TW201602411A - 金屬基板 - Google Patents
金屬基板 Download PDFInfo
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- TW201602411A TW201602411A TW104109762A TW104109762A TW201602411A TW 201602411 A TW201602411 A TW 201602411A TW 104109762 A TW104109762 A TW 104109762A TW 104109762 A TW104109762 A TW 104109762A TW 201602411 A TW201602411 A TW 201602411A
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- Prior art keywords
- film
- adhesive
- metal substrate
- metal plate
- metal
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- PMMYEEVYMWASQN-IMJSIDKUSA-N cis-4-Hydroxy-L-proline Chemical compound O[C@@H]1CN[C@H](C(O)=O)C1 PMMYEEVYMWASQN-IMJSIDKUSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
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- 239000010960 cold rolled steel Substances 0.000 description 1
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- 238000006482 condensation reaction Methods 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- IFDVQVHZEKPUSC-UHFFFAOYSA-N cyclohex-3-ene-1,2-dicarboxylic acid Chemical compound OC(=O)C1CCC=CC1C(O)=O IFDVQVHZEKPUSC-UHFFFAOYSA-N 0.000 description 1
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- 230000002950 deficient Effects 0.000 description 1
- 125000005442 diisocyanate group Chemical group 0.000 description 1
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- SZXQTJUDPRGNJN-UHFFFAOYSA-N dipropylene glycol Chemical compound OCCCOCCCO SZXQTJUDPRGNJN-UHFFFAOYSA-N 0.000 description 1
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- 238000007733 ion plating Methods 0.000 description 1
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- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- SJCKRGFTWFGHGZ-UHFFFAOYSA-N magnesium silver Chemical compound [Mg].[Ag] SJCKRGFTWFGHGZ-UHFFFAOYSA-N 0.000 description 1
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- 239000011976 maleic acid Substances 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- KHARCSTZAGNHOT-UHFFFAOYSA-N naphthalene-2,3-dicarboxylic acid Chemical compound C1=CC=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 KHARCSTZAGNHOT-UHFFFAOYSA-N 0.000 description 1
- RXOHFPCZGPKIRD-UHFFFAOYSA-N naphthalene-2,6-dicarboxylic acid Chemical compound C1=C(C(O)=O)C=CC2=CC(C(=O)O)=CC=C21 RXOHFPCZGPKIRD-UHFFFAOYSA-N 0.000 description 1
- WPUMVKJOWWJPRK-UHFFFAOYSA-N naphthalene-2,7-dicarboxylic acid Chemical compound C1=CC(C(O)=O)=CC2=CC(C(=O)O)=CC=C21 WPUMVKJOWWJPRK-UHFFFAOYSA-N 0.000 description 1
- 229910001000 nickel titanium Inorganic materials 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N o-biphenylenemethane Natural products C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 1
- WCPAKWJPBJAGKN-UHFFFAOYSA-N oxadiazole Chemical compound C1=CON=N1 WCPAKWJPBJAGKN-UHFFFAOYSA-N 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229920006289 polycarbonate film Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920005990 polystyrene resin Polymers 0.000 description 1
- 229920000166 polytrimethylene carbonate Polymers 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- BITYAPCSNKJESK-UHFFFAOYSA-N potassiosodium Chemical compound [Na].[K] BITYAPCSNKJESK-UHFFFAOYSA-N 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- JEXVQSWXXUJEMA-UHFFFAOYSA-N pyrazol-3-one Chemical compound O=C1C=CN=N1 JEXVQSWXXUJEMA-UHFFFAOYSA-N 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 239000001054 red pigment Substances 0.000 description 1
- YYMBJDOZVAITBP-UHFFFAOYSA-N rubrene Chemical compound C1=CC=CC=C1C(C1=C(C=2C=CC=CC=2)C2=CC=CC=C2C(C=2C=CC=CC=2)=C11)=C(C=CC=C2)C2=C1C1=CC=CC=C1 YYMBJDOZVAITBP-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229920005792 styrene-acrylic resin Polymers 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- UFDHBDMSHIXOKF-UHFFFAOYSA-N tetrahydrophthalic acid Natural products OC(=O)C1=C(C(O)=O)CCCC1 UFDHBDMSHIXOKF-UHFFFAOYSA-N 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- GBRYOJYRBUXELD-UHFFFAOYSA-K tris[(5-phenylquinolin-8-yl)oxy]alumane Chemical compound C=1C=C(C=2C=CC=CC=2)C2=CC=CN=C2C=1O[Al](OC=1C2=NC=CC=C2C(C=2C=CC=CC=2)=CC=1)OC(C1=NC=CC=C11)=CC=C1C1=CC=CC=C1 GBRYOJYRBUXELD-UHFFFAOYSA-K 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 235000013799 ultramarine blue Nutrition 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
- B32B15/09—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin comprising polyesters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/04—Interconnection of layers
- B32B7/12—Interconnection of layers using interposed adhesives or interposed materials with bonding properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03923—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIBIIICVI compound materials, e.g. CIS, CIGS
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/88—Passivation; Containers; Encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/40—Properties of the layers or laminate having particular optical properties
- B32B2307/402—Coloured
- B32B2307/4026—Coloured within the layer by addition of a colorant, e.g. pigments, dyes
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B2307/00—Properties of the layers or laminate
- B32B2307/50—Properties of the layers or laminate having particular mechanical properties
- B32B2307/538—Roughness
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
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- Optics & Photonics (AREA)
- Laminated Bodies (AREA)
- Electroluminescent Light Sources (AREA)
- Photovoltaic Devices (AREA)
Abstract
本發明係提供一種藉由層合特定皮膜於金屬板,使皮膜的表面變為平滑,同時皮膜為具有絕緣性之金屬基板。本發明為一種次直型(Sub Straight)薄膜太陽能電池或頂部發光(Top emission)型有機EL元件所使用之金屬基板,其特徵為於金屬板的表面,透過接著劑層合1層的熱可塑性樹脂薄膜,上述薄膜係由固體顏料之體積分率為20%以下之組成物所得者,膜厚為12μm以上且250μm以下,層合後之上述薄膜表面的表面粗糙度Ra為30nm以下。
Description
本發明係關於次直型薄膜太陽能電池或頂部發光型有機EL元件所使用之金屬基板,使皮膜的表面變為平滑,同時皮膜為具有絕緣性之金屬基板。
作為使用非晶矽、或CdS.CuInSe2等之化合物半導體,亦即薄膜半導體太陽能電池(以下稱為薄膜太陽能電池),已知有超直型(Super Straight)薄膜太陽能電池與次直型薄膜太陽能電池2種的構造。
於超直型薄膜太陽能電池,通常係依基板、透明電極、光電變換層、背面電極順序層合之構造,從基板側入射光。另外,於次直型薄膜太陽能電池,通常係依基板、背面電極、光電變換層、透明電極順序層合之構造,從透明電極側入射光。
以往作為薄膜太陽能電池的基板,已使用透光性之玻璃或塑膠等。惟,玻璃除了易破裂之外並有缺乏加工性,重而且成本高等之問題,又,塑膠由於有透濕性,必須設置氣體阻隔層,除了成本變得更貴之外,不加
熱就無法加工故困難。
然而,次直型薄膜太陽能電池由於係從透明電極側入射光,次直型薄膜太陽能電池的基板中不要求透光性。因此,可使用並非如玻璃或塑膠之基板,而是雖不具有如金屬板之透光性但加工性優異之基板。惟,為了用作薄膜太陽能電池,雖基板的表面平滑,且此表面為具有絕緣性的必要,但由於金屬板本身的表面通常具有1μm左右以上的凹凸,且有導電性,無法直接作為基板使用。因此,認為若如滿足上述的條件,能形成薄膜於金屬板上,可將金屬板作為基板使用。於以下之專利文獻1或2提案有如此之基板。
專利文獻1中,記載有一種金屬板層合用聚酯薄膜,其特徵為薄膜表面的高度400nm以上的突起為150個/mm2以下,薄膜之3次元表面粗糙度為8nm~25nm。惟,於此專利文獻1,將上述薄膜層合於經加熱之金屬板,由於金屬基板並未使用接著劑,故將此金屬基板作為次直型薄膜太陽光發電.有機EL照明使用時,薄膜與金屬板的接著性有不夠充分之虞。
專利文獻2中,記載有一種有機電致發光照明基板用聚酯薄膜,其係由基材層、與形成於其至少一側的面之平滑層所構成之薄膜,在平滑層的表面之表面粗糙度Ra為5.0nm以下。惟,於專利文獻2,藉由於基材層之上設置表面為平滑之平滑層,藉由形成複數層之薄膜,而將薄膜表面變為平滑,卻導致產生成本方面的問題。
[專利文獻1]日本特開平11-10724號公報
[專利文獻2]日本特開2012-146413號公報
本發明係次直型薄膜太陽能電池或頂部發光型有機EL元件所使用之金屬基板,以提供一種儘管不必加熱即可加工,且可以低成本製作,但金屬板的表面的平滑性優異,同時絕緣性亦優異之金屬基板為課題。
本發明者等終至完成次直型薄膜太陽能電池或頂部發光型有機EL元件所使用之金屬基板,其係層合於金屬板之皮膜的表面變為平滑,同時皮膜的表面為具有絕緣性之金屬基板。
亦即,本發明係一種金屬基板,其特徵為於金屬板的表面透過接著劑層合1層的熱可塑性樹脂薄膜,上述薄膜係由固體顏料之體積分率為20%以下之組成物所得者,膜厚為12μm以上且250μm以下,層合後之上述薄膜表面的表面粗糙度Ra為30nm以下,上述金屬基板係
次直型薄膜太陽能電池或頂部發光型有機EL元件所使用。
上述熱可塑性樹脂較佳為聚酯樹脂。
上述層合後之薄膜表面的表面粗糙度Ra較佳為10nm以下。
有關本發明之金屬基板係藉由層合特定薄膜於金屬板,金屬基板的表面變為平滑,進而成為金屬基板為具有絕緣性者。藉由使用此加工性優異之金屬基板,變成可以低成本得到薄膜太陽能電池或有機EL元件。
本發明的金屬基板係次直型薄膜太陽能電池或頂部發光型有機EL元件所使用者,其係於金屬板之至少一側的面透過接著劑層合1層的熱可塑性樹脂薄膜者。
本發明的金屬基板所使用之金屬板為冷軋鋼板、熔融純鋅鍍敷鋼板(GI)、或合金化熔融Zn-Fe鍍敷鋼板(GA)、合金化熔融Zn-5%Al鍍敷鋼板(GF)、電鍍純鋅鋼板(EG)、電鍍Zn-Ni鋼板、鋁板、鈦板、鍍鋁鋅(Galvalume)鋼板等,雖然較佳為無鉻酸鹽者,但亦可使用鉻酸鹽處理或者無處理者。金屬板的厚度雖並未特別
限定,但可適合使用0.3~2.5mm左右者。
本發明所使用之接著劑中含有樹脂。樹脂雖並未特別限定,但可列舉聚烯烴樹脂、聚酯樹脂、聚苯乙烯樹脂、聚胺基甲酸乙酯樹脂等,較佳為聚烯烴樹脂或聚酯樹脂。接著劑形成用組成物中之固體含量較佳為15~35質量%,更佳為20~30質量%。
聚酯樹脂係藉由二元酸等之多元酸與多元醇類的縮合反應所得到者。
作為聚酯樹脂之原料所使用之多元酸,例如雖可列舉馬來酸、馬來酸酐、富馬酸、衣康酸、衣康酸酐等之α,β-不飽和二元酸;苯二甲酸、苯二甲酸酐、鹵化苯二甲酸酐、異苯二甲酸、對苯二甲酸、四氫苯二甲酸、四氫苯二甲酸酐、六氫苯二甲酸、六氫異苯二甲酸、六氫對苯二甲酸、環戊二烯-馬來酸酐加成物、丁二酸、丙二酸、戊二酸、己二酸、癸二酸、1,10-癸烷二羧酸、2,6-萘二羧酸、2,7-萘二羧酸、2,3-萘二羧酸、2,3-萘二羧酸酐、4,4’-聯苯基二羧酸、及、此等之二烷基酯等之飽和二元酸等,但並未特別限定。多元酸可僅一種使用,適當的話亦可混合二種以上使用。
作為聚酯樹脂的原料所使用之多元醇類,例如雖可列舉乙二醇、二乙二醇、聚乙二醇等之乙二醇類、丙二醇、二丙二醇、聚丙二醇等之丙二醇類、2-甲基-1,3-
丙二醇、1,3-丁二醇、雙酚A與環氧丙烷或環氧乙烷的加成物、甘油、三羥甲基丙烷、1,3-丙二醇、1,2-環己烷二醇、1,3-環己烷二醇、1,4-環己烷二醇、對二甲苯二醇、雙環己基-4,4’-二醇、2,6-十氫萘二醇、參(2-羥乙基)異氰脲酸酯等,並未特別限定。又,可使用乙醇胺等之胺基醇類。此等多元醇類可僅使用一種,適當的話亦可混合二種以上。又,視必要亦可進行藉由環氧樹脂、二異氰酸酯、二環戊二烯等之改質。
作為於本發明所使用之接著劑,可適當使用各種市售品。尤其是作為接著劑的市售品,例如可列舉熱可塑性聚酯系熱熔膠接著劑即東亞合成公司製Aron melt(註冊商標)PES系列、將改質烯烴作為主成分之熱熔膠接著劑即東亞合成公司製Aron melt(註冊商標)PPET系列、東亞合成公司製Aron Mighty(註冊商標)FS-175SV10、東亞合成公司製Aron Mighty(註冊商標)AS-60等。
將上述市售品作為接著劑使用時,將此等之市售品以甲基乙基酮、甲基異丁基酮、甲苯、二甲苯等之稀釋劑稀釋者塗佈於金屬板。
作為於本發明所使用之熱可塑性樹脂薄膜,雖並未特別限定,但可列舉聚酯薄膜、聚乙烯薄膜、聚丙烯薄膜、聚苯乙烯薄膜、聚乙烯醇系薄膜、聚氯乙烯薄膜、聚偏二
氯乙烯薄膜、氟樹脂薄膜、纖維素系薄膜、聚碳酸脂薄膜、聚醯胺薄膜等。此等當中可適合使用者為聚酯薄膜,更佳為聚對苯二甲酸乙二酯(PET)薄膜或聚萘二甲酸乙二酯(PEN)薄膜,再更佳為PEN薄膜。聚酯薄膜製作所使用之聚酯樹脂可用與上述之接著劑所使用之聚酯樹脂的製法相同的製法來製造。
於本發明所使用之熱可塑性樹脂薄膜較佳係薄膜單體(於接著於金屬板前的狀態的薄膜)的表面粗糙度Ra為30nm以下,更佳為薄膜單體的表面粗糙度Ra為10nm以下。使用薄膜單體的表面粗糙度Ra超過30nm之薄膜製造金屬基板時,金屬基板的表面粗糙度Ra變過大,在接著薄膜於金屬基板狀態之薄膜表面的凹凸變成原因,恐有因電極間的短路招致發生故障之虞。
作為於本發明所使用之熱可塑性樹脂薄膜,可適合使用各種之市售品。尤其是作為聚酯樹脂之市售品,例如可列舉Unitika公司製Emblet(註冊商標)P652、帝人杜邦薄膜公司製Teonex(註冊商標)Q65FA等。
經層合之熱可塑性樹脂薄膜的膜厚為12μm以上且250μm以下。膜厚未達12μm時,恐有於熱可塑性樹脂薄膜存在缺陷部分之虞,而導致金屬基板的耐電壓未達0.1kV,恐有無法確保耐電壓(絕緣耐性)之虞。又,膜厚超過250μm時,將金屬基板進行切斷加工時,變成易發生薄膜的切斷,恐有金屬基板之製造線的生產效率降低
之虞。
於本發明的金屬基板,必須薄膜表面為平滑。具體而言,與金屬基板接著之薄膜(層合後之薄膜)的表面粗糙度Ra為30nm以下,較佳為與金屬基板接著之薄膜的表面粗糙度Ra為10nm以下。與金屬基板接著之薄膜的表面粗糙度Ra超過30nm時,薄膜表面的凹凸變成原因,恐有因電極間的短路招致發生故障之虞。尚,對於藉由附著塵或垃圾等之粒子所產生之表面的凹凸,由於塵或垃圾等之粒子遠較30nm左右更大,可藉由研磨等之平滑化輕易去除。因此,因塵或垃圾等之粒子導致之凹凸,與導致發生故障之虞極為低。對於與金屬基板接著之薄膜的表面粗糙度Ra,可藉由後述之測定方法測定。
將薄膜表面變為平滑,具體而言,為了將薄膜表面的表面粗糙度Ra定為30nm以下,較佳為薄膜中未含有固體顏料。惟,必須使用著色薄膜時,較佳為將薄膜形成用組成物中之固體顏料的體積分率定為20%以下。由於固體顏料的粒徑通常較30nm更大,薄膜形成用組成物中之固體顏料的體積分率超過20%時,將薄膜表面的表面粗糙度Ra定為30nm以下變困難。
作為用以著色於下述各種顏色之顏料種類之
例,可列舉白色:氧化鈦、碳酸鈣、氧化鋅、硫酸鋇、鋅鋇白、鉛白等之無機系顏料、黑色:苯胺黑(Aniline black)、苯胺黑(Nigrosine)等之有機系顏料、碳黑、鐵黑等之無機系顏料、紅色:不溶性偶氮系(萘酚系及苯胺化物系)或溶性偶氮系等之有機系顏料、或鐵丹、鎘紅、紅丹等之無機系顏料、黃色:不溶性偶氮系(萘酚系及苯胺化物系)、溶性偶氮系、喹吖啶酮系等之有機系顏料、或鉻黃、鎘黃、鎳鈦黃、黃丹、鍶鉻酸鹽等之無機系顏料、綠色:有機酞菁系顏料、青色:有機酞菁系顏料、雙噁嗪系顏料、鐵藍、群青、鈷藍、翡翠綠等之無機系顏料、橙色:苯并咪唑酮系、吡唑啉酮系等之有機系顏料等。上述著色顏料當中,即使同顏色為化學構造不同者、或者藉由將不同顏色之著色顏料以2種以上適當之摻合比混合,可著色成灰色、茶色、紫色、紅紫色、青紫色、橙色、黃金色等所期望之顏色。
例如,氧化鈦中,推薦平均粒徑例如為粒狀時大概為0.1~0.5μm,較佳為0.2μm以上、0.4μm以下,更佳為0.2μm以上、0.3μm以下。平均粒徑超過0.5μm時,將由包含氧化鈦之薄膜形成用組成物所形成之薄膜表面的表面粗糙度Ra定為30nm以下變為困難。
於此,上述氧化鈦之平均粒徑係意指藉由一般粒度分布計測定分級後之氧化鈦粒子的粒度分布,從根據該測定結果所算出之小粒徑側之積算值50%的粒度(D50)。該粒度分布可藉由讓粒子照到光所產生之繞射
或散射的強度圖型來測定,作為如此之粒度分布計,例如例示有日機裝公司製之Micro track 9220FRA或Micro track HRA等。
尚,滿足上述較佳平均粒徑之氧化鈦,可作為市售品使用,例如可列舉Tayca公司製之TITANIX(註冊商標)JR-301(平均粒徑0.30μm)、JR-603(平均粒徑0.28μm)、JR-806(平均粒徑0.25μm)、JRNC(平均粒徑0.37μm)等。
尚,為了抑制顏料的偏析,可於薄膜形成用組成物添加顏料分散劑。適合之顏料分散劑係選自由水溶性丙烯酸樹脂、水溶性苯乙烯丙烯酸樹脂及非離子系界面活性劑所構成之群組中之1種以上。使用此等時,變成殘存顏料分散劑於著色塗膜。
耐電壓係已由後述之方法測定,較佳為0.1kV以上。更佳為0.3kV以上,再更佳為1.0kV以上。耐電壓未達0.1kV時,恐有因電極間的短路招致發生故障之虞。
塗佈接著劑於金屬板上,然後進行燒附,再藉由接著薄膜於接著劑之上,可製得有關本發明之金屬基板。
對金屬板上之接著劑的塗佈並未特別限制,可適當採用既知之方法。作為組成物之塗佈方法,例如可
列舉棒塗佈機法、輥塗機法、簾式流塗機法、噴霧法、噴霧環(Spray Ringer)法等,此等當中,從成本等之觀點來看,較佳為棒塗佈機法、輥塗機法、噴霧環法。
塗佈接著劑後,再進行燒附。作為接著劑的燒附溫度,例如較佳為80℃以上且200℃以下,更佳為100℃以上且180℃以下。由此燒附,製得塗裝接著劑於金屬板上之接著劑塗裝金屬板。尚,燒附溫度為到達板溫(Peak Metal Temperature:PMT)。
其次,將薄膜接著於接著劑塗裝金屬板之接著劑塗佈面上。作為對接著劑塗裝金屬板之薄膜的接著方法,並未特別限制,雖可適當採用既知之方法,但較佳為加壓接著法。加壓接著法雖為以呈特定時間、特定溫度狀態加壓於特定壓力以進行接著之方法,但加壓接著法較佳為於80℃以上且200℃以下進行,更佳為100℃以上且180℃以下。又,加壓接著法較佳為於5分鐘以下進行,更佳為3分鐘以下。加壓接著法較佳為於0.5kgf/cm2以上且100kgf/cm2以下的壓力進行,更佳為1kgf/cm2以上且50kgf/cm2以下。
對於具備有關本發明之金屬基板的次直型薄膜太陽能電池進行說明。次直型太陽能電池若為具備有關本發明之金屬基板者,可為公知之任一種構造,例如基本上於有關本發明之金屬基板的薄膜上,以背面電極、光電變換層、
透明電極的順序層合之構造。光電變換層係通過透明電極吸收經到達之光而產生電流之層,背面電極及透明電極皆為用以取出以光電變換層所產生之電流者,皆由導電性材料所構成。光入射側之透明電極必須具有透光性。對於背面電極、光電變換層、透明電極,可使用與公知之次直型薄膜太陽能電池相同的材料。
背面電極為未被特別限制者,例如可使用Mo、Cr、W等之金屬、及組合此等之金屬者。背面電極可為單層構造,亦可為2層構造等之層合構造。背面電極的厚度雖並未被特別限制,但厚度較佳為0.1μm以上,更佳為0.45~1.0μm。
光電變換層的構成並未被特別限制,例如為至少1種黃銅礦構造之化合物半導體。又,光電變換層可為由Ib族元素與IIIb族元素與VIb族元素所構成之至少1種化合物半導體。
進而由於得到光吸收率高、且高光電變換效率,光電變換層較佳為由選自由Cu及Ag所構成之群組中之1種Ib族元素、與選自由Al、Ga及In所構成之群組中之1種IIIb族元素、與選自由S、Se、及Te所構成之群組中之1種VIb族元素所構成之至少1種化合物半導體。作為此化合物半導體,可列舉CuAlS2、CuGaS2、CuInS2、CuAlSe2、CuGaSe2、CuInSe2(CIS)、AgAlS2、AgGaS2、AgInS2、AgAlSe2、AgGaSe2、AgInSe2、AgAlTe2、AgGaTe2、AgInTe2、Cu(In1-xGax)Se2(CIGS)、
Cu(In1-xAlx)Se2、Cu(In1-xGax)(S、Se)2、Ag(In1-xGax)Se2、及Ag(In1-xGax)(S、Se)2等。
透明電極例如藉由添加Al、B、Ga、Sb等之ZnO、ITO(銦-錫氧化物)、或SnO2及組合此等所構成。透明電極可為單層構造,亦可為2層構造等之層合構造。又,透明電極的厚度雖並未被特別限制,但較佳為0.3~1μm。
次直型薄膜太陽能電池可用公知之方法製得,例如可用以下之製造方法製得次直型薄膜太陽能電池。首先,於有關本發明之金屬基板之上,由濺鍍法、真空蒸鍍法、熱CVD法、濕式塗佈法等自以往所知之方法形成背面電極。其次,於背面電極之上由濺鍍法、真空蒸鍍法、熱CVD法、濕式塗佈法等自以往所知之方法形成光電變換層。接著,於光電變換層之上由濺鍍法、真空蒸鍍法、熱CVD法、濕式塗佈法等自以往所知之方法形成透明電極。
尚,透明電極之形成時為了保護光電變換層,可於光電變換層與透明電極之間設置緩衝層。又,可於透明電極之上設置密封材料。
有關本發明之金屬基板亦可適用於頂部發光型有機EL元件。如此之頂部發光型有機EL元件若為具備有關本發明之金屬基板者,可為公知之任一種構造,例如基本上
於有關本發明之金屬基板的薄膜上,係以電極、有機層、透明導電膜的順序層合者。對於電極、有機層、透明導電膜,可使用與公知之頂部發光型薄膜太陽能電池相同之材料。於頂部發光型有機EL元件,由於光係透過透明導電性膜取出(並非透過基板),作為基板可使用並非透明之金屬板。
電極例如係銦-錫氧化物(ITO)、銦-鋅氧化物(IZO)、錫氧化物、Au等金屬之極薄膜、導電性高分子、導電性之有機材料、含有摻雜劑(供體或受體)之有機層、導電體與導電性有機材料(包含高分子)之混合物、或此等之層合體等作為材料使用。電極可將此等材料使用濺鍍法或離子鍍法等之氣相成長法成膜。
有機層之有機發光層,例如係將蒽、萘、芘、稠四苯、蔻、苝、酞苝(Phthaloperylene)、萘苝(Naphthaloperylene)、二苯基丁二烯、四苯基丁二烯、香豆素、惡二唑、雙苯並噁唑啉、雙苯乙烯基、環戊二烯、喹啉金屬錯合物、參(8-羥喹啉根(Hydroxyquinolinate))鋁錯合物、參(4-甲基-8-喹啉根)鋁錯合物、參(5-苯基-8-喹啉根)鋁錯合物、胺基喹啉金屬錯合物、苯并喹啉金屬錯合物、三-(p-三聯苯-4-基)胺、吡喃、喹吖啶酮、紅熒烯、及此等之衍生物、或者1-芳基-2,5-二(2-噻吩基)吡咯衍生物、二苯乙烯基苯衍生物、苯乙烯基亞芳基衍生物、苯乙烯基胺衍生物、及於分子之一部分具有由此等之發光性化合物所構成之基之
化合物或者高分子等來作為材料使用。進而不僅使用來自上述化合物所代表之螢光色素的化合物,亦即燐光發光材料例如亦使用Ir錯合物、Os錯合物、Pt錯合物、銪錯合物等之發光材料、或是於分子內具有該等之化合物或高分子。有機層可藉由濺鍍法、真空蒸鍍法等自以往所知之方法形成。尚,有機層除了有機發光層之外,亦可包含電洞注入層、電洞傳遞層、電子輸送層、電子注入層等。
透明導電膜係組合Al或銀等之單體、或Al或銀等與其他電極材料,以構成層合構造者來作為材料使用。電極材料的組合,可列舉鹼金屬與Al之層合體、鹼金屬與銀之層合體、鹼金屬之鹵化物與Al之層合體、鹼金屬之氧化物與Al之層合體、鹼土類金屬或稀土類金屬與Al之層合體、此等之金屬種與其他金屬之合金等。具體而言,例如可列舉鈉、鈉-鉀合金、鋰、鎂等與Al之層合體、鎂-銀混合物、鎂-銦混合物、鋁-鋰合金、LiF與Al之混合物、Al與Al2O3之混合物等。透明導電膜可藉由濺鍍法、真空蒸鍍法等自以往所知之方法形成。
本案係根據2014年3月31日所申請之日本國專利申請第2014-073359號而主張優先權之利益者。2014年3月31日所申請之日本國專利申請第2014-073359號說明書之全部內容為了參考而援用於本案。
以下雖列舉實施例更具體說明本發明,但本發明並非被限定於下述實施例者,亦可於可適合前、後述之趣旨之範圍進行適當變更來實施,該等任一種皆包含在本發明的技術的範圍。又,於實施例所使用之評價方法係如以下所述。
於後述的製造方法製得尺寸50mm×50mm×0.8mm之測試材料後,依據JIS規格C2110-1,於測試材料一側的面使外徑20mm之球形電極以荷重500gf接觸之狀態,使用絕緣破壞試驗裝置,以20~40秒左右以引起絕緣破壞的方式用一定速度對厚度方向施加直流電壓,測定產生絕緣破壞時之電壓。進行5次上述電壓測定,並將其平均值作為耐電壓。
針對以後述的製造方法所得之測試材料,使用原子力顯微鏡(Atomic Force Microscope、AFM)(精工電子工業製SPI3800N),對於層合測試材料之薄膜側的表面,測定10μm×10μm區域之任意3處的表面粗糙度,將其平均值作為平均表面粗糙度Ra。
將電鍍鋅鋼板(板厚0.8mm)作為金屬板,於金屬板
的表面,混合有將烯烴樹脂作為主成分之熱可塑性接著劑(東亞合成公司製Aronmelt(註冊商標)PPET(註冊商標)1505SG28)70質量%與甲基乙基酮30質量%之分散液,使用安田精機製作所公司製棒塗佈機紗數60進行塗佈,再以到達板溫(Peak Metal Temperature:PMT)成為100℃的方式進行燒附、乾燥2分鐘,而得到接著劑的膜厚為5.7μm之接著劑塗裝金屬板1。將接著劑塗裝金屬板1的製作條件、物性等示於表1。
將電鍍鋅鋼板(板厚0.8mm)作為金屬板,於金屬板的表面,混合有將聚酯樹脂作為主成分之熱可塑性接著劑(東亞合成公司製Aron melt(註冊商標)PPET(註冊商標)360HVXM30)90質量%與甲基乙基酮10質量%之分散液,使用安田精機製作所公司製棒塗佈機紗數60進行塗佈,再以到達板溫(Peak Metal Temperature:PMT)成為100℃的方式進行燒附、乾燥2分鐘,而得到接著劑的膜厚為12.4μm之接著劑塗裝金屬板2。將接著劑塗裝金屬板2的製作條件、物性等示於表1。
在接著劑塗裝金屬板2,除了將分散液變更為混合有熱可塑性接著劑(東亞合成公司製Aronmelt(註冊商標)PES(註冊商標)360HVXM30)50質量%與甲基乙基酮
50質量%之分散液的點之外,其他與接著劑塗裝金屬板2同樣進行而得到接著劑的膜厚為7.0μm之接著劑塗裝金屬板3。將接著劑塗裝金屬板3的製作條件、物性等示於表1。
在接著劑塗裝金屬板2,除了將分散液變更為混合有熱可塑性接著劑(東亞合成公司製Aronmelt(註冊商標)PES(註冊商標)360HVXM30)70質量%與甲基乙基酮30質量%之分散液,改使用棒塗佈機紗數30的點之外,其他與接著劑塗裝金屬板2同樣進行而得到接著劑的膜厚為4.9μm之接著劑塗裝金屬板4。將接著劑塗裝金屬板4的製作條件、物性等示於表1。
在接著劑塗裝金屬板2,除了將分散液變更為混合有熱可塑性接著劑(東亞合成公司製Aronmelt(註冊商標)PES(註冊商標)360HVXM30)70質量%與甲基乙基酮30質量%之分散液,改使用棒塗佈機紗數20的點之外,其他與接著劑塗裝金屬板2同樣進行而得到接著劑的膜厚為3.2μm之接著劑塗裝金屬板5。將接著劑塗裝金屬板5的製作條件、物性等示於表1。
在接著劑塗裝金屬板2,除了將分散液變更為混合有熱可塑性接著劑(東亞合成公司製Aronmelt(註冊商標)PES(註冊商標)360HVXM30)70質量%與甲基乙基酮30質量%之分散液,改使用棒塗佈機紗數10的點之外,其他與接著劑塗裝金屬板2同樣進行而得到接著劑的膜厚為1.6μm之接著劑塗裝金屬板6。將接著劑塗裝金屬板6的製作條件.物性等示於表1。
承載25μm之PET薄膜1(Unitika公司製Emblet(註冊商標)P652:表面粗糙度Ra 20nm)於接著劑塗裝金屬板1之接著劑塗佈面上,於溫度180℃、壓力10kgf/cm2的條件下,藉由進行1分鐘加壓接著,使接著劑塗裝金屬板1與PET薄膜進行接著而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結
果示於表2。
在實施例1,除了改使用接著劑塗裝金屬板2取代接著劑塗裝金屬板1之外,其他與實施例1同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
承載100μm之PET薄膜1(帝人杜邦薄膜公司製Teonex(註冊商標)Q65FA:表面粗糙度Ra 1.2nm)於接著劑塗裝金屬板1之接著劑塗佈面上,於溫度180℃、壓力50kgf/cm2的條件下,藉由進行1分鐘加壓接著,使接著劑塗裝金屬板1與PET薄膜進行接著而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
在實施例3,除了改使用接著劑塗裝金屬板2取代接著劑塗裝金屬板1之外,其他與實施例3同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
承載100μm之PET薄膜(Q65FA)於接著劑塗裝金屬板3之接著劑塗佈面上,於溫度100℃、壓力1kgf/cm2的條件下,藉由進行1分鐘加壓接著,使接著劑塗裝金屬板3與PET薄膜進行接著而得到金屬基板。將所得之金屬板的物性、評價結果示於表2。
在實施例5,除了將加壓接著時之溫度變更為120℃、140℃的點之外,其他與實施例5同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
如表2所記載,在實施例5,除了變更接著劑塗裝金屬板、加壓接著時之溫度的至少一種之外,其他與實施例5同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
在實施例4,除了將加壓接著時之溫度定為100℃、120℃、140℃,加壓接著時之壓力變更為1kgf/cm2的點之外,其他與實施例4同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
在實施例1,除了改使用50μm之PET薄膜2(Unitika公司製E5101:表面粗糙度Ra 50nm)來取代25μm之PET薄膜1的點之外,其他與實施例1同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
在實施例2,除了改使用50μm之PET薄膜2(E5101)來取代25μm之PET薄膜1的點之外,其他與實施例2同樣進行而得到金屬基板。將金屬基板的製作條件、所得之金屬基板的物性、評價結果示於表2。
藉由層合特定皮膜於金屬板,使皮膜的表面變為平滑,同時成為皮膜為具有絕緣性之金屬基板,可用在次直型薄膜太陽能電池或頂部發光型有機EL元件。
Claims (3)
- 一種次直型(Sub Straight)薄膜太陽能電池或頂部發光型(Top emission)有機EL元件所使用之金屬基板,其特徵為於金屬板的表面透過接著劑層合1層的熱可塑性樹脂薄膜,上述薄膜係由固體顏料之體積分率為20%以下之組成物所得者,膜厚為12μm以上且250μm以下,層合後之上述薄膜表面的表面粗糙度Ra為30nm以下。
- 如請求項1之金屬基板,其中,上述熱可塑性樹脂為聚酯樹脂。
- 如請求項1或2之金屬基板,其中,上述層合後之薄膜的表面粗糙度Ra為10nm以下。
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JP5853567B2 (ja) * | 2011-10-11 | 2016-02-09 | 日新製鋼株式会社 | 有機el素子用基板及びその製造方法、並びに有機el素子 |
CN105102218B (zh) * | 2013-03-28 | 2017-11-21 | 株式会社神户制钢所 | 金属基板、使用其的衬底型薄膜太阳能电池及顶部发光型有机el元件 |
CN103522658B (zh) * | 2013-09-18 | 2017-02-15 | 东莞市安派电子有限公司 | 一种金属穿孔式太阳能电池用背板及其制备方法 |
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2014
- 2014-03-31 JP JP2014073359A patent/JP6510760B2/ja active Active
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2015
- 2015-03-16 CN CN201580016824.0A patent/CN106165112B/zh active Active
- 2015-03-16 WO PCT/JP2015/057684 patent/WO2015151773A1/ja active Application Filing
- 2015-03-16 MY MYPI2016703535A patent/MY181305A/en unknown
- 2015-03-16 KR KR1020187036144A patent/KR20180135122A/ko not_active Application Discontinuation
- 2015-03-16 KR KR1020167027058A patent/KR20160129870A/ko active Application Filing
- 2015-03-26 TW TW104109762A patent/TWI598464B/zh active
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TWI598464B (zh) | 2017-09-11 |
KR20180135122A (ko) | 2018-12-19 |
WO2015151773A1 (ja) | 2015-10-08 |
MY181305A (en) | 2020-12-21 |
CN106165112B (zh) | 2019-05-10 |
JP6510760B2 (ja) | 2019-05-08 |
KR20160129870A (ko) | 2016-11-09 |
JP2015195315A (ja) | 2015-11-05 |
CN106165112A (zh) | 2016-11-23 |
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