TW581871B - Probe card for testing liquid crystal display - Google Patents

Probe card for testing liquid crystal display Download PDF

Info

Publication number
TW581871B
TW581871B TW091124320A TW91124320A TW581871B TW 581871 B TW581871 B TW 581871B TW 091124320 A TW091124320 A TW 091124320A TW 91124320 A TW91124320 A TW 91124320A TW 581871 B TW581871 B TW 581871B
Authority
TW
Taiwan
Prior art keywords
stylus
plate
guide plate
needle
base
Prior art date
Application number
TW091124320A
Other languages
English (en)
Chinese (zh)
Inventor
Tae-Un Jun
Original Assignee
Yoon Soo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yoon Soo filed Critical Yoon Soo
Application granted granted Critical
Publication of TW581871B publication Critical patent/TW581871B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW091124320A 2001-11-01 2002-10-22 Probe card for testing liquid crystal display TW581871B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020010067754A KR100545189B1 (ko) 2001-11-01 2001-11-01 엘시디 검사용 프로브 카드

Publications (1)

Publication Number Publication Date
TW581871B true TW581871B (en) 2004-04-01

Family

ID=19715588

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091124320A TW581871B (en) 2001-11-01 2002-10-22 Probe card for testing liquid crystal display

Country Status (4)

Country Link
JP (1) JP3585902B2 (ja)
KR (1) KR100545189B1 (ja)
CN (1) CN1217197C (ja)
TW (1) TW581871B (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100599767B1 (ko) * 2004-06-07 2006-07-13 (주)유비프리시젼 프로브및 이를 이용한 프로브조립체
TWI281026B (en) * 2004-12-30 2007-05-11 De & T Co Ltd Needle assembly of probe unit for testing flat display panel
KR100684045B1 (ko) * 2005-08-08 2007-02-16 주식회사 프로텍 액정디스플레이 검사기용 프로브 조립체
CN100424514C (zh) * 2005-08-09 2008-10-08 陈文祺 用于防止噪声干扰的半导体测试板结构
TW200846668A (en) * 2007-01-23 2008-12-01 Nictech Co Ltd Probe and probe card having the same
KR100883269B1 (ko) * 2008-02-14 2009-02-10 (주) 루켄테크놀러지스 저가형 엘시디 검사용 일체형 프로브 유니트
KR100872966B1 (ko) * 2008-04-15 2008-12-08 유명자 디스플레이 패널 검사용 프로브 유니트
JP5396104B2 (ja) * 2009-03-05 2014-01-22 株式会社日本マイクロニクス プローブ組立体
KR101123887B1 (ko) * 2009-11-11 2012-03-23 주식회사 코디에스 프로브 유닛
CN102103150B (zh) * 2009-12-22 2015-03-25 Klt 支架针及装有支架针的探针
CN102103152A (zh) * 2009-12-22 2011-06-22 沋博普利斯金股份有限公司 容易整列的lcd检测设备用一体型探针模块
IT201600084921A1 (it) * 2016-08-11 2018-02-11 Technoprobe Spa Sonda di contatto e relativa testa di misura di un’apparecchiatura di test di dispositivi elettronici

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100198512B1 (ko) * 1996-02-06 1999-06-15 허기호 Lcd 검사용 프로브 블록
KR200164792Y1 (ko) * 1999-09-13 2000-02-15 주식회사금강시스템 엘씨디 검사용 프로브 블록

Also Published As

Publication number Publication date
CN1217197C (zh) 2005-08-31
JP3585902B2 (ja) 2004-11-10
CN1417589A (zh) 2003-05-14
KR20030037279A (ko) 2003-05-14
KR100545189B1 (ko) 2006-01-24
JP2003202351A (ja) 2003-07-18

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees