TW200807417A - SRAM having variable power supply and method therefor - Google Patents
SRAM having variable power supply and method therefor Download PDFInfo
- Publication number
- TW200807417A TW200807417A TW096118282A TW96118282A TW200807417A TW 200807417 A TW200807417 A TW 200807417A TW 096118282 A TW096118282 A TW 096118282A TW 96118282 A TW96118282 A TW 96118282A TW 200807417 A TW200807417 A TW 200807417A
- Authority
- TW
- Taiwan
- Prior art keywords
- line
- power supply
- memory
- coupled
- memory unit
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 9
- 230000015654 memory Effects 0.000 claims abstract description 155
- 239000003990 capacitor Substances 0.000 claims description 21
- 230000008878 coupling Effects 0.000 claims description 10
- 238000010168 coupling process Methods 0.000 claims description 10
- 238000005859 coupling reaction Methods 0.000 claims description 10
- 241000239226 Scorpiones Species 0.000 claims 1
- 230000006735 deficit Effects 0.000 claims 1
- 239000011159 matrix material Substances 0.000 claims 1
- 238000011084 recovery Methods 0.000 claims 1
- 230000009467 reduction Effects 0.000 abstract description 2
- 239000004020 conductor Substances 0.000 description 55
- 238000012545 processing Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 4
- 230000002457 bidirectional effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 210000004907 gland Anatomy 0.000 description 1
- 239000010977 jade Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/461,200 US7292485B1 (en) | 2006-07-31 | 2006-07-31 | SRAM having variable power supply and method therefor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200807417A true TW200807417A (en) | 2008-02-01 |
Family
ID=38653438
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096118282A TW200807417A (en) | 2006-07-31 | 2007-05-23 | SRAM having variable power supply and method therefor |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7292485B1 (enExample) |
| JP (1) | JP5179496B2 (enExample) |
| CN (1) | CN101496107B (enExample) |
| TW (1) | TW200807417A (enExample) |
| WO (1) | WO2008016737A2 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8264896B2 (en) * | 2008-07-31 | 2012-09-11 | Freescale Semiconductor, Inc. | Integrated circuit having an array supply voltage control circuit |
| KR20100028416A (ko) * | 2008-09-04 | 2010-03-12 | 삼성전자주식회사 | 반도체 메모리 장치 및 상기 반도체 메모리 장치의 동작 방법 |
| KR101446337B1 (ko) * | 2008-09-08 | 2014-10-02 | 삼성전자주식회사 | 반도체 메모리 장치 및 상기 반도체 메모리 장치의 동작 방법 |
| KR101505554B1 (ko) * | 2008-09-08 | 2015-03-25 | 삼성전자주식회사 | 반도체 메모리 장치 및 상기 반도체 메모리 장치의 동작 방법 |
| US8045402B2 (en) * | 2009-06-29 | 2011-10-25 | Arm Limited | Assisting write operations to data storage cells |
| US20120120702A1 (en) * | 2010-11-13 | 2012-05-17 | Browning Christopher D | Power saving technique in a content addressable memory during compare operations |
| US9017528B2 (en) | 2011-04-14 | 2015-04-28 | Tel Nexx, Inc. | Electro chemical deposition and replenishment apparatus |
| US9005409B2 (en) | 2011-04-14 | 2015-04-14 | Tel Nexx, Inc. | Electro chemical deposition and replenishment apparatus |
| US9303329B2 (en) | 2013-11-11 | 2016-04-05 | Tel Nexx, Inc. | Electrochemical deposition apparatus with remote catholyte fluid management |
| WO2015171684A1 (en) * | 2014-05-07 | 2015-11-12 | Fong John Yit | 4 bit nonvolatile flash or variable resistance memory |
| KR102714216B1 (ko) * | 2016-12-06 | 2024-10-10 | 삼성전자주식회사 | 균일한 쓰기 특성을 갖는 에스램 장치 |
| US10867646B2 (en) * | 2018-03-28 | 2020-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bit line logic circuits and methods |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4094008A (en) * | 1976-06-18 | 1978-06-06 | Ncr Corporation | Alterable capacitor memory array |
| GB2259589A (en) * | 1991-09-12 | 1993-03-17 | Motorola Inc | Self - timed random access memories |
| JP4198201B2 (ja) * | 1995-06-02 | 2008-12-17 | 株式会社ルネサステクノロジ | 半導体装置 |
| JP4162076B2 (ja) | 2002-05-30 | 2008-10-08 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
| JP3906166B2 (ja) * | 2003-02-25 | 2007-04-18 | 株式会社東芝 | 半導体記憶装置 |
| US7333357B2 (en) | 2003-12-11 | 2008-02-19 | Texas Instruments Incorproated | Static random access memory device having reduced leakage current during active mode and a method of operating thereof |
| JP4053510B2 (ja) | 2004-03-23 | 2008-02-27 | 日本テキサス・インスツルメンツ株式会社 | Sram装置 |
| JP2006127460A (ja) * | 2004-06-09 | 2006-05-18 | Renesas Technology Corp | 半導体装置、半導体信号処理装置、およびクロスバースイッチ |
| JP4477456B2 (ja) * | 2004-09-06 | 2010-06-09 | 富士通マイクロエレクトロニクス株式会社 | 半導体メモリ |
| CN100483547C (zh) * | 2004-09-27 | 2009-04-29 | 国际商业机器公司 | 具有改进的单元稳定性的静态随机存取存储器阵列及方法 |
| JP4912016B2 (ja) * | 2005-05-23 | 2012-04-04 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
-
2006
- 2006-07-31 US US11/461,200 patent/US7292485B1/en active Active
-
2007
- 2007-05-10 JP JP2009522905A patent/JP5179496B2/ja active Active
- 2007-05-10 CN CN2007800281906A patent/CN101496107B/zh active Active
- 2007-05-10 WO PCT/US2007/068677 patent/WO2008016737A2/en not_active Ceased
- 2007-05-23 TW TW096118282A patent/TW200807417A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008016737A3 (en) | 2008-07-17 |
| JP2009545834A (ja) | 2009-12-24 |
| CN101496107A (zh) | 2009-07-29 |
| JP5179496B2 (ja) | 2013-04-10 |
| CN101496107B (zh) | 2012-06-13 |
| US7292485B1 (en) | 2007-11-06 |
| WO2008016737A2 (en) | 2008-02-07 |
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