TW200506113A - Process for producing P doped silicon single crystal and P doped N type silicon single crystal wafer - Google Patents

Process for producing P doped silicon single crystal and P doped N type silicon single crystal wafer

Info

Publication number
TW200506113A
TW200506113A TW093101045A TW93101045A TW200506113A TW 200506113 A TW200506113 A TW 200506113A TW 093101045 A TW093101045 A TW 093101045A TW 93101045 A TW93101045 A TW 93101045A TW 200506113 A TW200506113 A TW 200506113A
Authority
TW
Taiwan
Prior art keywords
single crystal
silicon single
doped
producing
region
Prior art date
Application number
TW093101045A
Other languages
English (en)
Other versions
TWI333002B (zh
Inventor
Masahiro Sakurada
Izumi Fusegawa
Original Assignee
Shinetsu Handotai Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Handotai Kk filed Critical Shinetsu Handotai Kk
Publication of TW200506113A publication Critical patent/TW200506113A/zh
Application granted granted Critical
Publication of TWI333002B publication Critical patent/TWI333002B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20—Controlling or regulating
    • C30B15/203—Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
    • C30B15/04—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt adding doping materials, e.g. for n-p-junction
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02—Elements
    • C30B29/06—Silicon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
TW093101045A 2003-01-17 2004-01-15 Process for producing P doped silicon single crystal and P doped N type silicon single crystal wafer TW200506113A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003010436A JP4207577B2 (ja) 2003-01-17 2003-01-17 Ｐドープシリコン単結晶の製造方法

Publications (2)

Publication Number Publication Date
TW200506113A true TW200506113A (en) 2005-02-16
TWI333002B TWI333002B (zh) 2010-11-11

Family

ID=32767251

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093101045A TW200506113A (en) 2003-01-17 2004-01-15 Process for producing P doped silicon single crystal and P doped N type silicon single crystal wafer

Country Status (6)

Country Link
US (1) US7214268B2 (zh)
EP (1) EP1591566B8 (zh)
JP (1) JP4207577B2 (zh)
KR (1) KR101029141B1 (zh)
TW (1) TW200506113A (zh)
WO (1) WO2004065666A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200428637A (en) * 2003-01-23 2004-12-16 Shinetsu Handotai Kk SOI wafer and production method thereof
JP4854917B2 (ja) * 2003-03-18 2012-01-18 信越半導体株式会社 Ｓｏｉウェーハ及びその製造方法
JP4432458B2 (ja) * 2003-10-30 2010-03-17 信越半導体株式会社 単結晶の製造方法
DE102004039197B4 (de) 2004-08-12 2010-06-17 Siltronic Ag Verfahren zur Herstellung von dotierten Halbleiterscheiben aus Silizium
JP4604889B2 (ja) * 2005-05-25 2011-01-05 株式会社Ｓｕｍｃｏ シリコンウェーハの製造方法、並びにシリコン単結晶育成方法
JP5167654B2 (ja) * 2007-02-26 2013-03-21 信越半導体株式会社 シリコン単結晶ウエーハの製造方法
JP5003283B2 (ja) * 2007-05-23 2012-08-15 信越半導体株式会社 シリコン単結晶の引上げ方法
JP6107308B2 (ja) * 2013-03-28 2017-04-05 信越半導体株式会社 シリコン単結晶製造方法
JP7463934B2 (ja) 2020-10-07 2024-04-09 信越半導体株式会社 Ｎ型シリコン単結晶ウェーハの製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0741390A (ja) * 1993-07-29 1995-02-10 Nippon Steel Corp シリコンの熱処理方法
JP3195889B2 (ja) * 1994-07-06 2001-08-06 信越半導体株式会社 シリコン単結晶の製造方法及び石英ガラスルツボ
JP3525141B2 (ja) * 1997-08-20 2004-05-10 独立行政法人 科学技術振興機構 抵抗率が低いｎ型又はｐ型金属シリコンの製造方法
JP3412531B2 (ja) * 1998-08-31 2003-06-03 信越半導体株式会社 リンドープシリコン単結晶ウエーハ及びエピタキシャルシリコンウエーハ及びこれらの製造方法
JP3601328B2 (ja) 1998-12-14 2004-12-15 信越半導体株式会社 シリコン単結晶の製造方法およびこの方法で製造されたシリコン単結晶とシリコンウエーハ
JP4634553B2 (ja) * 1999-06-08 2011-02-16 シルトロニック・ジャパン株式会社 シリコン単結晶ウエーハおよびその製造方法

Also Published As

Publication number Publication date
EP1591566A1 (en) 2005-11-02
EP1591566B8 (en) 2015-11-18
JP2004224577A (ja) 2004-08-12
US20060065184A1 (en) 2006-03-30
KR20050091783A (ko) 2005-09-15
EP1591566A4 (en) 2012-04-25
KR101029141B1 (ko) 2011-04-13
EP1591566B1 (en) 2015-10-14
TWI333002B (zh) 2010-11-11
WO2004065666A1 (ja) 2004-08-05
JP4207577B2 (ja) 2009-01-14
US7214268B2 (en) 2007-05-08

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