TW581871B - Probe card for testing liquid crystal display - Google Patents
Probe card for testing liquid crystal display Download PDFInfo
- Publication number
- TW581871B TW581871B TW091124320A TW91124320A TW581871B TW 581871 B TW581871 B TW 581871B TW 091124320 A TW091124320 A TW 091124320A TW 91124320 A TW91124320 A TW 91124320A TW 581871 B TW581871 B TW 581871B
- Authority
- TW
- Taiwan
- Prior art keywords
- stylus
- plate
- guide plate
- needle
- base
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Liquid Crystal (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010067754A KR100545189B1 (ko) | 2001-11-01 | 2001-11-01 | 엘시디 검사용 프로브 카드 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW581871B true TW581871B (en) | 2004-04-01 |
Family
ID=19715588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW091124320A TW581871B (en) | 2001-11-01 | 2002-10-22 | Probe card for testing liquid crystal display |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3585902B2 (ja) |
KR (1) | KR100545189B1 (ja) |
CN (1) | CN1217197C (ja) |
TW (1) | TW581871B (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100599767B1 (ko) * | 2004-06-07 | 2006-07-13 | (주)유비프리시젼 | 프로브및 이를 이용한 프로브조립체 |
TWI281026B (en) * | 2004-12-30 | 2007-05-11 | De & T Co Ltd | Needle assembly of probe unit for testing flat display panel |
KR100684045B1 (ko) * | 2005-08-08 | 2007-02-16 | 주식회사 프로텍 | 액정디스플레이 검사기용 프로브 조립체 |
CN100424514C (zh) * | 2005-08-09 | 2008-10-08 | 陈文祺 | 用于防止噪声干扰的半导体测试板结构 |
TW200846668A (en) * | 2007-01-23 | 2008-12-01 | Nictech Co Ltd | Probe and probe card having the same |
KR100883269B1 (ko) * | 2008-02-14 | 2009-02-10 | (주) 루켄테크놀러지스 | 저가형 엘시디 검사용 일체형 프로브 유니트 |
KR100872966B1 (ko) * | 2008-04-15 | 2008-12-08 | 유명자 | 디스플레이 패널 검사용 프로브 유니트 |
JP5396104B2 (ja) * | 2009-03-05 | 2014-01-22 | 株式会社日本マイクロニクス | プローブ組立体 |
KR101123887B1 (ko) * | 2009-11-11 | 2012-03-23 | 주식회사 코디에스 | 프로브 유닛 |
CN102103150B (zh) * | 2009-12-22 | 2015-03-25 | Klt | 支架针及装有支架针的探针 |
CN102103152A (zh) * | 2009-12-22 | 2011-06-22 | 沋博普利斯金股份有限公司 | 容易整列的lcd检测设备用一体型探针模块 |
IT201600084921A1 (it) * | 2016-08-11 | 2018-02-11 | Technoprobe Spa | Sonda di contatto e relativa testa di misura di un’apparecchiatura di test di dispositivi elettronici |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100198512B1 (ko) * | 1996-02-06 | 1999-06-15 | 허기호 | Lcd 검사용 프로브 블록 |
KR200164792Y1 (ko) * | 1999-09-13 | 2000-02-15 | 주식회사금강시스템 | 엘씨디 검사용 프로브 블록 |
-
2001
- 2001-11-01 KR KR1020010067754A patent/KR100545189B1/ko not_active IP Right Cessation
-
2002
- 2002-10-22 TW TW091124320A patent/TW581871B/zh not_active IP Right Cessation
- 2002-10-24 JP JP2002309466A patent/JP3585902B2/ja not_active Expired - Fee Related
- 2002-10-31 CN CN021459916A patent/CN1217197C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1217197C (zh) | 2005-08-31 |
JP3585902B2 (ja) | 2004-11-10 |
CN1417589A (zh) | 2003-05-14 |
KR20030037279A (ko) | 2003-05-14 |
KR100545189B1 (ko) | 2006-01-24 |
JP2003202351A (ja) | 2003-07-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |