TWI338186B - - Google Patents
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- Publication number
- TWI338186B TWI338186B TW092102638A TW92102638A TWI338186B TW I338186 B TWI338186 B TW I338186B TW 092102638 A TW092102638 A TW 092102638A TW 92102638 A TW92102638 A TW 92102638A TW I338186 B TWI338186 B TW I338186B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- photovoltaic device
- substrate
- protective layer
- film
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/124—Insulating layers formed between TFT elements and OLED elements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002026132 | 2002-02-01 | ||
| JP2003022022A JP2003316296A (ja) | 2002-02-01 | 2003-01-30 | 回路基板、電気光学装置、電子機器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200401944A TW200401944A (en) | 2004-02-01 |
| TWI338186B true TWI338186B (enExample) | 2011-03-01 |
Family
ID=26625676
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW092102638A TW200401944A (en) | 2002-02-01 | 2003-01-30 | Circuit substrate, electro-optical device and electronic appliances |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20030214042A1 (enExample) |
| EP (1) | EP1333497A3 (enExample) |
| JP (1) | JP2003316296A (enExample) |
| KR (1) | KR100508296B1 (enExample) |
| CN (1) | CN1268000C (enExample) |
| TW (1) | TW200401944A (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6824879B2 (en) | 1999-06-10 | 2004-11-30 | Honeywell International Inc. | Spin-on-glass anti-reflective coatings for photolithography |
| US20030064282A1 (en) * | 2000-03-31 | 2003-04-03 | Hiroe Nakagawa | Battery-use separator, battery-use power generating element and battery |
| AU2002227106A1 (en) | 2001-11-15 | 2003-06-10 | Honeywell International Inc. | Spin-on anti-reflective coatings for photolithography |
| US8263983B2 (en) * | 2003-10-28 | 2012-09-11 | Semiconductor Energy Laboratory Co., Ltd. | Wiring substrate and semiconductor device |
| KR100544138B1 (ko) * | 2003-11-12 | 2006-01-23 | 삼성에스디아이 주식회사 | 액티브 매트릭스형 유기전계발광소자 |
| US8053159B2 (en) | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
| KR100686341B1 (ko) | 2003-11-29 | 2007-02-22 | 삼성에스디아이 주식회사 | 유기전계발광 표시장치 및 그의 제조방법 |
| JP4564364B2 (ja) * | 2004-01-19 | 2010-10-20 | 株式会社 日立ディスプレイズ | 有機エレクトロルミネッセンス表示装置とその製造方法 |
| KR100741966B1 (ko) * | 2004-01-27 | 2007-07-23 | 삼성에스디아이 주식회사 | 유기전계발광 표시장치 및 그의 제조방법 |
| KR100556421B1 (ko) | 2004-04-09 | 2006-03-03 | 엘지전자 주식회사 | 청색 인광용 유기 전계 발광 소자 |
| KR101052960B1 (ko) * | 2004-04-29 | 2011-07-29 | 엘지디스플레이 주식회사 | 반투과형 폴리실리콘 액정표시소자 제조방법 |
| DE102004040277B4 (de) * | 2004-06-30 | 2015-07-30 | Osram Opto Semiconductors Gmbh | Reflektierendes Schichtsystem mit einer Mehrzahl von Schichten zur Aufbringung auf ein III/V-Verbindungshalbleitermaterial |
| JP2006066871A (ja) | 2004-07-27 | 2006-03-09 | Seiko Epson Corp | 発光装置、画像形成装置および表示装置 |
| JP4193805B2 (ja) * | 2004-07-27 | 2008-12-10 | セイコーエプソン株式会社 | 発光装置および画像形成装置 |
| JP4485277B2 (ja) * | 2004-07-28 | 2010-06-16 | 大日本印刷株式会社 | エレクトロルミネッセント素子の製造方法 |
| US20080157065A1 (en) * | 2004-08-03 | 2008-07-03 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
| US8901268B2 (en) | 2004-08-03 | 2014-12-02 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
| JP4894138B2 (ja) * | 2004-10-14 | 2012-03-14 | 住友ベークライト株式会社 | 樹脂組成物、樹脂層、樹脂層付きキャリア材料および回路基板 |
| JP4967116B2 (ja) * | 2005-08-23 | 2012-07-04 | 国立大学法人東北大学 | 多層回路基板及び電子機器 |
| JP4994727B2 (ja) * | 2005-09-08 | 2012-08-08 | 株式会社リコー | 有機トランジスタアクティブ基板とその製造方法および該有機トランジスタアクティブ基板を用いた電気泳動ディスプレイ |
| KR100703157B1 (ko) | 2005-09-15 | 2007-04-06 | 삼성전자주식회사 | 표시 장치 |
| JP4428345B2 (ja) * | 2006-02-03 | 2010-03-10 | セイコーエプソン株式会社 | 光ヘッドおよび画像形成装置 |
| KR100746163B1 (ko) * | 2006-02-06 | 2007-08-06 | 삼성전자주식회사 | 디스플레이장치 및 그 제조방법 |
| JP4542051B2 (ja) * | 2006-02-22 | 2010-09-08 | エヌ・ティ・ティ・アドバンステクノロジ株式会社 | 多孔質膜の形成方法 |
| JP5128085B2 (ja) * | 2006-06-06 | 2013-01-23 | 三菱電機株式会社 | 薄膜トランジスタ装置およびその製造方法 |
| KR101269227B1 (ko) | 2006-06-29 | 2013-05-30 | 엘지디스플레이 주식회사 | 유기전계 발광소자와 그 제조방법 |
| US8642246B2 (en) | 2007-02-26 | 2014-02-04 | Honeywell International Inc. | Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof |
| JP5320753B2 (ja) * | 2008-01-29 | 2013-10-23 | セイコーエプソン株式会社 | 電気泳動表示装置 |
| JP5378420B2 (ja) * | 2008-02-25 | 2013-12-25 | ハネウェル・インターナショナル・インコーポレーテッド | 加工可能な無機及び有機ポリマー配合物、それらの製造方法及び使用 |
| TWI555205B (zh) | 2010-11-05 | 2016-10-21 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
| JP6015389B2 (ja) * | 2012-11-30 | 2016-10-26 | 株式会社リコー | 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム |
| US9960280B2 (en) * | 2013-12-26 | 2018-05-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP6451875B2 (ja) * | 2018-01-04 | 2019-01-16 | 株式会社リコー | 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム |
| JP6787386B2 (ja) * | 2018-12-12 | 2020-11-18 | 株式会社リコー | 絶縁膜形成用塗布液 |
| CN112071915B (zh) * | 2019-06-10 | 2025-07-22 | 堺显示器制品株式会社 | 薄膜晶体管及其制造方法以及显示装置 |
| US11217664B2 (en) * | 2020-02-11 | 2022-01-04 | Nanya Technology Corporation | Semiconductor device with porous dielectric structure |
| US20210249310A1 (en) * | 2020-02-11 | 2021-08-12 | Nanya Technology Corporation | Semiconductor device with porous dielectric structure and method for fabricating the same |
| DE102021107615A1 (de) * | 2021-03-25 | 2022-09-29 | Ottobock Se & Co. Kgaa | Verfahren zum Herstellen eines dreidimensionalen Erzeugnisses |
| CN114203750A (zh) * | 2021-12-07 | 2022-03-18 | 深圳市华星光电半导体显示技术有限公司 | 显示面板及其制备方法 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0482145A (ja) * | 1990-07-24 | 1992-03-16 | Toshiba Corp | 表示装置 |
| JP3587884B2 (ja) * | 1994-07-21 | 2004-11-10 | 富士通株式会社 | 多層回路基板の製造方法 |
| US5525857A (en) * | 1994-08-19 | 1996-06-11 | Texas Instruments Inc. | Low density, high porosity material as gate dielectric for field emission device |
| JP3015717B2 (ja) * | 1994-09-14 | 2000-03-06 | 三洋電機株式会社 | 半導体装置の製造方法および半導体装置 |
| US6124606A (en) * | 1995-06-06 | 2000-09-26 | Ois Optical Imaging Systems, Inc. | Method of making a large area imager with improved signal-to-noise ratio |
| US6326318B1 (en) * | 1995-09-14 | 2001-12-04 | Sanyo Electric Co., Ltd. | Process for producing semiconductor devices including an insulating layer with an impurity |
| US6268657B1 (en) * | 1995-09-14 | 2001-07-31 | Sanyo Electric Co., Ltd. | Semiconductor devices and an insulating layer with an impurity |
| US20010048147A1 (en) * | 1995-09-14 | 2001-12-06 | Hideki Mizuhara | Semiconductor devices passivation film |
| TW309633B (enExample) * | 1995-12-14 | 1997-07-01 | Handotai Energy Kenkyusho Kk | |
| US5912913A (en) * | 1995-12-27 | 1999-06-15 | Hitachi, Ltd. | Vertical cavity surface emitting laser, optical transmitter-receiver module using the laser, and parallel processing system using the laser |
| DE19712233C2 (de) * | 1996-03-26 | 2003-12-11 | Lg Philips Lcd Co | Flüssigkristallanzeige und Herstellungsverfahren dafür |
| JP3397287B2 (ja) * | 1997-03-27 | 2003-04-14 | 株式会社アドバンスト・ディスプレイ | 液晶表示装置およびその製造方法 |
| WO1999030363A2 (en) * | 1997-12-10 | 1999-06-17 | Koninklijke Philips Electronics N.V. | Semiconductor device and method of manufacturing such a device |
| JP3358544B2 (ja) * | 1998-07-01 | 2002-12-24 | 日本電気株式会社 | 電界効果型トランジスタの製造方法 |
| KR100635550B1 (ko) * | 1998-12-09 | 2006-10-18 | 니폰 가야꾸 가부시끼가이샤 | 경질 코팅물질 및 이를 포함하는 막 |
| US6531713B1 (en) * | 1999-03-19 | 2003-03-11 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and manufacturing method thereof |
| US7288420B1 (en) * | 1999-06-04 | 2007-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing an electro-optical device |
| TW512543B (en) * | 1999-06-28 | 2002-12-01 | Semiconductor Energy Lab | Method of manufacturing an electro-optical device |
| US6466281B1 (en) * | 1999-08-23 | 2002-10-15 | Industrial Technology Research Institute | Integrated black matrix/color filter structure for TFT-LCD |
| TW516244B (en) * | 1999-09-17 | 2003-01-01 | Semiconductor Energy Lab | EL display device and method for manufacturing the same |
| US6762553B1 (en) * | 1999-11-10 | 2004-07-13 | Matsushita Electric Works, Ltd. | Substrate for light emitting device, light emitting device and process for production of light emitting device |
| US6635528B2 (en) * | 1999-12-22 | 2003-10-21 | Texas Instruments Incorporated | Method of planarizing a conductive plug situated under a ferroelectric capacitor |
| US6620749B2 (en) * | 2000-01-24 | 2003-09-16 | Hc Chem Research And Service Corp. | Light-weight black ceramic insulation |
| TW494447B (en) * | 2000-02-01 | 2002-07-11 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
| TW525305B (en) * | 2000-02-22 | 2003-03-21 | Semiconductor Energy Lab | Self-light-emitting device and method of manufacturing the same |
| TW495854B (en) * | 2000-03-06 | 2002-07-21 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
| TWI226205B (en) * | 2000-03-27 | 2005-01-01 | Semiconductor Energy Lab | Self-light emitting device and method of manufacturing the same |
| US6309957B1 (en) * | 2000-04-03 | 2001-10-30 | Taiwan Semiconductor Maufacturing Company | Method of low-K/copper dual damascene |
| JP4889872B2 (ja) * | 2000-04-17 | 2012-03-07 | 株式会社半導体エネルギー研究所 | 発光装置及びそれを用いた電気器具 |
| KR100345323B1 (ko) * | 2000-04-24 | 2002-07-24 | 학교법인 포항공과대학교 | 나노 자성체 입자들을 포함하는 복합체 |
| US6989805B2 (en) * | 2000-05-08 | 2006-01-24 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
| JP4494595B2 (ja) * | 2000-06-20 | 2010-06-30 | 大日本印刷株式会社 | 有機エレクトロルミネッセント素子 |
| US6846688B2 (en) * | 2001-03-30 | 2005-01-25 | Sharp Laboratories Of America, Inc. | Method of manufacturing a liquid crystal display device with a multi-layer interlayer insulator |
| JP2003142262A (ja) * | 2001-11-06 | 2003-05-16 | Seiko Epson Corp | 電気光学装置、膜状部材、積層膜、低屈折率膜、多層積層膜、電子機器 |
| US7294877B2 (en) * | 2003-03-28 | 2007-11-13 | Nantero, Inc. | Nanotube-on-gate FET structures and applications |
-
2003
- 2003-01-30 US US10/353,976 patent/US20030214042A1/en not_active Abandoned
- 2003-01-30 JP JP2003022022A patent/JP2003316296A/ja active Pending
- 2003-01-30 KR KR10-2003-0006377A patent/KR100508296B1/ko not_active Expired - Lifetime
- 2003-01-30 TW TW092102638A patent/TW200401944A/zh not_active IP Right Cessation
- 2003-01-31 EP EP03250647A patent/EP1333497A3/en not_active Withdrawn
- 2003-02-08 CN CNB031043534A patent/CN1268000C/zh not_active Expired - Lifetime
-
2008
- 2008-09-16 US US12/232,379 patent/US20090026942A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| JP2003316296A (ja) | 2003-11-07 |
| EP1333497A3 (en) | 2005-01-05 |
| KR100508296B1 (ko) | 2005-08-17 |
| US20030214042A1 (en) | 2003-11-20 |
| CN1435804A (zh) | 2003-08-13 |
| TW200401944A (en) | 2004-02-01 |
| CN1268000C (zh) | 2006-08-02 |
| EP1333497A2 (en) | 2003-08-06 |
| KR20030066417A (ko) | 2003-08-09 |
| US20090026942A1 (en) | 2009-01-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |