TWI416115B - - Google Patents

Info

Publication number
TWI416115B
TWI416115B TW98138864A TW98138864A TWI416115B TW I416115 B TWI416115 B TW I416115B TW 98138864 A TW98138864 A TW 98138864A TW 98138864 A TW98138864 A TW 98138864A TW I416115 B TWI416115 B TW I416115B
Authority
TW
Taiwan
Prior art keywords
probe
main body
insulation material
conductive
circuit board
Prior art date
Application number
TW98138864A
Other languages
English (en)
Chinese (zh)
Other versions
TW201118381A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98138864A priority Critical patent/TW201118381A/zh
Publication of TW201118381A publication Critical patent/TW201118381A/zh
Application granted granted Critical
Publication of TWI416115B publication Critical patent/TWI416115B/zh

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW98138864A 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card TW201118381A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Publications (2)

Publication Number Publication Date
TW201118381A TW201118381A (en) 2011-06-01
TWI416115B true TWI416115B (https=) 2013-11-21

Family

ID=44935625

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Country Status (1)

Country Link
TW (1) TW201118381A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105588957A (zh) * 2014-11-12 2016-05-18 致伸科技股份有限公司 测试座

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019086519A (ja) * 2017-11-07 2019-06-06 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験プローブ及び試験プローブ・チップ
CN113092982B (zh) * 2020-01-09 2022-03-18 珠海格力电器股份有限公司 一种测试座以及测试设备
TWI799834B (zh) * 2020-05-22 2023-04-21 南韓商李諾工業股份有限公司 測試座以及其製造方法
TWI730806B (zh) * 2020-06-10 2021-06-11 中華精測科技股份有限公司 具有懸臂式探針的垂直式探針卡

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200617397A (en) * 2004-09-30 2006-06-01 Yokowo Seisakusho Kk Inspection unit
CN1281966C (zh) * 2002-10-02 2006-10-25 株式会社瑞萨科技 探针片、探针卡及半导体检查装置
TW200813458A (en) * 2006-09-12 2008-03-16 Yokowo Seisakusho Kk Socket for use in inspection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1281966C (zh) * 2002-10-02 2006-10-25 株式会社瑞萨科技 探针片、探针卡及半导体检查装置
TW200617397A (en) * 2004-09-30 2006-06-01 Yokowo Seisakusho Kk Inspection unit
TW200813458A (en) * 2006-09-12 2008-03-16 Yokowo Seisakusho Kk Socket for use in inspection

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105588957A (zh) * 2014-11-12 2016-05-18 致伸科技股份有限公司 测试座
CN105588957B (zh) * 2014-11-12 2019-03-22 致伸科技股份有限公司 测试座

Also Published As

Publication number Publication date
TW201118381A (en) 2011-06-01

Similar Documents

Publication Publication Date Title
CN201207715Y (zh) 射频测试系统及其射频测试电路
US9500675B2 (en) Probe module supporting loopback test
MY162914A (en) Wiring board for testing loaded printed circuit board
MX2011007564A (es) Conector de telecomunicaciones.
TWI416115B (https=)
MY138790A (en) Inspection unit for high frequency/high speed device connections
TW201617624A (zh) 懸臂式高頻探針卡
US9470716B2 (en) Probe module
US9442134B2 (en) Signal path switch and probe card having the signal path switch
US20150168454A1 (en) Probe module
WO2012081864A3 (ko) 반도체 검사 장치
CN104714057B (zh) 测试治具
WO2009008193A1 (ja) 体液採取用回路基板
TW200708745A (en) Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board
TW201418723A (zh) 低電源損耗之探針卡結構
MY175570A (en) Multiple rigid contact solution for ic testing
CN103808992B (zh) 低电源损耗的探针卡结构
JP2010164490A5 (https=)
TWI416120B (https=)
CN101656365B (zh) 一种方便测试的电连接器
TW201522980A (zh) 探針模組（二）
TWI405971B (https=)
CN204964691U (zh) Gis局部放电监测装置
TW201502523A (zh) 可切換訊號路徑之探針卡
TWI515436B (zh) Detect fixture