TWD194953S - Elastic film for semiconductor wafer polishing - Google Patents
Elastic film for semiconductor wafer polishingInfo
- Publication number
- TWD194953S TWD194953S TW106303209D01F TW106303209D01F TWD194953S TW D194953 S TWD194953 S TW D194953S TW 106303209D01 F TW106303209D01 F TW 106303209D01F TW 106303209D01 F TW106303209D01 F TW 106303209D01F TW D194953 S TWD194953 S TW D194953S
- Authority
- TW
- Taiwan
- Prior art keywords
- view
- design
- article
- wafer
- polishing
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract description 7
- 239000004065 semiconductor Substances 0.000 title abstract description 5
- 239000012528 membrane Substances 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000007517 polishing process Methods 0.000 abstract description 2
- 239000000758 substrate Substances 0.000 abstract description 2
- 238000003825 pressing Methods 0.000 abstract 1
Abstract
【物品用途】;本設計的物品是半導體晶圓研磨用彈性膜(亦稱為隔模(membrane)),為一種應用於半導體等的製造上之晶圓研磨工序中,安裝在研磨裝置的基板保持環內側,從裝置側將空氣等氣體供給到本物品的背面側使膜面朝正面側膨脹,用以將配置在正面側的晶圓單面朝研磨墊按壓,並且,通過小孔進行真空吸引來保持晶圓。;【設計說明】;本衍生設計與原設計之外觀差異在於:如立體圖1、A-A線剖面圖及B部放大圖等所示,其斷面形狀略有所不同,因此本案與原設計案之差異些微,不影響原設計與衍生設計之近似。;仰視圖與俯視圖相對稱,仰視圖省略。;左側視圖與右側視圖相對稱,左側視圖省略。
Description
本設計的物品是半導體晶圓研磨用彈性膜(亦稱為隔模(membrane)),為一種應用於半導體等的製造上之晶圓研磨工序中,安裝在研磨裝置的基板保持環內側,從裝置側將空氣等氣體供給到本物品的背面側使膜面朝正面側膨脹,用以將配置在正面側的晶圓單面朝研磨墊按壓,並且,通過小孔進行真空吸引來保持晶圓。
本衍生設計與原設計之外觀差異在於:如立體圖1、A-A線剖面圖及B部放大圖等所示,其斷面形狀略有所不同,因此本案與原設計案之差異些微,不影響原設計與衍生設計之近似。
仰視圖與俯視圖相對稱,仰視圖省略。
左側視圖與右側視圖相對稱,左側視圖省略。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-013970 | 2017-06-29 | ||
JP2017013970F JP1590248S (zh) | 2017-06-29 | 2017-06-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
TWD194953S true TWD194953S (zh) | 2018-12-21 |
Family
ID=68318634
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106303209D01F TWD194953S (zh) | 2017-06-29 | 2017-12-25 | Elastic film for semiconductor wafer polishing |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP1590248S (zh) |
TW (1) | TWD194953S (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWD205953S (zh) | 2019-05-30 | 2020-07-21 | 林珍如 | 緩衝墊(三) |
TWD206007S (zh) | 2019-05-30 | 2020-07-21 | 林珍如 | 緩衝墊(四) |
-
2017
- 2017-06-29 JP JP2017013970F patent/JP1590248S/ja active Active
- 2017-12-25 TW TW106303209D01F patent/TWD194953S/zh unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWD205953S (zh) | 2019-05-30 | 2020-07-21 | 林珍如 | 緩衝墊(三) |
TWD206007S (zh) | 2019-05-30 | 2020-07-21 | 林珍如 | 緩衝墊(四) |
Also Published As
Publication number | Publication date |
---|---|
JP1590248S (zh) | 2019-10-28 |
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