TW200609563A - Display apparatus and inspection method - Google Patents

Display apparatus and inspection method

Info

Publication number
TW200609563A
TW200609563A TW094115826A TW94115826A TW200609563A TW 200609563 A TW200609563 A TW 200609563A TW 094115826 A TW094115826 A TW 094115826A TW 94115826 A TW94115826 A TW 94115826A TW 200609563 A TW200609563 A TW 200609563A
Authority
TW
Taiwan
Prior art keywords
potential
short circuit
detecting
data line
gate line
Prior art date
Application number
TW094115826A
Other languages
English (en)
Chinese (zh)
Other versions
TWI323360B (enExample
Inventor
Naoki Ando
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of TW200609563A publication Critical patent/TW200609563A/zh
Application granted granted Critical
Publication of TWI323360B publication Critical patent/TWI323360B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G09G3/3666—Control of matrices with row and column drivers using an active matrix with the matrix divided into sections
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S345/00—Computer graphics processing and selective visual display systems
    • Y10S345/904—Display with fail/safe testing feature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW094115826A 2004-05-31 2005-05-16 Display apparatus and inspection method TW200609563A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004162048A JP4281622B2 (ja) 2004-05-31 2004-05-31 表示装置及び検査方法

Publications (2)

Publication Number Publication Date
TW200609563A true TW200609563A (en) 2006-03-16
TWI323360B TWI323360B (enExample) 2010-04-11

Family

ID=35446993

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094115826A TW200609563A (en) 2004-05-31 2005-05-16 Display apparatus and inspection method

Country Status (3)

Country Link
US (2) US7145358B2 (enExample)
JP (1) JP4281622B2 (enExample)
TW (1) TW200609563A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104460065A (zh) * 2014-11-27 2015-03-25 友达光电股份有限公司 液晶显示器及其测试电路
TWI847504B (zh) * 2023-01-17 2024-07-01 友達光電股份有限公司 顯示面板

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003289260A1 (en) * 2002-12-26 2004-07-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for driving semiconductor device, and method for testing semiconductor device
JP2006178029A (ja) * 2004-12-21 2006-07-06 Seiko Epson Corp 電気光学装置、その検査方法、駆動装置および電子機器
JP2006178030A (ja) * 2004-12-21 2006-07-06 Seiko Epson Corp 電気光学装置、その駆動方法、駆動装置および電子機器
KR101337459B1 (ko) * 2006-02-03 2013-12-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치 및 그 표시장치를 구비한 전자기기
EP1826741A3 (en) * 2006-02-23 2012-02-15 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device having the same
TW200732808A (en) * 2006-02-24 2007-09-01 Prime View Int Co Ltd Thin film transistor array substrate and electronic ink display device
KR20080010837A (ko) * 2006-07-28 2008-01-31 삼성전자주식회사 박막 트랜지스터 기판의 불량 검사 모듈 및 방법
TWI345747B (en) * 2006-08-07 2011-07-21 Au Optronics Corp Method of testing liquid crystal display
KR101465976B1 (ko) * 2007-07-31 2014-11-27 삼성전자주식회사 ＵＰｎＰ 디바이스가 화면 상의 복수의 재생 영역을 통해복수의 컨텐츠를 재생하는 방법 및 이를 위한 장치
US8912990B2 (en) * 2008-04-21 2014-12-16 Apple Inc. Display having a transistor-degradation circuit
US7859285B2 (en) * 2008-06-25 2010-12-28 United Microelectronics Corp. Device under test array for identifying defects
WO2011001557A1 (ja) * 2009-06-29 2011-01-06 シャープ株式会社 アクティブマトリクス基板の製造装置及び製造方法、並びに表示パネルの製造装置及び製造方法
TWI412766B (zh) * 2009-09-04 2013-10-21 Wintek Corp 主動元件陣列以及檢測方法
KR101931175B1 (ko) * 2012-05-18 2019-03-14 삼성디스플레이 주식회사 쇼트 불량 검사 방법, 표시 장치의 쇼트 불량 검사 방법 및 유기 발광 표시 장치의 쇼트 불량 검사 방법
US20140139256A1 (en) * 2012-11-20 2014-05-22 Shenzhen China Star Optoelectronics Technology Co. Ltd. Detecting device and method for liquid crystal panel
KR102193574B1 (ko) 2014-01-20 2020-12-22 삼성디스플레이 주식회사 표시 장치 및 그 구동 방법
CN105578175B (zh) * 2014-10-11 2018-03-30 深圳超多维光电子有限公司 立体显示装置检测系统及其检测方法
FR3027402B1 (fr) * 2014-10-21 2016-11-18 Centre Nat Rech Scient Circuit et procede pour le test sur puce d'une matrice de pixels
CN104297622B (zh) * 2014-10-30 2017-08-25 京东方科技集团股份有限公司 检测显示面板缺陷的方法及装置
JP6162679B2 (ja) 2014-12-19 2017-07-12 ファナック株式会社 コモン信号の故障箇所を検出するマトリクス回路
CN104538410B (zh) * 2015-01-20 2017-10-13 京东方科技集团股份有限公司 薄膜晶体管阵列基板及显示装置
KR102383287B1 (ko) * 2015-06-29 2022-04-05 주식회사 엘엑스세미콘 감지 회로를 포함하는 소스 드라이버 및 디스플레이 장치
KR102426668B1 (ko) * 2015-08-26 2022-07-28 삼성전자주식회사 디스플레이 구동 회로 및 디스플레이 장치
JP2017181574A (ja) * 2016-03-28 2017-10-05 株式会社ジャパンディスプレイ 表示装置
CN106128351B (zh) * 2016-08-31 2020-12-29 京东方科技集团股份有限公司 一种显示装置
CN106486041B (zh) * 2017-01-03 2019-04-02 京东方科技集团股份有限公司 一种像素电路、其驱动方法及相关显示装置
KR102451951B1 (ko) 2017-11-23 2022-10-06 주식회사 엘엑스세미콘 디스플레이 구동 장치
KR102527995B1 (ko) * 2018-01-05 2023-05-04 삼성디스플레이 주식회사 단락 검사 회로 및 이를 포함하는 표시 장치
JP2019128536A (ja) * 2018-01-26 2019-08-01 株式会社ジャパンディスプレイ 表示装置
US10818208B2 (en) * 2018-09-14 2020-10-27 Novatek Microelectronics Corp. Source driver
CN109300440B (zh) * 2018-10-15 2020-05-22 深圳市华星光电技术有限公司 显示装置
CN109616036B (zh) * 2019-01-07 2022-01-18 重庆京东方显示技术有限公司 显示屏单体、显示屏单体不良位置定位系统及其定位方法
CN110426568B (zh) * 2019-07-08 2020-11-24 武汉华星光电半导体显示技术有限公司 显示面板
JP2023152563A (ja) 2022-04-04 2023-10-17 上海天馬微電子有限公司 表示装置及び表示装置の検査方法
KR20240121526A (ko) * 2023-02-02 2024-08-09 엘지디스플레이 주식회사 데이터 구동 회로 및 이를 포함하는 표시 장치

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4819038A (en) * 1986-12-22 1989-04-04 Ibm Corporation TFT array for liquid crystal displays allowing in-process testing
JP2758103B2 (ja) * 1992-04-08 1998-05-28 シャープ株式会社 アクティブマトリクス基板及びその製造方法
US5497146A (en) * 1992-06-03 1996-03-05 Frontec, Incorporated Matrix wiring substrates
US5428300A (en) * 1993-04-26 1995-06-27 Telenix Co., Ltd. Method and apparatus for testing TFT-LCD
DE69528384D1 (de) * 1995-07-31 2002-10-31 Fire Technology Inc Halbleiterschaltermatrix mit schutz vor elektrischer entladung und herstellungsverfahren
TW331599B (en) * 1995-09-26 1998-05-11 Toshiba Co Ltd Array substrate for LCD and method of making same
JPH1097203A (ja) 1996-06-10 1998-04-14 Toshiba Corp 表示装置
JP2001188213A (ja) 1999-12-28 2001-07-10 Hitachi Ltd 液晶表示装置
JP2001201765A (ja) 2000-01-18 2001-07-27 Toshiba Corp 液晶表示装置及びその検査方法
US20030085855A1 (en) * 2001-07-17 2003-05-08 Kabushiki Kaisha Toshiba Array substrate, method of inspecting array substrate, and liquid crystal display
JP3707404B2 (ja) * 2001-08-03 2005-10-19 ソニー株式会社 検査方法、半導体装置、及び表示装置
JP3701924B2 (ja) * 2002-03-29 2005-10-05 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｅｌアレイ基板の検査方法及びその検査装置
JP3882773B2 (ja) * 2003-04-03 2007-02-21 ソニー株式会社 画像表示装置、駆動回路装置および発光ダイオードの不良検出方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104460065A (zh) * 2014-11-27 2015-03-25 友达光电股份有限公司 液晶显示器及其测试电路
TWI847504B (zh) * 2023-01-17 2024-07-01 友達光電股份有限公司 顯示面板

Also Published As

Publication number Publication date
US7358757B2 (en) 2008-04-15
TWI323360B (enExample) 2010-04-11
JP4281622B2 (ja) 2009-06-17
US20060226866A1 (en) 2006-10-12
JP2005345546A (ja) 2005-12-15
US7145358B2 (en) 2006-12-05
US20050270059A1 (en) 2005-12-08

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MM4A Annulment or lapse of patent due to non-payment of fees