TW200737214A - Semiconductor memory and test system - Google Patents

Semiconductor memory and test system

Info

Publication number
TW200737214A
TW200737214A TW095110763A TW95110763A TW200737214A TW 200737214 A TW200737214 A TW 200737214A TW 095110763 A TW095110763 A TW 095110763A TW 95110763 A TW95110763 A TW 95110763A TW 200737214 A TW200737214 A TW 200737214A
Authority
TW
Taiwan
Prior art keywords
abnormal
signal
memory cell
redundant
virtual
Prior art date
Application number
TW095110763A
Other languages
English (en)
Chinese (zh)
Other versions
TWI300570B (enrdf_load_stackoverflow
Inventor
Hiroyuki Kobayashi
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to TW095110763A priority Critical patent/TW200737214A/zh
Publication of TW200737214A publication Critical patent/TW200737214A/zh
Application granted granted Critical
Publication of TWI300570B publication Critical patent/TWI300570B/zh

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW095110763A 2006-03-28 2006-03-28 Semiconductor memory and test system TW200737214A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095110763A TW200737214A (en) 2006-03-28 2006-03-28 Semiconductor memory and test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095110763A TW200737214A (en) 2006-03-28 2006-03-28 Semiconductor memory and test system

Publications (2)

Publication Number Publication Date
TW200737214A true TW200737214A (en) 2007-10-01
TWI300570B TWI300570B (enrdf_load_stackoverflow) 2008-09-01

Family

ID=45069999

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095110763A TW200737214A (en) 2006-03-28 2006-03-28 Semiconductor memory and test system

Country Status (1)

Country Link
TW (1) TW200737214A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI452879B (zh) * 2010-04-27 2014-09-11 Univ Nat Sun Yat Sen 特殊應用網路晶片之全晶片拓樸產生合成方法

Also Published As

Publication number Publication date
TWI300570B (enrdf_load_stackoverflow) 2008-09-01

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