TW200824082A - Manufacturing method of semiconductor device - Google Patents
Manufacturing method of semiconductor device Download PDFInfo
- Publication number
- TW200824082A TW200824082A TW096141633A TW96141633A TW200824082A TW 200824082 A TW200824082 A TW 200824082A TW 096141633 A TW096141633 A TW 096141633A TW 96141633 A TW96141633 A TW 96141633A TW 200824082 A TW200824082 A TW 200824082A
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- substrate
- conductive layer
- semiconductor device
- manufacturing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/095—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers of vias therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/129—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01215—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps forming coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01225—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006303139A JP4758869B2 (ja) | 2006-11-08 | 2006-11-08 | 半導体装置の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200824082A true TW200824082A (en) | 2008-06-01 |
Family
ID=38982849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096141633A TW200824082A (en) | 2006-11-08 | 2007-11-05 | Manufacturing method of semiconductor device |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20080182400A1 (https=) |
| EP (1) | EP1921670A2 (https=) |
| JP (1) | JP4758869B2 (https=) |
| KR (1) | KR20080041991A (https=) |
| CN (1) | CN101179036A (https=) |
| TW (1) | TW200824082A (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8692135B2 (en) * | 2008-08-27 | 2014-04-08 | Nec Corporation | Wiring board capable of containing functional element and method for manufacturing same |
| US9299661B2 (en) * | 2009-03-24 | 2016-03-29 | General Electric Company | Integrated circuit package and method of making same |
| JP5237242B2 (ja) | 2009-11-27 | 2013-07-17 | 日東電工株式会社 | 配線回路構造体およびそれを用いた半導体装置の製造方法 |
| EP2563464B1 (en) * | 2010-04-30 | 2018-06-06 | Second Sight Medical Products, Inc. | Improved biocompatible bonding method |
| TWI557855B (zh) * | 2011-12-30 | 2016-11-11 | 旭德科技股份有限公司 | 封裝載板及其製作方法 |
| KR102015812B1 (ko) * | 2012-10-05 | 2019-08-30 | 한국전자통신연구원 | 회로보드, 그 제조방법, 및 이를 포함하는 반도체 패키지 |
| WO2014155619A1 (ja) * | 2013-03-28 | 2014-10-02 | 株式会社安川電機 | 半導体装置、電力変換装置および半導体装置の製造方法 |
| CN105990288B (zh) | 2015-01-30 | 2019-03-12 | 日月光半导体制造股份有限公司 | 半导体衬底及其制造方法 |
| JP2017126688A (ja) * | 2016-01-15 | 2017-07-20 | 株式会社ジェイデバイス | 半導体パッケージの製造方法及び半導体パッケージ |
| US12107037B2 (en) * | 2021-11-03 | 2024-10-01 | Amkor Technology Singapore Holding Pte. Ltd. | Semiconductor devices and methods of manufacturing electronic devices |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5796590A (en) * | 1996-11-05 | 1998-08-18 | Micron Electronics, Inc. | Assembly aid for mounting packaged integrated circuit devices to printed circuit boards |
| JP2001339011A (ja) * | 2000-03-24 | 2001-12-07 | Shinko Electric Ind Co Ltd | 半導体装置およびその製造方法 |
| JP2002050716A (ja) * | 2000-08-02 | 2002-02-15 | Dainippon Printing Co Ltd | 半導体装置及びその作製方法 |
| JP4075306B2 (ja) * | 2000-12-19 | 2008-04-16 | 日立電線株式会社 | 配線基板、lga型半導体装置、及び配線基板の製造方法 |
| JP2004047725A (ja) * | 2002-07-11 | 2004-02-12 | Sumitomo Bakelite Co Ltd | 半導体装置及び製造方法 |
| JP3933094B2 (ja) * | 2003-05-27 | 2007-06-20 | セイコーエプソン株式会社 | 電子部品の実装方法 |
| JP2005064362A (ja) * | 2003-08-19 | 2005-03-10 | Nec Electronics Corp | 電子装置の製造方法及びその電子装置並びに半導体装置の製造方法 |
-
2006
- 2006-11-08 JP JP2006303139A patent/JP4758869B2/ja not_active Expired - Fee Related
-
2007
- 2007-10-22 KR KR1020070105924A patent/KR20080041991A/ko not_active Withdrawn
- 2007-10-24 US US11/923,096 patent/US20080182400A1/en not_active Abandoned
- 2007-11-05 TW TW096141633A patent/TW200824082A/zh unknown
- 2007-11-08 EP EP07021716A patent/EP1921670A2/en not_active Withdrawn
- 2007-11-08 CN CNA2007101637924A patent/CN101179036A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP1921670A2 (en) | 2008-05-14 |
| JP4758869B2 (ja) | 2011-08-31 |
| CN101179036A (zh) | 2008-05-14 |
| KR20080041991A (ko) | 2008-05-14 |
| JP2008124077A (ja) | 2008-05-29 |
| US20080182400A1 (en) | 2008-07-31 |
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