TWI414801B - 電流檢測電路 - Google Patents

電流檢測電路 Download PDF

Info

Publication number
TWI414801B
TWI414801B TW098138008A TW98138008A TWI414801B TW I414801 B TWI414801 B TW I414801B TW 098138008 A TW098138008 A TW 098138008A TW 98138008 A TW98138008 A TW 98138008A TW I414801 B TWI414801 B TW I414801B
Authority
TW
Taiwan
Prior art keywords
circuit
voltage
current detecting
resistor
input
Prior art date
Application number
TW098138008A
Other languages
English (en)
Chinese (zh)
Other versions
TW201028706A (en
Inventor
Masaki Mitarai
Hirotaka Sugawara
Original Assignee
Thine Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thine Electronics Inc filed Critical Thine Electronics Inc
Publication of TW201028706A publication Critical patent/TW201028706A/zh
Application granted granted Critical
Publication of TWI414801B publication Critical patent/TWI414801B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Dc-Dc Converters (AREA)
  • Power Conversion In General (AREA)
  • Emergency Protection Circuit Devices (AREA)
TW098138008A 2009-01-22 2009-11-10 電流檢測電路 TWI414801B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009011638A JP5422212B2 (ja) 2009-01-22 2009-01-22 電流検出回路

Publications (2)

Publication Number Publication Date
TW201028706A TW201028706A (en) 2010-08-01
TWI414801B true TWI414801B (zh) 2013-11-11

Family

ID=42355721

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098138008A TWI414801B (zh) 2009-01-22 2009-11-10 電流檢測電路

Country Status (4)

Country Link
JP (1) JP5422212B2 (ko)
KR (1) KR101374848B1 (ko)
TW (1) TWI414801B (ko)
WO (1) WO2010084652A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI658278B (zh) * 2015-03-19 2019-05-01 日商艾普凌科有限公司 Current detection circuit

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101458983B1 (ko) * 2013-04-29 2014-11-10 코원에너지서비스 주식회사 정류기 디지털 원격 감시제어회로
JP6796732B1 (ja) * 2020-01-20 2020-12-09 日立ジョンソンコントロールズ空調株式会社 回路基板、回路および空気調和装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04351969A (ja) * 1991-05-29 1992-12-07 Fujitsu Ltd 電流測定回路
JPH09243673A (ja) * 1996-03-05 1997-09-19 Nippon Telegr & Teleph Corp <Ntt> 信号レベル検出回路
TW358887B (en) * 1997-04-24 1999-05-21 Sanyo Electric Co Electric current detection circuit having an automatic offset correction circuit
JP2002082139A (ja) * 2000-09-05 2002-03-22 Advantest Corp 電源電圧監視回路
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit
TW591234B (en) * 2001-02-16 2004-06-11 Fuji Electric Co Ltd Current detector and overload current protective device using the same
US6946828B1 (en) * 2003-05-20 2005-09-20 Ami Semiconductor, Inc. Bi-directional current measurement circuit that uses a transconductance amplifier to generate a copy current

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182317A (ja) * 1982-04-19 1983-10-25 Sony Corp 比較回路

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04351969A (ja) * 1991-05-29 1992-12-07 Fujitsu Ltd 電流測定回路
JPH09243673A (ja) * 1996-03-05 1997-09-19 Nippon Telegr & Teleph Corp <Ntt> 信号レベル検出回路
TW358887B (en) * 1997-04-24 1999-05-21 Sanyo Electric Co Electric current detection circuit having an automatic offset correction circuit
JP2002082139A (ja) * 2000-09-05 2002-03-22 Advantest Corp 電源電圧監視回路
TW591234B (en) * 2001-02-16 2004-06-11 Fuji Electric Co Ltd Current detector and overload current protective device using the same
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit
US6946828B1 (en) * 2003-05-20 2005-09-20 Ami Semiconductor, Inc. Bi-directional current measurement circuit that uses a transconductance amplifier to generate a copy current

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI658278B (zh) * 2015-03-19 2019-05-01 日商艾普凌科有限公司 Current detection circuit

Also Published As

Publication number Publication date
TW201028706A (en) 2010-08-01
WO2010084652A1 (ja) 2010-07-29
JP5422212B2 (ja) 2014-02-19
KR20110099312A (ko) 2011-09-07
KR101374848B1 (ko) 2014-03-18
JP2010172099A (ja) 2010-08-05

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees