TW200739079A - Test handler and loading method thereof - Google Patents

Test handler and loading method thereof

Info

Publication number
TW200739079A
TW200739079A TW096102885A TW96102885A TW200739079A TW 200739079 A TW200739079 A TW 200739079A TW 096102885 A TW096102885 A TW 096102885A TW 96102885 A TW96102885 A TW 96102885A TW 200739079 A TW200739079 A TW 200739079A
Authority
TW
Taiwan
Prior art keywords
test handler
pitch
semiconductor devices
loading method
test
Prior art date
Application number
TW096102885A
Other languages
English (en)
Other versions
TWI328119B (en
Inventor
Jae-Gyun Shim
Yun-Sung Na
In-Gu Jeon
Tae-Hung Ku
Hyun-Jun Yoo
Original Assignee
Tech Wing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tech Wing Co Ltd filed Critical Tech Wing Co Ltd
Publication of TW200739079A publication Critical patent/TW200739079A/zh
Application granted granted Critical
Publication of TWI328119B publication Critical patent/TWI328119B/zh

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/08—Limitation or suppression of earth fault currents, e.g. Petersen coil
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
TW096102885A 2006-01-25 2007-01-25 Test handler and loading method thereof TWI328119B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060007763A KR100800312B1 (ko) 2006-01-25 2006-01-25 테스트핸들러 및 테스트핸들러의 로딩방법

Publications (2)

Publication Number Publication Date
TW200739079A true TW200739079A (en) 2007-10-16
TWI328119B TWI328119B (en) 2010-08-01

Family

ID=38321427

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096102885A TWI328119B (en) 2006-01-25 2007-01-25 Test handler and loading method thereof

Country Status (5)

Country Link
US (2) US7656150B2 (zh)
JP (2) JP4652348B2 (zh)
KR (1) KR100800312B1 (zh)
CN (2) CN102323534B (zh)
TW (1) TWI328119B (zh)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100541546B1 (ko) * 2003-07-14 2006-01-10 삼성전자주식회사 반도체 디바이스 테스트장치
KR100800312B1 (ko) * 2006-01-25 2008-02-04 (주)테크윙 테스트핸들러 및 테스트핸들러의 로딩방법
KR100771475B1 (ko) * 2006-10-04 2007-10-30 (주)테크윙 사이드도킹방식 테스트핸들러 및 사이드도킹방식테스트핸들러용 테스트트레이 이송장치
KR100941672B1 (ko) * 2007-07-23 2010-02-12 (주)테크윙 테스트핸들러 및 테스트핸들러의 반도체소자 이송방법
KR100901395B1 (ko) * 2007-08-22 2009-06-05 세크론 주식회사 테스트 핸들러의 버퍼 트레이 피치를 조절하는 방법 및장치
KR100941671B1 (ko) * 2008-02-05 2010-02-12 (주)테크윙 전자부품 검사 지원을 위한 핸들러용 캐리어보드 및핸들러에서의 캐리어보드 이송방법
CN101738500B (zh) * 2008-11-20 2013-01-16 未来产业株式会社 用于校正用户托盘位置的设备以及测试处理机
DE102009013353B3 (de) * 2009-03-16 2010-10-07 Siemens Aktiengesellschaft Verfahren zur Bestimmung von Rüstungen für konstante Tische von Bestückautomaten
KR20110099556A (ko) * 2010-03-02 2011-09-08 삼성전자주식회사 반도체 패키지 테스트장치
KR101405300B1 (ko) 2010-03-26 2014-06-16 (주)테크윙 테스트핸들러용 로딩장치 및 테스트핸들러의 반도체소자 로딩방법
KR101499575B1 (ko) * 2010-10-13 2015-03-10 (주)테크윙 테스트핸들러용 캐리어보드 이송장치
KR101046983B1 (ko) 2011-01-31 2011-07-07 허길만 테스트 핸들러용 반도체 부재 업다운 이송장치
TWI483882B (zh) * 2011-04-29 2015-05-11 Hon Tech Inc 電子元件轉載收料機
KR101658078B1 (ko) * 2012-01-03 2016-09-21 (주)테크윙 테스트핸들러
KR102053081B1 (ko) * 2013-10-08 2019-12-06 (주)테크윙 테스트핸들러
KR102058443B1 (ko) 2014-03-03 2020-02-07 (주)테크윙 테스트핸들러 및 테스트핸들러에서의 테스트트레이 순환 방법
KR101811662B1 (ko) * 2014-03-07 2017-12-26 (주)테크윙 반도체소자 테스트용 핸들러 및 반도체소자 테스트용 핸들러에서의 테스트 지원 방법
KR102128545B1 (ko) * 2014-05-12 2020-07-01 (주)테크윙 테스트핸들러 및 이를 이용한 전자부품 테스트 방법
KR102254494B1 (ko) * 2015-04-30 2021-05-24 (주)테크윙 반도체소자 테스트용 핸들러
KR102252638B1 (ko) * 2015-05-04 2021-05-17 (주)테크윙 테스트핸들러용 인서트
JP7052296B2 (ja) * 2017-11-06 2022-04-12 富士電機株式会社 搬送装置及び搬送方法
JP7401060B2 (ja) * 2017-12-14 2023-12-19 富士電機株式会社 搬送装置及び搬送方法
KR102653937B1 (ko) 2018-07-17 2024-04-02 삼성전자주식회사 반도체 장치의 테스트 방법및 반도체 장치의 테스트 시스템

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US5290134A (en) 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
DE59307759D1 (de) * 1992-06-12 1998-01-15 Hoechst Ag Gallensäurederivate, Verfahren zu ihrer Herstellung und Verwendung dieser Verbindungen als Arzneimittel
JPH0664180U (ja) * 1993-02-17 1994-09-09 株式会社アドバンテスト Ｉｃハンドラにおける搬送装置
JP2599034Y2 (ja) * 1993-05-31 1999-08-30 株式会社アドバンテスト 可変ピッチ機構を持った複数デバイス搬送装置
KR970007078Y1 (en) * 1994-06-03 1997-07-15 Lg Semicon Co Ltd Devices feeding apparatus
JPH08170976A (ja) * 1994-09-06 1996-07-02 Advantest Corp 半導体試験装置用ハンドラ機構
US5839769A (en) * 1996-10-03 1998-11-24 Kinetrix, Inc. Expanding gripper with elastically variable pitch screw
JP2000088918A (ja) 1998-09-17 2000-03-31 Hitachi Ltd Ｉｃハンドラ
KR100309546B1 (ko) * 1999-07-09 2001-09-26 정문술 핸들러의 픽커 가변조절장치
KR100349942B1 (ko) * 1999-12-06 2002-08-24 삼성전자 주식회사 램버스 핸들러
KR100423945B1 (ko) * 2001-09-12 2004-03-22 미래산업 주식회사 반도체 소자 테스트용 핸들러
KR100428030B1 (ko) * 2001-09-12 2004-04-30 미래산업 주식회사 반도체 소자 테스트용 핸들러
KR100432356B1 (ko) * 2001-11-19 2004-05-22 미래산업 주식회사 핸들러의 디바이스 픽커
KR100436213B1 (ko) 2001-12-17 2004-06-16 미래산업 주식회사 반도체 소자 테스트 핸들러용 소자 정렬장치
KR100451586B1 (ko) * 2002-03-13 2004-10-08 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 이송장치의 작업 높이인식장치 및 이를 이용한 작업 높이 인식방법
KR100491304B1 (ko) * 2003-09-18 2005-05-24 미래산업 주식회사 번인 테스터용 소팅 핸들러
KR100622415B1 (ko) * 2004-12-06 2006-09-19 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 반송장치
US7196508B2 (en) * 2005-03-22 2007-03-27 Mirae Corporation Handler for testing semiconductor devices
WO2007007406A1 (ja) * 2005-07-13 2007-01-18 Advantest Corporation 電子部品試験装置
KR100800312B1 (ko) * 2006-01-25 2008-02-04 (주)테크윙 테스트핸들러 및 테스트핸들러의 로딩방법

Also Published As

Publication number Publication date
JP2007199064A (ja) 2007-08-09
US7656150B2 (en) 2010-02-02
JP5019647B2 (ja) 2012-09-05
CN101034132A (zh) 2007-09-12
TWI328119B (en) 2010-08-01
CN102323534B (zh) 2015-03-04
CN102323534A (zh) 2012-01-18
US20100097089A1 (en) 2010-04-22
JP2010175565A (ja) 2010-08-12
JP4652348B2 (ja) 2011-03-16
US8013620B2 (en) 2011-09-06
KR100800312B1 (ko) 2008-02-04
CN101034132B (zh) 2012-01-11
US20070176620A1 (en) 2007-08-02
KR20070077905A (ko) 2007-07-30

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