TW202131578A - Inspection socket comprising signal terminals received in a receiving part of a first casing and an insulation portion insulating between the signal terminals and the first casing - Google Patents

Inspection socket comprising signal terminals received in a receiving part of a first casing and an insulation portion insulating between the signal terminals and the first casing Download PDF

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TW202131578A
TW202131578A TW110103011A TW110103011A TW202131578A TW 202131578 A TW202131578 A TW 202131578A TW 110103011 A TW110103011 A TW 110103011A TW 110103011 A TW110103011 A TW 110103011A TW 202131578 A TW202131578 A TW 202131578A
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Taiwan
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signal terminal
inspection socket
housing
insulating
contact
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TW110103011A
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Chinese (zh)
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TWI811623B (en
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酒井貴浩
寺西宏真
笹野直哉
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日商歐姆龍股份有限公司
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46—Bases; Cases
    • H01R13/516—Means for holding or embracing insulating body, e.g. casing, hoods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding  
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Abstract

The present invention provides an inspection socket, which comprises: signal terminals that are electrically conductive and are in the form of a plate and have a first contact portion at each of two ends thereof; an electrically conductive first casing that is provided, in an interior thereof, with a first receiving part for receiving the signal terminals in a condition that the first contact portions are exposed to the outside; and an insulation portion that is arranged in the first receiving part to insulate between the signal terminals and the first casing.

Description

檢查插座Check the socket

本揭示是有關於一種檢查插座（socket）。This disclosure is about a check socket (socket).

於相機（camera）或液晶面板（panel）等電子零件模組（module）中，通常於其製造步驟中，進行導通檢查及動作特性檢查等。該些檢查是藉由使用檢查插座，將用於與設置於電子零件模組的本體基板連接的端子、和檢查裝置的端子加以連接來進行。In electronic component modules such as cameras or liquid crystal panels, continuity inspections and operating characteristics inspections are usually performed in the manufacturing steps. These inspections are performed by using an inspection socket to connect the terminals for connecting to the main body substrate provided in the electronic component module and the terminals of the inspection device.

作為此種檢查插座，有專利文獻1所記載的檢查插座。所述檢查插座包括：絕緣性的插座本體、以及收容於插座本體的多個電極部。 [現有技術文獻] [專利文獻]As such an inspection socket, there is an inspection socket described in Patent Document 1. The inspection socket includes an insulating socket body and a plurality of electrode parts accommodated in the socket body. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利特開2002-134202號公報[Patent Document 1] Japanese Patent Laid-Open No. 2002-134202

[發明所欲解決之課題][The problem to be solved by the invention]

近年來，隨著在電子零件模組間發送/接收的資訊量的增大等，對於用於電子零件模組的檢查的檢查插座亦要求應對高頻區域的訊號。然而，於專利文獻1的檢查插座中，不可謂一定能夠充分地應對高頻區域的訊號，而在檢查電子零件模組時存在高頻區域的訊號的傳輸損失變大的情況。In recent years, with the increase in the amount of information sent/received between electronic component modules, etc., inspection sockets used for inspection of electronic component modules are also required to cope with signals in the high-frequency region. However, the inspection socket of Patent Document 1 cannot be said to be able to adequately cope with signals in the high-frequency region, and the transmission loss of signals in the high-frequency region may increase when an electronic component module is inspected.

本揭示的目的在於提供一種能夠減小高頻區域的訊號的傳輸損失的檢查插座。 [解決課題之手段]The purpose of the present disclosure is to provide an inspection socket that can reduce the transmission loss of signals in the high-frequency region. [Means to solve the problem]

本揭示的一例的檢查插座包括： 導電性且為板狀的訊號端子，於兩端分別具有第一接點部； 導電性的第一殼體，於內部具有以所述第一接點部露出至外部的狀態收容所述訊號端子的第一收容部；以及 絕緣部，配置於所述第一收容部而將所述訊號端子與所述第一殼體之間予以絕緣。 [發明的效果]The inspection socket of an example of this disclosure includes: Conductive and plate-shaped signal terminals with first contact points at both ends respectively; The conductive first housing has a first accommodating portion for accommodating the signal terminal in a state where the first contact portion is exposed to the outside; and The insulating part is arranged in the first receiving part to insulate the signal terminal and the first housing. [Effects of the invention]

根據所述檢查插座，包括：板狀的訊號端子；導電性的第一殼體，於內部具有收容訊號端子的第一收容部；以及絕緣部，將訊號端子與第一殼體之間予以絕緣。藉由此種結構，可實現一種能夠減小高頻區域的訊號的傳輸損失的檢查插座。According to the inspection socket, the inspection socket includes: a plate-shaped signal terminal; a conductive first housing having a first receiving portion for accommodating the signal terminal inside; and an insulating portion to insulate the signal terminal from the first housing . With this structure, it is possible to realize an inspection socket that can reduce the transmission loss of signals in the high-frequency region.

以下，按照隨附圖式對本揭示的一例進行說明。再者，於以下的說明中，視需要使用表示特定的方向或位置的用語（例如包含「上」、「下」、「右」、「左」的用語），但該些用語的使用是為了容易理解參照圖式的本揭示，本揭示的技術範圍並不由該些用語的含義來限定。另外，以下的說明本質上只不過是例示，並不意圖限制本揭示、其適用物、或其用途。進而，圖式是示意性的圖，各尺寸的比率等未必與現實者一致。Hereinafter, an example of the present disclosure will be described in accordance with the accompanying drawings. Furthermore, in the following description, terms that indicate specific directions or positions (for example, terms including "up", "down", "right", and "left") are used as necessary, but these terms are used for It is easy to understand the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meaning of these terms. In addition, the following description is merely an illustration in nature, and is not intended to limit the present disclosure, its application, or its use. Furthermore, the drawing is a schematic drawing, and the ratio of each size, etc., does not necessarily match the actual one.

如圖1所示，本揭示的一實施方式的檢查插座1包括：導電性的第一殼體10、以及收容於第一殼體10的導電性的訊號端子20。又，如圖2所示，檢查插座1包括絕緣部40，所述絕緣部40於第一殼體10的內部將訊號端子20與第一殼體10之間予以絕緣。於所述實施方式中，檢查插座1作為一例而包括多個訊號端子20。各訊號端子20為利用電鑄法形成的板狀，且以板厚方向相互一致的方式配置。又，於所述實施方式中，將第一殼體10用作接地（Ground，GND）。As shown in FIG. 1, the inspection socket 1 of one embodiment of the present disclosure includes: a conductive first housing 10 and a conductive signal terminal 20 housed in the first housing 10. Furthermore, as shown in FIG. 2, the inspection socket 1 includes an insulating portion 40 that insulates the signal terminal 20 and the first housing 10 inside the first housing 10. In the above embodiment, the inspection socket 1 includes a plurality of signal terminals 20 as an example. Each signal terminal 20 has a plate shape formed by an electroforming method, and is arranged such that the plate thickness directions coincide with each other. Moreover, in the above-mentioned embodiment, the first housing 10 is used as a ground (Ground, GND).

如圖1所示，第一殼體10為大致長方體形狀，如圖2所示，於其內部具有多個第一收容部11。於各第一收容部11，以藉由絕緣部40相對於第一殼體10電性獨立的狀態收容有一個訊號端子20，後文所述的第一接點部23經由開口部13而露出至外部。As shown in FIG. 1, the first housing 10 has a substantially rectangular parallelepiped shape, and as shown in FIG. 2, it has a plurality of first accommodating portions 11 inside. In each first receiving portion 11, a signal terminal 20 is stored in a state of being electrically independent from the first housing 10 by the insulating portion 40, and the first contact portion 23 described later is exposed through the opening 13 To the outside.

又，如圖1及圖2所示，第一殼體10於其厚度方向的兩面的大致中央部具有多個大致圓形形狀的開口部13。各第一收容部11於第一殼體10的厚度方向（例如，圖2的上下方向。以下稱為第一方向X）上延伸，並具有配置於第一方向X的兩端的第一部分111、及配置於第一部分111之間的第二部分112。各第一部分111與開口部13連接。於構成第一部分111的各第一收容部11的內表面與訊號端子20之間，於第二方向Y上形成有間隙。第二方向Y是與第一方向X及訊號端子20的板厚方向交叉的方向。第二部分112在與第一方向X交叉的第二方向Y上的尺寸大於各第一部分111，而收容有絕緣部40。各訊號端子20經由絕緣部40而保持於第一收容部11內。In addition, as shown in FIGS. 1 and 2, the first housing 10 has a plurality of substantially circular openings 13 in substantially central portions of both surfaces in the thickness direction. Each first accommodating portion 11 extends in the thickness direction of the first housing 10 (for example, the up-down direction in FIG. 2. Hereinafter referred to as the first direction X), and has first portions 111 arranged at both ends of the first direction X. And the second part 112 disposed between the first part 111. Each first portion 111 is connected to the opening 13. A gap is formed in the second direction Y between the inner surface of each first receiving portion 11 constituting the first portion 111 and the signal terminal 20. The second direction Y is a direction crossing the first direction X and the thickness direction of the signal terminal 20. The size of the second portion 112 in the second direction Y crossing the first direction X is larger than that of each first portion 111, and the insulating portion 40 is accommodated. Each signal terminal 20 is held in the first receiving portion 11 via the insulating portion 40.

各訊號端子20例如構成為與設置於未圖示的檢查對象物或檢查裝置的訊號線連接，而能夠傳輸高頻訊號。於所述實施方式中，如圖3所示，各訊號端子20具有：彈性部21，沿著第一方向X伸縮；以及接觸部22，分別設置於彈性部21的第一方向X的兩端。彈性部21及接觸部22沿著第一方向X串聯地配置且構成為一體。Each signal terminal 20 is configured to be connected to, for example, a signal line provided on an inspection target or inspection device (not shown), and can transmit high-frequency signals. In the embodiment, as shown in FIG. 3, each signal terminal 20 has: an elastic portion 21 that expands and contracts along the first direction X; and a contact portion 22 is respectively provided at both ends of the elastic portion 21 in the first direction X . The elastic portion 21 and the contact portion 22 are arranged in series along the first direction X and are integrally formed.

彈性部21作為一例而具有蛇行形狀。具體而言，彈性部21具有：多個直線狀部211，沿著第二方向Y延伸、且於第一方向X上空開間隔地配置；以及彎曲狀部212，兩端分別與鄰接的直線狀部211的一端連接。The elastic part 21 has a meandering shape as an example. Specifically, the elastic portion 21 has: a plurality of linear portions 211 extending along the second direction Y and arranged at intervals in the first direction X; and a curved portion 212 having linear portions adjacent to each other at both ends One end of the part 211 is connected.

各接觸部22具有於第一方向X上延伸的大致矩形板狀的本體部221。於各接觸部22在第一方向X上的靠近彈性部21的端部，設置有寬度（換言之為第二方向Y的尺寸）大於本體部221的中間部222。於本體部221與中間部222的邊界部分，設置有自本體部221沿著第二方向Y相互朝相反方向延伸的一對肩部223。又，於各接觸部22在第一方向X上的遠離彈性部21的端部（換言之為訊號端子20的第一方向X的兩端部），分別設置有第一接點部23。於所述實施方式中，各第一接點部23構成為具有於第一方向X上朝向彈性部21凹入的彎曲形狀，而能夠與未圖示的檢查裝置或檢查對象物的端子接觸。Each contact portion 22 has a substantially rectangular plate-shaped body portion 221 extending in the first direction X. An end portion of each contact portion 22 close to the elastic portion 21 in the first direction X is provided with a middle portion 222 whose width (in other words, the size in the second direction Y) is greater than that of the main body portion 221. A pair of shoulders 223 extending from the main body 221 along the second direction Y in opposite directions to each other is provided at the boundary portion between the main body 221 and the middle portion 222. In addition, the end portions of each contact portion 22 away from the elastic portion 21 in the first direction X (in other words, both ends of the signal terminal 20 in the first direction X) are respectively provided with first contact portions 23. In the above-described embodiment, each first contact portion 23 is configured to have a curved shape recessed toward the elastic portion 21 in the first direction X, and is capable of contacting an inspection device or a terminal of an inspection target not shown.

如圖4所示，絕緣部40作為一例而包含絕緣性的第二殼體41。如圖2所示，第二殼體41具有大致圓柱形狀，於其內部具有：第三收容部411，能夠收容保持訊號端子20；以及開口部412、開口部413，分別設置於第一方向X的兩端，且分別與第三收容部411連接。其中一個開口部412具有能夠插入訊號端子20的彈性部21的大小。另一個開口部413小於其中一個開口部412，具有能夠插入訊號端子20的接觸部22的大小。於第三收容部411，收容有訊號端子20的彈性部21及各接觸部22的中間部222，其中一個接觸部22的肩部223與構成第三收容部411的第二殼體41的內表面接觸。又，訊號端子20的各接觸部22的本體部221的一部分經由開口部412、開口部413而露出至第二殼體41的外部。換言之，第二殼體41以第一接點部23經由開口部13而露出至外部的狀態將訊號端子20收容於內部。As shown in FIG. 4, the insulating part 40 includes an insulating second case 41 as an example. As shown in FIG. 2, the second housing 41 has a substantially cylindrical shape, and inside it has: a third receiving portion 411 capable of receiving and holding the signal terminal 20; and an opening portion 412 and an opening portion 413, respectively provided in the first direction X The two ends of, and are respectively connected to the third receiving portion 411. One of the openings 412 has a size that can be inserted into the elastic portion 21 of the signal terminal 20. The other opening 413 is smaller than one of the openings 412 and has a size that can be inserted into the contact portion 22 of the signal terminal 20. In the third receiving portion 411, the elastic portion 21 of the signal terminal 20 and the intermediate portion 222 of each contact portion 22 are received. The shoulder portion 223 of one of the contact portions 22 is connected to the inner portion of the second housing 41 constituting the third receiving portion 411. Surface contact. In addition, a part of the body portion 221 of each contact portion 22 of the signal terminal 20 is exposed to the outside of the second housing 41 through the opening 412 and the opening 413. In other words, the second housing 41 accommodates the signal terminal 20 in a state where the first contact portion 23 is exposed to the outside through the opening portion 13.

根據檢查插座1，可發揮如下所述的效果。According to the inspection socket 1, the following effects can be exerted.

檢查插座1包括：板狀的訊號端子20；導電性的第一殼體10，於內部具有收容訊號端子20的第一收容部11；以及絕緣部40，將訊號端子20與第一殼體10之間予以絕緣。藉由此種結構，可將訊號端子20與用作接地的第一殼體10之間的距離保持為一定，因此可容易地進行阻抗（impedance）匹配。又，訊號端子20收容於導電性的第一殼體10的內部，因此可藉由屏蔽效果而抑制雜訊（noise）。其結果為，可實現能夠減小高頻區域的訊號的傳輸損失的檢查插座1。The inspection socket 1 includes: a plate-shaped signal terminal 20; a conductive first housing 10 having a first receiving portion 11 for accommodating the signal terminal 20 inside; and an insulating portion 40 connecting the signal terminal 20 and the first housing 10 Insulate between. With this structure, the distance between the signal terminal 20 and the first housing 10 used as a ground can be kept constant, and therefore impedance matching can be easily performed. In addition, the signal terminal 20 is housed in the conductive first housing 10, so that noise can be suppressed by the shielding effect. As a result, it is possible to realize the inspection socket 1 capable of reducing the transmission loss of the signal in the high-frequency region.

絕緣部40包含絕緣性的第二殼體41，所述第二殼體41以第一接點部23露出至外部的狀態將訊號端子20收容於內部。藉由此種結構，可容易地實現能夠減小高頻區域的訊號的傳輸損失的檢查插座1。The insulating portion 40 includes an insulating second housing 41 that accommodates the signal terminal 20 in a state where the first contact portion 23 is exposed to the outside. With this structure, it is possible to easily realize the inspection socket 1 capable of reducing the transmission loss of the signal in the high-frequency region.

檢查插座1亦可如下述般構成。The inspection socket 1 may also be configured as follows.

檢查插座1並不限定於包括多個訊號端子20的情況，只要至少包括一個訊號端子20即可。The inspection socket 1 is not limited to the case where it includes a plurality of signal terminals 20, as long as it includes at least one signal terminal 20.

如圖5～圖10所示，檢查插座1可更包括至少一個接地端子30。As shown in FIGS. 5 to 10, the inspection socket 1 may further include at least one ground terminal 30.

於圖5～圖10中，示出包括多個檢查插座1的檢查單元2。檢查單元2包括：一對檢查插座1；基座殼體（base housing）3，收容一對檢查插座1；以及擺動構件4，以相對於配置在基座殼體3的內部的一對檢查插座1可擺動的狀態由基座殼體3予以支持。In FIGS. 5 to 10, the inspection unit 2 including a plurality of inspection sockets 1 is shown. The inspection unit 2 includes: a pair of inspection sockets 1; a base housing 3 accommodating a pair of inspection sockets 1; 1 The swingable state is supported by the base housing 3.

如圖6所示，各檢查插座1包括第一殼體10、以及分別收容於第一殼體10的四個訊號端子20及兩個接地端子30。於各檢查插座1中，各訊號端子20及各接地端子30的板厚方向的面相互相向且於板厚方向上空開間隔地配置，四個訊號端子20位於兩個接地端子30之間。As shown in FIG. 6, each inspection socket 1 includes a first housing 10, and four signal terminals 20 and two ground terminals 30 respectively accommodated in the first housing 10. In each inspection socket 1, the thickness-direction surfaces of the signal terminals 20 and the grounding terminals 30 face each other and are arranged at intervals in the thickness direction, and the four signal terminals 20 are located between the two grounding terminals 30.

如圖6所示，第一殼體10具有大致長方體的箱狀，如圖8所示，於第一方向X的兩端分別具有第二方向Y上的大小不同的開口部13。其中一個開口部13（例如，圖8的下側的開口部13）具有能夠插入訊號端子20及接地端子30的彈性部21、彈性部31的大小。另一個開口部13（例如，圖8的上側的開口部13）小於其中一個開口部13，具有能夠插入訊號端子20及接地端子30的接觸部22、接觸部32的大小。於各第一收容部11，收容有一個訊號端子20，一對絕緣構件42的安裝於位於第一方向X的一端的彈性部21的直線狀部211的部分421，與構成第三收容部411的第二殼體41的內表面接觸。又，雖未圖示，但於各第二收容部12，收容有一個接地端子30，位於第一方向X的一端的彈性部31的直線狀部與第二殼體41的內表面接觸。再者，如圖8所示，第一收容部11及第二收容部12於第二方向Y上具有大致相同的尺寸（於圖8僅示出第一收容部11）。As shown in FIG. 6, the first housing 10 has a substantially rectangular parallelepiped box shape. As shown in FIG. 8, both ends in the first direction X have openings 13 of different sizes in the second direction Y. One of the openings 13 (for example, the opening 13 on the lower side of FIG. 8) has a size such that the elastic portion 21 and the elastic portion 31 into which the signal terminal 20 and the ground terminal 30 can be inserted. The other opening 13 (for example, the opening 13 on the upper side of FIG. 8) is smaller than one of the openings 13, and has a size that can be inserted into the contact portion 22 and the contact portion 32 of the signal terminal 20 and the ground terminal 30. In each first receiving portion 11, a signal terminal 20 is received. The portion 421 of the pair of insulating members 42 mounted on the linear portion 211 of the elastic portion 21 at one end of the first direction X and constituting the third receiving portion 411 The inner surface of the second housing 41 contacts. In addition, although not shown, one ground terminal 30 is accommodated in each second accommodating portion 12, and the linear portion of the elastic portion 31 at one end in the first direction X is in contact with the inner surface of the second housing 41. Furthermore, as shown in FIG. 8, the first accommodating portion 11 and the second accommodating portion 12 have substantially the same size in the second direction Y (only the first accommodating portion 11 is shown in FIG. 8 ).

擺動構件4為絕緣性，且如圖5所示般包括連接部5，所述連接部5露出至第一殼體10的外部而能夠與接觸對象物（例如，檢查對象物或檢查裝置）連接。於所述連接部5，設置有將連接部5於其擺動方向（例如，第一方向X）上貫通的貫通孔6。如圖7所示，於貫通孔6收容有各訊號端子20的其中一個第一接點部23及各接地端子30的其中一個第二接點部33。又，如圖7所示，擺動構件4藉由配置於第一殼體10的內部的多個螺旋彈簧8而沿著第一方向X自第一殼體10的內部向外部施力。The swing member 4 is insulating and includes a connecting portion 5 as shown in FIG. 5, which is exposed to the outside of the first housing 10 and can be connected to a contact object (for example, an inspection object or an inspection device) . The connecting portion 5 is provided with a through hole 6 penetrating the connecting portion 5 in its swing direction (for example, the first direction X). As shown in FIG. 7, one of the first contact portions 23 of each signal terminal 20 and one of the second contact portions 33 of each ground terminal 30 are accommodated in the through hole 6. Furthermore, as shown in FIG. 7, the swing member 4 is urged from the inside of the first housing 10 to the outside along the first direction X by a plurality of coil springs 8 arranged inside the first housing 10.

如圖9所示，各訊號端子20的彈性部21包含相互空開間隙26而配置的多個彈性片24、25，於各接觸部22未設置中間部222。又，各訊號端子20的各第一接點部23的形狀不同。As shown in FIG. 9, the elastic portion 21 of each signal terminal 20 includes a plurality of elastic pieces 24 and 25 arranged with a gap 26 therebetween, and the intermediate portion 222 is not provided in each contact portion 22. In addition, the shape of each first contact portion 23 of each signal terminal 20 is different.

如圖10所示，各接地端子30作為一例而與訊號端子20同樣地為利用電鑄法形成的板狀，且具有：彈性部31，包含相互空開間隙36而配置的多個彈性片34、35；以及接觸部32，並且具有除了第二接點部33以外與訊號端子20大致相同的形狀。As shown in FIG. 10, each ground terminal 30 is, as an example, in the shape of a plate formed by electroforming like the signal terminal 20, and has an elastic portion 31 including a plurality of elastic pieces 34 arranged with gaps 36 therebetween. , 35; and the contact portion 32, and has substantially the same shape as the signal terminal 20 except for the second contact portion 33.

於圖5～圖10的檢查單元2中，訊號端子20及接地端子30分別具有板狀，以板厚方向相互一致的方式分別收容於第一收容部11及第二收容部12。藉由此種結構，可實現能夠更確實地減小高頻區域的訊號的傳輸損失的檢查插座1。In the inspection unit 2 of FIGS. 5 to 10, the signal terminal 20 and the ground terminal 30 each have a plate shape, and are respectively accommodated in the first accommodating portion 11 and the second accommodating portion 12 such that the thickness directions of the plates coincide with each other. With this structure, it is possible to realize the inspection socket 1 that can more reliably reduce the transmission loss of the signal in the high-frequency region.

訊號端子20及接地端子30分別不限於板狀，亦可為其他任意形狀。又，訊號端子20及接地端子30不限定於分別包括彈性部21、彈性部31以及接觸部22、接觸部32的情況，亦可採用於第一方向X的兩端分別具有接點部的其他任意結構。The signal terminal 20 and the ground terminal 30 are not limited to a plate shape, respectively, and may have any other shapes. In addition, the signal terminal 20 and the ground terminal 30 are not limited to the case where they include the elastic portion 21, the elastic portion 31, the contact portion 22, and the contact portion 32, respectively. Others having contact portions at both ends of the first direction X may also be used. Arbitrary structure.

圖5～圖10所示的檢查單元2的絕緣部40包含一對絕緣構件42，所述一對絕緣構件42分別安裝於訊號端子20的板厚方向的兩側。即，絕緣部40不限定於包含第二殼體41的情況。The insulating portion 40 of the inspection unit 2 shown in FIGS. 5 to 10 includes a pair of insulating members 42 which are respectively mounted on both sides of the signal terminal 20 in the plate thickness direction. That is, the insulating portion 40 is not limited to the case where the second case 41 is included.

如圖8及圖9所示，各絕緣構件42分別安裝於各訊號端子20的板厚方向的兩面。各絕緣構件42為薄膜狀，且具有沿著除了彈性部21及第一接點部23以外的接觸部22的形狀。又，關於各絕緣構件42，構成為在沿著各訊號端子20的板厚方向觀察時，其外形線位於較各訊號端子20的外形線更外側。藉由此種結構，可更容易地實現能夠減小高頻區域的訊號的傳輸損失的檢查插座1。再者，絕緣構件42未安裝於接地端子30。As shown in FIGS. 8 and 9, each insulating member 42 is respectively mounted on both surfaces of each signal terminal 20 in the plate thickness direction. Each insulating member 42 is in the shape of a film, and has a shape along the contact portion 22 except for the elastic portion 21 and the first contact portion 23. In addition, regarding each insulating member 42, when viewed along the thickness direction of each signal terminal 20, the outline line thereof is located on the outside of the outline line of each signal terminal 20. With this structure, it is easier to realize the inspection socket 1 capable of reducing the transmission loss of the signal in the high-frequency region. Furthermore, the insulating member 42 is not attached to the ground terminal 30.

例如，如圖11～圖13所示，絕緣部40亦可包含絕緣層43，所述絕緣層43遍及構成第一收容部11的第一殼體10的整個內表面而設置。藉由此種結構，可更容易地實現能夠減小高頻區域的訊號的傳輸損失的檢查插座1。For example, as shown in FIGS. 11 to 13, the insulating portion 40 may also include an insulating layer 43 provided over the entire inner surface of the first housing 10 constituting the first housing portion 11. With this structure, it is easier to realize the inspection socket 1 capable of reducing the transmission loss of the signal in the high-frequency region.

於圖11～圖13所示的檢查插座1中，第一殼體10於第一方向X的兩端分別具有第二方向Y上的大小不同的開口部13。其中一個開口部13（例如，圖12及圖13的上側的開口部13）具有能夠插入訊號端子20的彈性部21的大小。另一個開口部13（例如，圖12及圖13的下側的開口部13）小於其中一個開口部13，具有能夠插入訊號端子20的接觸部22的大小。於各第一收容部11，以其中一個接觸部22的肩部223與絕緣層43接觸、且另一個接觸部22的肩部223位於第一殼體10的外部的狀態收容有一個訊號端子20。In the inspection socket 1 shown in FIGS. 11 to 13, both ends of the first housing 10 in the first direction X have openings 13 of different sizes in the second direction Y, respectively. One of the openings 13 (for example, the opening 13 on the upper side in FIGS. 12 and 13) has a size such that the elastic portion 21 of the signal terminal 20 can be inserted. The other opening 13 (for example, the lower opening 13 in FIGS. 12 and 13) is smaller than one of the openings 13 and has a size that can be inserted into the contact portion 22 of the signal terminal 20. In each first receiving portion 11, a signal terminal 20 is received in a state where the shoulder portion 223 of one contact portion 22 is in contact with the insulating layer 43, and the shoulder portion 223 of the other contact portion 22 is located outside the first housing 10 .

再者，亦可不是於整個第一收容部11而是於一部分設置絕緣層43。Furthermore, the insulating layer 43 may not be provided on the entire first receiving portion 11 but on a part of it.

例如，如圖14～圖16所示，絕緣部40亦可包含一對第三殼體44，所述一對第三殼體44分別覆蓋訊號端子20的第一方向X的兩端的除了第一接點部23以外的部分。For example, as shown in FIGS. 14-16, the insulating portion 40 may also include a pair of third shells 44, which respectively cover both ends of the signal terminal 20 in the first direction X except for the first The part other than the contact part 23.

於圖14～圖16所示的檢查插座1中，各第三殼體44具有第一圓筒狀部441、以及與第一圓筒狀部441的第一方向X的一端連接的第二圓筒狀部442。第一圓筒狀部441覆蓋各訊號端子20的各接觸部22的本體部221的一部分。第二圓筒狀部442覆蓋各訊號端子20的各接觸部22的中間部222的一部分或全部，且具有小於第一圓筒狀部441的第一方向X上的尺寸、以及大於第一圓筒狀部441的相對於第一方向X的徑向尺寸。藉由此種結構，可更容易地實現能夠減小高頻區域的訊號的傳輸損失的檢查插座1。In the inspection socket 1 shown in FIGS. 14 to 16, each third housing 44 has a first cylindrical portion 441 and a second circle connected to one end of the first cylindrical portion 441 in the first direction X Cylindrical portion 442. The first cylindrical portion 441 covers a part of the body portion 221 of each contact portion 22 of each signal terminal 20. The second cylindrical portion 442 covers a part or all of the intermediate portion 222 of each contact portion 22 of each signal terminal 20, and has a size smaller than the size in the first direction X of the first cylindrical portion 441 and larger than the first circle The radial dimension of the cylindrical portion 441 with respect to the first direction X. With this structure, it is easier to realize the inspection socket 1 capable of reducing the transmission loss of the signal in the high-frequency region.

以上，參照圖式對本揭示的各種實施方式進行了詳細說明，最後對本揭示的各種形態進行說明。再者，於以下的說明中，作為一例，亦添加參照符號來進行記載。Above, various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various forms of the present disclosure have been described. In addition, in the following description, as an example, reference signs are also added for description.

本揭示的第一形態的檢查插座1包括： 導電性的訊號端子20，於兩端分別具有第一接點部23； 導電性的第一殼體10，於內部具有以所述第一接點部23露出至外部的狀態收容所述訊號端子20的第一收容部11；以及 絕緣部40，配置於所述第一收容部11而將所述訊號端子20與所述第一殼體10之間予以絕緣。The inspection socket 1 of the first form of the present disclosure includes: The conductive signal terminal 20 has first contact parts 23 at both ends; The conductive first housing 10 has a first accommodating portion 11 for accommodating the signal terminal 20 in a state where the first contact portion 23 is exposed to the outside; and The insulating portion 40 is disposed in the first receiving portion 11 to insulate the signal terminal 20 and the first housing 10.

本揭示的第二形態的檢查插座1的所述絕緣部40包括： 絕緣性的第二殼體41，以所述第一接點部23露出至外部的狀態將所述訊號端子20收容於內部。The insulating portion 40 of the inspection socket 1 of the second form of the present disclosure includes: The insulating second housing 41 accommodates the signal terminal 20 inside in a state where the first contact portion 23 is exposed to the outside.

本揭示的第三形態的檢查插座1的所述絕緣部40包括： 一對絕緣構件42，分別安裝於所述訊號端子20的板厚方向的兩側。The insulating portion 40 of the inspection socket 1 of the third form of the present disclosure includes: A pair of insulating members 42 are respectively mounted on both sides of the signal terminal 20 in the plate thickness direction.

本揭示的第四形態的檢查插座1的所述絕緣部40包括： 絕緣層43，設置於構成所述第一收容部11的所述第一殼體10的內表面。The insulating portion 40 of the inspection socket 1 of the fourth form of the present disclosure includes: The insulating layer 43 is provided on the inner surface of the first housing 10 constituting the first receiving portion 11.

本揭示的第五形態的檢查插座1的所述絕緣部40包括： 一對第三殼體44，分別覆蓋所述訊號端子20的兩端的除了所述第一接點部以外的部分。The insulating portion 40 of the inspection socket 1 of the fifth form of the present disclosure includes: A pair of third shells 44 respectively cover portions of both ends of the signal terminal 20 except for the first contact portion.

本揭示的第六形態的檢查插座1更包括： 導電性的接地端子30，於兩端分別具有第二接點部33， 所述第一殼體10於內部具有第二收容部12，以所述第二接點部33露出至外部的狀態收容所述接地端子30， 所述訊號端子20及所述接地端子30分別具有板狀，以板厚方向相互一致的方式分別收容於所述第一收容部11及所述第二收容部12。The inspection socket 1 of the sixth form of the present disclosure further includes: The conductive ground terminal 30 has a second contact portion 33 at both ends, respectively, The first housing 10 has a second receiving portion 12 inside, and receives the ground terminal 30 in a state where the second contact portion 33 is exposed to the outside. The signal terminal 20 and the ground terminal 30 each have a plate shape, and are respectively accommodated in the first receiving portion 11 and the second receiving portion 12 in such a manner that the thickness directions of the plates are consistent with each other.

再者，藉由適當組合所述各種實施方式或變形例中的任意的實施方式或變形例，可發揮分別所具有的效果。另外，能夠進行實施方式彼此的組合、或實施例彼此的組合、或實施方式與實施例的組合，並且亦能夠進行不同的實施方式或實施例中的特徵彼此的組合。 [產業上之可利用性]In addition, by appropriately combining any of the various embodiments or modifications described above, the respective effects can be exerted. In addition, a combination of embodiments, a combination of embodiments, or a combination of embodiments and examples can be performed, and a combination of features in different embodiments or examples can also be performed. [Industrial availability]

本揭示的檢查插座例如可應用於包括相機模組等的企業對企業（Business-to-Business，BtoB）連接器來作為連接媒體的模組、及小型封裝（Small Outline Package，SOP）、四方扁平封裝（Quad Flat Package，QFP）、球柵陣列（Ball grid array，BGA）等半導體封裝的檢查中所使用的檢查治具。The inspection socket of the present disclosure can be applied to, for example, a business-to-business (BtoB) connector including a camera module, etc., as a module of the connection medium, and a small package (Small Outline Package, SOP), quad flat Inspection jigs used in the inspection of semiconductor packages such as Quad Flat Package (QFP) and Ball Grid Array (BGA).

1:檢查插座 2:檢查單元 3:基座殼體 4:擺動構件 5:連接部 6:貫通孔 8:螺旋彈簧 10:第一殼體 11:第一收容部 12:第二收容部 13:開口部 20:訊號端子 21:彈性部 22:接觸部 23:第一接點部 24、25:彈性片 26:間隙 30:接地端子 31:彈性部 32:接觸部 33:第二接點部 34、35:彈性片 36:間隙 40:絕緣部 41:第二殼體 42:絕緣構件 43:絕緣層 44:第三殼體 111:第一部分 112:第二部分 211:直線狀部 212:彎曲狀部 221:本體部 222:中間部 223:肩部 411:第三收容部 412、413:開口部 441:第一圓筒狀部 442:第二圓筒狀部 II-II:線 VII-VII:線 VIII-VIII:線 X:第一方向 XII-XII:線 XIII-XIII:線 XV-XV:線 Y:第二方向1: Check the socket 2: Inspection unit 3: Base shell 4: swing member 5: Connection part 6: Through hole 8: Coil spring 10: The first shell 11: First Containment Department 12: Second Containment Department 13: Opening 20: Signal terminal 21: Elastic part 22: Contact part 23: The first contact 24, 25: elastic sheet 26: gap 30: Ground terminal 31: Elastic part 32: Contact 33: The second contact part 34, 35: elastic sheet 36: Clearance 40: Insulation part 41: second shell 42: Insulating member 43: Insulation layer 44: third shell 111: Part One 112: Part Two 211: Straight section 212: Curved part 221: body part 222: middle part 223: Shoulder 411: Third Containment Department 412, 413: opening 441: The first cylindrical part 442: second cylindrical part II-II: line VII-VII: Line VIII-VIII: Line X: first direction XII-XII: line XIII-XIII: line XV-XV: line Y: second direction

圖1是表示本揭示的一實施方式的檢查插座的立體圖。 圖2是沿著圖1的II-II線的剖視圖。 圖3是表示圖1的檢查插座的訊號端子的立體圖。 圖4是表示收容於第二殼體的狀態的圖3的訊號端子的立體圖。 圖5是表示包括圖1的檢查插座的第一變形例的檢查單元的立體圖。 圖6是表示圖1的檢查插座的第一變形例的立體圖。 圖7是沿著圖5的VII-VII線的剖視圖。 圖8是沿著圖6的VIII-VIII線的剖視圖。 圖9是表示圖6的檢查單元的訊號端子及一對絕緣構件的立體圖。 圖10是表示圖6的檢查單元的接地端子的立體圖。 圖11是表示圖1的檢查插座的第二變形例的立體圖。 圖12是沿著圖11的XII-XII線的剖視圖。 圖13是沿著圖11的XIII-XIII線的剖視圖。 圖14是表示圖1的檢查插座的第三變形例的立體圖。 圖15是沿著圖14的XV-XV線的剖視圖。 圖16是表示圖14的檢查插座的訊號端子及一對第三殼體的立體圖。Fig. 1 is a perspective view showing an inspection socket according to an embodiment of the present disclosure. Fig. 2 is a cross-sectional view taken along line II-II in Fig. 1. Fig. 3 is a perspective view showing a signal terminal of the inspection socket of Fig. 1. Fig. 4 is a perspective view of the signal terminal of Fig. 3 showing a state of being housed in a second housing. Fig. 5 is a perspective view showing an inspection unit including a first modification of the inspection socket of Fig. 1. Fig. 6 is a perspective view showing a first modification of the inspection socket of Fig. 1. Fig. 7 is a cross-sectional view taken along the line VII-VII in Fig. 5. Fig. 8 is a cross-sectional view taken along line VIII-VIII of Fig. 6. Fig. 9 is a perspective view showing a signal terminal and a pair of insulating members of the inspection unit of Fig. 6. Fig. 10 is a perspective view showing a ground terminal of the inspection unit of Fig. 6. Fig. 11 is a perspective view showing a second modification of the inspection socket of Fig. 1. Fig. 12 is a cross-sectional view taken along line XII-XII in Fig. 11. Fig. 13 is a cross-sectional view taken along the line XIII-XIII of Fig. 11. Fig. 14 is a perspective view showing a third modification of the inspection socket of Fig. 1. Fig. 15 is a cross-sectional view taken along line XV-XV in Fig. 14. Fig. 16 is a perspective view showing a signal terminal and a pair of third housings of the inspection socket of Fig. 14.

10:第一殼體10: The first shell

11:第一收容部11: First Containment Department

13:開口部13: Opening

20:訊號端子20: Signal terminal

21:彈性部21: Elastic part

22:接觸部22: Contact part

23:第一接點部23: The first contact

40:絕緣部40: Insulation part

111:第一部分111: Part One

112:第二部分112: Part Two

221:本體部221: body part

222:中間部222: middle part

223:肩部223: Shoulder

411:第三收容部411: Third Containment Department

412、413:開口部412, 413: opening

X:第一方向X: first direction

Y:第二方向Y: second direction

Claims (6)

一種檢查插座，包括： 導電性的訊號端子，於兩端分別具有第一接點部； 導電性的第一殼體，於內部具有以所述第一接點部露出至外部的狀態收容所述訊號端子的第一收容部；以及 絕緣部，配置於所述第一收容部而將所述訊號端子與所述第一殼體之間予以絕緣。An inspection socket, including: The conductive signal terminal has first contact parts at both ends respectively; The conductive first housing has a first accommodating portion for accommodating the signal terminal in a state where the first contact portion is exposed to the outside; and The insulating part is arranged in the first receiving part to insulate the signal terminal and the first housing. 如請求項1所述的檢查插座，其中所述絕緣部包括： 絕緣性的第二殼體，以所述第一接點部露出至外部的狀態將所述訊號端子收容於內部。The inspection socket according to claim 1, wherein the insulating part includes: The insulating second housing accommodates the signal terminal inside with the first contact part exposed to the outside. 如請求項1所述的檢查插座，其中所述絕緣部包括： 一對絕緣構件，分別安裝於所述訊號端子的板厚方向的兩側。The inspection socket according to claim 1, wherein the insulating part includes: A pair of insulating members are respectively installed on both sides of the signal terminal in the plate thickness direction. 如請求項1所述的檢查插座，其中所述絕緣部包括： 絕緣層，設置於構成所述第一收容部的所述第一殼體的內表面。The inspection socket according to claim 1, wherein the insulating part includes: The insulating layer is provided on the inner surface of the first housing constituting the first receiving portion. 如請求項1所述的檢查插座，其中所述絕緣部包括： 一對第三殼體，分別覆蓋所述訊號端子的兩端的除了所述第一接點部以外的部分。The inspection socket according to claim 1, wherein the insulating part includes: A pair of third shells respectively cover parts of both ends of the signal terminal except for the first contact part. 如請求項1至請求項5中任一項所述的檢查插座，更包括：導電性的接地端子，於兩端分別具有第二接點部， 所述第一殼體於內部具有第二收容部，以所述第二接點部露出至外部的狀態收容所述接地端子， 所述訊號端子及所述接地端子分別具有板狀，且以板厚方向相互一致的方式分別收容於所述第一收容部及所述第二收容部。The inspection socket according to any one of claim 1 to claim 5, further comprising: a conductive ground terminal with a second contact part at both ends, The first housing has a second accommodating part inside, and accommodating the ground terminal in a state where the second contact part is exposed to the outside, The signal terminal and the ground terminal each have a plate shape, and are respectively accommodated in the first accommodating portion and the second accommodating portion in such a manner that the thickness directions of the plates are consistent with each other.
TW110103011A 2020-02-13 2021-01-27 check socket TWI811623B (en)

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Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002134202A (en) 2000-10-27 2002-05-10 Otax Co Ltd Receptacle for electronic parts
JP2008175700A (en) * 2007-01-19 2008-07-31 Matsushita Electric Ind Co Ltd Inspection device or inspection method for semiconductor device
JP5381609B2 (en) * 2009-10-20 2014-01-08 日本電産リード株式会社 Inspection jig and contact
KR101051032B1 (en) * 2010-07-23 2011-07-26 리노공업주식회사 Test socket for semiconductor chip
JP2012098219A (en) * 2010-11-04 2012-05-24 Yamaichi Electronics Co Ltd Socket for semiconductor device
JPWO2013061486A1 (en) * 2011-10-26 2015-04-02 ユニテクノ株式会社 Contact probe and inspection socket with the same
KR101490501B1 (en) * 2013-11-12 2015-02-06 주식회사 아이에스시 Electrical test socket
KR101762836B1 (en) * 2015-09-10 2017-07-28 리노공업주식회사 A probe socket
JP2017130421A (en) * 2016-01-22 2017-07-27 山一電機株式会社 Contact terminal, contact support, and connection device including the same
JP6627655B2 (en) * 2016-06-17 2020-01-08 オムロン株式会社 socket
CN111033273B (en) * 2018-01-11 2022-04-26 欧姆龙株式会社 Probe, inspection tool, inspection unit, and inspection apparatus
WO2019138505A1 (en) * 2018-01-11 2019-07-18 オムロン株式会社 Probe pin, test jig, test unit, and test device
JP6988920B2 (en) * 2018-01-11 2022-01-05 オムロン株式会社 Probe pins, inspection jigs, inspection units and inspection equipment
US20200003802A1 (en) * 2018-07-02 2020-01-02 Powertech Technology Inc. Testing socket and testing apparatus
KR20200080922A (en) * 2018-12-27 2020-07-07 주식회사 아이에스시 Contact pin for test socket and test socket comprising the same

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