TWI275141B - Substrate processor - Google Patents

Substrate processor Download PDF

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Publication number
TWI275141B
TWI275141B TW094120163A TW94120163A TWI275141B TW I275141 B TWI275141 B TW I275141B TW 094120163 A TW094120163 A TW 094120163A TW 94120163 A TW94120163 A TW 94120163A TW I275141 B TWI275141 B TW I275141B
Authority
TW
Taiwan
Prior art keywords
substrate
liquid
unit
recovery type
cleaning
Prior art date
Application number
TW094120163A
Other languages
Chinese (zh)
Other versions
TW200618092A (en
Inventor
Kazuhiko Yamaguchi
Yusuke Muraoka
Original Assignee
Future Vision Inc
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Filing date
Publication date
Priority claimed from JP2004196045A external-priority patent/JP2006019525A/en
Priority claimed from JP2004197047A external-priority patent/JP4324517B2/en
Application filed by Future Vision Inc filed Critical Future Vision Inc
Publication of TW200618092A publication Critical patent/TW200618092A/en
Application granted granted Critical
Publication of TWI275141B publication Critical patent/TWI275141B/en

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1313Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells specially adapted for a particular application
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • B08B3/022Cleaning travelling work
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Weting (AREA)

Abstract

The substrate processing device 10 specifically processes a substrate B carried at a nearly horizontal attitude along a conveyance path 171. The device disposes in series a liquid collection type nozzle device 20 constituted to collect a supplied processing liquid from the substrate B as a processing liquid supply device supplying the specified processing liquid to the carrying substrate B, and an air knife 30 constituted to blow the remaining processing liquid on the substrate B with an air current as a processing removing device removing the processing liquid left on the substrate B, after the processing liquid is supplied are arranged in series along the conveyance path 171 to make a substrate processing device more compact.

Description

1275141 九、發明說明: 安裝有液晶或各種電子器件等玻璃 中對這些基板進行既定的處理的 【發明所屬之技術領域 本發明有關在包括 基板的各種基板的製造 基板處理裝置。 【先前技術】[Technical Field] The present invention relates to a substrate processing apparatus for manufacturing various substrates including a substrate, in which a substrate such as a liquid crystal or various electronic devices is mounted. [Prior Art]

在液日日顯不裔等所接用^ I 針對每巾,—般在製造時,在 对對母種處理液而設晋的益 置的稷數個處理槽内,依次裝入該基 板,在各處理槽内,供給 兀疋的處理液,由此,分 各種處理。設置連接各處 > u、+、+ 粕扪連迗通路,以便對基板進 仃上述處理,並且沿著哕 攸适 運逆機M " 一、路,設置複數個運送輥等 運t機構’基板通過運送機 槽内。 < 卫依—人運迗到各處理 在對基板,進行使用不同處 v _ _ t 、 处里/夜的多種處理的時候, '、須防止上游側的處理液隨 ,夜酼者基板,被帶到下游側的處理 :此、二;:此,必須充分地確保處理槽之間的距離。 :、:=處理所佔有的空間增加,導致 用製造空間的不利情況。 為了解決這樣的問題,人們 如,出了各種解決方案。比 /〇者運送通路,從清靈暗 理、夜的方气^ 、、,對運送中的基板喷霧處 ^.,,^ ^ b 從嘴務方式,可使處理液遍及基 板的整體,_基板浸潰於 比較,處理時間縮短,並且可更加可樣的次潰方式相 了罪地對處理液使用量 2〇l4-7191-PF;Ahddub 6 1275141 進行管理、控制。但是,即使這樣的處理液喷霧方式,仍 有大量的處理液殘留於處理後的基板上,因此,為了可靠 地對該殘留處理液進行去除處理,必須與下一處理液喷霧 位置,隔開相當長的距離,使殘留處理液從基板上滴落, 另外必須在最後通過除液部件進行除液處理。 另外近年,人們提出採用液體回收型喷嘴裝置,即 在基板運送方向的下游側’將處理液供給基板,在上游側, 從基板上回收該處理液(比如,JP特開2002- 280340號文 獻)。由於上述液體回收型噴嘴袭置即刻將已供給的處理液 體回收,故希望通過採用這樣的裝置,不用再設置去除處 理液的除液用的基板運送空間。但是,實際上,如果採用 液體回收型噴嘴裝置,進行基板處理,則具有下述的問題。 ① 即使使用液體时型噴嘴裝置,仍無法完全地將處 理液體回收於液體回收型喷嘴裝置的内部,一部分的處理 液殘留於基板上。 ② 由此,產生基板局部乾燥的乾燥不均勾。其結果是, 粒部分地附著於基板表面上,處理液的成分形成晶 體而邛为析出,即所謂的水痕。 ^痕是在從喷嘴喷霧處理液的已知的處理液喷霧方式 中二又有產生的現象,是在液體回收型喷嘴裝置的使用中產 生的新的技術課題。於是,紫 型喷嘴裝置的優點的㈣在發揮液體回收 鮮决上述問題的新的技術手段。 發明内容 2014~7191~PF/Ahddub 7 1275141 本叙明的目的在於提供一種解決上述問題的基板處理 裝置。 本t明的另一目的在於提供一種基板處理裝置,該基 板處理裝置在確保處理液的有效使用的基礎上,使基板處 理工間更加緊密’並且使基板處理更加有效化。 此外,本發明的還有一目的在於提供一種基板處理裝 置"亥基板處理I置不產生水痕,並發揮液體回收型喷嘴 裝置的特性。 ' 本發明有關-種基板處理裝置,對基板進行既定的處 理:其特徵在於包括:運送通路,運送基板;液體回收型 喷實π肖沿著上述運送通路運送的基,供、給處理液, f行基板處理’並且從基板回收處理後的處理液;及除液 部,在上述運送通路中的上述液體时型喷嘴部下游側, 仗上述液體回收型喷嘴部間隔_ ^距離地設置 的處理液去除。 ^過知用上述的方案,對送到基板處理裝置内部的基 板方面進行運送,另一方面,首先通過從液體回收型喷 =供給的處理液進行處理,並將大量的處理液體回收。、 *外理後的基板送達除液部,通過該除液部,對殘留 的处里液進仃除液處理。由Λ,即使在液體回收型喷嘴裝 =的正下游側的位置’設置除液部的情況下,仍可進行確 祐念嫌、、< 里α此’可以最大限度地減少隨著濕潤的基 ,被-到下游側的處理液的量,與過去的情況相比較,可 取大限度地縮短基板處理裝置的前後長度。可相對基板運 2〇14-7l9l~PF;Ahddub 8 1275141 ::向,密集設置液體回收型噴嘴部和除 運轉成:v 處理裝置緊密化,並且降低 運轉成本,採用了液體回收型 -It is used in the liquid day, Japanese, and the like. For each towel, in the manufacturing process, the substrate is sequentially loaded into a plurality of processing tanks for the parent-type processing liquid. In each of the treatment tanks, the treatment liquid of the crucible is supplied, and thus various treatments are performed. Set the connection u-, +, + 粕扪 迗 , , , , , , , , , , , , , , , 对 对 对 对 对 对 对 对 对 对 对 对 对 u u u u u u u u u u u u u u u u 'The substrate passes through the conveyor slot. < Weiyi-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- The treatment brought to the downstream side: this, two; this, the distance between the treatment tanks must be sufficiently ensured. :, := The increase in space occupied by the processing leads to an unfavorable situation in the manufacturing space. In order to solve such problems, people have come up with various solutions. The ratio of the delivery path to the substrate is from the clearing of the spirit, the nighttime atmosphere, and the spray on the substrate during transport. ^,, ^ ^ b From the mouth, the treatment liquid can be spread over the entire substrate. _Substrate immersion in comparison, the processing time is shortened, and the more versatile sub-cracking method can be used to manage and control the treatment liquid usage 2〇l4-7191-PF; Ahddub 6 1275141. However, even in such a treatment liquid spray method, a large amount of the treatment liquid remains on the treated substrate. Therefore, in order to reliably remove the residual treatment liquid, it is necessary to separate the spray position from the next treatment liquid. A considerable distance is opened to allow the residual treatment liquid to drip from the substrate, and the liquid removal treatment must be performed at the end by the liquid removal member. In addition, in recent years, it has been proposed to use a liquid recovery type nozzle device in which a processing liquid is supplied to a substrate on the downstream side in the substrate transport direction, and the processing liquid is recovered from the substrate on the upstream side (for example, JP-A-2002-280340) . Since the liquid recovery type nozzle is disposed to immediately collect the supplied processing liquid, it is desirable to use such a device, and it is not necessary to provide a substrate transfer space for removing the liquid to remove the liquid. However, in actuality, if a liquid recovery type nozzle device is used and substrate processing is performed, the following problems are caused. 1 Even if a liquid nozzle type device is used, the treatment liquid cannot be completely recovered inside the liquid recovery type nozzle device, and a part of the treatment liquid remains on the substrate. 2 Thus, a dry unevenness in which the substrate is partially dried is generated. As a result, the particles partially adhere to the surface of the substrate, and the components of the treatment liquid form crystals, which are precipitated, that is, so-called water marks. The mark is a phenomenon which occurs in the known treatment liquid spray method for spraying the treatment liquid from the nozzle, and is a new technical problem arising from the use of the liquid recovery type nozzle device. Therefore, the advantages of the violet nozzle device (4) are new technical means for exerting the above problems in liquid recovery. SUMMARY OF THE INVENTION 2014~7191~PF/Ahddub 7 1275141 The purpose of the present invention is to provide a substrate processing apparatus that solves the above problems. Another object of the present invention is to provide a substrate processing apparatus which makes the substrate processing work more compact and ensures more efficient substrate processing while ensuring effective use of the processing liquid. Further, another object of the present invention is to provide a substrate processing apparatus which does not generate water marks and exhibits characteristics of a liquid recovery type nozzle device. The substrate processing apparatus according to the present invention is characterized in that the substrate is subjected to a predetermined process including: a transport path for transporting the substrate; and a liquid recovery type 117 which is transported along the transport path to supply and supply the treatment liquid. The f-substrate processing 'and the processing liquid after the processing is recovered from the substrate; and the liquid-removing portion is disposed on the downstream side of the liquid-type nozzle portion in the transport path, and the liquid-collecting nozzle portion is spaced apart by a distance Liquid removal. According to the above-described scheme, the substrate sent to the inside of the substrate processing apparatus is transported. On the other hand, first, the processing liquid is supplied from the liquid recovery type injection, and a large amount of the processing liquid is recovered. * The substrate after the external treatment is sent to the liquid removing portion, and the remaining liquid is subjected to the liquid removal treatment through the liquid removing portion. Since, even in the case where the liquid-removing portion is provided at the position on the downstream side of the liquid recovery type nozzle mounting =, it is possible to make sure that the liquid-repellent portion can be minimized as it is wetted. The amount of the treatment liquid on the downstream side can be shortened to the front and rear length of the substrate processing apparatus to a large extent as compared with the past. It can transport 2相对14-7l9l~PF to the substrate; Ahddub 8 1275141::, the liquid recovery type nozzle part is densely arranged, and the operation is: v: The processing unit is compacted, and the running cost is reduced, and the liquid recovery type is adopted.

已知技術的以下不利情況,即為了防止二二T Γ:的情況’而不得不延長到下-步驟的距離= 板處理裝置的緊密化設置而產了促進基 降低。 座生的^置成本和運轉成本的 •之間另:置=’在上述液體回收型喷嘴部與上述除液部 5又置保持液供給部,該保㈣供 持濕潤狀態到至少在A柘、s、、^ 彳/、^使基板保 液。 …板運运到上述除液部為止的處理 按照上述的方案,送到基板處理裝置㈣的基板—方 仃運达,另-方面,首先通過從液體 給的處理液ii杆卢w #丄 i货01 口|5供 你其Η 持液供給部持續供給處理液 土反在濕潤狀態到達除液部,通過該除液部 :可防止從液體回收型喷嘴部,僅僅供給必= 顆< 度的處理液,因此,基板在到達除㈣ 顆粒局部地固宕於A L ^ ^ 心月j也各, ^ 、" ’或處理液巾的成分局n日 析出攻樣的不利情況的發生。於是,儘管為了使而 :置二化,並且降低運轉成本,採用了液體回:= 回收型喷嘴”置在在A “兄了最大限度地發揮將液體 土賀’ π 5又置在在基板處理裝置中的優點。 另外,上述保持液供給部最好是設置在比上述液體回 2〇l4-7191-PF;Ahddub 9 1275141 收3L喷鳴部與上述除液部的中間位置更接近上述液體回收 !噴鳥部側。按照該方案,由於上述保持液供給部設置於 相對上述液體回收型喷嘴部與上述除液部之間的基板運送 方向的中間位置偏向液體回收型喷嘴部的位置,故可確保 呆持液供給部冑於设置,i且盡彳能地制止通過液體回收 型噴嘴部進行處理的基板的乾燥。 主此外,保持在濕潤狀態的處理液最好採用清洗基板的 =洗水。按照該方案’由於處理液採用對基板進行清洗的 ,月洗水’故可將基板處理裝置用作清洗裝i,可通過清洗 水’將附著於基板上的顆粒等污染物沖洗掉,可對基板進 行清潔處理。 逖有,敢好形成有 ,卜穴q芏®的殽體合 相對向面的壁面的-面上形成基板送入口;在另一面上开 成基板送出口;在基板送入口與基板送出口之間,形成』 述運达通路;在上述殼體的内部’設置分隔壁;上述液儀 回收型喷嘴部設置於上述基板送入口和上述分隔壁之間; 上述除液部設置於上述分隔壁和基板送出口之門。 按照該方案,通過基板送人口,送人殼體㈣基板被 人运到沿運送通路而設置於殼體内部的液體 π、除液部和保持液供給部,通過各喷嘴部,進行既定處 理,然後從基板送出口排到系統之外。* 隔壁’在上游側,言免置保持液供給部,在下於°又置刀 液部,故即使在保持液供給部 ^ ’设置除 液飛“由分隔壁阻播,可防止這顆粒或處理 一,予游顆粒移動到設 2014-7191-PF;Ahddub 10 1275141 置除液部的空間(齡、原办 的^ & 本二間)晨,所以可保持乾燥空間清潔 w、j主衣士兄。 成—另外’也可通過上述液體回收型噴嘴部和除液部,形 :個單元的基板處理部,複數個單元的基板處理部沿上 =通路串聯設置,在各單元的基板處理部,採用不同 搜頰的處理液。 …按照該方案’基板沿著運送通路被運送,因而,從各 =基板處理部通過,由此可進行多種的處理液的處理。 、夜=與過去相比較,可減少上游側的基板處理部的處理 ?者基板被帶到下游側的基板處理部的量,故與過去相 比較,可以盡可能地縮短各基板處理部之間的距離。另外, =沒有分隔部的狀態τ,對基板進行處理,可有助於採 夕種處理液’對基板進行處理的基板處理裝置的裝置成 本和運轉成本的降低。 也可從運送的上游側起,設置作為上述各基板處理部 虫刻部、清洗部和乾燥部,在上耗刻部中,處理液採 用钱刻液,對基板進行敍刻處理,在上述清洗部中,處理 液㈣純水,對基板進行清洗,上述乾燥部可以將上述除 液部作為乾燥用來使用。 按照該方案,正在沿著運穿g … 者連廷通路運运的基板首先在蝕 y’進行供給钱刻液的钱刻處理,接著,在清洗部,通 匕供給的純水進行清洗處理,最後,在乾燥部,通過從除 液部供給的氣流’進行乾燥處理,然後將其排到下一步驟。 還有’也可在該殼體的相對向的壁面的_面上形成基 2014-7191-PF;Ahddub 11 1275141 口,在基板送入口與 ,上述液體回收型噴 可以設置將淨化空氣 及排出上述殼體内的 板ϋ入口 另—面上形成基板送出 基板送出nn彡成上述運送通路 嘴部和除液部設置於上述殼體内,也 达入上述殼體内的空氣導入機構,以 空氣的排氣機構。 ★按照該方案,沿著運送通路,從基板送入口,運送到 —的基板依_人運达到設置於殼體内的液體回收型喷^ 部和除液部,在各嗜禮都 一 、、, , 、▲。卩進仃既定的處理,然後從基板 士、, l到系m卜。將來自空氣導入機構的清潔空氣持 、只、到双體内冑’並且殼體内的空氣通過排氣機構,持續 排出坆樣,即使在殼體内部,存在處理液飛沫、浮游顆 粒也可/ ^著排氣而排到系統之外n # ^ ^ 可以持、,,地保持清潔的環境。因&,可確實防止因殼體内 的被污染的環境,而將基板污染的不利情況。 另卜最好上述除液部沿運送通路的寬度方向延伸, 相對運送方向錢定角度傾斜交叉的方向設置。按照該方 式’由於除液部在與基板運送面平行的面上,沿與基板運 达方向以既定角度傾斜而交叉的方向設置,故從除液部噴 射的空氣,其按壓力作為朝向基板寬度向的分力作用于附 著於基板上的處理液上,由此,與除液部與基板運送方向 相垂直的情況相比較,可有效地去除附著於基板上的處理 液0 【實施方式】 2014-7191-PF;Ahddub 12 1275141 弟1圖所示的本發明的一個實施例的基板處理裝置1〇 為對基板進行蝕刻處理的蝕刻處理裝置,如第丨圖所示, 在呈長方體狀的殼體丨丨内部,具有對基板Β進行蝕刻處理 的姓刻部1 2,對從該钱刻部i 2送出的基板Β進行清洗處 理的清洗部13,對從該清洗部13送出的基板β 二 處理的乾燥部14。 ” 在上述殼體11的上游側壁ηι(第i圖的右方),門执 有基板送入口 15,並且在下游側壁112上,在與上述:: 运入口 15相對向的位置,開設有基板送出Π 16。另外, 在該基板送人口 15與基板送“ 16之間, 向(第1圖中為向左的方向)按昭算門Η 反連运方 17,在該複數個運送輥:Γ': : 複數個運送輥 的運送通路171。各運送㈣通過圖示二: 動圖的逆時針方向驅動旋轉。 於是,從系統之外,通過基板送入口… 内的基板β通過各運逆亲 、λ又體11The following disadvantages of the known technique, i.e., the distance to the next step in order to prevent the situation of the second and second steps = the tight setting of the plate processing apparatus, resulting in a decrease in the promotion base. Between the seated cost and the running cost, the other is: set = 'the liquid recovery type nozzle portion and the liquid-removing portion 5 are further provided with a liquid supply portion, which holds the wet state to at least at A柘, s, , ^ 彳 /, ^ to make the substrate liquid. The process of transporting the board to the liquid removing unit is carried out according to the above-described scheme, and is sent to the substrate of the substrate processing apparatus (4), and the other side is firstly treated by the liquid from the liquid. 01口口|5 is available for you. The liquid supply unit continuously supplies the liquid to the liquid removal unit and reaches the liquid removal unit. The liquid removal unit prevents the liquid recovery type nozzle from being supplied only to the nozzle. The treatment liquid, therefore, the substrate arrives at the (four) particles locally fixed in the AL ^ ^ heart month j also, ^, " 'or the treatment of the liquid tissue of the composition of the n-day precipitation of the unfavorable situation. Therefore, in order to make the second: and reduce the running cost, the liquid back is used: = the recovery type nozzle is placed in the A "brothers to maximize the liquid soil" π 5 and placed on the substrate The advantages in the device. Further, it is preferable that the holding liquid supply portion is disposed closer to the liquid recovery than the liquid returning to the middle of the liquid returning portion of the third liquid jetting portion and the liquid removing portion of Ahdub 9 1275141; . According to this configuration, the holding liquid supply unit is disposed at a position offset from the liquid recovery type nozzle unit at an intermediate position in the substrate transport direction between the liquid recovery type nozzle unit and the liquid removal unit, thereby securing the holding liquid supply unit. In order to prevent the drying of the substrate processed by the liquid recovery type nozzle portion as much as possible. In addition, it is preferable to use a washing liquid for washing the substrate to maintain the wet state. According to the scheme 'because the treatment liquid is used to clean the substrate, the monthly washing water' can use the substrate processing device as the cleaning device i, and the particles such as particles attached to the substrate can be washed away by the cleaning water. The substrate is cleaned.逖 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , a partitioning passage is formed in the inside of the casing; the liquid meter recovery type nozzle portion is disposed between the substrate feeding inlet and the partition wall; and the liquid removing portion is disposed on the partition wall and The door of the substrate delivery port. According to this aspect, the human body is transported through the substrate, and the substrate (4) is transported to the liquid π, the liquid removing portion, and the holding liquid supply portion which are disposed inside the casing along the transport path, and the predetermined processing is performed by the nozzle portions. It is then discharged from the substrate delivery outlet to the outside of the system. * The partition wall 'on the upstream side is said to be free from the holding liquid supply part, and the knife liquid part is placed next to the lower part. Therefore, even if the liquid supply unit is provided in the holding liquid supply unit, the liquid separation can be prevented by the partition wall. First, the granules are moved to the setting of 2014-7191-PF; Ahddub 10 1275141 to remove the space of the liquid section (age, original ^ & this two) morning, so you can keep the dry space clean w, j main clothes In the above-mentioned liquid recovery type nozzle portion and the liquid removal portion, the substrate processing portion of the unit is formed, and the substrate processing portions of the plurality of units are arranged in series along the upper = path, and the substrate processing portion of each unit is provided. According to this scheme, the substrate is transported along the transport path. Therefore, it is possible to process a plurality of types of processing liquids by passing through the respective substrate processing units. Night = Compared with the past The amount of processing of the substrate processing unit on the upstream side can be reduced to the amount of the substrate processing unit on the downstream side, so that the distance between the substrate processing units can be shortened as much as possible in the past. Separate shape The τ, the processing of the substrate can contribute to the reduction of the device cost and the running cost of the substrate processing device that processes the substrate. The substrate can also be disposed as the substrate from the upstream side of the transport. In the upper insect cutting portion, the cleaning portion, and the drying portion, in the upper portion, the processing liquid is etched with a money engraving liquid, and the substrate is treated with the liquid (4) pure water in the cleaning portion, and the substrate is cleaned. The drying unit may use the above-mentioned liquid removing unit as a drying unit. According to the solution, the substrate that is being transported along the lining of the g-passage is first processed at the etch y' for the money engraving, and then, In the cleaning unit, the pure water supplied is purged, and finally, in the drying section, the airflow supplied from the liquid removing unit is dried, and then discharged to the next step. The base surface of the opposite wall of the body forms a base 2014-7191-PF; the Ahddub 11 1275141 port is provided at the substrate inlet and the liquid recovery type spray may be provided with a plate for purifying air and discharging the inside of the casing. The substrate is formed on the other side of the inlet, and the substrate is fed out to the substrate to be transported into the casing, and the liquid-removing portion is disposed in the casing, and the air introduction mechanism is also introduced into the casing, and the air is exhausted. According to this aspect, the substrate that is transported from the substrate along the transport path and transported to the substrate is transported to the liquid recovery type spray portion and the liquid removal portion provided in the casing, and is in a state of interest. , ▲. 卩 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃 仃The mechanism continuously discharges the sample, and even if there is a treatment liquid droplet or floating particles in the inside of the casing, it can be exhausted and discharged to the outside of the system. n # ^ ^ can be kept, and the ground is kept clean. Because &, it is possible to reliably prevent the contamination of the substrate due to the contaminated environment inside the casing. Further, it is preferable that the liquid-removing portion extends in the width direction of the transport path and is disposed in a direction obliquely intersecting with the transport direction. According to this aspect, since the liquid-repellent portion is provided on the surface parallel to the substrate transport surface in a direction intersecting with the substrate traveling direction at a predetermined angle, the air ejected from the liquid-removing portion is pressed toward the substrate width. The component force applied to the processing liquid adhered to the substrate can effectively remove the processing liquid adhered to the substrate as compared with the case where the liquid removing portion is perpendicular to the substrate transporting direction. [Embodiment] 2014 -7191-PF; Ahddub 12 1275141 The substrate processing apparatus 1 of one embodiment of the present invention shown in FIG. 1 is an etching processing apparatus for etching a substrate, as shown in the first drawing, in a rectangular parallelepiped shell. The inside of the body has a surname portion 1 2 for etching the substrate Β, a cleaning portion 13 for cleaning the substrate 送 sent from the nick portion i 2 , and a substrate β sent from the cleaning portion 13 The dried portion 14 of the treatment. On the upstream side wall ηι of the casing 11 (to the right of the i-th view), the door holds the substrate feed port 15, and on the downstream side wall 112, a substrate is opened at a position opposite to the above-mentioned port:送 16. In addition, between the substrate delivery population 15 and the substrate conveyance "16, in the direction of the left direction (in the first figure, the leftward direction) is pressed by the threshold Η 连 运 , 17 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Γ': : A plurality of transport rollers 171. Each transport (4) is driven by the counterclockwise direction of the motion diagram by means of the second diagram: Therefore, from the outside of the system, the substrate β in the substrate is fed through the substrate, and the substrate is passed through the substrate.

Mu b 17的驅動旋轉,將運送通路m 运向下游側,在蝕刻部12 逆、通路171 13進行清洗處理,最後在乾燥處理,’然後在清洗部 通過基板送出口16送到系統之°外/仃乾燥處理,接著, 上述清洗部1 3由上游側(第 ⑽,以及在下游側,與第R ^圖的右方)的第1清洗部 洗部130,構成。第卜 “ 130鄰接設置的第2清 Μ,進行普通的清洗處::2對_刻㈣送出的基 β,再次進行更高度的精細清洗洗部130,則對基板 2014-7191-PF;Ahddub 13 1275141 在上述殼體11内的蝕刻部12的下方位置,設置第) 料斗121,在該第1清洗部130的下方位置,設置第2料 + m’在該第2清洗部130’的下方位置,設置第3料斗 132’在該乾燥部14的下方位置,設置第4料斗⑷。另 外,沿運送通路171運送中的基板B上滴落的處理液由第 ;〜第4料斗m、m、132、⑷接收,然後,從底部的 開口,通過後述的氣液分離器181適當地排出。 另外’在_部12和清洗部13的運送通路171的上 Γ3Γ:’/設置分隔各部分的分隔壁,但是在第2清洗部 1 d ϋ 和乾燥部1 4的i蠢炅ϋ _ …, 的邊界位置’设置從殼體11的頂板113, 運送…71的正上方位置的頂部分隔壁114,通 二ΓΡ分隔壁114,防止在钮刻部12和清洗部13的内 ° 力水滴等移動到乾燥部14内部的情況。 *於:外、i弟2清洗部13°,的基板運送方向的長度按照 ;弟1清洗部1 3 〇的長度的尺寸Μ 名於成位τ 4 又97尺寸5又疋。如此構成的目的 板^ h間’即用於對進行最終的清洗處理後的基 -人使用後述液體保持用喷嘴裝 止處理的空間。 延仃顆粒形成防 遇有,在上述敍刻部12,對送入殼體u 進行蝕刻液的蝕刻處理, 土板 在弟1清洗部130,進0 i ^ :,:=,在第2清洗物,,進行精細清洗處理, 理。 ^月冼處理好的基板β,進行乾燥處 為了進行上述清洗處理等,在#刻部12、帛^清洗部The driving of the Mu b 17 is rotated, the transport path m is transported to the downstream side, the etching portion 12 is reversed, the passage 171 13 is cleaned, and finally, the drying process is performed, and then the cleaning portion is sent to the system through the substrate delivery port 16 / 仃 drying treatment, the cleaning unit 13 is configured by the first cleaning unit washing unit 130 on the upstream side (the (10), and the downstream side, and the right side of the R ^ drawing). In the second cleaning, the second cleaning is set to 130, and the ordinary cleaning is performed: 2 pairs of _ (4) sent base β, and a higher-level fine cleaning washing unit 130 is performed again, and the substrate is 2014-7191-PF; Ahddub 13 1275141 A first hopper 121 is provided below the etching portion 12 in the casing 11, and a second material + m' is provided below the second cleaning portion 130' at a position below the first cleaning portion 130. At the position, the third hopper 132' is provided at a position below the drying portion 14, and the fourth hopper (4) is provided. The processing liquid dripping on the substrate B that is transported along the transport path 171 is made of the first to fourth hoppers m and m. (132) (4) Receiving, and then, the opening from the bottom is appropriately discharged by the gas-liquid separator 181 which will be described later. Further, the upper portion of the transport path 171 of the _ portion 12 and the cleaning portion 13 is ': '/ The partition wall, but at the boundary position ' of the second cleaning portion 1 d ϋ and the drying portion 1 4, is provided with a top partition wall 114 from the top plate 113 of the casing 11 at a position directly above the conveyance 71. Passing through the partition wall 114 to prevent water droplets in the button portion 12 and the cleaning portion 13 The case where the inside of the drying unit 14 is moved to the inside of the drying unit 14. * The length of the substrate in the direction in which the cleaning unit 13 is at the outer portion, the length of the washing unit 13 is the length of the cleaning unit 1 3 〇, and the size of the length of the cleaning unit 1 3 Μ is in the position τ 4 97 size 5 is further reduced. The space between the target plates and the h's is configured to be used for the base-person after the final cleaning process, and the liquid holding nozzle to be described later is used for the treatment of the liquid holding nozzle. The scribing unit 12 performs an etching treatment on the feeding chamber u, and the soil plate is subjected to a fine cleaning treatment in the second cleaning unit 130 in the second cleaning unit 130. ^The 基板 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼 冼

Ahddub 2〇14~7l91-pp; 14 1275141 1 3 0和第2清济邱]q n, 冼邛130中,按照夾住運送通路 在上下處分別-罟义日斜a aA 格171的方式 ⑺叹置相對向的一對液體回收型 體回收型噴嘴邱) .〇 . ^ 1 %政置(液 .貝馮邛)20,並且在蝕刻部i 2和第、 處,在液體回收型噴喈_ w 9n ^ α π洗部130 叹生唷為裝置20的正下游側,按 通路Π1的方式八別< 罢μ π 夾住運送 万式刀別政置上下一對氣刀(除液 相對’在第2清洗部! 3〇’,在液體回收 ”此Ahddub 2〇14~7l91-pp; 14 1275141 1 3 0 and 2nd Qingji Qiu]qn, 冼邛130, sigh according to the way of clamping the transport path at the top and bottom respectively - 罟义日斜 a aA 171 (7) A pair of opposite liquid recovery type recovery type nozzles 邱. ^ 1 % 政 ((. w 9n ^ α π Washing part 130 Sighing sputum is the positive downstream side of the device 20, according to the way of the passage Π1, 八 罢 μ π 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹In the second cleaning department! 3〇', in liquid recovery"

下游側’以住運送通路171的狀態,設置;^置^ 保持用喷嘴裝置40。 置上下—對液體 在第2清洗部130,處設置液體保持用噴嘴襄置 因為由乾燥部14來進行由氣刀3。所進行的正式的乾燥: 理,所以可以防止通過液體回收型喷嘴裝置2〇而進行最2 的清洗處理的基板Β在到達乾燥部14之前的期間被自然乾 坧,就會有顆粒固著於基板Β的内外面上產生水痕的問 題,從而更進-步地進行最終的清洗處理。通過從該液體 保持用喷嘴裝置40,將超純水向基板Β的内外面噴射,可 通過乾燥部1 4的乾燥處理,防止在基板Β上產生顆粒或 水痕。 另外,在基板處理裝置1 0的附近,設置向液體回收型 噴嘴裝置20和液體保持用喷嘴裝置40供給處理液用的處 理液供給源5 0。該處理液供給源5 0由以下部分構成 艮 钱刻液供給源51,其向餘刻部1 2的液體回收型噴嘴事置 2 〇 ’供給以氟酸為主成分的钱刻液;第1清洗水供給源$ 2, 其向第1清洗部1 3 0的液體回收型喷嘴裝置2 〇供給清、先 水,第2清洗水供給源5 3 ’其向第2清洗部13 0,的液體 2014-7191-PF;Ahddub 15 •1275141 回收型噴嘴裝置2。供給超純水。 置的==部14中’按照夹住運送通路…方式設 "I射口朝向運送通路171的方 側傾斜地設置。在穿置…二 的方式,向上游 30供給進行 ^双體11的附近,設置向上述氣刀 ,^ /尹匕處理的加壓空氣的空氣供給裝置+ 自該空氣供认駐淫ΡΛ 口衣置60。來 邙η6^ 置60的加壓空氣還供向蝕刻部12和清洗 口Ρ 1 3的軋刀3 〇。 月/先 卜运入乾燥部14的基板Β首先通過上游 30,進行除、&走_ 、、工办例的虱刀 :除液處理,接著,通過下游側的氣刀3〇 分的乾燥處理。痛 充 尽 札刀3〇沿運送通路171的寬度方向延伸。 氣刀30沿與運送古 申。 广游A # 、方向傾斜地交又的方向設置,有效地進行 除液與乾燥。完成卜 订 述乾燥邛14的乾燥處理的基板β 基板达出口 1 6,诸 、糸、、先之外,使其去向下一步驟。另外, 錢㈣14處的氣刀3〇’如果只用上游側的上下 =刀可以充分地進行乾燥時,也可以不設置下游側的氣 ,第3圖為用於說明液體回收型喷嘴裝置20、氣刀3n 和液體保持用喷喈获 0 噴囑欢置40的立體圖,其表示液體回收型嗔 〃 /夜體保持用噴嘴襄置40設置於第2清洗部 、’乳刀30設置於乾燥部14的狀態。如第3圖所示, 液體回收型噴嘴萝署 、、2 0由設置於運送通路1 71的上方側的 頂部噴嘴裝置20 1,以乃^兮丁士 乂丨 勺 Λ及在该下方側,與頂部喷嘴裝置2〇】 相對向設置的底部喷嘴裝置2〇2構成。 20l4>7l91-PF;Ahddub 16 1275141 夜體回收型噴嘴裝置2〇如第4圖所示,包括上下 一對喷嘴本體21, 匕祜上下 與基板運送方向相垂 直的基板見度方向(與第4圖的紙面相垂 ==體;導人管22,該導人管22與各_體21 的基=方向下游側的端部連接;導出管Μ,該 導送方向上游側的端部連接;液體導…, 口茨及體導入口 2 4,形士认L π .,t、、 7成於上下一對的喷嘴本體21的各相 、 ,/、導入管22連通,且在盥美;、軍、、,t A Ϋ ^ ^ 社/、基板運达方向相垂直的 基板見度方向上呈長尺狀細 導出口 Μ > 長形,液體導出口 25,該液體 導出25知照與上述導出管23連诵& 士 ^ , 導入逑通的方式,與上述液體 導 2 4相對向地設置。 另一方面,在第2清洗水供 η ^ ^ ^ 、、°源53的下游側,如第3 圖所不的那樣,設置有將該第 弟d 逆屮&、、,山 弟Ζ π冼水供給源Μ的超純水 达出的达出泵531。該送出泵531盥 ~ 卜汁々憎, 一上述各導入管22連接, 上述各導出管23與設置於殼體η 接。於η 1的附近的吸引泵532連 妾於疋,如果通過送出泵531的酿說 清洗皮枇认π 的艇動’將超純水從第2 冼Μ,、給源53導入到各導入管 導入 9 U ’則該超純水通過液 導入口 24,供給到夾持於上下 、成 ub 、爲4置2 01、2 0 2之間的 狀恶的基板B的表背面與上之間的 不合因— 、鳥本體21的相對面之間, 曰口毛、、、田官現象,從基板Β與噴 漏到外部,而e h 道& 、本體21的間隙處,洩 導屮〇 % 万向移動。另外,到達液 導出口 25的超純水通過吸引 運及 9 Q AA τ> 的驅動’通過導屮答 23的吸引,排到系統外。 、、等出吕 另外’在底部的喷嘴本體21 π頂面側,設置支承基板 2〇14-7l91-PF;Ahddub 17 1275141 B的複數個支承滾輪26,基板B支承于這些支承滾輪26 上,由此,在該基板B與底部的喷嘴本體21❸上表面之間, 形成使超純水通過的通路。 由於通過採用這樣的液體回收型噴嘴裝置2〇,將所需 最小限度的超純水供向基板B,由此,實現可靠的清洗處 理,這樣,可有助於採用高價的超純水的基板清洗處理的 運轉成本的降低。 上述氣刀30如第3圖所示,具有從側面看呈五邊形狀 的,沿基板寬度方向的長尺狀的氣刀本體3ι ;形成於該氣 刀本體31的前端側的前端尖狀的喷嘴部32 ;與氣刀本體 31的根端側相連接的空氣導人管33。在噴嘴部犯的前端, 設置有沿基板寬度方向的長尺狀的吹氣細縫32丨。於是, 通過空氣供給裝置60的驅動而送出的加壓空氣通過空氣 導入管33,送入氣刀本體31的内部,然後,從吹氣細縫 32卜吹向基板B’通過上述程式的加壓氣流,吹散附著於 基板B的表背面上的超純水。 上述氣刀30相對基板B的運送方向傾斜狀態地設置。 如此,從吹氣細縫321喷射的吹氣,其按壓力向基板寬度 方向的分力作用於附著在基板B上的清洗水上,故與吹氣 細縫321與基板運送方向相垂直的情況相比較,能有效地 去除附著於基板B上的清洗水。 上述液體保持用喷嘴裝^ 40如帛3圖所示,在液體回 收型喷嘴裝置20和氣刀30之間,按照夹住運送通路i7i 的方式上下-對地設置,其包括呈圓筒狀的嗔嘴管導 18 20l4-7191-PF;Ahddub 1275141 吕42與上述喷嘴官41的一端部連接,通過上述送出 泵531的驅動’將來自第2清洗水供給源^的超純水送入 ^吕42 ’複數個喷嘴孔43,該複數個喷嘴孔43在各 、觜s 41的縱向的基本全長範圍内,等間距開設於與基 Β相對向的面上。 通過攸夹住運送通路171而上下一對地設置的液體保 持:喷嘴裝置40的㈣孔43,將超純水喷霧到基板6的 表背面上,以防止通過液體回收型喷嘴裝置20進行了清洗 处里的基板Β在到達氣刀3G之前乾燥的情況,並且通過來 自:體保持用喷嘴裝置4。的喷霧水,進一步進行最終階段 的清洗處理,由此,在進行氣刀3G的基板B的乾燥處理的 狀態下,可可靠地防止顆粒固著於基板B的表背面上的不 利情況。The downstream side is provided in a state in which the conveyance path 171 is housed, and the holding nozzle device 40 is placed. The liquid holding nozzle is disposed in the second cleaning unit 130. The air knife 3 is used by the drying unit 14. Since the main drying is performed, it is possible to prevent the substrate Β which is subjected to the most cleaning treatment by the liquid recovery type nozzle device 2 from being naturally dried before reaching the drying portion 14, and the particles are fixed to the particles. A problem of water marks is generated on the inner and outer surfaces of the substrate crucible, thereby further performing the final cleaning process. By the ultra-pure water being ejected from the inside and the outside of the substrate 从 from the liquid holding nozzle device 40, the drying process of the drying unit 14 prevents drying of particles or water marks on the substrate. Further, in the vicinity of the substrate processing apparatus 10, a processing liquid supply source 50 for supplying a processing liquid to the liquid recovery type nozzle device 20 and the liquid holding nozzle device 40 is provided. The processing liquid supply source 50 constitutes a money engraving liquid supply source 51, and supplies a liquid engraving liquid containing hydrofluoric acid as a main component to the liquid recovery type nozzle of the remaining portion 1 2; The cleaning water supply source $2 supplies the clear water to the liquid recovery type nozzle device 2 of the first cleaning unit 1130, and the second cleaning water supply source 5 3' to the liquid of the second cleaning unit 130. 2014-7191-PF; Ahddub 15 • 1275141 Recycling nozzle unit 2. Supply ultrapure water. The "= portion 14" is disposed obliquely to the side of the transport path 171 in accordance with the manner in which the transport path is sandwiched. In the way of wearing the second, the air supply device for supplying the pressurized air to the air knife, ^ / Yin + is supplied to the upstream 30, and the ventilating device is supplied from the air. 60. The pressurized air from the 6 6 6 is also supplied to the etched portion 12 and the nip 1 of the cleaning port 13 . The substrate 运 carried into the drying unit 14 is first passed through the upstream 30, and is subjected to the removal, & _, the knives of the work example: the liquid removal treatment, and then the drying by the downstream air knife 3 deal with. The pain is exhausted and the knives 3 extend in the width direction of the transport path 171. The air knife 30 is transported along with Gu Shen. Guangyou A #, the direction is obliquely placed in the direction of the direction, effectively performing liquid removal and drying. Completion The substrate β substrate which defines the drying process of the dried crucible 14 is discharged to the next step, except for the first, the first, the second, and the first. In addition, the air knife 3' at the 14th place of the money (4) can be used to explain the liquid recovery type nozzle device 20, if the upper and lower sides of the upstream side can be sufficiently dried, the downstream side gas can be omitted. The air knife 3n and the liquid holding squeegee have a three-dimensional view of the squirting 40, which indicates that the liquid recovery type 嗔〃/night body holding nozzle 40 40 is provided in the second cleaning unit, and the lacquer blade 30 is disposed in the drying section. The state of 14. As shown in Fig. 3, the liquid recovery type nozzle is provided by the top nozzle device 20 1 disposed on the upper side of the transport path 177, and is placed on the lower side and the top. The nozzle device 2〇 is configured to face the bottom nozzle device 2〇2 provided. 20l4>7l91-PF; Ahddub 16 1275141 Night body recovery type nozzle device 2, as shown in Fig. 4, includes a pair of upper and lower nozzle bodies 21, and a substrate visibility direction perpendicular to the substrate transport direction (with the fourth The paper surface of the figure is sag == body; the guide tube 22 is connected to the end of the _ body 21 in the base=direction downstream side; the outlet tube Μ is connected to the upstream side end in the guiding direction; The liquid guide ..., the mouth and the body introduction port 24, the shape of the L π., t, 7 is formed in the upper and lower pairs of the nozzle body 21, /, the introduction tube 22 is connected, and is comparable; , 军,,, t A Ϋ ^ ^ 社,, the direction of the substrate is perpendicular to the substrate in the direction of the visibility is a long-shaped thin guide Μ > elongated, liquid outlet 25, the liquid is derived 25 and the above The outlet pipe 23 is connected to the lower side of the liquid guide 24, and is connected to the liquid guide 24 in the second cleaning water. On the other hand, on the downstream side of the second cleaning water supply η ^ ^ ^ and the source 53 As shown in Fig. 3, it is provided that the ultrapure water of the first brother d is reversed &,, and the mountain Ζ π 冼 water supply source is provided. 531. The delivery pump 531 盥 卜 卜 々憎 々憎 々憎 一 一 一 一 一 一 一 上述 上述 上述 上述 上述 上述 上述 上述 上述 上述 上述 上述 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引The pumping 531 of the pump 531 sends the ultra-pure water from the second 冼Μ, and the source 53 is introduced to each of the inlet tubes to introduce 9 U. The ultrapure water is supplied to the liquid introduction port 24, and is supplied to the pump. The cause of the dislocation between the front and back of the substrate B sandwiched between the upper and lower sides, the ub, the 4, 2 01, and 2 0 2, and the opposite faces of the bird body 21, , Tian Guan phenomenon, from the substrate 喷 and the leakage to the outside, and the gap between the eh road & body, the body 21, the leakage 屮〇% universal movement. In addition, the ultra-pure water reaching the liquid outlet 25 passes through the suction And the drive of the 9 Q AA τ> is discharged outside the system by the attraction of the guide 23, and the other is provided at the bottom of the nozzle body 21 π top side, and the support substrate 2〇14-7l91-PF is provided. a plurality of support rollers 26 of Ahddub 17 1275141 B, on which the substrate B is supported, whereby the substrate A passage for passing ultrapure water is formed between B and the upper surface of the nozzle body 21 at the bottom. By using such a liquid recovery type nozzle device 2, the minimum required ultrapure water is supplied to the substrate B, thereby A reliable cleaning process is achieved, which contributes to a reduction in the running cost of the substrate cleaning process using expensive ultrapure water. As shown in FIG. 3, the air knife 30 has a pentagonal shape as seen from the side. A long-sized air knife body 3 in the width direction of the substrate; a nozzle portion 32 formed on the tip end side of the air knife body 31; and an air guiding tube 33 connected to the root end side of the air knife body 31 . At the tip end of the nozzle portion, a long-sized blow slit 32 沿 in the width direction of the substrate is provided. Then, the pressurized air sent by the driving of the air supply device 60 is sent to the inside of the air knife main body 31 through the air introduction pipe 33, and then blown from the air blowing slit 32 to the substrate B' by the above-described program. The air stream blows off the ultrapure water adhering to the front and back surfaces of the substrate B. The air knife 30 is provided in an inclined state with respect to the conveyance direction of the substrate B. In this way, the blown gas jetted from the blow slit 321 is applied to the cleaning water adhering to the substrate B by the component of the pressure in the width direction of the substrate, so that the blow slit 321 is perpendicular to the substrate transport direction. In comparison, the washing water attached to the substrate B can be effectively removed. As shown in FIG. 3, the liquid holding nozzle assembly 40 is disposed between the liquid recovery type nozzle device 20 and the air knife 30 so as to sandwich the transport path i7i, and includes a cylindrical crucible. The mouth tube guide 18 20l4-7191-PF; Ahddub 1275141 Lu 42 is connected to one end of the nozzle body 41, and the ultra pure water from the second washing water supply source ^ is sent to the ^ 42 by the drive of the delivery pump 531 The plurality of nozzle holes 43 are formed at equal intervals on the surface facing the base in the longitudinal direction of each of the plurality of nozzle holes 43. The liquid provided in the upper and lower pairs by holding the transport path 171 is held by the (four) hole 43 of the nozzle device 40, and the ultrapure water is sprayed onto the front and back surfaces of the substrate 6 to prevent the liquid recovery type nozzle device 20 from being carried out. The substrate Β in the cleaning place is dried before reaching the air knife 3G, and passes through the body holding nozzle device 4. Further, the spray water is further subjected to the cleaning treatment in the final stage, whereby the drying of the substrate B of the air knife 3G is performed, and the unevenness of the particles adhering to the front and back surfaces of the substrate B can be reliably prevented.

另外,在本實施例中,上述液體保持用喷嘴裝置4〇被 設置在,相對於液體回收型喷嘴裝置2〇和氣刀3〇之間的 中間位置’更靠近液體回收型喷嘴裝置2〇的位置,並且盡 可能地接近液體回收型噴嘴裝置2〇的位置。上述情況下, 由於在液體回收型喷嘴裝置2〇中,只將必要的最小限度的 超純水與基板B接觸,故附著水的量少,於是,基板b中 的已清洗的部分,從液體回收型喷嘴裝置2〇分離的瞬間開 始,自然乾燥便快速地進展,因此,液體保持用噴嘴裝置 40按照盡可能接近液體回收型喷嘴裝置2〇的方式嗖置, 以便避免上述情況。 另-方面,在第i〜第4料斗m、131、132、i4i的 2014-7191-PF;Ahddub 19 1275141 底部’如第1圖所示,設置對殼體u内的氣液的送出 導向的導向管〗8 、, 丁 18。各導向管18的底端部敞開,且面向殼 體11的底邛’並且在導向管18的中途,排氣管19形成支 路在導向g 18中的相對排氣管丨9的分支位置,設置既 定的氣液分離器m ’集中于導向管18中的清潔空氣和處 理液通過這些氣液分離器181分離,然後,處理液從導@ 管18的底端開口,送向殼體η的底部,另-方面,把通 過敍刻12、清洗部13和乾燥部14的用過的空氣送向排 氣管1 9。 上述各排乳管1 9的下游端與設置於基板處理裝置i 〇 的附近用於吸收工麻肉久立 廠内各邛位的排氣的集中排氣管(排翕 機構)7 4連接。於早 、s々 、 於疋通過Λ液分離器181分離的排氣 1 9内的用過的空氣集中到隼 彳釆Τ排軋官74中,通過設置於 工廠内的圖示省略的集塵器, 、 排到系統外。 #仃既…塵處理,然後, 接著,在各排氣管丨9的内部, & 刀⑺5又置用於调節吸引 風虿的調節風門191。該調節 乳門1 91在蝕刻部12、第1 清洗部130和乾燥部14中,在 主、 文乳刀3 0喷射加壓空氣的 f月況與不喷射的情況下,調 ,汀開耘度,由此,可在 體11内的塵力持續地處於預定的負屢環境。 π 即,在從氣刀30喷射加壓空氣 —从a , 風的時候,該情況通過既 疋的感測|§進行檢測,將該檢測 ^ , σ〜輸入到圖示省略的控 制為,由此,將來自該控制器的 ,Q1门# #工制^就輸出給調節風門 1 91 ’因基於該控制信號調節風 L門19丨的打開程度增加,向 2014-7191-PF/Ahddub 2〇 1275141 調節風門191的用過的空氣的吸引量被增加,另一方面, 如果從氣刀3 0而來的加懕处名, 加座工乳的排出被停止,則該情況可 通過既定的感測器檢測出,並通過基於該檢測信號的控制 器的控制信號’使調節風門191的打開程度變小,使用過 的空氣的吸引量減少。 ^通過上述調節風門191的打開程度控制,從氣刀30而 來的加壓空氣無論喷射或喷射停止,㈣㉝12、清洗部Η 和乾燥部14内的壓力持續保持在一定的狀態。 、、、如上所述,本發明的基板處理裝置1〇,是對正在沿運 适通路m,以基本水平的姿勢運送的基板β,進行既定的 處理之裝置’並且將液體回收型噴嘴裝置2()與氣刀3〇沿 運送通路171串聯地設置,其中液體回收型喷嘴裝置20作 :向運迗中的基板β供給既定的處理液的處理液供給器, 叔…、可攸基板β回收已供給的處理液的方式構成;而氣刀 、乍為去除在上述處理液被供給後的基板Β上殘留的處理 液的處理液去除裝置,按照通過氣流吹散基板Β上的殘留 外里液的方式構成,因此,送人基板處理裝置玉q内部的基 板壯B-方面進行運送,另一方面,首先通過液體回收型喷 W置2G供給的處理液進行處理,接著以液體濕潤狀態到 ' 3 0處通過該氣刀3 0,進行除液處理,這樣,以 ,餘刻口^ 1 2與清洗部1 30那樣,在相互鄰接並採用不同種 :、的液體的邛分’分離處理液,可最大限度地減少隨著該 /門的基板Β帶到下游側的處理液的量。 於疋,儘管為了使基板處理裝置〗〇緊密化,並且降低 20l4-7l91-pF;Ahddub 21 1275141 運轉成本,採用了液體回收型喷嘴裝置2〇,但是,也可以 2除為了防止將處理液帶到τ—步驟,而不得不延長到下 -步驟的距離的現有不利情況,可促進因基板處理裝置ι〇 的緊密化帶來的裝置成本和運轉成本的降低。 一另外,通過液體回收型喷嘴裝置20和氣刀30,形成 一個單元的基板處理部(在本實施例中,為蝕刻部12和第 1清洗部130) ’複數個單元的基板處理部沿運送通路171 串聯設置(在本實施射,㈣】部12和清洗部13串聯設 置),而1 ’因在各單兀的基板處理部採用不同種類的處理 液:在本實施例中,在姓刻部124,處理液採用姓刻液, 在第1清洗部130處,處理液採用清洗水),所以通過基板 Β沿運送通路171進行運送,通過各單元的基板處理部%蝕 刻部12和第1清洗部13〇),可進行多種處理液的處理。 另外,由於處理液供給器採用液體回收型噴嘴裝置2 〇,故 與過去相比較,可減少上游側的基板處理部的處理液隨著 基板Β帶到下游側的基板處理部的量,因此,與過去相比 較’可最大限度地縮短各基板處理部之間的距離,可促進 採用多種處理液,對基板Β進行處理的基板處理裝置ι〇的 裝置成本和運轉成本的降低。 此外’在本實施例中,作為各基板處理部,從運送通 路171的上游側起,設置蝕刻部12、清洗部和乾燥部 14,在該蝕刻部12,處理液採用對基板β進行蝕刻處理的 #刻液;在清洗部13,處理液採用對基板Β進行清洗的純 水’在乾燥部14,氣刀30被用於乾燥;因此,正在沿運 2014-7191-PF;Ahddub 22 ^275141 叙路171運达的基板β,首先在敍刻# 12,進行供給有 刻液的蝕刻處理’接著,在清洗部13,通過純水的供给 二行清洗處理,最後’在乾燥部14,通過從氣刀3〇供: 岁“氧流,進行乾燥處理。因此,使基板Β通過各處理部(敍 二部12,清洗部13和乾燥部⑷,由此,可對基板β,進 仃包括清洗和乾燥在内的—系列的#刻處理。 另外’液體回收型喷嘴裝置2〇和氣刀3〇,具有相互 對向的分別㈣於上游側壁⑴和下游側壁ιΐ2上的基板 k入口 15和基板送出口 16,並且該液體回收型噴嘴裝置 =和氣刀3G設置于形成有在基板送人口 15和基板送出\ 、之間的運送通路171的殼體n的内部,因此,沿運送Further, in the present embodiment, the liquid holding nozzle device 4 is disposed closer to the liquid recovery type nozzle device 2〇 with respect to the intermediate position between the liquid recovery type nozzle device 2〇 and the air knife 3〇. And as close as possible to the position of the liquid recovery type nozzle device 2〇. In the above case, in the liquid recovery type nozzle device 2, only the minimum necessary ultrapure water is brought into contact with the substrate B, so that the amount of adhered water is small, so that the cleaned portion of the substrate b is from the liquid. The recovery nozzle device 2 starts at the moment of separation, and the natural drying progresses rapidly. Therefore, the liquid holding nozzle device 40 is disposed as close as possible to the liquid recovery type nozzle device 2 to avoid the above. On the other hand, in the bottom of the 2014-7191-PF of the i-th to fourth hoppers m, 131, 132, and i4i, and the bottom of the Ahddub 19 1275141, as shown in Fig. 1, the gas-liquid delivery guide in the casing u is provided. Guide tube 〗 8, 8, D. The bottom end of each guide tube 18 is open and faces the bottom 邛 ' of the housing 11 and in the middle of the guide tube 18, the exhaust pipe 19 forms a branch position of the branch in the guide g 18 relative to the exhaust pipe 丨9, The predetermined air-liquid separator m' is disposed in the guide pipe 18, and the cleaning air and the treatment liquid are separated by the gas-liquid separator 181, and then the treatment liquid is opened from the bottom end of the guide tube 18 to the casing η. At the bottom, on the other hand, the used air passing through the scribe 12, the cleaning unit 13 and the drying unit 14 is sent to the exhaust pipe 19. The downstream end of each of the above-mentioned rows of the milk tubes 19 is connected to a concentrated exhaust pipe (drainage mechanism) 7.4 provided in the vicinity of the substrate processing apparatus i 用于 for absorbing the exhaust gas of each position in the jigsaw plant. The used air in the exhaust gas 19 separated by the sputum separator 181 in the early morning, the sputum, and the sputum 181 is concentrated in the sputum discharge official 74, and the dust collection is omitted by the illustration provided in the factory. , , and discharged outside the system. #仃 both...dust treatment, and then, inside the respective exhaust pipe 丨9, the & knives (7) 5 are again provided for adjusting the damper 191 for attracting the wind. In the etched portion 12, the first cleaning unit 130, and the drying unit 14, in the case where the main and the nipples 30 are injected with the pressurized air and the non-injection, the adjustment nipple 1 91 is adjusted. Thus, the dust force within the body 11 is continuously in a predetermined negative environment. π That is, when the pressurized air is injected from the air knife 30 - from a, wind, the situation is detected by the sensing of the | §, the detection ^, σ~ is input to the control omitted from the figure, by In this case, the Q1 door from the controller is output to the damper 1 91 'the opening degree of the wind L door 19 调节 is adjusted based on the control signal, and is transmitted to 2014-7191-PF/Ahddub 2〇 1275141 The amount of suction of the used air of the damper 191 is increased. On the other hand, if the name of the squeezing from the air knives 30 is stopped, the discharge of the squeezing work milk is stopped, the situation can pass the established feeling. The detector detects that the degree of opening of the damper 191 is reduced by the control signal of the controller based on the detection signal, and the amount of suction of the used air is reduced. By the above-described degree of opening control of the damper 191, the pressurized air from the air knife 30 is stopped regardless of the injection or ejection, and the pressure in the (four) 3312, the cleaning unit Η and the drying unit 14 is maintained constant. As described above, the substrate processing apparatus 1 of the present invention is a device that performs a predetermined process on the substrate β that is being transported in a substantially horizontal posture along the operational path m, and the liquid recovery type nozzle device 2 () is disposed in series with the air knife 3〇 along the transport path 171, wherein the liquid recovery type nozzle device 20 is a processing liquid supply device that supplies a predetermined processing liquid to the substrate β in the transport, and the sputum substrate β is recovered. The treatment liquid is supplied in the form of a treatment liquid, and the air knives and the sputum are the treatment liquid removal means for removing the treatment liquid remaining on the substrate raft after the treatment liquid is supplied, and the residual effluent on the substrate 吹 is blown off by the air flow. In this way, the substrate is transported to the inside of the substrate processing apparatus J, and the processing liquid which is supplied by the liquid recovery type spray 2G is first processed, and then the liquid is wetted to the ' At 30, the liquid knife 30 is used to perform the liquid removal treatment, so that the remaining ports 2 1 and the cleaning unit 1 30 are adjacent to each other and different types of liquid are used. , As this minimizes / door substrate Β amount of the treatment liquid to the downstream side. In addition, in order to make the substrate processing apparatus compact, and to reduce the operating cost of 20l4-7l91-pF; Ahddub 21 1275141, the liquid recovery type nozzle device 2〇 is used, but it is also possible to prevent the treatment liquid from being removed. The existing disadvantages of having to extend the distance to the next step are to the τ-step, which can promote the reduction of the device cost and the running cost due to the compactness of the substrate processing apparatus. In addition, the substrate processing unit (in the present embodiment, the etching unit 12 and the first cleaning unit 130) of one unit is formed by the liquid recovery type nozzle device 20 and the air knife 30. The substrate processing unit of the plurality of units is along the transport path. 171 is connected in series (in this embodiment, (4)] the portion 12 and the cleaning unit 13 are arranged in series), and 1' uses different types of processing liquids in the substrate processing unit of each unit: in the present embodiment, in the case of the last name 124, the treatment liquid is a surname engraving liquid, and the treatment liquid is washed water by the first cleaning unit 130. Therefore, the substrate is transported along the transport path 171, and the substrate processing unit % etching unit 12 and the first cleaning unit of each unit are used. Part 13)), can handle a variety of treatment liquids. In addition, since the liquid recovery type nozzle device 2 is used as the processing liquid supply device, the amount of the processing liquid in the upstream substrate processing unit can be reduced to the amount of the substrate processing unit on the downstream side of the substrate processing portion. Compared with the past, the distance between the substrate processing units can be minimized, and the device cost and the running cost of the substrate processing apparatus that processes the substrate 采用 can be promoted by using various processing liquids. In the present embodiment, as the respective substrate processing portions, the etching portion 12, the cleaning portion, and the drying portion 14 are provided from the upstream side of the transport path 171, and in the etching portion 12, the processing liquid is subjected to etching treatment on the substrate β. In the cleaning unit 13, the treatment liquid is made of pure water for cleaning the substrate ' in the drying section 14, and the air knife 30 is used for drying; therefore, it is being transported 2014-7191-PF; Ahddub 22 ^ 275141 The substrate β conveyed by the road 171 is first subjected to an etching process for supplying a liquid in the engraving #12, and then, in the cleaning unit 13, the cleaning process is performed by the supply of pure water, and finally, the drying unit 14 passes the drying process. It is supplied from the air knife 3: "Oxygen flow, drying treatment. Therefore, the substrate is passed through each processing portion (the second portion 12, the cleaning portion 13 and the drying portion (4), whereby the substrate β can be included Cleaning and drying - series of engraving treatments. In addition, the 'liquid recovery type nozzle device 2' and the air knife 3' have the opposite sides (4) respectively on the upstream side wall (1) and the downstream side wall ι2 on the substrate k inlet 15 and the substrate Delivery outlet 16, and the liquid is recovered Nozzle means provided in the 3G = air knife is formed out of the inner housing n conveyance passage 171 \ between the substrate 15 and the substrate feed population, therefore, along the transport

路1Ή ’從基板达入口 15,送入殼體"的内部的基板B 被依次送到設置於殼體11 Μ部的液體回收型噴嘴裝置 2〇和氣刀30,進行各噴嘴震置的既定的處理,秋後,二基 板送出口 16’排到系統之外。此外,由於在殼體U的二 部,具備送入清潔空氣的淨化空氣用吹風機Η,以及排出 二體11内的空氣的集中排氣管74,故通過空氣用吹風機 的平化空氣持績導入殼體u的内部的同時,將殼體η 内的空氣通過集中排氣管74持續地排出。因此,即使在殼 =的内二存在處理液的飛珠、浮游的顆粒,也將隨著 ,到糸1之*卜因此,可使殼體11内的環境持續保 、r、叮確實地防止由於殼體11内的污染的環境,將基 板B污染的不利情況。 此外,在液體回收型喷嘴裝置2〇和氣刀3〇 ^ 間,吕又 2014-7191-PF;Ahddub 23 ^75141 置向基板B,供认& 裳置40。 〜5乾無防止用的清洗水的液體保持用噴嘴 按照該方宰,# 進行運送,另i、方基板處理裝置内部的基板B 一方面 供給的清洗水^面’百先通過從液體回收型喷嘴裝置2〇 用喷嘴穿詈4Π沾主 被么、巧來自液體保持 3。广 清洗水,在液體濕潤的狀態下,到達氣刀 处’通過該氣刀30,進行除 型噴嘴裝置2〇n㈣μ丨 U體回收 修確實地防卜其4 度的清洗水,因此,可 土板Β在到達除液用喷嘴 粒固著於基板Β上的情況。、…便已“,使顆 於是,儘管為了實現基板處理裝置的緊⑧ 本的降低,採用了液體回收型 * 轉成 免因顆粒等固著於基板B 避 ^ 使I ασ的不合格率增加的情 土板處理裝置10中,可最大限 噴嘴裝置20的優點。 ”體回收型 • 另外,由於液體保持用嘴嘴農置4 〇 收型喷嘴裝置20和氣刀30之門^其/於相對液體回 ρ„ 之間的在基板運送方向上的中 立置’更罪近液體回收型喷嘴駐番ΑΑ, 可〜…, 置20的位置,故能夠盡 了此地抑制通過液體回收型嘴The substrate B of the inside of the substrate 15 is fed to the liquid recovery type nozzle device 2A and the air knife 30 provided in the crotch portion of the casing 11, and the nozzles are set. After the autumn, the two substrate delivery outlets 16' are discharged outside the system. In addition, in the two parts of the casing U, there is a blower for purifying air for supplying clean air, and a concentrated exhaust pipe 74 for exhausting air in the two bodies 11, so that the flat air is introduced through the air blower. At the same time as the inside of the casing u, the air in the casing n is continuously discharged through the concentrated exhaust pipe 74. Therefore, even if there are fly beads or floating particles of the treatment liquid in the inner part of the shell =, the sputum 1 will be maintained, so that the environment in the casing 11 can be maintained, r, and 叮 can be reliably prevented. The disadvantage of contamination of the substrate B due to the contaminated environment inside the casing 11. Further, between the liquid recovery type nozzle device 2〇 and the air knife 3〇, Lu is 2014-7191-PF; Ahddub 23^75141 is placed on the substrate B, and the acknowledgment & ~5 The liquid holding nozzle for the cleaning water for prevention is transported according to the square slaughter, #, and the substrate B inside the square substrate processing apparatus is supplied with the cleaning water surface. The nozzle device 2 is used to hold the main body by the nozzle. Wide cleaning water, in the state where the liquid is wet, reaches the air knife. 'With the air knife 30, the cleaning nozzle device 2〇n(4)μ丨U body is recovered and repaired to prevent the cleaning water of 4 degrees. Therefore, the soil can be cleaned. The sheet is fixed to the substrate crucible when it reaches the nozzle for liquid removal. "...", so that, in order to achieve a reduction in the compactness of the substrate processing apparatus, the liquid recovery type* is converted into a particle-free particle or the like, and the substrate B is prevented from increasing the failure rate of I ασ. In the home floor treatment device 10, the advantages of the nozzle device 20 can be maximized. "Body recovery type" In addition, since the liquid holding nozzles are placed, the nozzles 20 and the air knife 30 are relatively The liquid back ρ „ between the neutral direction of the substrate transport direction' is more sinful than the liquid recovery type nozzle in the Panyu, can be ~ ..., set the position of 20, so can do this to suppress the liquid recovery type nozzle

的乾燥。 贺’衣置2°進仃清洗的基板B 二卜,由於設置將淨化空氣導入處理室殼體u内部的 斤化工氣用吹風機6卜同時處理室殼體u的内部的空氣 可通過設置於工廠内的集中排氣管74而排出,故可以將來 自淨化空氣用吹風機61的淨化空氣持續地導入到處理室 24 2014-7191-PF;Ahddub 1275141 殼體11的内部’同時處理室殼體u内的空氣通過集中排 氣管74持續地向外排出。於是,即使在處理室殼體u内, 存在浮游顆粒,也可以將其隨著排氣,排到系統之外,因 此可持續地保持處理室殼體n内的環境的清潔,可確實地 防止由於殼體η内的污染的環境,導致顆粒將基板B污染 的不利情況。Dry. He's set the substrate B to be cleaned by 2°, and the air inside the chamber housing u can be set in the factory by setting the air to the inside of the processing chamber housing. The concentrated exhaust pipe 74 is discharged inside, so that the purified air from the clean air blower 61 can be continuously introduced into the processing chamber 24 2014-7191-PF; Ahddub 1275141 is inside the casing 11 while simultaneously processing the chamber casing u The air is continuously discharged outward through the concentrated exhaust pipe 74. Therefore, even if there are floating particles in the process chamber casing u, they can be discharged to the outside of the system along with the exhaust gas, so that the environment in the process chamber casing n can be kept clean and can be surely prevented. Due to the contaminated environment within the housing η, the particles cause contamination of the substrate B.

還有,由於在第3清洗室14中所採用的清洗水使用超 純水,故可在清洗處理的最終階段,使基完全清潔。 本發明不限於上述實施例,其還包括下述的内容。 (1)在上述實施例中,例舉了作為基板處理裝置對 基板B進行㈣處理的裝置的實例,但是,本發明並不限 於基板處縣置1G為_處理用的裝置,也可將基板處理 裝置10的整體作為進行清洗處理用的裝置。此時,钮刻液 供給源51由清洗水處理源代替。即,將清洗液從液供給源 5卜供向蝕刻部12的液體回收型噴嘴裝置2〇。蝕刻部u 可乍為第1 β洗部’第!清洗部i 3〇可作為第2清洗部。 *另外’此時’也可在第!清洗部12,第2清洗部13〇 &兩者上’設置液體保持用喷嘴裝置4〇。此時,來自第1 清洗水供給源51的清洗水供向設置於第)清洗部Μ上的 持用喷嘴裝^ 4〇,同時來自第2清洗水供給源52 的>"先水供向設置於第2清洗室13上的液體保持用噴嘴裝 置40中。通過以上構成,由於在第i和第2清洗部 0内的β洗處理形成為液體回收型噴嘴裝置Μ和液體保 持用喷嘴裝置40的二階段處理,故可實現比第!和第2清 2〇14-7l91^pF/Ahddub 25 1275141 洗部1 2、1 3 0的階段更有效的清洗處理。 (2) 在上述實施例中,蝕刻部12和第丨清洗部13〇中, 未設置液體保持用喷嘴裝置4〇,但是,本發明並不限於在 飯刻部12和第1清洗部13〇中不設置液體保持用喷嘴裝置 40,也可對應於基板處理的種類、狀況,在這些基板處理 部中,設置液體保持用喷嘴裝置4〇。通過以上構成,由於 在蝕刻部12和第"青洗部13〇内的處理形成為液體回收型 喷嘴裝置20和液體保持用喷嘴裝置4〇的二階段處理,故 _可以更有效地實現基板處理。 (3) 在上述實施例中,通過採用在第2清洗部13〇,中 的液體回收型喷嘴裝置2〇的超純水的基板B的清洗處理, 將從液體回收型喷嘴裝置2〇 #出的清洗處理後的=純水 排到系統之外,但是,也可代替這樣的方式,將清洗處理 後的超純水返回給第i清洗部13〇,以供再次使用。 (4) 在上述實施例中,液體保持用喷嘴裝置40中用於 _喷射清洗水的圓形的喷嘴孔43,穿設于噴嘴管41上,j 是,本發明並不限於噴射清洗水的部分為圓形的噴嘴:: 43,也可為方孔、多邊形孔,或星型孔等,還可代替孔, 而採用細縫,安裝於既定的喷嘴部件上。 曰 (5) 在上述實施例中,雖然第2清洗 r的液體 保持用噴嘴I置4〇,被設置于相對於液體回收型噴嘴妒 2〇與氣刀30的大致中間位置更接近液體回收型噴嘴 2〇 —側,但是,本發明並不限於液體保持用噴嘴裝置、置 設置於以上所述的位置,可根據基板B的種類、運行條: 2〇14-7191-pF;Ahddub 26 1275141 等與基板處理有關的各種狀況,設定適當地設置位置。 【圖式簡單說明】 第1圖為表示本發明的一個實施例的基板處理裝置的 大體結構的縱向剖視圖; 第2圖為第1圖所示的基板處理裝置的橫向剖視圖· 弟3圖為表示設置於上述基板處理裝晋 不1甲的,液體回 收型喷嘴裝置、氣刀和液體保持用噴嘴裳 触m · 、的位置關係立 弟4圖為第 視圖。 3圖所示的液體回收型喷嘴穿置 的縱向剖 主要元件符號說明】 11〜殼體; 112〜下游側壁; 114〜分隔壁; 1 21〜第1料斗; 1 3 0〜第1清洗部; 131〜第2料斗; 14〜乾燥部; 15〜基板送人σ · 1 7〜運送親; 18〜導向管; 1 9〜排氣管; I 0〜基板處理裝置·, 111〜上游側壁; II 3〜頂板; 1 2〜姓刻部; 1 3〜清洗部; 130’〜第2清洗部 1 3 2〜第3料斗; 141〜第4料斗; 16〜基板送出口; 171〜運送通路; 181〜氣液分離器·, 2014-7191-PF;Ahddub 27 1275141 1 91〜調節風門; 201〜頂部喷嘴裝置 21〜喷嘴本體; 23〜導出管; 25〜液體導出口; 31〜氣刀本體; 321〜吹氣細縫; 41〜喷嘴管; • 42〜導入管; 5 0〜處理液供給源 5 31〜送出泵; 532〜吸引泵; 60〜空氣供給裝置 74〜集中排氣管; 20〜液體回收型喷嘴部; 202〜底部喷嘴裝置; 22〜導入管; 24〜液體導入口; 3 0〜氣刀; 32〜喷嘴部; 33〜空氣導入管; 40〜液體保持用喷嘴裝置; 43〜喷嘴孔; 51〜蝕刻液供給源; 52〜第1清洗水供給源; 53〜第2清洗水供給源; 61〜淨化空氣用吹風機; B〜基板。 2014-7191-PF;Ahddub 28Further, since the cleaning water used in the third cleaning chamber 14 uses ultrapure water, the base can be completely cleaned in the final stage of the cleaning process. The present invention is not limited to the above embodiment, and includes the following contents. (1) In the above embodiment, an example of a device for performing (four) processing on the substrate B as a substrate processing apparatus is exemplified. However, the present invention is not limited to a device in which the substrate is placed at a level of 1 G, and the substrate may be used. The entire processing device 10 serves as a device for performing a cleaning process. At this time, the button engraving supply source 51 is replaced by the washing water treatment source. That is, the cleaning liquid is supplied from the liquid supply source 5 to the liquid recovery type nozzle device 2 of the etching unit 12. The etching portion u can be referred to as the first ? The cleaning unit i 3 can be used as the second cleaning unit. *Other 'this time' can also be in the first! In the cleaning unit 12, the second cleaning unit 13A and the above are provided with a liquid holding nozzle device 4'. At this time, the washing water from the first washing water supply source 51 is supplied to the holding nozzle provided on the first cleaning unit 〇, and the water supply from the second cleaning water supply source 52 The liquid holding nozzle device 40 is provided in the second cleaning chamber 13. With the above configuration, since the β-washing treatment in the i-th and second cleaning units 0 is formed as a two-stage process of the liquid recovery type nozzle device Μ and the liquid holding nozzle device 40, the ratio can be achieved! And the second clear 2〇14-7l91^pF/Ahddub 25 1275141 Washing part 1 2, 1 3 0 stage more effective cleaning process. (2) In the above embodiment, the liquid holding nozzle device 4A is not provided in the etching portion 12 and the second cleaning portion 13A, but the present invention is not limited to the rice portion 12 and the first cleaning portion 13 The liquid holding nozzle device 40 is not provided, and the liquid holding nozzle device 4A may be provided in the substrate processing unit in accordance with the type and condition of the substrate processing. With the above configuration, since the processing in the etching portion 12 and the "clearing portion 13" is formed into a two-stage process of the liquid recovery type nozzle device 20 and the liquid holding nozzle device 4, the substrate can be more efficiently realized. deal with. (3) In the above-described embodiment, the cleaning process of the substrate B using the ultrapure water of the liquid recovery type nozzle device 2 in the second cleaning unit 13A is performed from the liquid recovery type nozzle device 2 The pure water after the cleaning treatment is discharged to the outside of the system. However, instead of such a method, the ultra-pure water after the cleaning treatment may be returned to the i-th cleaning unit 13A for reuse. (4) In the above embodiment, the circular nozzle hole 43 for jetting the washing water in the liquid holding nozzle device 40 is bored on the nozzle tube 41, i, the present invention is not limited to the jet washing water. Partially rounded nozzles:: 43, can also be square holes, polygonal holes, or star-shaped holes, etc., and can be used instead of holes, but with slits, installed on a given nozzle part. (5) In the above embodiment, the liquid holding nozzle I of the second cleaning r is set to 4, and is disposed closer to the liquid recovery type than the substantially intermediate position between the liquid recovery type nozzle 妒2〇 and the air knife 30. The nozzle 2 is on the side, but the present invention is not limited to the liquid holding nozzle device, and is disposed at the above-described position, depending on the type of the substrate B, the running bar: 2〇14-7191-pF; Ahddub 26 1275141, etc. Various conditions related to substrate processing are set to appropriately set the position. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a longitudinal cross-sectional view showing a general configuration of a substrate processing apparatus according to an embodiment of the present invention; Fig. 2 is a transverse cross-sectional view of the substrate processing apparatus shown in Fig. 1; The positional relationship between the liquid recovery type nozzle device, the air knife, and the liquid holding nozzle is set to be the first view. 3 shows the longitudinal section of the liquid recovery type nozzle through the main component symbol description] 11 ~ housing; 112 ~ downstream side wall; 114 ~ partition wall; 1 21 ~ 1st hopper; 1 3 0 ~ 1st cleaning section; 131~2nd hopper; 14~drying section; 15~substrate give σ · 1 7~ transport pro; 18~ guide tube; 1 9~ exhaust pipe; I 0~substrate processing device ·, 111~upstream sidewall; II 3~ top plate; 1 2~single part; 1 3~cleaning part; 130'~2nd cleaning part 1 3 2~3rd hopper; 141~4th hopper; 16~substrate delivery port; 171~transportation path; ~ gas-liquid separator ·, 2014-7191-PF; Ahddub 27 1275141 1 91~ adjusting damper; 201~ top nozzle device 21~ nozzle body; 23~ outlet tube; 25~ liquid outlet; 31~ air knife body; ~ blowing slit; 41 ~ nozzle tube; • 42 ~ introduction tube; 5 0 ~ treatment liquid supply source 5 31 ~ delivery pump; 532 ~ suction pump; 60 ~ air supply device 74 ~ concentrated exhaust pipe; Recycling nozzle section; 202~ bottom nozzle device; 22~ introduction tube; 24~ liquid introduction port; 3 0~ air knife; 32 to nozzle portion; 33 to air introduction tube; 40 to liquid holding nozzle device; 43 to nozzle hole; 51 to etching liquid supply source; 52 to first cleaning water supply source; 53 to second cleaning water supply source; ~ Purify the air with a hair dryer; B ~ substrate. 2014-7191-PF; Ahddub 28

Claims (1)

1275141 十、申請專利範固: 土板處理裊置,對基板實施既定的處理,其特 徵在於包括: ^ 運送通路,運送基板; 液體回收型喷嘴部,向沿著上述運送通路運送的基板 供給處理液,來進行基板處理,同時,從基板回收處理後 的處理液;及 除液邛在上述運送通路中的上述液體回收型喷嘴部 下游側,從上述液體回收型喷嘴部,間隔既定距離地設置, 並去除基板上的處理液。 2·如申請專利範圍第丨項所述的基板處理裝置,其中 在上述液體回收型噴嘴部和上述除液部之間,還設置有保 持液供給部,該保持液供給部供給使基板保持濕潤狀態到 至少運送到上述除液部為止的處理液。 3 ·如申請專利範圍第2項所述的基板處理裝置,其中 _上述保持液供給部設置在比上述液體回收型喷嘴部與上述 除液部的中間位置,更偏向上述液體回收型噴嘴部側。 4·如申請專利範圍第2項所述的基板處理裝置,其中 保持濕潤狀態的所述處理液為清洗基板的清洗水。 5 ·如申晴專利範圍第2至4項中任一項所述的基板處 理裝置’其中進一步包括具有壁面的殼體,在殼體相對向 的壁面的一個壁面上形成基板送入口,在另一壁面上形成 基板送出口,在所述基板送入口與所述基板送出口之間, 形成上述運送通路,在上述殼體的内部設置分隔壁,上述 2014-7191-PF;Ahddub 29 1275141 液體回收型喷嘴部設置於上述基板送入口和 ea 上迹分隔壁之 4,上述除液部設置於上述分隔壁和上述基板送出 理/署如申請專利範圍第1至4項中任—項所述的口基之板間處 虞置’其中由上述液體回收型喷嘴部和上述除液部 —個單元的基板處理部,複數個單元的基板處理m 運送通路串聯設置,在各單元的基ϋ 類的處理液。 知用不同種 7.如申請專利範圍第6項所述的基板處理裝置,盆 從運送通路的上游侧起,設置蝕 八 α洗。卩和乾燥部來 作為上述各基板處理部,上述蝕 k做β 口Μ木用蝕刻液作為對基 板進料刻處理的處理液;上述清洗部採用純水作為對基 板進行清洗的處理液;上述乾燥部將上述除液部用作乾燥。 8·如申請專利範圍第1至4頊中 ” 4貝中任一項所述的基板處 理裝置,其中還包括具有壁面 J ^ 在设體的相對向的 壁面的-個壁面上形成基板送入口;在另一壁面上形成基 板送出口;在上述基板送入口盘 上迷基板达出口之間形成 上述運送通路;上述液體回收型噴嘴部和上述除液部設置 於上述殼體内;並設置有將清潔空氣導入到上述殼體内的 空乳導入機構,以及排出上述殼體内的空氣的排氣機構。 9·如申請專利範圍第項中任一項所述的基板處 理裝置,其甲上述除液部沿上述運送通路的寬度方向延 伸’並設置在㈣運送方向以既定角度傾斜交差的方向上。 2014-7191-PF;Ahddub 301275141 X. Patent application: The earth plate processing device performs a predetermined process on the substrate, and is characterized by: ^ a transport path for transporting the substrate; and a liquid recovery type nozzle portion for supplying the substrate to the transport path along the transport path The liquid material is subjected to the substrate treatment, and the treatment liquid after the treatment is recovered from the substrate; and the liquid removal hopper is disposed at a predetermined distance from the liquid recovery type nozzle portion on the downstream side of the liquid recovery type nozzle portion in the transport path. And remove the treatment liquid on the substrate. The substrate processing apparatus according to claim 2, wherein a holding liquid supply unit is provided between the liquid recovery type nozzle unit and the liquid removal unit, and the holding liquid supply unit supplies the substrate to be wet. The state is at least the processing liquid that has been transported to the above-described liquid removing portion. The substrate processing apparatus according to the second aspect of the invention, wherein the holding liquid supply unit is disposed at a position intermediate to the liquid recovery type nozzle unit and the liquid removal unit, and is further biased toward the liquid recovery type nozzle unit side. . 4. The substrate processing apparatus according to claim 2, wherein the processing liquid that is kept in a wet state is cleaning water for cleaning the substrate. The substrate processing apparatus according to any one of the items 2 to 4, wherein the substrate processing apparatus further includes a housing having a wall surface, and a substrate feeding inlet is formed on one wall surface of the opposite wall surface of the housing, in another A substrate delivery port is formed on one wall surface, and the transport path is formed between the substrate feed inlet and the substrate delivery port, and a partition wall is provided inside the casing, and the 2014-7191-PF; Ahddub 29 1275141 liquid recovery The nozzle portion is disposed on the substrate feed inlet and the ea upper partition wall 4, and the liquid removal portion is disposed on the partition wall and the substrate transfer mechanism as described in any one of claims 1 to 4 of the patent application scope. a substrate processing unit in which the liquid recovery type nozzle portion and the liquid removal unit are connected to each other, and a substrate processing m transportation path of a plurality of units is provided in series in the base of the unit. Treatment fluid. In the substrate processing apparatus according to the sixth aspect of the invention, the basin is provided with an etchback from the upstream side of the transport path. The 卩 and the drying unit are used as the processing unit for each of the substrates, wherein the etchant is used as a processing liquid for processing the substrate, and the cleaning unit is made of pure water as a processing liquid for cleaning the substrate; The drying section uses the above liquid removing section as a drying. The substrate processing apparatus according to any one of claims 1 to 4, further comprising a substrate having a wall surface J^ forming a substrate inlet on a wall surface of the opposite wall surface of the installation body Forming a substrate delivery opening on the other wall surface; forming the transport path between the substrate delivery outlets on the substrate feeding inlet tray; the liquid recovery type nozzle portion and the liquid removal portion are disposed in the housing; An empty milk introduction mechanism for introducing the clean air into the casing, and an exhausting mechanism for discharging the air in the casing. The substrate processing apparatus according to any one of the preceding claims, wherein The liquid removing portion extends in the width direction of the above-described conveying path and is disposed in the direction in which the (four) conveying direction is inclined at a predetermined angle. 2014-7191-PF; Ahddub 30
TW094120163A 2004-07-01 2005-06-17 Substrate processor TWI275141B (en)

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JP2004196045A JP2006019525A (en) 2004-07-01 2004-07-01 Substrate processing device
JP2004197047A JP4324517B2 (en) 2004-07-02 2004-07-02 Substrate processing equipment

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JP4688741B2 (en) * 2006-06-26 2011-05-25 大日本スクリーン製造株式会社 Substrate processing equipment
KR100854981B1 (en) * 2007-10-10 2008-08-28 홍경표 Wet processing treatment apparatus for manufacturing printed circuit board
KR102147687B1 (en) * 2013-08-13 2020-08-27 세메스 주식회사 Substrate treating apparatus and transporting method
JP6235070B2 (en) * 2015-07-06 2017-11-22 芝浦メカトロニクス株式会社 Substrate processing apparatus and substrate processing method
CN115254789A (en) * 2022-08-22 2022-11-01 赫曼半导体技术(深圳)有限公司 Wet processing substrate processing device

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JP3159658B2 (en) 1996-12-06 2001-04-23 松下電器産業株式会社 Method for etching a substrate having a transparent conductive layer
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