TWI287092B - Relay member and inspection probe jig - Google Patents

Relay member and inspection probe jig Download PDF

Info

Publication number
TWI287092B
TWI287092B TW94141841A TW94141841A TWI287092B TW I287092 B TWI287092 B TW I287092B TW 94141841 A TW94141841 A TW 94141841A TW 94141841 A TW94141841 A TW 94141841A TW I287092 B TWI287092 B TW I287092B
Authority
TW
Taiwan
Prior art keywords
inspection
strand
terminal
conductive single
conductive
Prior art date
Application number
TW94141841A
Other languages
English (en)
Chinese (zh)
Other versions
TW200626906A (en
Inventor
Shigeki Ishikawa
Hiroshi Nakayama
Takashi Nidaira
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200626906A publication Critical patent/TW200626906A/zh
Application granted granted Critical
Publication of TWI287092B publication Critical patent/TWI287092B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
TW94141841A 2004-11-29 2005-11-29 Relay member and inspection probe jig TWI287092B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004344329A JP4979190B2 (ja) 2004-11-29 2004-11-29 検査プローブ治具

Publications (2)

Publication Number Publication Date
TW200626906A TW200626906A (en) 2006-08-01
TWI287092B true TWI287092B (en) 2007-09-21

Family

ID=36498140

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94141841A TWI287092B (en) 2004-11-29 2005-11-29 Relay member and inspection probe jig

Country Status (3)

Country Link
JP (1) JP4979190B2 (ja)
TW (1) TWI287092B (ja)
WO (1) WO2006057407A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101455540B1 (ko) * 2013-10-07 2014-11-04 주식회사 세디콘 프로브 카드
KR102487912B1 (ko) 2018-03-23 2023-01-12 니혼덴산리드가부시키가이샤 저항 측정 장치 및 저항 측정 지그

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60116244U (ja) * 1984-01-13 1985-08-06 日本電子材料株式会社 プロ−ブカ−ド
JPH0652748B2 (ja) * 1987-05-12 1994-07-06 東京エレクトロン株式会社 プロ−ブカ−ド
JPH02178941A (ja) * 1988-12-29 1990-07-11 Fujitsu Ltd 集積回路測定治具
JPH0528969U (ja) * 1991-05-15 1993-04-16 オーガツト インコーポレイテツド プリント基板テストフイクスチヤー用インターフエイスボード
JP3357294B2 (ja) * 1998-09-01 2002-12-16 株式会社ヨコオ 回路基板検査装置のテストヘッド
JP2000258454A (ja) * 1999-03-05 2000-09-22 Fujitsu Ltd プローブユニット

Also Published As

Publication number Publication date
TW200626906A (en) 2006-08-01
JP4979190B2 (ja) 2012-07-18
JP2006153645A (ja) 2006-06-15
WO2006057407A1 (ja) 2006-06-01

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