TW201118381A - Test device for high-frequency vertical probe card - Google Patents
Test device for high-frequency vertical probe card Download PDFInfo
- Publication number
- TW201118381A TW201118381A TW98138864A TW98138864A TW201118381A TW 201118381 A TW201118381 A TW 201118381A TW 98138864 A TW98138864 A TW 98138864A TW 98138864 A TW98138864 A TW 98138864A TW 201118381 A TW201118381 A TW 201118381A
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- insulating material
- conductive
- tip
- probe card
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 114
- 238000012360 testing method Methods 0.000 title claims abstract description 36
- 239000004020 conductor Substances 0.000 claims abstract description 26
- 239000004744 fabric Substances 0.000 claims abstract description 17
- 239000011810 insulating material Substances 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 12
- 239000012212 insulator Substances 0.000 claims description 3
- 239000012777 electrically insulating material Substances 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims 2
- 239000000919 ceramic Substances 0.000 claims 1
- 229910052742 iron Inorganic materials 0.000 claims 1
- 239000008267 milk Substances 0.000 claims 1
- 210000004080 milk Anatomy 0.000 claims 1
- 235000013336 milk Nutrition 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 abstract description 3
- 239000012774 insulation material Substances 0.000 abstract 4
- 238000005259 measurement Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 229920002799 BoPET Polymers 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000005041 Mylar™ Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000013065 commercial product Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 210000000003 hoof Anatomy 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98138864A TW201118381A (en) | 2009-11-16 | 2009-11-16 | Test device for high-frequency vertical probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98138864A TW201118381A (en) | 2009-11-16 | 2009-11-16 | Test device for high-frequency vertical probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201118381A true TW201118381A (en) | 2011-06-01 |
| TWI416115B TWI416115B (https=) | 2013-11-21 |
Family
ID=44935625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98138864A TW201118381A (en) | 2009-11-16 | 2009-11-16 | Test device for high-frequency vertical probe card |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201118381A (https=) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109752574A (zh) * | 2017-11-07 | 2019-05-14 | 特克特朗尼克公司 | 探头末端和探头组件 |
| TWI730806B (zh) * | 2020-06-10 | 2021-06-11 | 中華精測科技股份有限公司 | 具有懸臂式探針的垂直式探針卡 |
| CN113092982A (zh) * | 2020-01-09 | 2021-07-09 | 珠海格力电器股份有限公司 | 一种测试座以及测试设备 |
| TWI799834B (zh) * | 2020-05-22 | 2023-04-21 | 南韓商李諾工業股份有限公司 | 測試座以及其製造方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105588957B (zh) * | 2014-11-12 | 2019-03-22 | 致伸科技股份有限公司 | 测试座 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI236723B (en) * | 2002-10-02 | 2005-07-21 | Renesas Tech Corp | Probe sheet, probe card, semiconductor inspection device, and manufacturing method for semiconductor device |
| JP4405358B2 (ja) * | 2004-09-30 | 2010-01-27 | 株式会社ヨコオ | 検査ユニット |
| JP2008070146A (ja) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | 検査用ソケット |
-
2009
- 2009-11-16 TW TW98138864A patent/TW201118381A/zh unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109752574A (zh) * | 2017-11-07 | 2019-05-14 | 特克特朗尼克公司 | 探头末端和探头组件 |
| CN113092982A (zh) * | 2020-01-09 | 2021-07-09 | 珠海格力电器股份有限公司 | 一种测试座以及测试设备 |
| TWI799834B (zh) * | 2020-05-22 | 2023-04-21 | 南韓商李諾工業股份有限公司 | 測試座以及其製造方法 |
| TWI730806B (zh) * | 2020-06-10 | 2021-06-11 | 中華精測科技股份有限公司 | 具有懸臂式探針的垂直式探針卡 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI416115B (https=) | 2013-11-21 |
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