TWI300570B - - Google Patents
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- Publication number
- TWI300570B TWI300570B TW95110763A TW95110763A TWI300570B TW I300570 B TWI300570 B TW I300570B TW 95110763 A TW95110763 A TW 95110763A TW 95110763 A TW95110763 A TW 95110763A TW I300570 B TWI300570 B TW I300570B
- Authority
- TW
- Taiwan
- Prior art keywords
- address
- memory
- unit
- bad
- semiconductor memory
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 133
- 239000004065 semiconductor Substances 0.000 claims description 86
- 230000002950 deficient Effects 0.000 claims description 81
- 230000007547 defect Effects 0.000 claims description 52
- 238000001514 detection method Methods 0.000 claims description 45
- 230000004913 activation Effects 0.000 claims description 24
- 230000009471 action Effects 0.000 claims description 16
- 238000013144 data compression Methods 0.000 claims description 16
- 230000006870 function Effects 0.000 claims description 14
- 238000007906 compression Methods 0.000 claims description 7
- 230000006835 compression Effects 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 3
- 229910052770 Uranium Inorganic materials 0.000 claims 1
- 230000014759 maintenance of location Effects 0.000 claims 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 11
- 238000010998 test method Methods 0.000 description 9
- 230000000694 effects Effects 0.000 description 6
- 230000004044 response Effects 0.000 description 6
- 230000003321 amplification Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 238000012812 general test Methods 0.000 description 3
- 210000003205 muscle Anatomy 0.000 description 3
- XJCLWVXTCRQIDI-UHFFFAOYSA-N Sulfallate Chemical compound CCN(CC)C(=S)SCC(Cl)=C XJCLWVXTCRQIDI-UHFFFAOYSA-N 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- VVNRQZDDMYBBJY-UHFFFAOYSA-M sodium 1-[(1-sulfonaphthalen-2-yl)diazenyl]naphthalen-2-olate Chemical compound [Na+].C1=CC=CC2=C(S([O-])(=O)=O)C(N=NC3=C4C=CC=CC4=CC=C3O)=CC=C21 VVNRQZDDMYBBJY-UHFFFAOYSA-M 0.000 description 2
- 206010011469 Crying Diseases 0.000 description 1
- 241000282320 Panthera leo Species 0.000 description 1
- 241000282376 Panthera tigris Species 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012669 compression test Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000116 mitigating effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW095110763A TW200737214A (en) | 2006-03-28 | 2006-03-28 | Semiconductor memory and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW095110763A TW200737214A (en) | 2006-03-28 | 2006-03-28 | Semiconductor memory and test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200737214A TW200737214A (en) | 2007-10-01 |
| TWI300570B true TWI300570B (enrdf_load_stackoverflow) | 2008-09-01 |
Family
ID=45069999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095110763A TW200737214A (en) | 2006-03-28 | 2006-03-28 | Semiconductor memory and test system |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200737214A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI452879B (zh) * | 2010-04-27 | 2014-09-11 | Univ Nat Sun Yat Sen | 特殊應用網路晶片之全晶片拓樸產生合成方法 |
-
2006
- 2006-03-28 TW TW095110763A patent/TW200737214A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI452879B (zh) * | 2010-04-27 | 2014-09-11 | Univ Nat Sun Yat Sen | 特殊應用網路晶片之全晶片拓樸產生合成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200737214A (en) | 2007-10-01 |
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