-16
TWI429923B true TWI429923B (zh) 2014-03-11

Family

ID=39471662

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096143998A TWI429923B (zh) 2006-11-30 2007-11-20 使用接觸滾筒以測試電子組件之裝置及方法

Country Status (6)

Country Link
US (1) US7443179B2 (enExample)
JP (1) JP5102840B2 (enExample)
KR (1) KR101390451B1 (enExample)
CN (1) CN101542265B (enExample)
TW (1) TWI429923B (enExample)
WO (1) WO2008067129A2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7839138B2 (en) * 2007-01-29 2010-11-23 Electro Scientific Industries, Inc. Adjustable force electrical contactor
KR102243657B1 (ko) 2014-10-06 2021-04-23 엘지전자 주식회사 포터블 디바이스 및 그 제어 방법
JP6727651B2 (ja) 2016-09-30 2020-07-22 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法
JP6679552B2 (ja) 2017-10-02 2020-04-15 株式会社ヒューモラボラトリー チップ電子部品の検査選別方法

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US3915850A (en) * 1973-11-14 1975-10-28 Gti Corp Component handler and method and apparatus utilizing same
US5034749A (en) 1988-10-06 1991-07-23 Electro Scientific Industries, Inc. Sliding contact test apparatus
US4931721A (en) 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors
US5057772A (en) 1990-05-29 1991-10-15 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
JP3156250B2 (ja) * 1990-08-27 2001-04-16 セイコーエプソン株式会社 コンタクトプローブ
JP2760263B2 (ja) 1993-08-20 1998-05-28 株式会社村田製作所 セラミックコンデンサの初期故障品のスクリーニング方法
US5673799A (en) 1995-06-05 1997-10-07 Chip Star Inc. Machine for testing and sorting capacitor chips and method of operating same
US5677634A (en) 1995-11-16 1997-10-14 Electro Scientific Industries, Inc. Apparatus for stress testing capacitive components
JPH1038919A (ja) * 1996-07-22 1998-02-13 Oki Electric Ind Co Ltd プローブ構造
DE19637808C1 (de) * 1996-09-17 1997-12-18 Honeywell Ag Vorrichtung zur Messung der Biegesteifigkeit von bewegtem blattförmigem Material
US6043665A (en) 1996-12-05 2000-03-28 Murata Manufacturing Co., Ltd. Capacitor charging current measurement method
US6198290B1 (en) 1997-07-18 2001-03-06 Mark Krinker Method to detect defective capacitors in circuit and meters for that
US6040705A (en) 1997-08-20 2000-03-21 Electro Scientific Industries, Inc. Rolling electrical contactor
US6204464B1 (en) * 1998-06-19 2001-03-20 Douglas J. Garcia Electronic component handler
US6268719B1 (en) * 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
US6100707A (en) * 1998-09-25 2000-08-08 Electro Scientific Industries, Inc. Apparatus for testing multi-terminal electronic components
US6459707B1 (en) 1998-12-22 2002-10-01 National Instruments Corporation Relay multiplexer system and method for prevention of shock hazard
US6677637B2 (en) 1999-06-11 2004-01-13 International Business Machines Corporation Intralevel decoupling capacitor, method of manufacture and testing circuit of the same
JP3548887B2 (ja) 1999-12-20 2004-07-28 株式会社村田製作所 絶縁抵抗測定方法および装置
JP2002286799A (ja) * 2001-03-27 2002-10-03 Tokyo Weld Co Ltd 電子部品の測定装置及び測定方法
JP2003084024A (ja) * 2001-07-04 2003-03-19 Murata Mfg Co Ltd 電子部品の特性検査装置
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TWI223084B (en) * 2002-04-25 2004-11-01 Murata Manufacturing Co Electronic component characteristic measuring device
JP3836830B2 (ja) * 2003-10-28 2006-10-25 インターナショナル・ビジネス・マシーンズ・コーポレーション アクティブマトリックスパネルの検査装置、アクティブマトリックスパネルの検査方法、およびアクティブマトリックスｏｌｅｄパネルの製造方法
JP4017586B2 (ja) * 2003-10-29 2007-12-05 三洋電機株式会社 電池の充電方法
CN1658379A (zh) * 2004-02-17 2005-08-24 育霈科技股份有限公司 封装后强化测试的结构与方法
GB2434211B (en) 2004-11-22 2009-09-23 Electro Scient Ind Inc Method and machine for repetitive testing of an electrical component
JP2006194831A (ja) * 2005-01-17 2006-07-27 Humo Laboratory Ltd チップ形電子部品特性検査分類装置

Also Published As

Publication number Publication date
US20080129310A1 (en) 2008-06-05
KR20090091185A (ko) 2009-08-26
CN101542265A (zh) 2009-09-23
WO2008067129A3 (en) 2009-02-12
TW200834093A (en) 2008-08-16
WO2008067129A2 (en) 2008-06-05
KR101390451B1 (ko) 2014-04-30
CN101542265B (zh) 2012-11-14
US7443179B2 (en) 2008-10-28
JP5102840B2 (ja) 2012-12-19
JP2010511865A (ja) 2010-04-15

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MM4A Annulment or lapse of patent due to non-payment of fees