TWD190540S - 探針之部分 - Google Patents

探針之部分

Info

Publication number
TWD190540S
TWD190540S TW106304545F TW106304545F TWD190540S TW D190540 S TWD190540 S TW D190540S TW 106304545 F TW106304545 F TW 106304545F TW 106304545 F TW106304545 F TW 106304545F TW D190540 S TWD190540 S TW D190540S
Authority
TW
Taiwan
Prior art keywords
design
case
electrical contact
article
parts
Prior art date
Application number
TW106304545F
Other languages
English (en)
Chinese (zh)
Inventor
那須美佳
Original Assignee
日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本麥克隆尼股份有限公司 filed Critical 日本麥克隆尼股份有限公司
Publication of TWD190540S publication Critical patent/TWD190540S/zh

Links

TW106304545F 2017-02-10 2017-08-09 探針之部分 TWD190540S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-002475 2017-02-10
JPD2017-2475F JP1592871S (enrdf_load_stackoverflow) 2017-02-10 2017-02-10

Publications (1)

Publication Number Publication Date
TWD190540S true TWD190540S (zh) 2018-05-21

Family

ID=60570635

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106304545F TWD190540S (zh) 2017-02-10 2017-08-09 探針之部分

Country Status (3)

Country Link
US (1) USD867183S1 (enrdf_load_stackoverflow)
JP (1) JP1592871S (enrdf_load_stackoverflow)
TW (1) TWD190540S (enrdf_load_stackoverflow)

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
EP2836847B1 (en) * 2012-04-13 2016-05-18 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6484137B2 (ja) 2014-11-26 2019-03-13 株式会社日本マイクロニクス プローブ及び接触検査装置
JP1529605S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529608S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529607S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529612S (enrdf_load_stackoverflow) * 2014-12-19 2015-07-27

Also Published As

Publication number Publication date
JP1592871S (enrdf_load_stackoverflow) 2017-12-11
USD867183S1 (en) 2019-11-19

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