DE10239889B4 - Verfahren zum Reduzieren von kohärentem zeilenweisen und spaltenweisen Festmusterrauschen bei CMOS-Bildsensoren - Google Patents

Verfahren zum Reduzieren von kohärentem zeilenweisen und spaltenweisen Festmusterrauschen bei CMOS-Bildsensoren Download PDF

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DE10239889B4
DE10239889B4 DE10239889.5A DE10239889A DE10239889B4 DE 10239889 B4 DE10239889 B4 DE 10239889B4 DE 10239889 A DE10239889 A DE 10239889A DE 10239889 B4 DE10239889 B4 DE 10239889B4
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reference signal
pixel
output
multiplexer
address
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Expired - Lifetime
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DE10239889.5A
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English (en)
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DE10239889A1 (de
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Yuen-Shung Chieh
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Aptina Imaging Corp
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Aptina Imaging Corp
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618—Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H04N25/633—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current by using optical black pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE10239889.5A 2001-09-20 2002-08-29 Verfahren zum Reduzieren von kohärentem zeilenweisen und spaltenweisen Festmusterrauschen bei CMOS-Bildsensoren Expired - Lifetime DE10239889B4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US956722 2001-09-20
US09/956,722 US7084912B2 (en) 2001-09-20 2001-09-20 Method for reducing coherent row-wise and column-wise fixed pattern noise in CMOS image sensors

Publications (2)

Publication Number Publication Date
DE10239889A1 DE10239889A1 (de) 2003-04-24
DE10239889B4 true DE10239889B4 (de) 2016-08-04

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DE10239889.5A Expired - Lifetime DE10239889B4 (de) 2001-09-20 2002-08-29 Verfahren zum Reduzieren von kohärentem zeilenweisen und spaltenweisen Festmusterrauschen bei CMOS-Bildsensoren

Country Status (4)

Country Link
US (1) US7084912B2 (https=)
JP (1) JP4345047B2 (https=)
DE (1) DE10239889B4 (https=)
TW (1) TW563349B (https=)

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US7508430B1 (en) * 2005-02-18 2009-03-24 Magnachip Semiconductor, Ltd. Method for locally reducing row noise
US7564489B1 (en) * 2005-02-18 2009-07-21 Crosstek Capital, LLC Method for reducing row noise with dark pixel data
US7701493B2 (en) * 2005-02-28 2010-04-20 Micron Technology, Inc. Imager row-wise noise correction
US7427735B2 (en) * 2005-12-14 2008-09-23 Micron Technology, Inc. Method and apparatus for setting black level in an imager using both optically black and tied pixels
JP4959207B2 (ja) * 2006-03-06 2012-06-20 ソニー株式会社 固体撮像装置
JP4702147B2 (ja) * 2006-04-04 2011-06-15 株式会社島津製作所 光または放射線検出装置及びこれを備えた光または放射線撮像装置
US20080054320A1 (en) * 2006-08-31 2008-03-06 Micron Technology, Inc. Method, apparatus and system providing suppression of noise in a digital imager
US7537951B2 (en) 2006-11-15 2009-05-26 International Business Machines Corporation Image sensor including spatially different active and dark pixel interconnect patterns
US20080239111A1 (en) * 2007-03-26 2008-10-02 Micron Technology, Inc. Method and appratus for dark current compensation of imaging sensors
US7642498B2 (en) 2007-04-04 2010-01-05 Aptina Imaging Corporation Capacitor multipler circuits and the applications thereof to attenuate row-wise temporal noise in image sensors
JP4292426B2 (ja) * 2007-05-15 2009-07-08 ソニー株式会社 撮像装置および撮像データ補正方法
WO2008150283A1 (en) 2007-05-21 2008-12-11 Micron Technology, Inc. Suppression of row-wise noise in cmos image sensors
DE102007027463B4 (de) * 2007-06-14 2021-03-25 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
GB2453544B (en) * 2007-10-08 2012-02-29 Keymed Medicals & Ind Equip Black level control apparatus and method
US7893977B2 (en) * 2007-10-23 2011-02-22 Xerox Corporation Multiplexing and offset correction system for an image sensor array
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US8089532B2 (en) * 2008-01-25 2012-01-03 Aptina Imaging Corporation Method and apparatus providing pixel-wise noise correction
US7889256B2 (en) 2008-06-11 2011-02-15 Aptina Imaging Corporation Method and apparatus for reducing temporal row-wise noise in imagers
US8248490B2 (en) * 2010-04-21 2012-08-21 Omnivision Technologies, Inc. Imaging sensor having reduced column fixed pattern noise
US8462240B2 (en) 2010-09-15 2013-06-11 Aptina Imaging Corporation Imaging systems with column randomizing circuits
US8836835B2 (en) 2010-10-04 2014-09-16 International Business Machines Corporation Pixel sensor cell with hold node for leakage cancellation and methods of manufacture and design structure
KR101754131B1 (ko) * 2010-12-01 2017-07-06 삼성전자주식회사 샘플링 회로와 광감지 장치
US8405747B2 (en) 2011-02-17 2013-03-26 Omnivision Technologies, Inc. Analog row black level calibration for CMOS image sensor
CN105637857B (zh) * 2014-07-02 2019-06-07 奥林巴斯株式会社 摄像元件、摄像装置、内窥镜以及内窥镜系统
WO2016121352A1 (ja) * 2015-01-28 2016-08-04 パナソニックＩｐマネジメント株式会社 固体撮像装置およびカメラ
US10291868B2 (en) * 2016-01-29 2019-05-14 SK Hynix Inc. Image sensing device
EP3780581B1 (en) * 2018-04-04 2023-10-25 Sony Semiconductor Solutions Corporation Solid-state imaging device
CN110933338B (zh) * 2019-10-28 2022-03-04 成都微光集电科技有限公司 一种降低固定列噪声的图像传感器

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DE68906100T2 (de) * 1988-09-02 1993-07-29 Fuji Photo Film Co Ltd Apparat zur korrektur des dunkelsignals eines bildsensors.
EP0673149A1 (en) * 1994-03-15 1995-09-20 Bayer Corporation Method and apparatus for correcting dark-signal non-uniformity of a photo-sensor
EP0957630A2 (en) * 1998-05-11 1999-11-17 Hewlett-Packard Company Column amplifier architecture in an active pixel sensor
EP1117250A2 (en) * 2000-01-11 2001-07-18 Agilent Technologies Inc. (a Delaware Corporation) Active pixel sensor with improved reference signal

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JP3142239B2 (ja) * 1996-06-11 2001-03-07 キヤノン株式会社 固体撮像装置
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Patent Citations (4)

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DE68906100T2 (de) * 1988-09-02 1993-07-29 Fuji Photo Film Co Ltd Apparat zur korrektur des dunkelsignals eines bildsensors.
EP0673149A1 (en) * 1994-03-15 1995-09-20 Bayer Corporation Method and apparatus for correcting dark-signal non-uniformity of a photo-sensor
EP0957630A2 (en) * 1998-05-11 1999-11-17 Hewlett-Packard Company Column amplifier architecture in an active pixel sensor
EP1117250A2 (en) * 2000-01-11 2001-07-18 Agilent Technologies Inc. (a Delaware Corporation) Active pixel sensor with improved reference signal

Also Published As

Publication number Publication date
JP2003163844A (ja) 2003-06-06
JP4345047B2 (ja) 2009-10-14
DE10239889A1 (de) 2003-04-24
TW563349B (en) 2003-11-21
US7084912B2 (en) 2006-08-01
US20030052982A1 (en) 2003-03-20

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Owner name: AVAGO TECHNOLOGIES GENERAL IP ( SINGAPORE) PTE. LT

8127 New person/name/address of the applicant

Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US

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Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY

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