DE69414459D1 - Dynamischer Speicher mit Referenzzellen - Google Patents
Dynamischer Speicher mit ReferenzzellenInfo
- Publication number
- DE69414459D1 DE69414459D1 DE69414459T DE69414459T DE69414459D1 DE 69414459 D1 DE69414459 D1 DE 69414459D1 DE 69414459 T DE69414459 T DE 69414459T DE 69414459 T DE69414459 T DE 69414459T DE 69414459 D1 DE69414459 D1 DE 69414459D1
- Authority
- DE
- Germany
- Prior art keywords
- dynamic memory
- reference cells
- cells
- dynamic
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4099—Dummy cell treatment; Reference voltage generators
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9306533A FR2705821B1 (fr) | 1993-05-24 | 1993-05-24 | Mémoire dynamique. |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69414459D1 true DE69414459D1 (de) | 1998-12-17 |
DE69414459T2 DE69414459T2 (de) | 1999-06-02 |
Family
ID=9447626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69414459T Expired - Fee Related DE69414459T2 (de) | 1993-05-24 | 1994-05-20 | Dynamischer Speicher mit Referenzzellen |
Country Status (5)
Country | Link |
---|---|
US (2) | US5592428A (de) |
EP (1) | EP0626696B1 (de) |
JP (1) | JPH0750090A (de) |
DE (1) | DE69414459T2 (de) |
FR (1) | FR2705821B1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2757973B1 (fr) * | 1996-12-27 | 1999-04-09 | Sgs Thomson Microelectronics | Processeur de traitement matriciel |
US5781483A (en) * | 1996-12-31 | 1998-07-14 | Micron Technology, Inc. | Device and method for repairing a memory array by storing each bit in multiple memory cells in the array |
JP3481817B2 (ja) * | 1997-04-07 | 2003-12-22 | 株式会社東芝 | 半導体記憶装置 |
US5959892A (en) * | 1997-08-26 | 1999-09-28 | Macronix International Co., Ltd. | Apparatus and method for programming virtual ground EPROM array cell without disturbing adjacent cells |
US6178118B1 (en) | 1997-08-26 | 2001-01-23 | Macronix International Co., Ltd. | Electrically programmable semiconductor device with multi-level wordline voltages for programming multi-level threshold voltages |
US6185135B1 (en) | 1999-01-05 | 2001-02-06 | International Business Machines Corporation | Robust wordline activation delay monitor using a plurality of sample wordlines |
US6115310A (en) * | 1999-01-05 | 2000-09-05 | International Business Machines Corporation | Wordline activation delay monitor using sample wordline located in data-storing array |
US6028790A (en) * | 1999-01-07 | 2000-02-22 | Macronix International Co., Ltd. | Method and device for programming a non-volatile memory cell by controlling source current pulldown rate |
US6370072B1 (en) * | 2000-11-30 | 2002-04-09 | International Business Machines Corporation | Low voltage single-input DRAM current-sensing amplifier |
US6549476B2 (en) | 2001-04-09 | 2003-04-15 | Micron Technology, Inc. | Device and method for using complementary bits in a memory array |
US6577548B1 (en) * | 2002-09-26 | 2003-06-10 | International Business Machines Corporation | Self timing interlock circuit for embedded DRAM |
JP4010995B2 (ja) * | 2003-07-31 | 2007-11-21 | Necエレクトロニクス株式会社 | 半導体メモリ及びそのリファレンス電位発生方法 |
KR100562646B1 (ko) | 2004-12-22 | 2006-03-20 | 주식회사 하이닉스반도체 | 저전압용 반도체 메모리 장치 |
KR100562647B1 (ko) * | 2004-12-22 | 2006-03-20 | 주식회사 하이닉스반도체 | 저전압용 반도체 메모리 장치 |
JP2006209817A (ja) * | 2005-01-25 | 2006-08-10 | Oki Electric Ind Co Ltd | 半導体記憶装置およびメモリセルの救済方法 |
US20070247885A1 (en) * | 2006-04-25 | 2007-10-25 | Renesas Technology Corp. | Content addressable memory |
WO2016035401A1 (ja) * | 2014-09-03 | 2016-03-10 | オリンパス株式会社 | 内視鏡装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4363111A (en) * | 1980-10-06 | 1982-12-07 | Heightley John D | Dummy cell arrangement for an MOS memory |
JPS581889A (ja) * | 1981-06-29 | 1983-01-07 | Fujitsu Ltd | 半導体記憶装置のダミ−セル制御方式 |
EP0068894B1 (de) * | 1981-06-29 | 1989-12-13 | Fujitsu Limited | Dynamische Direktzugriffspeicheranordnung |
US4961166A (en) * | 1984-05-07 | 1990-10-02 | Hitachi, Ltd. | Dynamic RAM having a full size dummy cell |
US4633443A (en) * | 1984-07-09 | 1986-12-30 | Texas Instruments Incorporated | Dynamic read/write memory circuits with equal-sized dummy and storage capacitors |
US4547868A (en) * | 1984-07-26 | 1985-10-15 | Texas Instruments Incorporated | Dummy-cell circuitry for dynamic read/write memory |
US5343433A (en) * | 1984-08-02 | 1994-08-30 | Texas Instruments Incorporated | CMOS sense amplifier |
JPH0787032B2 (ja) * | 1985-07-08 | 1995-09-20 | 日本電気アイシ−マイコンシステム株式会社 | 半導体記憶装置 |
JPH0775248B2 (ja) * | 1990-06-07 | 1995-08-09 | 株式会社東芝 | ダイナミック型半導体メモリ |
JP2573416B2 (ja) * | 1990-11-28 | 1997-01-22 | 株式会社東芝 | 半導体記憶装置 |
JPH0612860A (ja) * | 1992-06-29 | 1994-01-21 | Toshiba Corp | 半導体記憶装置 |
-
1993
- 1993-05-24 FR FR9306533A patent/FR2705821B1/fr not_active Expired - Fee Related
-
1994
- 1994-05-10 US US08/240,144 patent/US5592428A/en not_active Expired - Lifetime
- 1994-05-20 EP EP94410038A patent/EP0626696B1/de not_active Expired - Lifetime
- 1994-05-20 DE DE69414459T patent/DE69414459T2/de not_active Expired - Fee Related
- 1994-05-23 JP JP6108175A patent/JPH0750090A/ja not_active Withdrawn
-
1995
- 1995-06-06 US US08/465,810 patent/US5590070A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69414459T2 (de) | 1999-06-02 |
US5590070A (en) | 1996-12-31 |
EP0626696B1 (de) | 1998-11-11 |
JPH0750090A (ja) | 1995-02-21 |
FR2705821A1 (fr) | 1994-12-02 |
FR2705821B1 (fr) | 1995-08-11 |
US5592428A (en) | 1997-01-07 |
EP0626696A1 (de) | 1994-11-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |