TW563349B - Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors - Google Patents

Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors Download PDF

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Publication number
TW563349B
TW563349B TW091111544A TW91111544A TW563349B TW 563349 B TW563349 B TW 563349B TW 091111544 A TW091111544 A TW 091111544A TW 91111544 A TW91111544 A TW 91111544A TW 563349 B TW563349 B TW 563349B
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Taiwan
Prior art keywords
multiplexer
pixel
output
reference signal
address
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Application number
TW091111544A
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English (en)
Chinese (zh)
Inventor
Yuen-Shung Chieh
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Agilent Technologies Inc
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Publication of TW563349B publication Critical patent/TW563349B/zh

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618—Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H04N25/633—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current by using optical black pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
TW091111544A 2001-09-20 2002-05-30 Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors TW563349B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/956,722 US7084912B2 (en) 2001-09-20 2001-09-20 Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors

Publications (1)

Publication Number Publication Date
TW563349B true TW563349B (en) 2003-11-21

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW091111544A TW563349B (en) 2001-09-20 2002-05-30 Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors

Country Status (4)

Country Link
US (1) US7084912B2 (https=)
JP (1) JP4345047B2 (https=)
DE (1) DE10239889B4 (https=)
TW (1) TW563349B (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7642498B2 (en) 2007-04-04 2010-01-05 Aptina Imaging Corporation Capacitor multipler circuits and the applications thereof to attenuate row-wise temporal noise in image sensors
US8310569B2 (en) 2007-05-21 2012-11-13 Aptina Imaging Corporation Suppression of row-wise noise in CMOS image sensors

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3641619B2 (ja) * 2002-05-14 2005-04-27 株式会社日立製作所 生体試料検査装置
US6919551B2 (en) * 2002-08-29 2005-07-19 Micron Technology Inc. Differential column readout scheme for CMOS APS pixels
JP2004153705A (ja) * 2002-10-31 2004-05-27 Matsushita Electric Ind Co Ltd 増幅型固体撮像装置及びそれを用いた撮像システム
JP4574144B2 (ja) * 2003-09-09 2010-11-04 キヤノン株式会社 デジタルクランプ装置、デジタルクランプ方法、及びプログラム及び記憶媒体
US20050094005A1 (en) * 2003-11-03 2005-05-05 Eastman Kodak Company Apparatus and method for creating dark reference signals for dark reference pixels
US20050243193A1 (en) * 2004-04-30 2005-11-03 Bob Gove Suppression of row-wise noise in an imager
US20050270397A1 (en) * 2004-06-02 2005-12-08 Battles Amy E System and method for indicating settings
US7372493B2 (en) * 2004-07-12 2008-05-13 Micron Technology, Inc. Column-wise clamp voltage driver for suppression of noise in an imager
KR100680471B1 (ko) * 2004-11-24 2007-02-08 매그나칩 반도체 유한회사 보색 컬러 필터를 채택한 ＳｏＣ 카메라 시스템
US7508430B1 (en) * 2005-02-18 2009-03-24 Magnachip Semiconductor, Ltd. Method for locally reducing row noise
US7564489B1 (en) * 2005-02-18 2009-07-21 Crosstek Capital, LLC Method for reducing row noise with dark pixel data
US7701493B2 (en) * 2005-02-28 2010-04-20 Micron Technology, Inc. Imager row-wise noise correction
US7427735B2 (en) * 2005-12-14 2008-09-23 Micron Technology, Inc. Method and apparatus for setting black level in an imager using both optically black and tied pixels
JP4959207B2 (ja) * 2006-03-06 2012-06-20 ソニー株式会社 固体撮像装置
JP4702147B2 (ja) * 2006-04-04 2011-06-15 株式会社島津製作所 光または放射線検出装置及びこれを備えた光または放射線撮像装置
US20080054320A1 (en) * 2006-08-31 2008-03-06 Micron Technology, Inc. Method, apparatus and system providing suppression of noise in a digital imager
US7537951B2 (en) 2006-11-15 2009-05-26 International Business Machines Corporation Image sensor including spatially different active and dark pixel interconnect patterns
US20080239111A1 (en) * 2007-03-26 2008-10-02 Micron Technology, Inc. Method and appratus for dark current compensation of imaging sensors
JP4292426B2 (ja) * 2007-05-15 2009-07-08 ソニー株式会社 撮像装置および撮像データ補正方法
DE102007027463B4 (de) * 2007-06-14 2021-03-25 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
GB2453544B (en) * 2007-10-08 2012-02-29 Keymed Medicals & Ind Equip Black level control apparatus and method
US7893977B2 (en) * 2007-10-23 2011-02-22 Xerox Corporation Multiplexing and offset correction system for an image sensor array
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US8089532B2 (en) * 2008-01-25 2012-01-03 Aptina Imaging Corporation Method and apparatus providing pixel-wise noise correction
US7889256B2 (en) 2008-06-11 2011-02-15 Aptina Imaging Corporation Method and apparatus for reducing temporal row-wise noise in imagers
US8248490B2 (en) * 2010-04-21 2012-08-21 Omnivision Technologies, Inc. Imaging sensor having reduced column fixed pattern noise
US8462240B2 (en) 2010-09-15 2013-06-11 Aptina Imaging Corporation Imaging systems with column randomizing circuits
US8836835B2 (en) 2010-10-04 2014-09-16 International Business Machines Corporation Pixel sensor cell with hold node for leakage cancellation and methods of manufacture and design structure
KR101754131B1 (ko) * 2010-12-01 2017-07-06 삼성전자주식회사 샘플링 회로와 광감지 장치
US8405747B2 (en) 2011-02-17 2013-03-26 Omnivision Technologies, Inc. Analog row black level calibration for CMOS image sensor
CN105637857B (zh) * 2014-07-02 2019-06-07 奥林巴斯株式会社 摄像元件、摄像装置、内窥镜以及内窥镜系统
WO2016121352A1 (ja) * 2015-01-28 2016-08-04 パナソニックＩｐマネジメント株式会社 固体撮像装置およびカメラ
US10291868B2 (en) * 2016-01-29 2019-05-14 SK Hynix Inc. Image sensing device
EP3780581B1 (en) * 2018-04-04 2023-10-25 Sony Semiconductor Solutions Corporation Solid-state imaging device
CN110933338B (zh) * 2019-10-28 2022-03-04 成都微光集电科技有限公司 一种降低固定列噪声的图像传感器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2587470B2 (ja) * 1988-09-02 1997-03-05 富士写真フイルム株式会社 イメージセンサの暗時出力補正装置
US4996413A (en) * 1990-02-27 1991-02-26 General Electric Company Apparatus and method for reading data from an image detector
US5225696A (en) * 1992-01-29 1993-07-06 Northrop Corporation Focal plane array with charge transfer gate
EP0673149A1 (en) * 1994-03-15 1995-09-20 Bayer Corporation Method and apparatus for correcting dark-signal non-uniformity of a photo-sensor
US5654755A (en) * 1996-01-05 1997-08-05 Xerox Corporation System for determining a video offset from dark photosensors in an image sensor array
JP3142239B2 (ja) * 1996-06-11 2001-03-07 キヤノン株式会社 固体撮像装置
US6369853B1 (en) * 1997-11-13 2002-04-09 Foveon, Inc. Intra-pixel frame storage element, array, and electronic shutter method suitable for electronic still camera applications
US6476864B1 (en) * 1998-05-11 2002-11-05 Agilent Technologies, Inc. Pixel sensor column amplifier architecture
EP1117250A2 (en) * 2000-01-11 2001-07-18 Agilent Technologies Inc. (a Delaware Corporation) Active pixel sensor with improved reference signal
US6744526B2 (en) * 2001-02-09 2004-06-01 Eastman Kodak Company Image sensor having black pixels disposed in a spaced-apart relationship from the active pixels

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7642498B2 (en) 2007-04-04 2010-01-05 Aptina Imaging Corporation Capacitor multipler circuits and the applications thereof to attenuate row-wise temporal noise in image sensors
US8310569B2 (en) 2007-05-21 2012-11-13 Aptina Imaging Corporation Suppression of row-wise noise in CMOS image sensors

Also Published As

Publication number Publication date
JP2003163844A (ja) 2003-06-06
JP4345047B2 (ja) 2009-10-14
DE10239889A1 (de) 2003-04-24
DE10239889B4 (de) 2016-08-04
US7084912B2 (en) 2006-08-01
US20030052982A1 (en) 2003-03-20

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