TW201827418A - 化合物、樹脂、組成物、抗蝕圖型形成方法及電路圖型形成方法 - Google Patents
化合物、樹脂、組成物、抗蝕圖型形成方法及電路圖型形成方法 Download PDFInfo
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- TW201827418A TW201827418A TW106131477A TW106131477A TW201827418A TW 201827418 A TW201827418 A TW 201827418A TW 106131477 A TW106131477 A TW 106131477A TW 106131477 A TW106131477 A TW 106131477A TW 201827418 A TW201827418 A TW 201827418A
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D311/00—Heterocyclic compounds containing six-membered rings having one oxygen atom as the only hetero atom, condensed with other rings
- C07D311/02—Heterocyclic compounds containing six-membered rings having one oxygen atom as the only hetero atom, condensed with other rings ortho- or peri-condensed with carbocyclic rings or ring systems
- C07D311/78—Ring systems having three or more relevant rings
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C39/00—Compounds having at least one hydroxy or O-metal group bound to a carbon atom of a six-membered aromatic ring
- C07C39/205—Compounds having at least one hydroxy or O-metal group bound to a carbon atom of a six-membered aromatic ring polycyclic, containing only six-membered aromatic rings as cyclic parts with unsaturation outside the rings
- C07C39/21—Compounds having at least one hydroxy or O-metal group bound to a carbon atom of a six-membered aromatic ring polycyclic, containing only six-membered aromatic rings as cyclic parts with unsaturation outside the rings with at least one hydroxy group on a non-condensed ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G8/00—Condensation polymers of aldehydes or ketones with phenols only
- C08G8/04—Condensation polymers of aldehydes or ketones with phenols only of aldehydes
- C08G8/08—Condensation polymers of aldehydes or ketones with phenols only of aldehydes of formaldehyde, e.g. of formaldehyde formed in situ
- C08G8/20—Condensation polymers of aldehydes or ketones with phenols only of aldehydes of formaldehyde, e.g. of formaldehyde formed in situ with polyhydric phenols
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Structural Engineering (AREA)
- Architecture (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Phenolic Resins Or Amino Resins (AREA)
- Pyrane Compounds (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-178433 | 2016-09-13 | ||
JP2016178433 | 2016-09-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201827418A true TW201827418A (zh) | 2018-08-01 |
Family
ID=61618822
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106131477A TW201827418A (zh) | 2016-09-13 | 2017-09-13 | 化合物、樹脂、組成物、抗蝕圖型形成方法及電路圖型形成方法 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP7452947B2 (ko) |
KR (1) | KR20190049731A (ko) |
CN (1) | CN109715591A (ko) |
TW (1) | TW201827418A (ko) |
WO (1) | WO2018052026A1 (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109715591A (zh) * | 2016-09-13 | 2019-05-03 | 三菱瓦斯化学株式会社 | 化合物、树脂、组合物、以及抗蚀图案形成方法和电路图案形成方法 |
JPWO2020027206A1 (ja) * | 2018-07-31 | 2021-08-12 | 三菱瓦斯化学株式会社 | 光学部品形成用組成物及び光学部品、並びに、化合物及び樹脂 |
US11650503B2 (en) | 2018-08-02 | 2023-05-16 | Tokyo Ohka Kogyo Co., Ltd. | Hard mask-forming composition and method for manufacturing electronic component |
TW202104175A (zh) * | 2019-01-31 | 2021-02-01 | 日商三菱瓦斯化學股份有限公司 | 化合物、樹脂、組成物、阻劑圖型形成方法、回路圖型形成方法及樹脂之純化方法 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS635053A (ja) * | 1986-06-25 | 1988-01-11 | Sumitomo Chem Co Ltd | ビスフエノ−ル誘導体の製造方法 |
JPH0725946B2 (ja) * | 1986-07-23 | 1995-03-22 | 住友化学工業株式会社 | ブタジエン系ポリマ−組成物 |
JP3774668B2 (ja) | 2001-02-07 | 2006-05-17 | 東京エレクトロン株式会社 | シリコン窒化膜形成装置の洗浄前処理方法 |
JP3685253B2 (ja) * | 2001-02-23 | 2005-08-17 | 信越化学工業株式会社 | シリコーン変性エポキシ樹脂又はシリコーン変性フェノール樹脂を含有する樹脂組成物、並びにこれを用いた半導体装置 |
JP3914493B2 (ja) | 2002-11-27 | 2007-05-16 | 東京応化工業株式会社 | 多層レジストプロセス用下層膜形成材料およびこれを用いた配線形成方法 |
EP1592051A4 (en) | 2003-01-24 | 2012-02-22 | Tokyo Electron Ltd | CHEMICAL VAPOR DEPOSITION METHOD FOR FORMING SILICON NITRIDE FILM ON A SUBSTRATE |
JP3981030B2 (ja) | 2003-03-07 | 2007-09-26 | 信越化学工業株式会社 | レジスト下層膜材料ならびにパターン形成方法 |
JP4388429B2 (ja) | 2004-02-04 | 2009-12-24 | 信越化学工業株式会社 | レジスト下層膜材料ならびにパターン形成方法 |
CN1942825B (zh) | 2004-04-15 | 2010-05-12 | 三菱瓦斯化学株式会社 | 抗蚀剂组合物 |
JP4781280B2 (ja) | 2006-01-25 | 2011-09-28 | 信越化学工業株式会社 | 反射防止膜材料、基板、及びパターン形成方法 |
JP4638380B2 (ja) | 2006-01-27 | 2011-02-23 | 信越化学工業株式会社 | 反射防止膜材料、反射防止膜を有する基板及びパターン形成方法 |
JP4858136B2 (ja) | 2006-12-06 | 2012-01-18 | 三菱瓦斯化学株式会社 | 感放射線性レジスト組成物 |
JP5446118B2 (ja) | 2007-04-23 | 2014-03-19 | 三菱瓦斯化学株式会社 | 感放射線性組成物 |
JP2010138393A (ja) | 2008-11-13 | 2010-06-24 | Nippon Kayaku Co Ltd | 光学レンズシート用エネルギー線硬化型樹脂組成物及びその硬化物 |
KR101907481B1 (ko) * | 2011-08-12 | 2018-10-12 | 미쯔비시 가스 케미칼 컴파니, 인코포레이티드 | 리소그래피용 하층막 형성재료, 리소그래피용 하층막 및 패턴형성방법 |
KR101986346B1 (ko) | 2011-08-12 | 2019-06-05 | 미쯔비시 가스 케미칼 컴파니, 인코포레이티드 | 레지스트 조성물, 레지스트 패턴 형성방법, 이에 이용되는 폴리페놀 화합물 및 이로부터 유도될 수 있는 알코올 화합물 |
JP5900318B2 (ja) * | 2012-12-21 | 2016-04-06 | 信越化学工業株式会社 | ジアリル基含有ヒドロキシフェニル誘導体、シリコーン骨格含有高分子化合物、ネガ型レジスト材料、光硬化性ドライフィルム、パターン形成方法及び電気・電子部品保護用皮膜 |
EP2955169B1 (en) | 2013-02-08 | 2017-03-15 | Mitsubishi Gas Chemical Company, Inc. | Novel allyl compound and method for producing the same |
JP2015174877A (ja) | 2014-03-13 | 2015-10-05 | 日産化学工業株式会社 | 特定の硬化促進触媒を含む樹脂組成物 |
JP6515919B2 (ja) * | 2014-03-13 | 2019-05-22 | 三菱瓦斯化学株式会社 | レジスト組成物及びレジストパターン形成方法 |
CN104449670B (zh) * | 2014-11-11 | 2016-05-25 | 山东大学 | 一种苯基呋喃类hERG钾离子通道的小分子荧光探针及其应用 |
KR101930803B1 (ko) * | 2015-12-11 | 2018-12-20 | 주식회사 삼양사 | 티올-엔 반응을 이용한 에폭시 화합물 및 그 제조방법, 및 그 경화 생성물을 포함하는 유기-무기재료 복합체 및 그 복합체 제조방법 |
JP6763293B2 (ja) * | 2016-01-07 | 2020-09-30 | 信越化学工業株式会社 | アリール化合物及びその製造方法 |
JP6613901B2 (ja) * | 2016-01-07 | 2019-12-04 | 信越化学工業株式会社 | エポキシ変性シリコーン樹脂及びその製造方法、硬化性組成物及び電子部品 |
CN109715591A (zh) * | 2016-09-13 | 2019-05-03 | 三菱瓦斯化学株式会社 | 化合物、树脂、组合物、以及抗蚀图案形成方法和电路图案形成方法 |
-
2017
- 2017-09-13 CN CN201780055990.0A patent/CN109715591A/zh not_active Withdrawn
- 2017-09-13 WO PCT/JP2017/033063 patent/WO2018052026A1/ja active Application Filing
- 2017-09-13 JP JP2018539752A patent/JP7452947B2/ja active Active
- 2017-09-13 KR KR1020197007278A patent/KR20190049731A/ko not_active Application Discontinuation
- 2017-09-13 TW TW106131477A patent/TW201827418A/zh unknown
-
2022
- 2022-06-13 JP JP2022094792A patent/JP2022130463A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP7452947B2 (ja) | 2024-03-19 |
JPWO2018052026A1 (ja) | 2019-06-24 |
JP2022130463A (ja) | 2022-09-06 |
KR20190049731A (ko) | 2019-05-09 |
CN109715591A (zh) | 2019-05-03 |
WO2018052026A1 (ja) | 2018-03-22 |
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