TW348266B - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
TW348266B
TW348266B TW086102667A TW86102667A TW348266B TW 348266 B TW348266 B TW 348266B TW 086102667 A TW086102667 A TW 086102667A TW 86102667 A TW86102667 A TW 86102667A TW 348266 B TW348266 B TW 348266B
Authority
TW
Taiwan
Prior art keywords
memory device
semiconductor memory
cell arrays
memory cell
data lines
Prior art date
Application number
TW086102667A
Other languages
English (en)
Inventor
Haruki Toda
Original Assignee
Toshiba Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Co Ltd filed Critical Toshiba Co Ltd
Application granted granted Critical
Publication of TW348266B publication Critical patent/TW348266B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/025Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
TW086102667A 1996-03-11 1997-03-05 Semiconductor memory device TW348266B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5281196 1996-03-11

Publications (1)

Publication Number Publication Date
TW348266B true TW348266B (en) 1998-12-21

Family

ID=12925238

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086102667A TW348266B (en) 1996-03-11 1997-03-05 Semiconductor memory device

Country Status (4)

Country Link
US (5) US5978300A (zh)
KR (1) KR100268773B1 (zh)
DE (1) DE69722837T2 (zh)
TW (1) TW348266B (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW348266B (en) * 1996-03-11 1998-12-21 Toshiba Co Ltd Semiconductor memory device
US6295231B1 (en) 1998-07-17 2001-09-25 Kabushiki Kaisha Toshiba High-speed cycle clock-synchronous memory device
JP2000137983A (ja) 1998-08-26 2000-05-16 Toshiba Corp 半導体記憶装置
JP2000100169A (ja) * 1998-09-22 2000-04-07 Fujitsu Ltd 半導体記憶装置及び半導体記憶装置のデータ制御方法
US6404694B2 (en) 1999-08-16 2002-06-11 Hitachi, Ltd. Semiconductor memory device with address comparing functions
US6530045B1 (en) * 1999-12-03 2003-03-04 Micron Technology, Inc. Apparatus and method for testing rambus DRAMs
JP4083944B2 (ja) 1999-12-13 2008-04-30 東芝マイクロエレクトロニクス株式会社 半導体記憶装置
DE10034255C2 (de) * 2000-07-14 2002-05-16 Infineon Technologies Ag Schaltungsanordnung zum Lesen und Schreiben von Information an einem Speicherzellenfeld
EP1316955A1 (de) * 2001-11-30 2003-06-04 Infineon Technologies AG Zwischenspeichereinrichtung
US6917552B2 (en) * 2002-03-05 2005-07-12 Renesas Technology Corporation Semiconductor device using high-speed sense amplifier
DE10255867B3 (de) * 2002-11-29 2004-08-05 Infineon Technologies Ag Dynamischer RAM-Halbleiterspeicher und Verfahren zum Betrieb desselben
DE10258168B4 (de) * 2002-12-12 2005-07-07 Infineon Technologies Ag Integrierter DRAM-Halbleiterspeicher und Verfahren zum Betrieb desselben
JPWO2004075199A1 (ja) * 2003-02-18 2006-06-01 富士通株式会社 半導体記憶装置及び半導体記憶装置の読み出し方法
JP2007128633A (ja) * 2005-10-07 2007-05-24 Matsushita Electric Ind Co Ltd 半導体記憶装置及びこれを備えた送受信システム
EP3103511B1 (en) 2015-06-11 2019-03-06 Oticon A/s Cochlear hearing device with cable antenna

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0814985B2 (ja) * 1989-06-06 1996-02-14 富士通株式会社 半導体記憶装置
JPH03108188A (ja) * 1989-09-20 1991-05-08 Fujitsu Ltd 半導体記憶装置
US6223264B1 (en) * 1991-10-24 2001-04-24 Texas Instruments Incorporated Synchronous dynamic random access memory and data processing system using an address select signal
JP2962080B2 (ja) * 1991-12-27 1999-10-12 日本電気株式会社 ランダムアクセスメモリ
US5272664A (en) * 1993-04-21 1993-12-21 Silicon Graphics, Inc. High memory capacity DRAM SIMM
JPH0786425A (ja) * 1993-06-30 1995-03-31 Hitachi Ltd ダイナミック型ram
JP3048498B2 (ja) * 1994-04-13 2000-06-05 株式会社東芝 半導体記憶装置
JP3176228B2 (ja) * 1994-08-23 2001-06-11 シャープ株式会社 半導体記憶装置
JP3135795B2 (ja) * 1994-09-22 2001-02-19 東芝マイクロエレクトロニクス株式会社 ダイナミック型メモリ
US5613084A (en) * 1994-10-04 1997-03-18 Panasonic Technologies, Inc. Interpolation filter selection circuit for sample rate conversion using phase quantization
JP3267462B2 (ja) * 1995-01-05 2002-03-18 株式会社東芝 半導体記憶装置
US5621695A (en) * 1995-07-17 1997-04-15 Galvantech, Inc. SRAM with simplified architecture for use with pipelined data
JPH09161476A (ja) * 1995-10-04 1997-06-20 Toshiba Corp 半導体メモリ及びそのテスト回路、並びにデ−タ転送システム
TW348266B (en) * 1996-03-11 1998-12-21 Toshiba Co Ltd Semiconductor memory device
US5671188A (en) * 1996-06-26 1997-09-23 Alliance Semiconductor Corporation Random access memory having selective intra-bank fast activation of sense amplifiers

Also Published As

Publication number Publication date
KR100268773B1 (ko) 2000-10-16
DE69722837T2 (de) 2004-05-13
US20010005336A1 (en) 2001-06-28
US6469951B2 (en) 2002-10-22
US6219295B1 (en) 2001-04-17
KR970067854A (ko) 1997-10-13
DE69722837D1 (de) 2003-07-24
US6396765B2 (en) 2002-05-28
US20020067653A1 (en) 2002-06-06
US5978300A (en) 1999-11-02
US6084817A (en) 2000-07-04

Similar Documents

Publication Publication Date Title
TW339439B (en) A semiconductor memory device
TW348266B (en) Semiconductor memory device
EP0763241A4 (en) DYNAMIC MEMORY WITH ONE TO MULTIPLE BITS PER CELL
DE69615233D1 (de) Halbleiterspeicheranordnung mit einer Peripherieschaltung und einer Schnittstellenschaltung in einem Massivgebiet und mit Speicherzellen in einem Halbleiter-auf-Isolator-Gebiet
AU3832297A (en) Semiconductor memory device having faulty cells
EP0531707A3 (en) Semiconductor memory cell and memory array with inversion layer
TW332927B (en) Sense amplifier
DE3571895D1 (en) Semiconductor memory device having stacked-capacitor type memory cells and manufacturing method for the same
EP0375105A3 (en) Memory apparatus for multiple processor systems
DE69328639D1 (de) Halbleiterspeicheranordnung mit Ersatzspeicherzellen
DE69121483D1 (de) Dynamische Halbleiterspeicherzelle
CA2166254A1 (en) Improving Memory Layout Based on Connectivity Considerations
EP0553547A3 (en) Strobe signals in semiconductor memory devices
GB2307076B (en) Semiconductor memory device with split word lines
DE69215707D1 (de) Halbleiter-Speicherzelle
GB2209858B (en) Semiconductor memory device with redundant memory cells
SG34380A1 (en) Semiconductor memory device and memory module using the same
EP0522689A3 (en) Semiconductor memory device using sram cells
GB2302748B (en) Semiconductor memory cell repair
TW344138B (en) Nonvolatile memory array with compatible vertical source lines
TW358179B (en) Method for distributing banks in semiconductor memory device
GB2247550B (en) Bipolar transistor memory cell and method
DE69414459D1 (de) Dynamischer Speicher mit Referenzzellen
EP0414477A3 (en) Semiconductor memory device having redundant memory cells
GB9706442D0 (en) Semiconductor device with memory cell and fabrication method thereof

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees