TWD195361S - 電性接觸子之部分 - Google Patents

電性接觸子之部分

Info

Publication number
TWD195361S
TWD195361S TW107304474D01F TW107304474D01F TWD195361S TW D195361 S TWD195361 S TW D195361S TW 107304474D01 F TW107304474D01 F TW 107304474D01F TW 107304474D01 F TW107304474D01 F TW 107304474D01F TW D195361 S TWD195361 S TW D195361S
Authority
TW
Taiwan
Prior art keywords
design
view
line
sectional
enlarged view
Prior art date
Application number
TW107304474D01F
Other languages
English (en)
Chinese (zh)
Inventor
那須美佳
大喜彦
深津奈美子
Original Assignee
日商日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本麥克隆尼股份有限公司 filed Critical 日商日本麥克隆尼股份有限公司
Publication of TWD195361S publication Critical patent/TWD195361S/zh

Links

TW107304474D01F 2018-02-02 2018-08-02 電性接觸子之部分 TWD195361S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2018-2099F JP1623279S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02
JP2018-002099 2018-02-02

Publications (1)

Publication Number Publication Date
TWD195361S true TWD195361S (zh) 2019-01-11

Family

ID=65037440

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107304474D01F TWD195361S (zh) 2018-02-02 2018-08-02 電性接觸子之部分

Country Status (3)

Country Link
US (1) USD873685S1 (enrdf_load_stackoverflow)
JP (1) JP1623279S (enrdf_load_stackoverflow)
TW (1) TWD195361S (enrdf_load_stackoverflow)

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
TWI421504B (zh) * 2010-07-02 2014-01-01 Isc Co Ltd 測試用的測試探針以及其製造方法
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
EP2836847B1 (en) * 2012-04-13 2016-05-18 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP1529605S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529608S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529607S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529612S (enrdf_load_stackoverflow) * 2014-12-19 2015-07-27
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip

Also Published As

Publication number Publication date
USD873685S1 (en) 2020-01-28
JP1623279S (enrdf_load_stackoverflow) 2019-01-28

Similar Documents

Publication Publication Date Title
WO2018129439A3 (en) Socket side thermal system
TWD209939S (zh) 電性接觸子
MY192337A (en) Test socket assembly
MY179623A (en) Apparatus for heating smokable material and article of smokable material
MY193495A (en) Electronic device having fingerprint sensor
EP4535143A3 (en) Touch-sensitive fabric device
TW200508625A (en) Device for inspecting a conductive pattern
TWD198372S (zh) 電氣特性測定用探針之部分
JP2013234990A5 (enrdf_load_stackoverflow)
SA519410635B1 (ar) نظام لقياس الانعكاس للكشف عن الأعطال على موصل متعدد النقاط مــُصلب في شبكة كهربائية
TWD195360S (zh) 電性接觸子之部分
TWD195583S (zh) 電性接觸子之部分
TWD198746S (zh) 導通檢查用探針接腳
MY175281A (en) Kelvin contact assembly in a testing apparatus for integrated circuits
TWD195361S (zh) 電性接觸子之部分
TWD197821S (zh) 電性接觸子之部分
TWD195584S (zh) 電性接觸子之部分
TWD197820S (zh) 電性接觸子之部分
WO2015104015A3 (de) Sensorelement zur bestimmung von dehnungen
TWD197823S (zh) 電性接觸子之部分
TWD197822S (zh) 電性接觸子之部分
BR112017004637A2 (pt) medidor de teste portátil com canal térmico integrado
MY168991A (en) Clothing processing device
TWD194905S (zh) 導通檢查用探針接腳
TWD194906S (zh) 導通檢查用探針接腳