TW200508629A - Anisotropic conductive connector and wafer inspection device - Google Patents
Anisotropic conductive connector and wafer inspection deviceInfo
- Publication number
- TW200508629A TW200508629A TW093116029A TW93116029A TW200508629A TW 200508629 A TW200508629 A TW 200508629A TW 093116029 A TW093116029 A TW 093116029A TW 93116029 A TW93116029 A TW 93116029A TW 200508629 A TW200508629 A TW 200508629A
- Authority
- TW
- Taiwan
- Prior art keywords
- anisotropic conductive
- inspection device
- wafer inspection
- conductive connector
- connecting conduction
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title abstract 4
- 239000002245 particle Substances 0.000 abstract 3
- 239000011247 coating layer Substances 0.000 abstract 1
- 238000009413 insulation Methods 0.000 abstract 1
- 230000005389 magnetism Effects 0.000 abstract 1
- 239000007769 metal material Substances 0.000 abstract 1
- 229910000510 noble metal Inorganic materials 0.000 abstract 1
- 239000002861 polymer material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/04—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation using electrically conductive adhesives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003163866 | 2003-06-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200508629A true TW200508629A (en) | 2005-03-01 |
TWI248519B TWI248519B (en) | 2006-02-01 |
Family
ID=33508767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093116029A TWI248519B (en) | 2003-06-09 | 2004-06-03 | Anisotropic conductive connector and wafer inspection device |
Country Status (6)
Country | Link |
---|---|
US (1) | US7384279B2 (zh) |
EP (1) | EP1640729A4 (zh) |
KR (1) | KR100684221B1 (zh) |
CN (1) | CN1806178A (zh) |
TW (1) | TWI248519B (zh) |
WO (1) | WO2004109302A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI571613B (zh) * | 2005-09-22 | 2017-02-21 | 星社股份有限公司 | 負和正表面膨脹之電性測量用的膨脹感測器 |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8518304B1 (en) | 2003-03-31 | 2013-08-27 | The Research Foundation Of State University Of New York | Nano-structure enhancements for anisotropic conductive material and thermal interposers |
TWI239684B (en) * | 2003-04-16 | 2005-09-11 | Jsr Corp | Anisotropic conductive connector and electric inspection device for circuit device |
EP1640729A4 (en) | 2003-06-09 | 2010-06-16 | Jsr Corp | ANISOTROPIC CONDUCTIVE CONNECTOR AND WAFER INSPECTION DEVICE |
KR100708880B1 (ko) * | 2006-12-12 | 2007-04-18 | 주식회사 리뷰텍 | 이방성 전도루버를 이용한 프로브 헤드 유닛 |
KR100886712B1 (ko) * | 2007-07-27 | 2009-03-04 | 주식회사 하이닉스반도체 | 반도체 패키지 및 이의 제조 방법 |
JP5081533B2 (ja) * | 2007-08-21 | 2012-11-28 | ポリマテック株式会社 | 異方導電性コネクタおよび異方導電性コネクタの接続構造 |
KR200449396Y1 (ko) * | 2008-02-25 | 2010-07-07 | 주식회사 아이에스시테크놀러지 | 매개기판을 가진 테스트 소켓 |
CN101576576B (zh) * | 2008-05-08 | 2012-05-30 | 南茂科技股份有限公司 | 探针卡组件以及使用于探针卡组件的中介装置 |
JP5509486B2 (ja) * | 2009-03-05 | 2014-06-04 | ポリマテック・ジャパン株式会社 | 弾性コネクタ及び弾性コネクタの製造方法並びに導通接続具 |
JP5404220B2 (ja) * | 2009-07-09 | 2014-01-29 | 株式会社オーディオテクニカ | コンデンサマイクロホン |
JP5684584B2 (ja) * | 2010-04-28 | 2015-03-11 | 株式会社アイエスシーIsc Co., Ltd. | 電子部品、電子部材の接続方法および回路接続部材 |
JP2012078222A (ja) * | 2010-10-01 | 2012-04-19 | Fujifilm Corp | 回路基板接続構造体および回路基板の接続方法 |
KR101266124B1 (ko) * | 2012-04-03 | 2013-05-27 | 주식회사 아이에스시 | 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법 |
KR101204941B1 (ko) * | 2012-04-27 | 2012-11-27 | 주식회사 아이에스시 | 전극지지부를 가지는 테스트용 소켓 및 그 테스트용 소켓의 제조방법 |
JP5880428B2 (ja) * | 2012-12-28 | 2016-03-09 | 株式会社オートネットワーク技術研究所 | カードエッジコネクタ |
WO2014129784A1 (ko) * | 2013-02-19 | 2014-08-28 | 주식회사 아이에스시 | 고밀도 도전부를 가지는 테스트용 소켓 |
US9435852B1 (en) * | 2015-09-23 | 2016-09-06 | GlobalFoundries, Inc. | Integrated circuit (IC) test structure with monitor chain and test wires |
WO2018021216A1 (ja) * | 2016-07-28 | 2018-02-01 | 日本電産リード株式会社 | 検査治具、基板検査装置、及び検査治具の製造方法 |
KR20190035735A (ko) * | 2016-08-08 | 2019-04-03 | 세키스이가가쿠 고교가부시키가이샤 | 도통 검사 장치용 부재 및 도통 검사 장치 |
JP2018073577A (ja) * | 2016-10-27 | 2018-05-10 | 株式会社エンプラス | 異方導電性シート及びその製造方法 |
CN106864181B (zh) * | 2017-04-28 | 2018-11-27 | 吉林大学 | 一种基于导电膜的汽车防爆胎预警装置及其控制方法 |
US10177058B1 (en) * | 2018-01-26 | 2019-01-08 | Powertech Technology Inc. | Encapsulating composition, semiconductor package and manufacturing method thereof |
CN111987548B (zh) * | 2019-05-21 | 2021-09-21 | 新韩精密电子有限公司 | 各向异性导电片 |
JP7226415B2 (ja) * | 2020-03-18 | 2023-02-21 | カシオ計算機株式会社 | 表示装置及び時計 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4902857A (en) * | 1988-12-27 | 1990-02-20 | American Telephone And Telegraph Company, At&T Bell Laboratories | Polymer interconnect structure |
JP2737647B2 (ja) * | 1994-03-10 | 1998-04-08 | カシオ計算機株式会社 | 異方導電性接着剤およびそれを用いた導電接続構造 |
JPH1140224A (ja) | 1997-07-11 | 1999-02-12 | Jsr Corp | 異方導電性シート |
JP2000147036A (ja) | 1998-11-10 | 2000-05-26 | Murata Mfg Co Ltd | 表面電位計 |
KR100375117B1 (ko) * | 1998-12-30 | 2003-08-19 | 제이에스알 가부시끼가이샤 | 위치 결정부를 구비한 이방 도전성 시트_ |
JP2000207943A (ja) * | 1999-01-11 | 2000-07-28 | Sony Corp | 異方性導電膜及び異方性導電膜を用いた電気的接続装置 |
TW561266B (en) * | 1999-09-17 | 2003-11-11 | Jsr Corp | Anisotropic conductive sheet, its manufacturing method, and connector |
JP4240724B2 (ja) * | 2000-01-26 | 2009-03-18 | Jsr株式会社 | 異方導電性シートおよびコネクター |
EP1195860B1 (en) * | 2000-09-25 | 2004-12-01 | JSR Corporation | Anisotropically conductive sheet, production process thereof and applied product thereof |
JP3906068B2 (ja) * | 2000-12-08 | 2007-04-18 | Jsr株式会社 | 異方導電性シート、コネクターおよびウエハ検査装置 |
AU2002221060A1 (en) * | 2000-12-08 | 2002-06-18 | Jsr Corporation | Anisotropic conductive sheet and wafer inspection device |
JP2002184821A (ja) * | 2000-12-12 | 2002-06-28 | Jsr Corp | シート状コネクターおよびその製造方法並びにプローブ装置 |
DE60238824D1 (de) * | 2001-02-09 | 2011-02-17 | Jsr Corp | "anisotroper leitfähiger verbinder, herstellungsverfahren dafür und sondenglied" |
JP3573120B2 (ja) * | 2001-08-31 | 2004-10-06 | Jsr株式会社 | 異方導電性コネクターおよびその製造方法並びにその応用製品 |
EP1640729A4 (en) | 2003-06-09 | 2010-06-16 | Jsr Corp | ANISOTROPIC CONDUCTIVE CONNECTOR AND WAFER INSPECTION DEVICE |
-
2004
- 2004-06-01 EP EP04745480A patent/EP1640729A4/en not_active Ceased
- 2004-06-01 CN CNA2004800161614A patent/CN1806178A/zh active Pending
- 2004-06-01 KR KR1020057023604A patent/KR100684221B1/ko active IP Right Grant
- 2004-06-01 US US10/559,846 patent/US7384279B2/en active Active
- 2004-06-01 WO PCT/JP2004/007515 patent/WO2004109302A1/ja not_active Application Discontinuation
- 2004-06-03 TW TW093116029A patent/TWI248519B/zh not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI571613B (zh) * | 2005-09-22 | 2017-02-21 | 星社股份有限公司 | 負和正表面膨脹之電性測量用的膨脹感測器 |
Also Published As
Publication number | Publication date |
---|---|
KR20060014440A (ko) | 2006-02-15 |
US20060154500A1 (en) | 2006-07-13 |
EP1640729A4 (en) | 2010-06-16 |
CN1806178A (zh) | 2006-07-19 |
WO2004109302A1 (ja) | 2004-12-16 |
KR100684221B1 (ko) | 2007-02-22 |
EP1640729A1 (en) | 2006-03-29 |
US7384279B2 (en) | 2008-06-10 |
TWI248519B (en) | 2006-02-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |