TW312763B - - Google Patents
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- Publication number
- TW312763B TW312763B TW085102428A TW85102428A TW312763B TW 312763 B TW312763 B TW 312763B TW 085102428 A TW085102428 A TW 085102428A TW 85102428 A TW85102428 A TW 85102428A TW 312763 B TW312763 B TW 312763B
- Authority
- TW
- Taiwan
- Prior art keywords
- row
- column
- clock signal
- memory
- selection device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/86—Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Detection And Correction Of Errors (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Debugging And Monitoring (AREA)
- Dram (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19512791 | 1995-04-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW312763B true TW312763B (forum.php) | 1997-08-11 |
Family
ID=7758876
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW085102428A TW312763B (forum.php) | 1995-04-05 | 1996-02-29 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5751742A (forum.php) |
| EP (1) | EP0738974B1 (forum.php) |
| JP (1) | JP3850484B2 (forum.php) |
| KR (1) | KR100409113B1 (forum.php) |
| AT (1) | ATE217987T1 (forum.php) |
| DE (1) | DE59609221D1 (forum.php) |
| TW (1) | TW312763B (forum.php) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100417450B1 (ko) * | 1995-09-13 | 2004-03-19 | 지멘스 악티엔게젤샤프트 | 연속적으로동작하는디지털메모리의특정라인에대한점프형어드레싱장치 |
| TW399219B (en) * | 1997-09-26 | 2000-07-21 | Siemens Ag | Pointer-circuit with small space requirement, higher speed and smaller power loss |
| DE602004020887D1 (de) * | 2003-05-22 | 2009-06-10 | Nxp Bv | Test von ram addressdekodierern auf widerstandsbehaftete leiterunterbrechungen |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3812336A (en) * | 1972-12-18 | 1974-05-21 | Ibm | Dynamic address translation scheme using orthogonal squares |
| JPS58139399A (ja) * | 1982-02-15 | 1983-08-18 | Hitachi Ltd | 半導体記憶装置 |
| EP0189699B1 (en) * | 1984-12-26 | 1992-09-30 | STMicroelectronics, Inc. | Interdigitated bit line rom |
| JP2852049B2 (ja) * | 1987-05-06 | 1999-01-27 | 日本電気アイシーマイコンシステム株式会社 | シリアル列選択回路 |
| JP2816512B2 (ja) * | 1992-07-27 | 1998-10-27 | 三菱電機株式会社 | 半導体記憶装置 |
-
1996
- 1996-02-29 TW TW085102428A patent/TW312763B/zh active
- 1996-03-15 EP EP96104260A patent/EP0738974B1/de not_active Expired - Lifetime
- 1996-03-15 DE DE59609221T patent/DE59609221D1/de not_active Expired - Fee Related
- 1996-03-15 AT AT96104260T patent/ATE217987T1/de not_active IP Right Cessation
- 1996-04-02 US US08/626,512 patent/US5751742A/en not_active Expired - Lifetime
- 1996-04-04 KR KR1019960010103A patent/KR100409113B1/ko not_active Expired - Fee Related
- 1996-04-05 JP JP08413396A patent/JP3850484B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US5751742A (en) | 1998-05-12 |
| KR100409113B1 (ko) | 2004-03-18 |
| JP3850484B2 (ja) | 2006-11-29 |
| JPH08287699A (ja) | 1996-11-01 |
| KR960038976A (ko) | 1996-11-21 |
| EP0738974A2 (de) | 1996-10-23 |
| EP0738974A3 (de) | 1999-06-02 |
| DE59609221D1 (de) | 2002-06-27 |
| ATE217987T1 (de) | 2002-06-15 |
| EP0738974B1 (de) | 2002-05-22 |
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