TW201702392A - 合金材料、接觸探針及連接端子 - Google Patents

合金材料、接觸探針及連接端子 Download PDF

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Publication number
TW201702392A
TW201702392A TW105110500A TW105110500A TW201702392A TW 201702392 A TW201702392 A TW 201702392A TW 105110500 A TW105110500 A TW 105110500A TW 105110500 A TW105110500 A TW 105110500A TW 201702392 A TW201702392 A TW 201702392A
Authority
TW
Taiwan
Prior art keywords
alloy material
contact
weight
plunger
probe
Prior art date
Application number
TW105110500A
Other languages
English (en)
Chinese (zh)
Inventor
風間俊男
谷幸央
荘司哲
安楽照男
相之谷正之
久保田智大
豊武孝太郎
安部一志
Original Assignee
日本發條股份有限公司
山本貴金屬地金股份有限公司
神鋼金屬製造有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本發條股份有限公司, 山本貴金屬地金股份有限公司, 神鋼金屬製造有限公司 filed Critical 日本發條股份有限公司
Publication of TW201702392A publication Critical patent/TW201702392A/zh

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C9/00—Alloys based on copper
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C9/00—Alloys based on copper
    • C22C9/06—Alloys based on copper with nickel or cobalt as the next major constituent
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Conductive Materials (AREA)
  • Non-Insulated Conductors (AREA)
TW105110500A 2015-03-31 2016-03-31 合金材料、接觸探針及連接端子 TW201702392A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015074331 2015-03-31

Publications (1)

Publication Number Publication Date
TW201702392A true TW201702392A (zh) 2017-01-16

Family

ID=57004414

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105110500A TW201702392A (zh) 2015-03-31 2016-03-31 合金材料、接觸探針及連接端子

Country Status (3)

Country Link
JP (1) JP6728057B2 (ja)
TW (1) TW201702392A (ja)
WO (1) WO2016159316A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI668459B (zh) * 2017-06-14 2019-08-11 日商日本發條股份有限公司 導電性接觸子單元
TWI787250B (zh) * 2017-04-28 2022-12-21 日商阿德潘鐵斯特股份有限公司 電子元件測試裝置用之載具
TWI787302B (zh) * 2017-07-10 2022-12-21 日商聯合精密科技股份有限公司 一種二元銅銀合金體的製造方法、觸頭引腳以及使用二元銅銀合金的裝置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023145888A (ja) * 2022-03-29 2023-10-12 石福金属興業株式会社 プローブピン用合金材料
JP2023145917A (ja) * 2022-03-29 2023-10-12 株式会社ヨコオ プローブ
KR20240042565A (ko) 2022-06-08 2024-04-02 에스더블유씨씨 가부시키가이샤 전기 특성 검사용 도선 및 그 제조 방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56133442A (en) * 1980-03-24 1981-10-19 Tanaka Kikinzoku Kogyo Kk Electrical contact material
JPS57171599A (en) * 1981-04-13 1982-10-22 Mitsubishi Metal Corp Low melting point cu-ag system alloy solder with excellent wetting property
JPS6293327A (ja) * 1985-10-21 1987-04-28 Tanaka Kikinzoku Kogyo Kk コンミテ−タ用材料
JP2004061265A (ja) * 2002-07-29 2004-02-26 Sumitomo Electric Ind Ltd 電気接点用微細部品およびその製造方法
JP4446479B2 (ja) * 2005-01-31 2010-04-07 日鉱金属株式会社 電子機器用銅合金
JP4708833B2 (ja) * 2005-04-08 2011-06-22 昭和電線ケーブルシステム株式会社 耐へたり性に優れた電気・電子部品精密導電性ばね用高強度銅合金材料とその製造方法
JP4801757B2 (ja) * 2009-05-29 2011-10-26 田中貴金属工業株式会社 接触抵抗、防汚特性に優れるプローブピン
US9804198B2 (en) * 2012-08-03 2017-10-31 Yamamoto Precious Metal Co., Ltd. Alloy material, contact probe, and connection terminal
WO2014049874A1 (ja) * 2012-09-28 2014-04-03 株式会社徳力本店 電気・電子機器用途のＡｇ‐Ｐｄ‐Ｃｕ‐Ｃｏ合金

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI787250B (zh) * 2017-04-28 2022-12-21 日商阿德潘鐵斯特股份有限公司 電子元件測試裝置用之載具
TWI668459B (zh) * 2017-06-14 2019-08-11 日商日本發條股份有限公司 導電性接觸子單元
US11293946B2 (en) 2017-06-14 2022-04-05 Nhk Spring Co., Ltd. Conductive contactor unit
TWI787302B (zh) * 2017-07-10 2022-12-21 日商聯合精密科技股份有限公司 一種二元銅銀合金體的製造方法、觸頭引腳以及使用二元銅銀合金的裝置

Also Published As

Publication number Publication date
JP6728057B2 (ja) 2020-07-22
WO2016159316A1 (ja) 2016-10-06
JPWO2016159316A1 (ja) 2018-03-08

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