TWI397078B - 用於快閃記憶體中錯誤掃描之方法、裝置及系統 - Google Patents
用於快閃記憶體中錯誤掃描之方法、裝置及系統 Download PDFInfo
- Publication number
- TWI397078B TWI397078B TW097132305A TW97132305A TWI397078B TW I397078 B TWI397078 B TW I397078B TW 097132305 A TW097132305 A TW 097132305A TW 97132305 A TW97132305 A TW 97132305A TW I397078 B TWI397078 B TW I397078B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory device
- scanning
- information
- block
- errors
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/006—Identification
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
- G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/843,466 US7770079B2 (en) | 2007-08-22 | 2007-08-22 | Error scanning in flash memory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200917263A TW200917263A (en) | 2009-04-16 |
| TWI397078B true TWI397078B (zh) | 2013-05-21 |
Family
ID=40076845
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097132305A TWI397078B (zh) | 2007-08-22 | 2008-08-22 | 用於快閃記憶體中錯誤掃描之方法、裝置及系統 |
Country Status (7)
| Country | Link |
|---|---|
| US (4) | US7770079B2 (enExample) |
| EP (1) | EP2198368B1 (enExample) |
| JP (2) | JP2010537314A (enExample) |
| KR (2) | KR20160065222A (enExample) |
| CN (1) | CN101809541A (enExample) |
| TW (1) | TWI397078B (enExample) |
| WO (1) | WO2009025857A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8713385B2 (en) | 2007-08-22 | 2014-04-29 | Micron Technology, Inc. | Error scanning in flash memory |
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| JP4905839B2 (ja) * | 2005-10-18 | 2012-03-28 | 日本電気株式会社 | Mramの動作方法 |
| WO2008133087A1 (ja) * | 2007-04-17 | 2008-11-06 | Nec Corporation | 半導体記憶装置及びその動作方法 |
| US20090327581A1 (en) * | 2008-06-30 | 2009-12-31 | Coulson Richard L | Nand memory |
| US8171332B2 (en) * | 2009-05-12 | 2012-05-01 | Himax Technologies Limited | Integrated circuit with reduced electromagnetic interference induced by memory access and method for the same |
| US9170879B2 (en) * | 2009-06-24 | 2015-10-27 | Headway Technologies, Inc. | Method and apparatus for scrubbing accumulated data errors from a memory system |
| US8775865B2 (en) | 2009-06-24 | 2014-07-08 | Headway Technologies, Inc. | Method and apparatus for scrubbing accumulated disturb data errors in an array of SMT MRAM memory cells including rewriting reference bits |
| US8456926B2 (en) * | 2010-11-18 | 2013-06-04 | Grandis, Inc. | Memory write error correction circuit |
| CN101794622B (zh) * | 2010-02-10 | 2012-12-12 | 华为数字技术(成都)有限公司 | 存储设备的数据扫描方法和装置 |
| US8320185B2 (en) * | 2010-03-31 | 2012-11-27 | Micron Technology, Inc. | Lifetime markers for memory devices |
| US8429391B2 (en) | 2010-04-16 | 2013-04-23 | Micron Technology, Inc. | Boot partitions in memory devices and systems |
| US8451664B2 (en) | 2010-05-12 | 2013-05-28 | Micron Technology, Inc. | Determining and using soft data in memory devices and systems |
| US8990538B2 (en) | 2010-11-05 | 2015-03-24 | Microsoft Corporation | Managing memory with limited write cycles in heterogeneous memory systems |
| US8627176B2 (en) | 2010-11-30 | 2014-01-07 | Microsoft Corporation | Systematic mitigation of memory errors |
| KR101826140B1 (ko) | 2011-08-04 | 2018-03-22 | 삼성전자주식회사 | 메모리 컨트롤러의 동작 방법, 및 상기 메모리 컨트롤러를 포함하는 메모리 시스템 |
| US9176800B2 (en) | 2011-08-31 | 2015-11-03 | Micron Technology, Inc. | Memory refresh methods and apparatuses |
| US8862952B1 (en) * | 2012-03-16 | 2014-10-14 | Western Digital Technologies, Inc. | Prioritized memory scanning for data storage systems |
| US9032271B2 (en) * | 2012-12-07 | 2015-05-12 | Western Digital Technologies, Inc. | System and method for lower page data recovery in a solid state drive |
| US8869009B2 (en) * | 2013-02-11 | 2014-10-21 | Apple Inc. | Read commands specifying error performance |
| FR3003051B1 (fr) * | 2013-03-08 | 2016-07-29 | Peugeot Citroen Automobiles Sa | Methode de verification de l'integrite des donnees d'un calculateur embarque |
| US9367391B2 (en) | 2013-03-15 | 2016-06-14 | Micron Technology, Inc. | Error correction operations in a memory device |
| GB201322075D0 (en) | 2013-12-13 | 2014-01-29 | Ibm | Device for selecting a level for at least one read voltage |
| KR102182368B1 (ko) * | 2013-12-19 | 2020-11-24 | 에스케이하이닉스 주식회사 | 어드레스 검출회로 및 이를 포함하는 메모리 |
| US9558107B2 (en) | 2013-12-24 | 2017-01-31 | International Business Machines Corporation | Extending useful life of a non-volatile memory by health grading |
| JP2015148859A (ja) * | 2014-02-05 | 2015-08-20 | コニカミノルタ株式会社 | 情報処理装置及び起動制御プログラム並びに起動制御方法 |
| US9563373B2 (en) | 2014-10-21 | 2017-02-07 | International Business Machines Corporation | Detecting error count deviations for non-volatile memory blocks for advanced non-volatile memory block management |
| US10365859B2 (en) | 2014-10-21 | 2019-07-30 | International Business Machines Corporation | Storage array management employing a merged background management process |
| KR102264757B1 (ko) | 2014-11-11 | 2021-06-16 | 에스케이하이닉스 주식회사 | 데이터 저장 장치 및 그것의 동작 방법 |
| US9990279B2 (en) | 2014-12-23 | 2018-06-05 | International Business Machines Corporation | Page-level health equalization |
| US10339048B2 (en) | 2014-12-23 | 2019-07-02 | International Business Machines Corporation | Endurance enhancement scheme using memory re-evaluation |
| JP6515752B2 (ja) | 2015-09-07 | 2019-05-22 | 富士通株式会社 | ストレージ制御装置、制御方法、および制御プログラム |
| US10241856B2 (en) * | 2016-09-09 | 2019-03-26 | Oracle International Corporation | Memory quarantine |
| US10545810B2 (en) * | 2016-12-22 | 2020-01-28 | Western Digital Technologies, Inc. | Method and apparatus for monitoring non-volatile memory read errors using background media scan |
| KR102347184B1 (ko) | 2017-05-23 | 2022-01-04 | 삼성전자주식회사 | 스토리지 장치 및 상기 스토리지 장치의 동작 방법 |
| US10366770B1 (en) * | 2018-02-28 | 2019-07-30 | Toshiba Memory Corporation | Bit error rate estimation for NAND flash memory |
| KR102499061B1 (ko) | 2018-08-22 | 2023-02-13 | 삼성전자주식회사 | 상 변화 메모리 장치를 포함하는 반도체 메모리 장치 및 상 변화 메모리 장치를 액세스하는 방법 |
| GB2577120B (en) * | 2018-09-14 | 2022-06-01 | Siemens Ind Software Inc | Error detection within an integrated circuit chip |
| US11061754B2 (en) * | 2019-08-06 | 2021-07-13 | Alteryx, Inc. | Error handling during asynchronous processing of sequential data blocks |
| CN112002369A (zh) * | 2020-07-13 | 2020-11-27 | 珠海妙存科技有限公司 | 提升闪存数据安全性的扫描方法 |
| US20240054070A1 (en) * | 2020-12-23 | 2024-02-15 | Micron Technology, Inc | A dynamic read disturb management algorithm for flash-based memory |
| US11923022B2 (en) | 2021-10-27 | 2024-03-05 | SK Hynix Inc. | Storage device and operating method for controller |
| US12014087B2 (en) * | 2022-07-20 | 2024-06-18 | Silicon Motion, Inc. | Method and apparatus for performing data management of memory device with aid of targeted protection control |
| US12481567B2 (en) | 2023-02-28 | 2025-11-25 | Oracle International Corporation | System and method of providing system availability by preventing software crash due to recovery failure |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6046937A (en) * | 1998-07-28 | 2000-04-04 | Denso Corporation | Electronic control unit and method for storing rewrite count of nonvolatile memory |
| US6336203B1 (en) * | 1995-05-30 | 2002-01-01 | Mitsubishi Denki Kabushiki Kaisha | Error correction coding and decoding method, and circuit using said method |
| US6993690B1 (en) * | 1998-12-16 | 2006-01-31 | Hagiwara Sys-Com Co., Ltd. | Memory unit having memory status indicator |
| US20060039196A1 (en) * | 2003-10-03 | 2006-02-23 | Gorobets Sergey A | Corrected data storage and handling methods |
| US20070168603A1 (en) * | 2006-01-17 | 2007-07-19 | Kabushiki Kaisha Toshiba | Information recording apparatus and control method thereof |
| US7356442B1 (en) * | 2006-10-05 | 2008-04-08 | International Business Machines Corporation | End of life prediction of flash memory |
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-
2007
- 2007-08-22 US US11/843,466 patent/US7770079B2/en active Active
-
2008
- 2008-08-22 EP EP08795536.5A patent/EP2198368B1/en active Active
- 2008-08-22 KR KR1020167014244A patent/KR20160065222A/ko not_active Ceased
- 2008-08-22 JP JP2010521891A patent/JP2010537314A/ja active Pending
- 2008-08-22 WO PCT/US2008/010005 patent/WO2009025857A1/en not_active Ceased
- 2008-08-22 KR KR1020107006146A patent/KR101660049B1/ko active Active
- 2008-08-22 CN CN200880109070A patent/CN101809541A/zh active Pending
- 2008-08-22 TW TW097132305A patent/TWI397078B/zh active
-
2010
- 2010-07-29 US US12/846,629 patent/US8095835B2/en active Active
-
2012
- 2012-01-09 US US13/346,538 patent/US8356216B2/en active Active
-
2013
- 2013-01-14 US US13/741,148 patent/US8713385B2/en active Active
- 2013-10-17 JP JP2013216759A patent/JP5719902B2/ja active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6336203B1 (en) * | 1995-05-30 | 2002-01-01 | Mitsubishi Denki Kabushiki Kaisha | Error correction coding and decoding method, and circuit using said method |
| US6046937A (en) * | 1998-07-28 | 2000-04-04 | Denso Corporation | Electronic control unit and method for storing rewrite count of nonvolatile memory |
| US6993690B1 (en) * | 1998-12-16 | 2006-01-31 | Hagiwara Sys-Com Co., Ltd. | Memory unit having memory status indicator |
| US20060039196A1 (en) * | 2003-10-03 | 2006-02-23 | Gorobets Sergey A | Corrected data storage and handling methods |
| US20070168603A1 (en) * | 2006-01-17 | 2007-07-19 | Kabushiki Kaisha Toshiba | Information recording apparatus and control method thereof |
| US7356442B1 (en) * | 2006-10-05 | 2008-04-08 | International Business Machines Corporation | End of life prediction of flash memory |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8713385B2 (en) | 2007-08-22 | 2014-04-29 | Micron Technology, Inc. | Error scanning in flash memory |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120110399A1 (en) | 2012-05-03 |
| KR20100046265A (ko) | 2010-05-06 |
| US8713385B2 (en) | 2014-04-29 |
| US8095835B2 (en) | 2012-01-10 |
| US8356216B2 (en) | 2013-01-15 |
| US20130132805A1 (en) | 2013-05-23 |
| KR101660049B1 (ko) | 2016-09-26 |
| EP2198368A1 (en) | 2010-06-23 |
| US7770079B2 (en) | 2010-08-03 |
| JP5719902B2 (ja) | 2015-05-20 |
| TW200917263A (en) | 2009-04-16 |
| EP2198368B1 (en) | 2018-11-14 |
| US20090055697A1 (en) | 2009-02-26 |
| CN101809541A (zh) | 2010-08-18 |
| WO2009025857A1 (en) | 2009-02-26 |
| US20100313077A1 (en) | 2010-12-09 |
| JP2014041644A (ja) | 2014-03-06 |
| KR20160065222A (ko) | 2016-06-08 |
| JP2010537314A (ja) | 2010-12-02 |
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