TW352468B - Semiconductor device wherein one of capacitor electrode comprises a conductor pole and a tray-shaped conductor layer - Google Patents
Semiconductor device wherein one of capacitor electrode comprises a conductor pole and a tray-shaped conductor layerInfo
- Publication number
- TW352468B TW352468B TW085111726A TW85111726A TW352468B TW 352468 B TW352468 B TW 352468B TW 085111726 A TW085111726 A TW 085111726A TW 85111726 A TW85111726 A TW 85111726A TW 352468 B TW352468 B TW 352468B
- Authority
- TW
- Taiwan
- Prior art keywords
- pole
- tray
- conductor
- semiconductor device
- capacitor electrode
- Prior art date
Links
- 239000004020 conductor Substances 0.000 title abstract 5
- 239000003990 capacitor Substances 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 230000002093 peripheral effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
- H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
- H10B12/318—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7254104A JP2776331B2 (ja) | 1995-09-29 | 1995-09-29 | 半導体装置およびその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW352468B true TW352468B (en) | 1999-02-11 |
Family
ID=17260285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085111726A TW352468B (en) | 1995-09-29 | 1996-09-25 | Semiconductor device wherein one of capacitor electrode comprises a conductor pole and a tray-shaped conductor layer |
Country Status (6)
Country | Link |
---|---|
US (2) | US5753949A (zh) |
EP (1) | EP0766314A1 (zh) |
JP (1) | JP2776331B2 (zh) |
KR (1) | KR970018608A (zh) |
CN (1) | CN1078744C (zh) |
TW (1) | TW352468B (zh) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3666893B2 (ja) * | 1993-11-19 | 2005-06-29 | 株式会社日立製作所 | 半導体メモリ装置 |
JP2776331B2 (ja) * | 1995-09-29 | 1998-07-16 | 日本電気株式会社 | 半導体装置およびその製造方法 |
US5744833A (en) * | 1996-08-16 | 1998-04-28 | United Microelectronics Corporation | Semiconductor memory device having tree-type capacitor |
TW312828B (en) * | 1996-08-16 | 1997-08-11 | United Microelectronics Corp | Manufacturing method of semiconductor memory device with capacitor(5) |
TW392282B (en) * | 1998-01-20 | 2000-06-01 | Nanya Technology Corp | Manufacturing method for cylindrical capacitor |
US6005269A (en) * | 1998-02-19 | 1999-12-21 | Texas Instruments - Acer Incorporated | DRAM cell with a double-crown shaped capacitor |
US6249018B1 (en) | 1998-02-26 | 2001-06-19 | Vanguard International Semiconductor Corporation | Fabrication method to approach the conducting structure of a DRAM cell with straightforward bit line |
JPH11251540A (ja) * | 1998-02-26 | 1999-09-17 | Oki Electric Ind Co Ltd | 半導体装置およびその製造方法 |
TW432697B (en) * | 1998-04-20 | 2001-05-01 | United Microelectronics Corp | Method for fabricating capacitor of dynamic random access memory |
KR100270210B1 (ko) * | 1998-04-25 | 2000-10-16 | 윤종용 | 디램 셀 커패시터 및 그의 제조 방법 |
TW399211B (en) * | 1998-08-14 | 2000-07-21 | Winbond Electronics Corp | The multiple stage sensor device applied to flash memory |
KR100338552B1 (ko) | 1999-07-28 | 2002-05-27 | 윤종용 | 불휘발성 강유전체 랜덤 액세스 메모리 장치 및 그것의 데이터읽기 방법 |
US6265280B1 (en) * | 1999-11-29 | 2001-07-24 | Chartered Semiconductor Manufacturing, Inc. | Method for manufacturing a cylindrical semiconductor capacitor |
US6297524B1 (en) * | 2000-04-04 | 2001-10-02 | Philips Electronics North America Corporation | Multilayer capacitor structure having an array of concentric ring-shaped plates for deep sub-micron CMOS |
US6515325B1 (en) * | 2002-03-06 | 2003-02-04 | Micron Technology, Inc. | Nanotube semiconductor devices and methods for making the same |
US6963122B1 (en) * | 2003-02-21 | 2005-11-08 | Barcelona Design, Inc. | Capacitor structure and automated design flow for incorporating same |
KR100546395B1 (ko) * | 2003-11-17 | 2006-01-26 | 삼성전자주식회사 | 반도체소자의 커패시터 및 그 제조방법 |
DE102004021401B4 (de) * | 2004-04-30 | 2011-02-03 | Qimonda Ag | Herstellungsverfahren für ein Stapelkondensatorfeld |
US20070037349A1 (en) * | 2004-04-30 | 2007-02-15 | Martin Gutsche | Method of forming electrodes |
DE102005042524A1 (de) * | 2005-09-07 | 2007-03-08 | Infineon Technologies Ag | Verfahren zur Herstellung von Stapelkondensatoren für dynamische Speicherzellen |
US7645663B2 (en) * | 2007-07-18 | 2010-01-12 | Infineon Technologies Ag | Method of producing non volatile memory device |
US9418864B2 (en) * | 2008-01-30 | 2016-08-16 | Infineon Technologies Ag | Method of forming a non volatile memory device using wet etching |
US9401663B2 (en) | 2012-12-21 | 2016-07-26 | Infineon Technologies Austria Ag | Power converter circuit with AC output |
US9484746B2 (en) | 2012-01-17 | 2016-11-01 | Infineon Technologies Austria Ag | Power converter circuit with AC output |
US9478989B2 (en) | 2012-01-17 | 2016-10-25 | Infineon Technologies Austria Ag | Power converter circuit with AC output |
US9425622B2 (en) | 2013-01-08 | 2016-08-23 | Infineon Technologies Austria Ag | Power converter circuit with AC output and at least one transformer |
US9461474B2 (en) | 2012-01-17 | 2016-10-04 | Infineon Technologies Austria Ag | Power converter circuit with AC output |
KR101934426B1 (ko) * | 2012-11-26 | 2019-01-03 | 삼성전자 주식회사 | 반도체 장치 및 그 제조 방법 |
JP6225005B2 (ja) * | 2013-12-03 | 2017-11-01 | Sppテクノロジーズ株式会社 | 積層膜及びその製造方法 |
WO2018063207A1 (en) * | 2016-09-29 | 2018-04-05 | Intel Corporation | Resistive random access memory cell |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04264767A (ja) * | 1991-02-20 | 1992-09-21 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JP2692402B2 (ja) * | 1991-02-26 | 1997-12-17 | 日本電気株式会社 | 半導体素子の製造方法 |
US5137842A (en) * | 1991-05-10 | 1992-08-11 | Micron Technology, Inc. | Stacked H-cell capacitor and process to fabricate same |
JPH0637271A (ja) * | 1992-07-14 | 1994-02-10 | Sharp Corp | 半導体メモリ素子の製造方法 |
JP2833946B2 (ja) * | 1992-12-08 | 1998-12-09 | 日本電気株式会社 | エッチング方法および装置 |
KR940016805A (ko) * | 1992-12-31 | 1994-07-25 | 김주용 | 반도체 소자의 적층 캐패시터 제조 방법 |
KR970000228B1 (ko) * | 1993-08-30 | 1997-01-06 | 현대전자산업 주식회사 | 디램 캐패시터의 제조방법 |
KR970000229B1 (ko) * | 1993-08-30 | 1997-01-06 | 현대전자산업 주식회사 | 디램 캐패시터의 제조방법 |
US5543346A (en) * | 1993-08-31 | 1996-08-06 | Hyundai Electronics Industries Co., Ltd. | Method of fabricating a dynamic random access memory stacked capacitor |
KR960016486B1 (ko) | 1993-08-31 | 1996-12-12 | 현대전자산업 주식회사 | 디램 캐패시터 및 그 제조방법 |
JP2555965B2 (ja) * | 1993-12-13 | 1996-11-20 | 日本電気株式会社 | 半導体装置の製造方法 |
US5550076A (en) * | 1995-09-11 | 1996-08-27 | Vanguard International Semiconductor Corp. | Method of manufacture of coaxial capacitor for dram memory cell and cell manufactured thereby |
US5595928A (en) * | 1995-09-18 | 1997-01-21 | Vanguard International Semiconductor Corporation | High density dynamic random access memory cell structure having a polysilicon pillar capacitor |
JP2776331B2 (ja) * | 1995-09-29 | 1998-07-16 | 日本電気株式会社 | 半導体装置およびその製造方法 |
US5643819A (en) * | 1995-10-30 | 1997-07-01 | Vanguard International Semiconductor Corporation | Method of fabricating fork-shaped stacked capacitors for DRAM cells |
-
1995
- 1995-09-29 JP JP7254104A patent/JP2776331B2/ja not_active Expired - Fee Related
-
1996
- 1996-09-20 EP EP96115150A patent/EP0766314A1/en not_active Withdrawn
- 1996-09-24 US US08/710,939 patent/US5753949A/en not_active Expired - Fee Related
- 1996-09-25 TW TW085111726A patent/TW352468B/zh active
- 1996-09-27 CN CN96119844A patent/CN1078744C/zh not_active Expired - Fee Related
- 1996-09-30 KR KR1019960043802A patent/KR970018608A/ko not_active Application Discontinuation
-
1997
- 1997-06-04 US US08/868,582 patent/US5837594A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0997879A (ja) | 1997-04-08 |
EP0766314A1 (en) | 1997-04-02 |
CN1078744C (zh) | 2002-01-30 |
KR970018608A (ko) | 1997-04-30 |
CN1158001A (zh) | 1997-08-27 |
JP2776331B2 (ja) | 1998-07-16 |
US5837594A (en) | 1998-11-17 |
US5753949A (en) | 1998-05-19 |
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