JP2010511865A5 - - Google Patents
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- Publication number
- JP2010511865A5 JP2010511865A5 JP2009539396A JP2009539396A JP2010511865A5 JP 2010511865 A5 JP2010511865 A5 JP 2010511865A5 JP 2009539396 A JP2009539396 A JP 2009539396A JP 2009539396 A JP2009539396 A JP 2009539396A JP 2010511865 A5 JP2010511865 A5 JP 2010511865A5
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- test
- contact roller
- predetermined force
- test plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/565,406 | 2006-11-30 | ||
| US11/565,406 US7443179B2 (en) | 2006-11-30 | 2006-11-30 | Zero motion contact actuation |
| PCT/US2007/084075 WO2008067129A2 (en) | 2006-11-30 | 2007-11-08 | Zero motion contact actuation |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010511865A JP2010511865A (ja) | 2010-04-15 |
| JP2010511865A5 true JP2010511865A5 (enExample) | 2010-12-02 |
| JP5102840B2 JP5102840B2 (ja) | 2012-12-19 |
Family
ID=39471662
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009539396A Expired - Fee Related JP5102840B2 (ja) | 2006-11-30 | 2007-11-08 | 移動のない接触作動 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7443179B2 (enExample) |
| JP (1) | JP5102840B2 (enExample) |
| KR (1) | KR101390451B1 (enExample) |
| CN (1) | CN101542265B (enExample) |
| TW (1) | TWI429923B (enExample) |
| WO (1) | WO2008067129A2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7839138B2 (en) * | 2007-01-29 | 2010-11-23 | Electro Scientific Industries, Inc. | Adjustable force electrical contactor |
| KR102243657B1 (ko) | 2014-10-06 | 2021-04-23 | 엘지전자 주식회사 | 포터블 디바이스 및 그 제어 방법 |
| JP6727651B2 (ja) | 2016-09-30 | 2020-07-22 | 株式会社ヒューモラボラトリー | チップ電子部品の電気特性の連続的な検査方法 |
| JP6679552B2 (ja) | 2017-10-02 | 2020-04-15 | 株式会社ヒューモラボラトリー | チップ電子部品の検査選別方法 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3915850A (en) * | 1973-11-14 | 1975-10-28 | Gti Corp | Component handler and method and apparatus utilizing same |
| US5034749A (en) | 1988-10-06 | 1991-07-23 | Electro Scientific Industries, Inc. | Sliding contact test apparatus |
| US4931721A (en) | 1988-12-22 | 1990-06-05 | E. I. Du Pont De Nemours And Company | Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors |
| US5057772A (en) | 1990-05-29 | 1991-10-15 | Electro Scientific Industries, Inc. | Method and system for concurrent electronic component testing and lead verification |
| JP3156250B2 (ja) * | 1990-08-27 | 2001-04-16 | セイコーエプソン株式会社 | コンタクトプローブ |
| JP2760263B2 (ja) | 1993-08-20 | 1998-05-28 | 株式会社村田製作所 | セラミックコンデンサの初期故障品のスクリーニング方法 |
| US5673799A (en) | 1995-06-05 | 1997-10-07 | Chip Star Inc. | Machine for testing and sorting capacitor chips and method of operating same |
| US5677634A (en) | 1995-11-16 | 1997-10-14 | Electro Scientific Industries, Inc. | Apparatus for stress testing capacitive components |
| JPH1038919A (ja) * | 1996-07-22 | 1998-02-13 | Oki Electric Ind Co Ltd | プローブ構造 |
| DE19637808C1 (de) * | 1996-09-17 | 1997-12-18 | Honeywell Ag | Vorrichtung zur Messung der Biegesteifigkeit von bewegtem blattförmigem Material |
| US6043665A (en) | 1996-12-05 | 2000-03-28 | Murata Manufacturing Co., Ltd. | Capacitor charging current measurement method |
| US6198290B1 (en) | 1997-07-18 | 2001-03-06 | Mark Krinker | Method to detect defective capacitors in circuit and meters for that |
| US6040705A (en) | 1997-08-20 | 2000-03-21 | Electro Scientific Industries, Inc. | Rolling electrical contactor |
| US6204464B1 (en) * | 1998-06-19 | 2001-03-20 | Douglas J. Garcia | Electronic component handler |
| US6268719B1 (en) * | 1998-09-23 | 2001-07-31 | Delaware Capital Formation, Inc. | Printed circuit board test apparatus |
| US6100707A (en) * | 1998-09-25 | 2000-08-08 | Electro Scientific Industries, Inc. | Apparatus for testing multi-terminal electronic components |
| US6459707B1 (en) | 1998-12-22 | 2002-10-01 | National Instruments Corporation | Relay multiplexer system and method for prevention of shock hazard |
| US6677637B2 (en) | 1999-06-11 | 2004-01-13 | International Business Machines Corporation | Intralevel decoupling capacitor, method of manufacture and testing circuit of the same |
| JP3548887B2 (ja) | 1999-12-20 | 2004-07-28 | 株式会社村田製作所 | 絶縁抵抗測定方法および装置 |
| JP2002286799A (ja) * | 2001-03-27 | 2002-10-03 | Tokyo Weld Co Ltd | 電子部品の測定装置及び測定方法 |
| JP2003084024A (ja) * | 2001-07-04 | 2003-03-19 | Murata Mfg Co Ltd | 電子部品の特性検査装置 |
| US6907363B1 (en) | 2001-10-15 | 2005-06-14 | Sandia Corporation | Automatic insulation resistance testing apparatus |
| US6714028B2 (en) | 2001-11-14 | 2004-03-30 | Electro Scientific Industries, Inc. | Roller contact with conductive brushes |
| TWI223084B (en) * | 2002-04-25 | 2004-11-01 | Murata Manufacturing Co | Electronic component characteristic measuring device |
| JP3836830B2 (ja) * | 2003-10-28 | 2006-10-25 | インターナショナル・ビジネス・マシーンズ・コーポレーション | アクティブマトリックスパネルの検査装置、アクティブマトリックスパネルの検査方法、およびアクティブマトリックスｏｌｅｄパネルの製造方法 |
| JP4017586B2 (ja) * | 2003-10-29 | 2007-12-05 | 三洋電機株式会社 | 電池の充電方法 |
| CN1658379A (zh) * | 2004-02-17 | 2005-08-24 | 育霈科技股份有限公司 | 封装后强化测试的结构与方法 |
| GB2434211B (en) | 2004-11-22 | 2009-09-23 | Electro Scient Ind Inc | Method and machine for repetitive testing of an electrical component |
| JP2006194831A (ja) * | 2005-01-17 | 2006-07-27 | Humo Laboratory Ltd | チップ形電子部品特性検査分類装置 |
-
2006
- 2006-11-30 US US11/565,406 patent/US7443179B2/en active Active
-
2007
- 2007-11-08 WO PCT/US2007/084075 patent/WO2008067129A2/en not_active Ceased
- 2007-11-08 KR KR1020097012704A patent/KR101390451B1/ko not_active Expired - Fee Related
- 2007-11-08 CN CN2007800436466A patent/CN101542265B/zh not_active Expired - Fee Related
- 2007-11-08 JP JP2009539396A patent/JP5102840B2/ja not_active Expired - Fee Related
- 2007-11-20 TW TW096143998A patent/TWI429923B/zh not_active IP Right Cessation
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