TW200622386A - Inspection device for display panel - Google Patents

Inspection device for display panel

Info

Publication number
TW200622386A
TW200622386A TW094138527A TW94138527A TW200622386A TW 200622386 A TW200622386 A TW 200622386A TW 094138527 A TW094138527 A TW 094138527A TW 94138527 A TW94138527 A TW 94138527A TW 200622386 A TW200622386 A TW 200622386A
Authority
TW
Taiwan
Prior art keywords
display panel
inspection device
electrode
foreign substance
arrangement region
Prior art date
Application number
TW094138527A
Other languages
English (en)
Inventor
Masayuki Anzai
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200622386A publication Critical patent/TW200622386A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/701—Line sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Cleaning In General (AREA)
TW094138527A 2004-12-17 2005-11-03 Inspection device for display panel TW200622386A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004365547 2004-12-17
JP2005293430A JP2006194858A (ja) 2004-12-17 2005-10-06 表示用パネルの検査装置

Publications (1)

Publication Number Publication Date
TW200622386A true TW200622386A (en) 2006-07-01

Family

ID=36801038

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094138527A TW200622386A (en) 2004-12-17 2005-11-03 Inspection device for display panel

Country Status (4)

Country Link
JP (1) JP2006194858A (zh)
KR (1) KR100829892B1 (zh)
CN (1) CN100439922C (zh)
TW (1) TW200622386A (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI398630B (zh) * 2008-04-07 2013-06-11 Ubprec Co Ltd 液晶顯示器檢測設備用探測部件的自動變更裝置
TWI417599B (zh) * 2009-09-28 2013-12-01 Au Optronics Xiamen Corp 異方性導電膜之貼附設備及貼附方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4800874B2 (ja) * 2006-08-11 2011-10-26 株式会社日本マイクロニクス 表示パネルのための検査装置、プローブユニットおよびプローブ組立体
JP2008134439A (ja) * 2006-11-28 2008-06-12 Matsushita Electric Ind Co Ltd フラットパネル供給方法及びフラットパネル組立装置
CN101211021B (zh) * 2006-12-27 2010-08-25 富士迈半导体精密工业（上海）有限公司 面板检测装置
KR101033776B1 (ko) * 2009-08-03 2011-05-13 주식회사 탑 엔지니어링 클리너를 구비한 어레이 테스트 장치
KR20120077291A (ko) * 2010-12-30 2012-07-10 주식회사 탑 엔지니어링 어레이 테스트 장치
KR20150066018A (ko) * 2013-12-05 2015-06-16 주식회사 이엘피 Ａｍｏｌｅｄ 패널 검사를 위한 표시 패널 검사 장치 및 그 방법
KR101682378B1 (ko) * 2014-09-24 2016-12-07 주식회사 디이엔티 액정표시패널의 검사장치
CN105785260A (zh) * 2016-05-25 2016-07-20 上海华岭集成电路技术股份有限公司 防止晶圆测试探针台撞针的装置及方法
KR102112555B1 (ko) * 2019-11-21 2020-05-19 케이맥(주) 이종 사이즈 디스플레이 패널 검사 장치
JP2022061531A (ja) * 2020-10-07 2022-04-19 日本電気硝子株式会社 ガラス板の製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02116703A (ja) * 1988-10-27 1990-05-01 Matsushita Electric Ind Co Ltd ガラス基板上の回路パターンの検査装置
JP2808123B2 (ja) * 1988-11-16 1998-10-08 キヤノン株式会社 異物検出装置
CN2153632Y (zh) * 1993-03-19 1994-01-19 四川石油管理局测井公司 双侧向主电极检测器
KR0147600B1 (ko) * 1994-09-13 1998-08-01 김광호 음극선관 패널의 결함 검사장치
JPH11237847A (ja) * 1998-02-24 1999-08-31 Sharp Corp 液晶パネルの自動検査装置
JP2000019063A (ja) * 1998-07-06 2000-01-21 Sokkia Co Ltd プラズマディスプレイパネルの電極パターン検査装置
KR20030060243A (ko) * 2002-01-07 2003-07-16 엘지전자 주식회사 평판 디스플레이 자동 검사장치
JP2003295281A (ja) * 2002-04-03 2003-10-15 Canon Inc 撮像装置及び動作処理方法及びプログラム及び記憶媒体
JP4222546B2 (ja) * 2003-03-31 2009-02-12 株式会社日本コンラックス 紙葉類識別装置および方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI398630B (zh) * 2008-04-07 2013-06-11 Ubprec Co Ltd 液晶顯示器檢測設備用探測部件的自動變更裝置
TWI417599B (zh) * 2009-09-28 2013-12-01 Au Optronics Xiamen Corp 異方性導電膜之貼附設備及貼附方法

Also Published As

Publication number Publication date
JP2006194858A (ja) 2006-07-27
CN1790032A (zh) 2006-06-21
KR20060069260A (ko) 2006-06-21
KR100829892B1 (ko) 2008-05-16
CN100439922C (zh) 2008-12-03

Similar Documents

Publication Publication Date Title
TW200622386A (en) Inspection device for display panel
EP2343529A3 (en) Particulate matter detection device and inspection method of the particulate matter detection device
JP2015114704A5 (zh)
WO2010135072A3 (en) Device with proximity detection capability
EP4187240A3 (en) Gas sensor interrogation
EA201100443A1 (ru) Способ и устройство для обнаружения дефектов
EP2019587A4 (en) PROTEASE DETECTION AND PROTEASE ACTIVITY USING SINGLE NANOCROUTING SEN PROBE
BR112013007156A2 (pt) sistemas e métodos para estabilidade aperfeiçoada de sensores eletroquímicos
GB2479687B (en) Device and method for measuring microspheres
EP2426477A3 (en) Particulate matter detection device
FR2868845B1 (fr) Procede de detection et de localisation de source de decharge partielle dans un appareil electrique
WO2008106535A3 (en) Probe for inspection of edges of a structure
ATE519119T1 (de) Elektrisches rückkopplungs-detektionssystem für mehrpunktsonden
TW200726652A (en) Microinjection apparatus integrated with size detector
JP2006194699A5 (zh)
EP2039997A3 (en) Ultraviolet frame sensor with run-on detection
TW200745578A (en) Inspection apparatus of testing a flat panel display and method of fabricating the same
WO2007149838A3 (en) Oscillatory measurement device with visual recorder
TW200613754A (en) Inspection apparatus, inspection method and sensor for inspection apparatus
WO2009034831A1 (ja) 紫外線センサ
TW201423509A (zh) 觸摸屏檢測治具
WO2003058189A1 (fr) Dispositif d'inspection d'etat scelle
CN205482865U (zh) 尺寸自动检测装置
CN208684968U (zh) 一种效率高的蛋白酶检测装置
CN207717998U (zh) 一种铆钉测试治具