TWI253144B - Automatic design method, automatic design device, reticule set, semiconductor integrated circuit and recording media - Google Patents
Automatic design method, automatic design device, reticule set, semiconductor integrated circuit and recording media Download PDFInfo
- Publication number
- TWI253144B TWI253144B TW093128682A TW93128682A TWI253144B TW I253144 B TWI253144 B TW I253144B TW 093128682 A TW093128682 A TW 093128682A TW 93128682 A TW93128682 A TW 93128682A TW I253144 B TWI253144 B TW I253144B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- wiring
- pattern
- lower layer
- wiring pattern
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/394—Routing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Geometry (AREA)
- Evolutionary Computation (AREA)
- Computer Networks & Wireless Communication (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003343302A JP4509521B2 (ja) | 2003-10-01 | 2003-10-01 | 自動設計方法、自動設計装置、レチクルセット、半導体集積回路及び設計プログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200519668A TW200519668A (en) | 2005-06-16 |
| TWI253144B true TWI253144B (en) | 2006-04-11 |
Family
ID=34537317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093128682A TWI253144B (en) | 2003-10-01 | 2004-09-22 | Automatic design method, automatic design device, reticule set, semiconductor integrated circuit and recording media |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7146597B2 (https=) |
| JP (1) | JP4509521B2 (https=) |
| TW (1) | TWI253144B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4801333B2 (ja) * | 2004-07-23 | 2011-10-26 | パナソニック株式会社 | 電源配線構造および該電源配線構造を備えた半導体集積回路 |
| JP4901302B2 (ja) * | 2006-05-26 | 2012-03-21 | 株式会社東芝 | 半導体集積回路 |
| JP2010003712A (ja) * | 2007-08-09 | 2010-01-07 | Renesas Technology Corp | 半導体装置、半導体装置の配置配線方法、及びデータ処理システム |
| CN102622469A (zh) * | 2012-02-20 | 2012-08-01 | 浙江工业大学 | 一种基于相似度的产品可拓分类知识挖掘方法 |
| US8631375B2 (en) * | 2012-04-10 | 2014-01-14 | International Business Machines Corporation | Via selection in integrated circuit design |
| CN103093051B (zh) * | 2013-01-17 | 2015-10-07 | 浙江工业大学 | 一种产品性能传导知识挖掘方法 |
| CN103136349A (zh) * | 2013-02-22 | 2013-06-05 | 浙江工业大学 | 一种产品性能传导知识挖掘方法 |
| CN105097800B (zh) * | 2015-08-31 | 2018-09-07 | 京东方科技集团股份有限公司 | 一种显示基板、显示面板和显示装置 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61140149A (ja) * | 1984-12-12 | 1986-06-27 | Hitachi Comput Eng Corp Ltd | 半導体集積回路装置 |
| US5618744A (en) * | 1992-09-22 | 1997-04-08 | Fujitsu Ltd. | Manufacturing method and apparatus of a semiconductor integrated circuit device |
| KR100273703B1 (ko) * | 1997-12-12 | 2001-03-02 | 윤종용 | 콘택관련 결함 및 콘택저항을 감소하기 위한 반도체 장치의 콘택구조 및 그 제조 방법 |
| US6349403B1 (en) * | 1998-12-18 | 2002-02-19 | Synopsys, Inc. | Interative, gridless, cost-based layer assignment coarse router for computer controlled IC design |
| US6507941B1 (en) * | 1999-04-28 | 2003-01-14 | Magma Design Automation, Inc. | Subgrid detailed routing |
| JP4008629B2 (ja) * | 1999-09-10 | 2007-11-14 | 株式会社東芝 | 半導体装置、その設計方法、及びその設計プログラムを格納したコンピュータ読み取り可能な記録媒体 |
| JP3822009B2 (ja) * | 1999-11-17 | 2006-09-13 | 株式会社東芝 | 自動設計方法、露光用マスクセット、半導体集積回路装置、半導体集積回路装置の製造方法、および自動設計プログラムを記録した記録媒体 |
| JP3390393B2 (ja) * | 1999-12-21 | 2003-03-24 | エヌイーシーマイクロシステム株式会社 | 自動配置配線システムの配線方法および自動配置配線システムの配線方法を記録した記録媒体 |
| JP2001284455A (ja) * | 2000-03-29 | 2001-10-12 | Kawasaki Steel Corp | 自動レイアウト方法及び装置ならびにそれらを用いた半導体集積回路 |
| JP2001291844A (ja) * | 2000-04-06 | 2001-10-19 | Fujitsu Ltd | 半導体装置及びその製造方法 |
| US6900540B1 (en) * | 2000-12-07 | 2005-05-31 | Cadence Design Systems, Inc. | Simulating diagonal wiring directions using Manhattan directional wires |
| US6858928B1 (en) * | 2000-12-07 | 2005-02-22 | Cadence Design Systems, Inc. | Multi-directional wiring on a single metal layer |
| JP2002329783A (ja) * | 2001-04-27 | 2002-11-15 | Toshiba Corp | 配線パターンの自動レイアウト方法、レイアウトパターンの光学補正方法、自動レイアウト方法と光学補正方法に基づいて製造される半導体集積回路、および自動レイアウト光学補正プログラムを記録した記録媒体 |
| JP2003031662A (ja) * | 2001-07-16 | 2003-01-31 | Mitsubishi Electric Corp | 半導体集積回路の配線方法、半導体集積回路、及び配線方法をコンピュータに実行させるプログラム |
| JP2003218115A (ja) * | 2002-01-23 | 2003-07-31 | Hitachi Ltd | ヴィアを有する配線構造 |
-
2003
- 2003-10-01 JP JP2003343302A patent/JP4509521B2/ja not_active Expired - Lifetime
-
2004
- 2004-09-22 TW TW093128682A patent/TWI253144B/zh not_active IP Right Cessation
- 2004-09-27 US US10/951,858 patent/US7146597B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US7146597B2 (en) | 2006-12-05 |
| TW200519668A (en) | 2005-06-16 |
| JP4509521B2 (ja) | 2010-07-21 |
| US20050108673A1 (en) | 2005-05-19 |
| JP2005109336A (ja) | 2005-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6486066B2 (en) | Method of generating integrated circuit feature layout for improved chemical mechanical polishing | |
| TW523831B (en) | Semiconductor device and a process for designing a mask | |
| JP3779243B2 (ja) | 半導体装置及びその製造方法 | |
| TWI223322B (en) | Design method of semiconductor device and recording medium for storing its design program | |
| TW201104482A (en) | Method, system, and program product for routing an integrated circuit to be manufactured by doubled patterning | |
| CN100375267C (zh) | 制造半导体器件的方法 | |
| US7958481B2 (en) | Method of designing a semiconductor integrated circuit having a dummy area and the semiconductor integrated circuit thereof | |
| TWI253144B (en) | Automatic design method, automatic design device, reticule set, semiconductor integrated circuit and recording media | |
| JP2916905B2 (ja) | 半導体素子の配線形成方法 | |
| US7859111B2 (en) | Computer implemented method for designing a semiconductor device, an automated design system and a semiconductor device | |
| TW200903739A (en) | Flash memory cell with a flare gate | |
| JP4469539B2 (ja) | 半導体集積回路装置の製造方法 | |
| JP3334339B2 (ja) | 半導体装置の配線レイアウト方法及び製造方法 | |
| US6094812A (en) | Dishing avoidance in wide soft metal wires | |
| US20020106901A1 (en) | Method for forming semiconductor device having high-density contacts | |
| JP3004313B2 (ja) | 半導体装置の製造方法 | |
| US20050075854A1 (en) | Simulation circuit pattern evaluation method, manufacturing method of semiconductor integrated circuit, test substrate, and test substrate group | |
| JP3373382B2 (ja) | 半導体装置の製造方法 | |
| JP2005303089A (ja) | 半導体装置 | |
| US9087880B2 (en) | Removing metal fills in a wiring layer | |
| KR100541550B1 (ko) | 배선 포토 마스크들 및 그를 이용한 반도체 장치의제조방법들 | |
| TWI506754B (zh) | 積體電路圖案及方法 | |
| JP2794118B2 (ja) | 微細パターンの形成方法 | |
| JP2001298081A (ja) | 半導体装置及びその製造方法 | |
| TWI300586B (en) | Method of disposing and arranging dummy patterns |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |