TW200719089A - A salt suitable for an acid generator and a chemically amplified resist composition containing the same - Google Patents
A salt suitable for an acid generator and a chemically amplified resist composition containing the sameInfo
- Publication number
- TW200719089A TW200719089A TW095131302A TW95131302A TW200719089A TW 200719089 A TW200719089 A TW 200719089A TW 095131302 A TW095131302 A TW 095131302A TW 95131302 A TW95131302 A TW 95131302A TW 200719089 A TW200719089 A TW 200719089A
- Authority
- TW
- Taiwan
- Prior art keywords
- carbon atoms
- group
- resist composition
- chemically amplified
- amplified resist
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/17—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing carboxyl groups bound to the carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2601/00—Systems containing only non-condensed rings
- C07C2601/12—Systems containing only non-condensed rings with a six-membered ring
- C07C2601/14—The ring being saturated
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005314037 | 2005-10-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200719089A true TW200719089A (en) | 2007-05-16 |
TWI395064B TWI395064B (zh) | 2013-05-01 |
Family
ID=37997356
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095131302A TWI395064B (zh) | 2005-10-28 | 2006-08-25 | 適用於酸產生劑之鹽及含有該鹽之化學放大光阻組成物 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7262321B2 (zh) |
KR (1) | KR101278086B1 (zh) |
CN (1) | CN1955844B (zh) |
TW (1) | TWI395064B (zh) |
Cited By (2)
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---|---|---|---|---|
TWI381246B (zh) * | 2005-12-27 | 2013-01-01 | Sumitomo Chemical Co | 適用於酸產生劑的鹽及含有該鹽之化學增幅型阻劑組成物 |
TWI460151B (zh) * | 2009-05-28 | 2014-11-11 | Sumitomo Chemical Co | 鹽及含有該鹽之光阻組成物 |
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TWI394004B (zh) * | 2005-03-30 | 2013-04-21 | Sumitomo Chemical Co | 適合作為酸產生劑之鹽及含有該鹽之化學放大型光阻組成物 |
TWI378325B (en) * | 2005-03-30 | 2012-12-01 | Sumitomo Chemical Co | Salt suitable for an acid generator and a chemically amplified resist composition containing the same |
TWI411881B (zh) * | 2005-10-28 | 2013-10-11 | Sumitomo Chemical Co | 適用為酸產生劑之鹽以及包含該鹽之化學增幅型阻劑組成物 |
CN1971421B (zh) * | 2005-11-21 | 2012-05-30 | 住友化学株式会社 | 适合于酸生成剂的盐和含有该盐的化学放大型抗蚀剂组合物 |
US7862980B2 (en) * | 2006-08-02 | 2011-01-04 | Sumitomo Chemical Company, Limited | Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same |
TWI412888B (zh) * | 2006-08-18 | 2013-10-21 | Sumitomo Chemical Co | 適合作為酸產生劑之鹽及含有該鹽之化學放大型正光阻組成物 |
TWI402249B (zh) * | 2006-08-22 | 2013-07-21 | Sumitomo Chemical Co | 適合作為酸產生劑之鹽及含有該鹽之化學放大型正型光阻組成物 |
KR100829615B1 (ko) * | 2006-10-11 | 2008-05-14 | 삼성전자주식회사 | 광산 발생제, 이를 포함하는 포토레지스트 조성물 및 패턴형성 방법 |
US7741007B2 (en) * | 2006-12-06 | 2010-06-22 | Sumitomo Chemical Company, Limited | Chemicallly amplified resist composition |
TWI437364B (zh) * | 2006-12-14 | 2014-05-11 | Sumitomo Chemical Co | 化學放大型阻劑組成物 |
CN101211113B (zh) * | 2006-12-27 | 2012-01-11 | 住友化学株式会社 | 化学放大型抗蚀剂组合物 |
US7527913B2 (en) * | 2007-01-25 | 2009-05-05 | Samsung Electronics Co., Ltd. | Photoacid generators, photoresist composition including the same and method of forming pattern using the same |
CN101236357B (zh) * | 2007-01-30 | 2012-07-04 | 住友化学株式会社 | 化学放大型抗蚀剂组合物 |
JP4844436B2 (ja) * | 2007-03-07 | 2011-12-28 | 住友化学株式会社 | 化学増幅型レジスト組成物 |
JP5012122B2 (ja) * | 2007-03-22 | 2012-08-29 | 住友化学株式会社 | 化学増幅型レジスト組成物 |
TWI438182B (zh) * | 2007-07-25 | 2014-05-21 | Sumitomo Chemical Co | 適用於酸產生劑之鹽以及含有該鹽之化學放大正型抗蝕劑組成物 |
US9034556B2 (en) * | 2007-12-21 | 2015-05-19 | Tokyo Ohka Kogyo Co., Ltd. | Compound and method of producing the same, acid generator, resist composition and method of forming resist pattern |
JP5186249B2 (ja) * | 2007-12-21 | 2013-04-17 | 東京応化工業株式会社 | 新規な化合物およびその製造方法、酸発生剤、レジスト組成物およびレジストパターン形成方法 |
TWI462938B (zh) * | 2008-05-21 | 2014-12-01 | Sumitomo Chemical Co | 聚合物及含有該聚合物之化學放大型阻劑組成物 |
JP5746818B2 (ja) * | 2008-07-09 | 2015-07-08 | 富士フイルム株式会社 | 感活性光線性または感放射線性樹脂組成物及びそれを用いたパターン形成方法 |
JP5368270B2 (ja) * | 2009-02-19 | 2013-12-18 | 信越化学工業株式会社 | 新規スルホン酸塩及びその誘導体、光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
KR101744715B1 (ko) * | 2009-07-16 | 2017-06-08 | 스미또모 가가꾸 가부시키가이샤 | 염 및 이를 함유하는 포토레지스트 조성물 |
TWI530478B (zh) * | 2010-02-18 | 2016-04-21 | 住友化學股份有限公司 | 鹽及包含該鹽之光阻組成物 |
JP5903833B2 (ja) | 2010-11-09 | 2016-04-13 | 住友化学株式会社 | 樹脂、レジスト組成物及びレジストパターン製造方法 |
KR101830595B1 (ko) | 2010-11-09 | 2018-02-21 | 스미또모 가가꾸 가부시키가이샤 | 수지 및 포토레지스트 조성물 |
JP6034026B2 (ja) | 2011-02-25 | 2016-11-30 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
JP6022788B2 (ja) | 2011-04-07 | 2016-11-09 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
JP5934536B2 (ja) | 2011-04-07 | 2016-06-15 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
JP5852490B2 (ja) | 2011-04-07 | 2016-02-03 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
JP6005964B2 (ja) | 2011-04-07 | 2016-10-12 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
TWI525066B (zh) * | 2011-04-13 | 2016-03-11 | 住友化學股份有限公司 | 鹽、光阻組成物及製備光阻圖案之方法 |
JP6214134B2 (ja) * | 2011-04-13 | 2017-10-18 | 住友化学株式会社 | 塩、レジスト組成物及びレジストパターンの製造方法 |
JP5866100B2 (ja) | 2011-04-13 | 2016-02-17 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
EP2527918A2 (en) | 2011-05-27 | 2012-11-28 | Rohm and Haas Electronic Materials LLC | Photoresist composition |
JP6189020B2 (ja) | 2011-07-19 | 2017-08-30 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
JP5865199B2 (ja) * | 2012-07-09 | 2016-02-17 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、感活性光線性又は感放射線性膜、感活性光線性又は感放射線性膜を備えたマスクブランクス、パターン形成方法、及び、フォトマスクの製造方法 |
JP2017019997A (ja) * | 2015-06-01 | 2017-01-26 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 酸発生剤化合物及びそれを含むフォトレジスト |
JP6991792B2 (ja) | 2016-09-02 | 2022-02-03 | 住友化学株式会社 | 塩、酸発生剤、レジスト組成物及びレジストパターンの製造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE295421C (zh) * | ||||
US5004669A (en) * | 1988-10-31 | 1991-04-02 | Konica Corporation | Light-sensitive silver halide photographic material |
JP4150509B2 (ja) | 2000-11-20 | 2008-09-17 | 富士フイルム株式会社 | ポジ型感光性組成物 |
JP2002361802A (ja) * | 2001-06-11 | 2002-12-18 | Oji Paper Co Ltd | 電子線硬化型工程用剥離シート |
US6818379B2 (en) * | 2001-12-03 | 2004-11-16 | Sumitomo Chemical Company, Limited | Sulfonium salt and use thereof |
US6893792B2 (en) * | 2002-02-19 | 2005-05-17 | Sumitomo Chemical Company, Limited | Positive resist composition |
JP2004004561A (ja) | 2002-02-19 | 2004-01-08 | Sumitomo Chem Co Ltd | ポジ型レジスト組成物 |
JP4103523B2 (ja) | 2002-09-27 | 2008-06-18 | Jsr株式会社 | レジスト組成物 |
KR101086169B1 (ko) * | 2003-01-22 | 2011-11-25 | 제이에스알 가부시끼가이샤 | 술포늄염 화합물, 감방사선성 산 발생제 및 포지티브형감방사선성 수지 조성물 |
US7001706B2 (en) * | 2003-07-18 | 2006-02-21 | Sumitomo Chemical Company, Limited | Sulfonate and a resist composition |
US7304175B2 (en) | 2005-02-16 | 2007-12-04 | Sumitomo Chemical Company, Limited | Salt suitable for an acid generator and a chemically amplified resist composition containing the same |
-
2006
- 2006-08-25 KR KR1020060081357A patent/KR101278086B1/ko active IP Right Grant
- 2006-08-25 TW TW095131302A patent/TWI395064B/zh active
- 2006-08-25 CN CN2006101218432A patent/CN1955844B/zh not_active Expired - Fee Related
- 2006-09-07 US US11/516,644 patent/US7262321B2/en active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI381246B (zh) * | 2005-12-27 | 2013-01-01 | Sumitomo Chemical Co | 適用於酸產生劑的鹽及含有該鹽之化學增幅型阻劑組成物 |
TWI460151B (zh) * | 2009-05-28 | 2014-11-11 | Sumitomo Chemical Co | 鹽及含有該鹽之光阻組成物 |
Also Published As
Publication number | Publication date |
---|---|
US20070100096A1 (en) | 2007-05-03 |
CN1955844B (zh) | 2011-01-26 |
US7262321B2 (en) | 2007-08-28 |
TWI395064B (zh) | 2013-05-01 |
KR20070045903A (ko) | 2007-05-02 |
CN1955844A (zh) | 2007-05-02 |
KR101278086B1 (ko) | 2013-06-24 |
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