TW222349B - - Google Patents

Info

Publication number
TW222349B
TW222349B TW082104168A TW82104168A TW222349B TW 222349 B TW222349 B TW 222349B TW 082104168 A TW082104168 A TW 082104168A TW 82104168 A TW82104168 A TW 82104168A TW 222349 B TW222349 B TW 222349B
Authority
TW
Taiwan
Application number
TW082104168A
Original Assignee
Gold Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gold Electronics Co Ltd filed Critical Gold Electronics Co Ltd
Application granted granted Critical
Publication of TW222349B publication Critical patent/TW222349B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/91—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/75—Electrodes comprising two or more layers, e.g. comprising a barrier layer and a metal layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/92—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by patterning layers, e.g. by etching conductive layers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/942—Masking
    • Y10S438/947—Subphotolithographic processing

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Drying Of Semiconductors (AREA)
TW082104168A 1992-06-18 1993-05-26 TW222349B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019920010546A KR960003498B1 (ko) 1992-06-18 1992-06-18 반도체장치의 캐패시터 제조방법

Publications (1)

Publication Number Publication Date
TW222349B true TW222349B (zh) 1994-04-11

Family

ID=19334842

Family Applications (1)

Application Number Title Priority Date Filing Date
TW082104168A TW222349B (zh) 1992-06-18 1993-05-26

Country Status (5)

Country Link
US (1) US5480824A (zh)
JP (1) JP3288805B2 (zh)
KR (1) KR960003498B1 (zh)
DE (1) DE4320060B4 (zh)
TW (1) TW222349B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100388519B1 (ko) * 1995-02-22 2003-09-19 마이크론 테크놀로지, 인크. 메모리셀의커패시터배열위에비트선을형성하는방법및이를이용한집적회로및반도체메모리장치
US5604148A (en) * 1996-03-08 1997-02-18 United Microelectronics Corporation Process of fabricating stacked capacitor configuration for dynamic random access memory
US5776660A (en) * 1996-09-16 1998-07-07 International Business Machines Corporation Fabrication method for high-capacitance storage node structures
GB2322964B (en) * 1997-03-07 2001-10-17 United Microelectronics Corp Polysilicon CMP process for high-density DRAM cell structures
DE19710375C2 (de) * 1997-03-13 2002-11-07 Micronas Semiconductor Holding Verfahren zum Herstellen von räumlich strukturierten Bauteilen
US5756388A (en) * 1997-06-24 1998-05-26 Powerchip Semiconductor Corp. Method for fabricating a rake-shaped capacitor
US6265263B1 (en) * 1998-02-19 2001-07-24 Texas Instruments - Acer Incorporated Method for forming a DRAM capacitor with porous storage node and rugged sidewalls
US6153540A (en) * 1998-03-04 2000-11-28 Applied Materials, Inc. Method of forming phosphosilicate glass having a high wet-etch rate
FR2813142B1 (fr) 2000-08-17 2002-11-29 St Microelectronics Sa Fabrication de condensateurs a armatures metalliques

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923851A (ja) * 1982-07-30 1984-02-07 Furukawa Electric Co Ltd:The 高透磁率合金
ES8609190A1 (es) * 1985-02-07 1986-07-16 Pharma Investi S A Un procedimiento para preparar eteres fenolicos
US4650544A (en) * 1985-04-19 1987-03-17 Advanced Micro Devices, Inc. Shallow groove capacitor fabrication method
KR910009805B1 (ko) * 1987-11-25 1991-11-30 후지쓰 가부시끼가이샤 다이나믹 랜덤 액세스 메모리 장치와 그의 제조방법
JP2838412B2 (ja) * 1988-06-10 1998-12-16 三菱電機株式会社 半導体記憶装置のキャパシタおよびその製造方法
US5028980A (en) * 1988-12-21 1991-07-02 Texas Instruments Incorporated Trench capacitor with expanded area
JPH0391957A (ja) * 1989-09-04 1991-04-17 Sony Corp メモリ装置の製造方法
US5164337A (en) * 1989-11-01 1992-11-17 Matsushita Electric Industrial Co., Ltd. Method of fabricating a semiconductor device having a capacitor in a stacked memory cell
KR930005741B1 (ko) * 1990-11-01 1993-06-24 삼성전자 주식회사 터널구조의 디램 셀 및 그의 제조방법
DE69029465T2 (de) * 1990-01-24 1997-05-15 Toshiba Kawasaki Kk Verfahren zur Herstellung eines Halbleiterbauelementes mit einer Grabenkapazität
JP2818964B2 (ja) * 1990-03-30 1998-10-30 三菱電機株式会社 積層構造の電荷蓄積部を有する半導体記憶装置の製造方法
KR950003915B1 (ko) * 1990-04-10 1995-04-20 마쯔시다덴기산교 가부시기가이샤 반도체집적회로장치 및 그 제조방법
JP2504606B2 (ja) * 1990-05-18 1996-06-05 株式会社東芝 半導体記憶装置およびその製造方法
DD297279A5 (de) * 1990-08-14 1992-01-02 ��������@���������������@����������������������@���k�� Kondensatoranordnung mit grosser kapazitaet und verfahren zur herstellung derselben
US5223729A (en) * 1990-09-26 1993-06-29 Matsushita Electric Industrial Co., Ltd. Semiconductor device and a method of producing the same
KR930009594B1 (ko) * 1991-01-30 1993-10-07 삼성전자 주식회사 고집적 반도체 메모리장치 및 그 제조방법
JPH05183121A (ja) * 1991-04-01 1993-07-23 Fujitsu Ltd 半導体装置とその製造方法
US5084405A (en) * 1991-06-07 1992-01-28 Micron Technology, Inc. Process to fabricate a double ring stacked cell structure
KR940005288B1 (ko) * 1991-07-11 1994-06-15 금성일렉트론 주식회사 반도체 장치의 제조방법
US5266512A (en) * 1991-10-23 1993-11-30 Motorola, Inc. Method for forming a nested surface capacitor
US5262662A (en) * 1991-10-31 1993-11-16 Micron Technology, Inc. Storage node capacitor having tungsten and etched tin storage node capacitor plate
KR950009740B1 (ko) * 1991-11-12 1995-08-26 금성일렉트론주식회사 메모리 캐패시터 제조방법 및 그 구조
TW221720B (zh) * 1991-11-15 1994-03-11 Gold Star Co
US5150276A (en) * 1992-01-24 1992-09-22 Micron Technology, Inc. Method of fabricating a vertical parallel cell capacitor having a storage node capacitor plate comprising a center fin effecting electrical communication between itself and parallel annular rings

Also Published As

Publication number Publication date
DE4320060B4 (de) 2006-11-16
US5480824A (en) 1996-01-02
JP3288805B2 (ja) 2002-06-04
JPH0697371A (ja) 1994-04-08
KR960003498B1 (ko) 1996-03-14
DE4320060A1 (de) 1993-12-23
KR940001398A (ko) 1994-01-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees