TWI384224B - 導電性接觸件單元 - Google Patents

導電性接觸件單元 Download PDF

Info

Publication number
TWI384224B
TWI384224B TW096105188A TW96105188A TWI384224B TW I384224 B TWI384224 B TW I384224B TW 096105188 A TW096105188 A TW 096105188A TW 96105188 A TW96105188 A TW 96105188A TW I384224 B TWI384224 B TW I384224B
Authority
TW
Taiwan
Prior art keywords
contact
conductive contact
conductive
guiding groove
connecting portion
Prior art date
Application number
TW096105188A
Other languages
English (en)
Chinese (zh)
Other versions
TW200809207A (en
Inventor
Taiichi Rikimaru
Koji Ishikawa
Jun Tominaga
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200809207A publication Critical patent/TW200809207A/zh
Application granted granted Critical
Publication of TWI384224B publication Critical patent/TWI384224B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW096105188A 2006-02-17 2007-02-13 導電性接觸件單元 TWI384224B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006040746A JP4907191B2 (ja) 2006-02-17 2006-02-17 導電性接触子ユニット
PCT/JP2007/052258 WO2007094237A1 (ja) 2006-02-17 2007-02-08 導電性接触子および導電性接触子ユニット

Publications (2)

Publication Number Publication Date
TW200809207A TW200809207A (en) 2008-02-16
TWI384224B true TWI384224B (zh) 2013-02-01

Family

ID=38371424

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096105188A TWI384224B (zh) 2006-02-17 2007-02-13 導電性接觸件單元

Country Status (6)

Country Link
US (1) US7942677B2 (ko)
JP (1) JP4907191B2 (ko)
KR (1) KR101012732B1 (ko)
CN (1) CN101384909A (ko)
TW (1) TWI384224B (ko)
WO (1) WO2007094237A1 (ko)

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JP4842733B2 (ja) * 2006-08-18 2011-12-21 日本発條株式会社 導電性接触子および導電性接触子ユニット
JP4781938B2 (ja) * 2006-08-18 2011-09-28 日本発條株式会社 導電性接触子ユニット
JP5103566B2 (ja) * 2007-11-26 2012-12-19 株式会社コーヨーテクノス 電気接触子およびそれを備える検査冶具
EP2646839B1 (en) * 2010-12-03 2017-08-16 Ardent Concepts, Inc. Compliant electrical contact and assembly
JP2012186117A (ja) * 2011-03-08 2012-09-27 Fujitsu Component Ltd インタポーザ及び中継端子
KR101236312B1 (ko) 2011-10-17 2013-02-28 (주)기가레인 반도체 검사용 프로브
KR101373642B1 (ko) * 2012-10-23 2014-03-12 (주)아이윈 고무 연결핀 및 그 제조 방법
WO2015020176A1 (ja) * 2013-08-09 2015-02-12 日本発條株式会社 接続端子、パワーモジュールおよび通電ユニット
KR101582634B1 (ko) * 2013-09-13 2016-01-08 한국기계연구원 프로브 모듈 및 프로브 모듈의 제조 방법
US9653827B2 (en) * 2015-09-04 2017-05-16 Cheng Uei Precision Industry Co., Ltd. Battery connector with large current carrying capacity
US9985374B2 (en) * 2016-05-06 2018-05-29 Tc1 Llc Compliant implantable connector and methods of use and manufacture
JP6737002B2 (ja) * 2016-06-17 2020-08-05 オムロン株式会社 プローブピン
US10199751B1 (en) 2017-08-04 2019-02-05 Onesubsea Ip Uk Limited Connector assembly
CN111602062B (zh) * 2018-01-11 2023-03-03 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
JP6881343B2 (ja) * 2018-02-07 2021-06-02 オムロン株式会社 プローブピン、検査治具、検査ユニットおよび検査装置
KR102070915B1 (ko) * 2018-07-03 2020-01-29 서울대학교산학협력단 도전성 나노 구조 및 이를 이용 하는 제조 방법, 광합성 방법.
JP6835792B2 (ja) * 2018-10-29 2021-02-24 矢崎総業株式会社 電気接続箱のアース接続構造および電気接続箱
JP2020180889A (ja) * 2019-04-25 2020-11-05 オムロン株式会社 プローブピン、検査治具および検査ユニット
KR102166677B1 (ko) * 2019-08-09 2020-10-16 주식회사 오킨스전자 멤스 포고 핀 및 이를 이용한 검사 방법

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JPH11133060A (ja) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk テスト用端子
JP2003307525A (ja) * 2002-04-16 2003-10-31 Sumitomo Electric Ind Ltd コンタクトプローブ
JP2004107360A (ja) * 1995-04-07 2004-04-08 Penwest Pharmaceuticals Co 薬剤用放出制御吹入剤担体

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US5967856A (en) * 1995-12-20 1999-10-19 Berg Technology, Inc. Connector with spring contact member and shorting means
JP2000046870A (ja) * 1998-07-30 2000-02-18 Denso Corp 端子接続装置
JP2000133353A (ja) * 1998-10-27 2000-05-12 Hirose Electric Co Ltd 中間電気コネクタ
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JP3773396B2 (ja) 2000-06-01 2006-05-10 住友電気工業株式会社 コンタクトプローブおよびその製造方法
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US6783405B1 (en) * 2003-11-28 2004-08-31 Chuan Yi Precision Industry Co., Ltd. Terminal for electric connector for communication apparatus
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CN2800520Y (zh) * 2005-04-28 2006-07-26 富士康(昆山)电脑接插件有限公司 电连接器
USD556135S1 (en) * 2005-10-07 2007-11-27 Advanced Connectek Inc. Connector terminal
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USD555096S1 (en) * 2006-03-30 2007-11-13 Cheng Uei Precision Industry Co., Ltd. Connector contact
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004107360A (ja) * 1995-04-07 2004-04-08 Penwest Pharmaceuticals Co 薬剤用放出制御吹入剤担体
JPH11133060A (ja) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk テスト用端子
JP2003307525A (ja) * 2002-04-16 2003-10-31 Sumitomo Electric Ind Ltd コンタクトプローブ

Also Published As

Publication number Publication date
US7942677B2 (en) 2011-05-17
US20100227514A1 (en) 2010-09-09
JP2007218776A (ja) 2007-08-30
KR101012732B1 (ko) 2011-02-09
WO2007094237A1 (ja) 2007-08-23
KR20080086931A (ko) 2008-09-26
CN101384909A (zh) 2009-03-11
JP4907191B2 (ja) 2012-03-28
TW200809207A (en) 2008-02-16

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Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees