TW361010B - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
TW361010B
TW361010B TW086113646A TW86113646A TW361010B TW 361010 B TW361010 B TW 361010B TW 086113646 A TW086113646 A TW 086113646A TW 86113646 A TW86113646 A TW 86113646A TW 361010 B TW361010 B TW 361010B
Authority
TW
Taiwan
Prior art keywords
nmos2
gate
level
signal
grounding wiring
Prior art date
Application number
TW086113646A
Other languages
English (en)
Inventor
Toshikazu Tachibana
Takeshi Sakai
Yoshinobu Nakagome
Original Assignee
Hitachi Ltd
Hitachi Device Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Device Eng filed Critical Hitachi Ltd
Application granted granted Critical
Publication of TW361010B publication Critical patent/TW361010B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/01—Modifications for accelerating switching
    • H03K19/017—Modifications for accelerating switching in field-effect transistor circuits
    • H03K19/01707—Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
    • H03K19/01714—Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits by bootstrapping, i.e. by positive feed-back
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/787—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Dram (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
TW086113646A 1996-09-30 1997-09-19 Semiconductor device TW361010B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25827796 1996-09-30

Publications (1)

Publication Number Publication Date
TW361010B true TW361010B (en) 1999-06-11

Family

ID=17318018

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086113646A TW361010B (en) 1996-09-30 1997-09-19 Semiconductor device

Country Status (3)

Country Link
US (1) US6072354A (zh)
KR (1) KR19980025112A (zh)
TW (1) TW361010B (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6232821B1 (en) * 2000-01-15 2001-05-15 Cirrus Logic, Inc. System for allowing below-ground and rail-to-rail input voltages
US6404237B1 (en) * 2000-12-29 2002-06-11 Intel Corporation Boosted multiplexer transmission gate
ITTO20010531A1 (it) * 2001-06-01 2002-12-01 St Microelectronics Srl Buffer di uscita per una memoria non volatile con controllo dello slew rate ottimizzato.
US20030016070A1 (en) * 2001-07-17 2003-01-23 Wenhua Yang Bootstrap module for multi-stage circuit
US7053692B2 (en) * 2002-12-19 2006-05-30 United Memories, Inc. Powergate control using boosted and negative voltages
US20040130387A1 (en) * 2003-01-06 2004-07-08 Andrew Marshall Logic circuitry with reduced standby leakage using charge pumped switches
KR100490623B1 (ko) * 2003-02-24 2005-05-17 삼성에스디아이 주식회사 버퍼 회로 및 이를 이용한 액티브 매트릭스 표시 장치
US7019342B2 (en) * 2003-07-03 2006-03-28 American Semiconductor, Inc. Double-gated transistor circuit
US6919647B2 (en) * 2003-07-03 2005-07-19 American Semiconductor, Inc. SRAM cell
US7015547B2 (en) * 2003-07-03 2006-03-21 American Semiconductor, Inc. Multi-configurable independently multi-gated MOSFET
JP2006059910A (ja) * 2004-08-18 2006-03-02 Fujitsu Ltd 半導体装置
US8035148B2 (en) 2005-05-17 2011-10-11 Analog Devices, Inc. Micromachined transducer integrated with a charge pump
US7646233B2 (en) * 2006-05-11 2010-01-12 Dsm Solutions, Inc. Level shifting circuit having junction field effect transistors
JP2010204599A (ja) * 2009-03-06 2010-09-16 Epson Imaging Devices Corp スキャナー、電気光学パネル、電気光学表示装置及び電子機器
US8154322B2 (en) * 2009-12-21 2012-04-10 Analog Devices, Inc. Apparatus and method for HDMI transmission
CN102751974B (zh) * 2011-04-22 2015-02-25 联咏科技股份有限公司 输出缓冲器
TWI548217B (zh) * 2015-03-05 2016-09-01 華邦電子股份有限公司 輸出電路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2133946B (en) * 1983-01-14 1986-02-26 Itt Ind Ltd Memory output circuit
JP3362890B2 (ja) * 1992-12-28 2003-01-07 ソニー株式会社 バツフア回路
KR0154157B1 (ko) * 1994-04-29 1998-12-15 김주용 반도체 소자의 부스트랩 회로
KR0149527B1 (ko) * 1994-06-15 1998-10-01 김주용 반도체 소자의 고전압용 트랜지스터 및 그 제조방법
US5621342A (en) * 1995-10-27 1997-04-15 Philips Electronics North America Corporation Low-power CMOS driver circuit capable of operating at high frequencies

Also Published As

Publication number Publication date
US6072354A (en) 2000-06-06
KR19980025112A (ko) 1998-07-06

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees