TW542907B - Band-pass filter for ultraviolet light, detection device for ultraviolet light and luminous device - Google Patents
Band-pass filter for ultraviolet light, detection device for ultraviolet light and luminous device Download PDFInfo
- Publication number
- TW542907B TW542907B TW091113915A TW91113915A TW542907B TW 542907 B TW542907 B TW 542907B TW 091113915 A TW091113915 A TW 091113915A TW 91113915 A TW91113915 A TW 91113915A TW 542907 B TW542907 B TW 542907B
- Authority
- TW
- Taiwan
- Prior art keywords
- ultraviolet
- light
- wavelength
- pass filter
- thin film
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 98
- 229910052709 silver Inorganic materials 0.000 claims abstract description 98
- 239000004332 silver Substances 0.000 claims abstract description 98
- 239000010408 film Substances 0.000 claims description 77
- 239000010409 thin film Substances 0.000 claims description 69
- 238000002834 transmittance Methods 0.000 claims description 53
- 238000000825 ultraviolet detection Methods 0.000 claims description 28
- 230000005540 biological transmission Effects 0.000 abstract description 27
- 230000003287 optical effect Effects 0.000 abstract description 15
- 238000010586 diagram Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- 229920001296 polysiloxane Polymers 0.000 description 7
- 239000000758 substrate Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 206010034972 Photosensitivity reaction Diseases 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 230000036211 photosensitivity Effects 0.000 description 4
- 230000003014 reinforcing effect Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- VSQYNPJPULBZKU-UHFFFAOYSA-N mercury xenon Chemical compound [Xe].[Hg] VSQYNPJPULBZKU-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 229920002050 silicone resin Polymers 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 206010034960 Photophobia Diseases 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 208000013469 light sensitivity Diseases 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/208—Filters for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Optical Filters (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001335392A JP4213379B2 (ja) | 2001-10-31 | 2001-10-31 | 紫外線バンドパスフィルタ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW542907B true TW542907B (en) | 2003-07-21 |
Family
ID=19150386
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW091113915A TW542907B (en) | 2001-10-31 | 2002-06-25 | Band-pass filter for ultraviolet light, detection device for ultraviolet light and luminous device |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7405873B2 (enExample) |
| EP (1) | EP1440336B1 (enExample) |
| JP (1) | JP4213379B2 (enExample) |
| KR (1) | KR100870301B1 (enExample) |
| CN (1) | CN1238735C (enExample) |
| DE (1) | DE60229154D1 (enExample) |
| TW (1) | TW542907B (enExample) |
| WO (1) | WO2003038483A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004076997A1 (ja) * | 2003-02-28 | 2004-09-10 | Hamamatsu Photonics K.K. | 分光装置 |
| EP1673599A4 (en) * | 2003-09-29 | 2009-08-05 | Trojan Techn Inc | RADIATION SENSOR DEVICE AND RADIATION SOURCE MODULE THEREWITH |
| JP4370945B2 (ja) * | 2004-03-11 | 2009-11-25 | ソニー株式会社 | 誘電率の測定方法 |
| JP4344638B2 (ja) * | 2004-03-26 | 2009-10-14 | 富士フイルム株式会社 | 反射防止フィルム及びその製造方法、製造装置 |
| TWI271514B (en) * | 2005-02-21 | 2007-01-21 | Pixart Imaging Inc | UV sensor having a UV-pervious quartz glass |
| JP4324685B2 (ja) * | 2007-03-29 | 2009-09-02 | Ｏｋｉセミコンダクタ株式会社 | 紫外線受光素子およびその製造方法、並びに紫外線量測定装置 |
| JP2010101627A (ja) * | 2008-10-21 | 2010-05-06 | Murata Mfg Co Ltd | 紫外線測定装置、コンパクトケースおよび電子機器 |
| US7967435B1 (en) * | 2010-04-21 | 2011-06-28 | 3M Innovative Properties Company | Metal detectable lens |
| US20140009905A1 (en) * | 2010-12-16 | 2014-01-09 | Sharp Kabushiki Kaisha | Fluorescent substrate, display apparatus, and lighting apparatus |
| JP5834694B2 (ja) * | 2011-09-26 | 2015-12-24 | 株式会社ニデック | バンドパスフィルタ |
| CN103513313A (zh) * | 2013-09-27 | 2014-01-15 | 华侨大学 | 一种皮肤损伤检测用的紫外荧光滤光片及其制备方法 |
| CN103529506A (zh) * | 2013-09-27 | 2014-01-22 | 华侨大学 | 一种紫外荧光滤光片及其制备方法 |
| US12005266B2 (en) * | 2013-10-04 | 2024-06-11 | Strata Skin Sciences, Inc. | Device for targeted treatment of dermatosis |
| KR102219871B1 (ko) * | 2014-07-31 | 2021-02-25 | 스트라타 스킨 사이언시즈, 인코포레이티드 | 피부병의 표적 치료용 장치 |
| US20170028121A1 (en) * | 2015-07-31 | 2017-02-02 | Fenwal, Inc. | Irradiation device for biological fluids |
| CN109891277B (zh) * | 2016-12-26 | 2021-03-23 | Ａｇｃ株式会社 | 紫外线透射滤波器 |
| CN111031212A (zh) * | 2019-12-20 | 2020-04-17 | Oppo广东移动通信有限公司 | 蓝玻璃滤光片及制备方法、摄像模组和电子设备 |
| US20230305204A1 (en) * | 2020-08-20 | 2023-09-28 | Nippon Electric Glass Co., Ltd. | Optical filter, method for producing same and sterilization device |
| KR102422624B1 (ko) * | 2021-05-14 | 2022-07-20 | 영남대학교 산학협력단 | 자외선 필터 및 이를 포함하는 광학 램프 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51131340A (en) | 1975-05-12 | 1976-11-15 | Hitachi Ltd | Optical interference filter |
| JPS60252303A (ja) | 1984-05-29 | 1985-12-13 | Anpuru Softwear Kk | 光学フイルタ |
| US4799745A (en) * | 1986-06-30 | 1989-01-24 | Southwall Technologies, Inc. | Heat reflecting composite films and glazing products containing the same |
| US5183700A (en) * | 1990-08-10 | 1993-02-02 | Viratec Thin Films, Inc. | Solar control properties in low emissivity coatings |
| TW205099B (enExample) * | 1991-05-30 | 1993-05-01 | Mitsui Toatsu Chemicals | |
| US5361172A (en) * | 1993-01-21 | 1994-11-01 | Midwest Research Institute | Durable metallized polymer mirror |
| JP2000180615A (ja) | 1998-12-11 | 2000-06-30 | Mitsui Chemicals Inc | 反射体及びそれを用いた反射部材 |
| JP2001154016A (ja) * | 1999-11-29 | 2001-06-08 | Marktec Corp | 紫外線透過フィルター及び該紫外線透過フィルターを用いた紫外線探傷灯 |
| US6587263B1 (en) * | 2000-03-31 | 2003-07-01 | Lockheed Martin Corporation | Optical solar reflectors |
-
2001
- 2001-10-31 JP JP2001335392A patent/JP4213379B2/ja not_active Expired - Fee Related
-
2002
- 2002-06-20 CN CNB028214447A patent/CN1238735C/zh not_active Expired - Fee Related
- 2002-06-20 DE DE60229154T patent/DE60229154D1/de not_active Expired - Fee Related
- 2002-06-20 EP EP02743669A patent/EP1440336B1/en not_active Expired - Lifetime
- 2002-06-20 KR KR1020047006308A patent/KR100870301B1/ko not_active Expired - Fee Related
- 2002-06-20 US US10/493,845 patent/US7405873B2/en not_active Expired - Fee Related
- 2002-06-20 WO PCT/JP2002/006182 patent/WO2003038483A1/en not_active Ceased
- 2002-06-25 TW TW091113915A patent/TW542907B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JP2003139945A (ja) | 2003-05-14 |
| US7405873B2 (en) | 2008-07-29 |
| KR100870301B1 (ko) | 2008-11-25 |
| KR20040111331A (ko) | 2004-12-31 |
| EP1440336B1 (en) | 2008-10-01 |
| DE60229154D1 (de) | 2008-11-13 |
| CN1578917A (zh) | 2005-02-09 |
| US20050063045A1 (en) | 2005-03-24 |
| JP4213379B2 (ja) | 2009-01-21 |
| EP1440336A1 (en) | 2004-07-28 |
| WO2003038483A1 (en) | 2003-05-08 |
| CN1238735C (zh) | 2006-01-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW542907B (en) | Band-pass filter for ultraviolet light, detection device for ultraviolet light and luminous device | |
| TW202119001A (zh) | 包括內部光譜參考件的光學量測裝置 | |
| EP2618187A2 (en) | Interference filter, optical module, and electronic apparatus | |
| JP2012108440A (ja) | 干渉フィルター、光モジュール、及び光分析装置 | |
| JP2003139945A5 (enExample) | ||
| US20040008406A1 (en) | Wavelength specific coating for mirrored optics and method for reducing reflection of white light | |
| JP2003050311A (ja) | 紫外線用の減衰フィルタ | |
| JPH10206552A (ja) | コントラストを向上させた像検出器 | |
| US20110222159A1 (en) | Optical filter, analytical instrument, optical apparatus, and method of manufacturing optical filter | |
| JP5845592B2 (ja) | 波長可変干渉フィルター、光モジュール、及び光分析装置 | |
| JP2000314807A (ja) | 可視光線遮断赤外線透過フィルター | |
| KR20190088027A (ko) | 광 필터에 대한 입사각 제한 | |
| US7329876B2 (en) | Narrow-band transmission filter for EUV radiation | |
| JP2007232402A (ja) | 光学式ガス検知装置 | |
| JPWO2004076997A1 (ja) | 分光装置 | |
| US12072235B2 (en) | Filter assembly, detector, and method of manufacture of a filter assembly | |
| US20060028642A1 (en) | Support device for chromophore elements | |
| JP5498399B2 (ja) | 色検出器 | |
| EP4603807A1 (en) | Phase change material as switchable optical element | |
| WO2006003843A1 (ja) | 光検出器 | |
| JP3803400B2 (ja) | 照度計の受光部 | |
| KR20110072503A (ko) | 빔 스플리터를 구비한 광 모듈 | |
| TW202501040A (zh) | 角度選擇性濾波器 | |
| JPH01254888A (ja) | Ｘ線イメージセンサー | |
| JP2003270414A (ja) | 反射鏡 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |