JP4345047B2 - 能動画素センサ（ａｐｓ）の撮像システム - Google Patents

能動画素センサ（ａｐｓ）の撮像システム Download PDF

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JP4345047B2
JP4345047B2 JP2002269618A JP2002269618A JP4345047B2 JP 4345047 B2 JP4345047 B2 JP 4345047B2 JP 2002269618 A JP2002269618 A JP 2002269618A JP 2002269618 A JP2002269618 A JP 2002269618A JP 4345047 B2 JP4345047 B2 JP 4345047B2
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output
multiplexer
pixel
imaging
reference signal
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JP2003163844A (ja
JP2003163844A5 (https=
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ユエン−シュン・チェ
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マイクロン テクノロジー， インク．
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618—Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H04N25/633—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current by using optical black pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2002269618A 2001-09-20 2002-09-17 能動画素センサ（ａｐｓ）の撮像システム Expired - Fee Related JP4345047B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/956,722 2001-09-20
US09/956,722 US7084912B2 (en) 2001-09-20 2001-09-20 Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors

Publications (3)

Publication Number Publication Date
JP2003163844A JP2003163844A (ja) 2003-06-06
JP2003163844A5 JP2003163844A5 (https=) 2005-10-27
JP4345047B2 true JP4345047B2 (ja) 2009-10-14

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JP2002269618A Expired - Fee Related JP4345047B2 (ja) 2001-09-20 2002-09-17 能動画素センサ（ａｐｓ）の撮像システム

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Country Link
US (1) US7084912B2 (https=)
JP (1) JP4345047B2 (https=)
DE (1) DE10239889B4 (https=)
TW (1) TW563349B (https=)

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US20050243193A1 (en) * 2004-04-30 2005-11-03 Bob Gove Suppression of row-wise noise in an imager
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US7372493B2 (en) * 2004-07-12 2008-05-13 Micron Technology, Inc. Column-wise clamp voltage driver for suppression of noise in an imager
KR100680471B1 (ko) * 2004-11-24 2007-02-08 매그나칩 반도체 유한회사 보색 컬러 필터를 채택한 ＳｏＣ 카메라 시스템
US7508430B1 (en) * 2005-02-18 2009-03-24 Magnachip Semiconductor, Ltd. Method for locally reducing row noise
US7564489B1 (en) * 2005-02-18 2009-07-21 Crosstek Capital, LLC Method for reducing row noise with dark pixel data
US7701493B2 (en) * 2005-02-28 2010-04-20 Micron Technology, Inc. Imager row-wise noise correction
US7427735B2 (en) * 2005-12-14 2008-09-23 Micron Technology, Inc. Method and apparatus for setting black level in an imager using both optically black and tied pixels
JP4959207B2 (ja) * 2006-03-06 2012-06-20 ソニー株式会社 固体撮像装置
JP4702147B2 (ja) * 2006-04-04 2011-06-15 株式会社島津製作所 光または放射線検出装置及びこれを備えた光または放射線撮像装置
US20080054320A1 (en) * 2006-08-31 2008-03-06 Micron Technology, Inc. Method, apparatus and system providing suppression of noise in a digital imager
US7537951B2 (en) 2006-11-15 2009-05-26 International Business Machines Corporation Image sensor including spatially different active and dark pixel interconnect patterns
US20080239111A1 (en) * 2007-03-26 2008-10-02 Micron Technology, Inc. Method and appratus for dark current compensation of imaging sensors
US7642498B2 (en) 2007-04-04 2010-01-05 Aptina Imaging Corporation Capacitor multipler circuits and the applications thereof to attenuate row-wise temporal noise in image sensors
JP4292426B2 (ja) * 2007-05-15 2009-07-08 ソニー株式会社 撮像装置および撮像データ補正方法
WO2008150283A1 (en) 2007-05-21 2008-12-11 Micron Technology, Inc. Suppression of row-wise noise in cmos image sensors
DE102007027463B4 (de) * 2007-06-14 2021-03-25 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
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US7893977B2 (en) * 2007-10-23 2011-02-22 Xerox Corporation Multiplexing and offset correction system for an image sensor array
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US8089532B2 (en) * 2008-01-25 2012-01-03 Aptina Imaging Corporation Method and apparatus providing pixel-wise noise correction
US7889256B2 (en) 2008-06-11 2011-02-15 Aptina Imaging Corporation Method and apparatus for reducing temporal row-wise noise in imagers
US8248490B2 (en) * 2010-04-21 2012-08-21 Omnivision Technologies, Inc. Imaging sensor having reduced column fixed pattern noise
US8462240B2 (en) 2010-09-15 2013-06-11 Aptina Imaging Corporation Imaging systems with column randomizing circuits
US8836835B2 (en) 2010-10-04 2014-09-16 International Business Machines Corporation Pixel sensor cell with hold node for leakage cancellation and methods of manufacture and design structure
KR101754131B1 (ko) * 2010-12-01 2017-07-06 삼성전자주식회사 샘플링 회로와 광감지 장치
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CN105637857B (zh) * 2014-07-02 2019-06-07 奥林巴斯株式会社 摄像元件、摄像装置、内窥镜以及内窥镜系统
WO2016121352A1 (ja) * 2015-01-28 2016-08-04 パナソニックＩｐマネジメント株式会社 固体撮像装置およびカメラ
US10291868B2 (en) * 2016-01-29 2019-05-14 SK Hynix Inc. Image sensing device
EP3780581B1 (en) * 2018-04-04 2023-10-25 Sony Semiconductor Solutions Corporation Solid-state imaging device
CN110933338B (zh) * 2019-10-28 2022-03-04 成都微光集电科技有限公司 一种降低固定列噪声的图像传感器

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Also Published As

Publication number Publication date
JP2003163844A (ja) 2003-06-06
DE10239889A1 (de) 2003-04-24
TW563349B (en) 2003-11-21
DE10239889B4 (de) 2016-08-04
US7084912B2 (en) 2006-08-01
US20030052982A1 (en) 2003-03-20

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