TW200417B - - Google Patents

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Publication number
TW200417B
TW200417B TW081107808A TW81107808A TW200417B TW 200417 B TW200417 B TW 200417B TW 081107808 A TW081107808 A TW 081107808A TW 81107808 A TW81107808 A TW 81107808A TW 200417 B TW200417 B TW 200417B
Authority
TW
Taiwan
Prior art keywords
solder
layer
pad
block
metallurgical
Prior art date
Application number
TW081107808A
Other languages
English (en)
Original Assignee
Mcnc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mcnc filed Critical Mcnc
Application granted granted Critical
Publication of TW200417B publication Critical patent/TW200417B/zh

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    • HELECTRICITY
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    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/11Manufacturing methods
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/49117Conductor or circuit manufacturing

Description

200417 A 6 B6 五、發明説明i f ) f發明領域] , \: 本發明關於徹電子說置的製造法,持別是閟於形成供 微電子基片所用的電子及機滅聯结的方法,及利用此種方 法所製造的聯結。 「發明背景] „ • % 高性能微電子_置經常使甩焊接球或焊接塊進行與其 他微電子_置之間的電子聯結。舉例而言,吾人可能利用 V··':. 焊接球或焊接塊,而電子式地聯结一種弗番 -—l-a-r-g-e scale in t a-β ra ion 晶片至一電路板 或其iit :穴層包装基片。此聯结科技也被稱為”受控的崩裂 晶 Η 礙结-C 4 ι Controlled Coiiapse Chip C ο η n a ο ΐ i o a -C 4 )或”倒装法(f 1 i ρ - c h i ρ ) ” ,本文也將稱之為” 焊接塊”。 由I B H所發展的原始焊接塊科技中,首先夾一値陰影 掩樓到一積體電路片,然後利用蒸發焊料,透過陰影掩模 的孔,而形成焊接塊。也有人尋求以電鍍製程來製造焊接 塊,持別用來處理較大的基Η及較小的焊接塊。在此製程 中,一 ’’ j·旱接塊之下的冶金 ( u n d 3 r - b u a p m e ΐ a 1 1 u r g :/ 經濟部屮欠標';'1-局尚工消';?合作^卬?41 (請先聞讀背面之:;i意事項再填寫本頁) (UBM)) ”被用在一微電子基片(微電子基片有一些墊片 與之接镯),通常是利用蒸發或噴塗(濺射)。一片連續 的焊接塊之下的冶金層膜通常被舖在墊片之上及基片之上 而介於各墊片之間,以准許電流在鍍焊塊過程中流通。 為了界定焊塊在接觸墊片上成形的位置,利用攝影刻 表 +¾ Vt :4 »!中 S 句家埝 KC.NS > 〒·μ| 格(21 η X 297 公弩 ΐ 200417 A6 B6 五、洤叫説明f二) . 印35方式來描繪焊接塊3¾泣置,放置厚厚的一層宠 在該焊接塊之下的冶金1摸上及畫出該光致電阻的形狀以 暴露該垾接塊之下的冶金.1摸於該接镯墊Η之上Γ'外、,): 然後,利用形狀電鍍,焊接墊Η被形成在該焊接塊之下的 冶金層漠玻暴露於該接壤Β Μ之外的S域:.被鍍的焊接 塊堆積在光敏電阻的凹穴甲,透過接赛墊Η。然後,介於 :1被鍍的焊接墊Η之間的焊接塊之下的冶金層膜被蝕刻( 以焊接塊作為蝕刻掩模)μ攱壤介於焊接塊之間的電子聯 结:U_S. Patents 4,35 :3, 32:3 ta Dishon t 己被讓渡給本 !案的申請人、;4,9 4 0 . 1 3 1 ί : J u s k e y, J r . 9 t a I · ; a n d 4 , 7 S 3,3 2 d邰钶_ 了’ 一圣译接魂的袈造方 <去: 言: 不幸的是,在利用邁述專利所討論的製程來製造焊接 塊時,不容易保護焊接塊在接獨墊片上的基部。保護焊接 塊的莶部是重要的,s a焊接塊的基部是用來密封接觸墊 η:上述專利所討論的製程绖常降低焊接塊的基部,此舉 暴露了绱在下方接獨μ η且導致機械或電子失靈& 焊接塊的基部可能由於上述製程中至少兩画步驟而愛 >.·;十 」'」λ —, j .1印I a f的.1 ? 一譽的弋窀電阻層部有先 埤濟郎屮史標 fN 工-νί,'κιν合fift卬¾ (請先聞讀计面之注意事項再堪坏本頁) •訂丨· 天的扭曲菱形,光敏電阻1無:去對齊於接觸塾。通常,使 " '! t- 甩一乾式厚摸光敏電阻:如d~u n t R I S T Q N光敏電阻)或 塗上多層的液光敏電阻,以累積足夠的被鍍的焊接塊的證 積。通常使用的膜的厚度是數十激米(例如5 0微米)的 等级。厚膜光敏電阻必須在接觸墊的上方被精確地繪出形 3 200417 A6 B6 五、發明説明(3 ) 狀,而沒有任何不對齊或扭曲變形。不幸地,對乾式厚膜 光敏電阻而言,焊接塊位置形狀的扭曲變形可能肇因於光 敏電阻不良地附著於平滑的焊接塊下方冶金層。透過厚膜 光敏電阻器及封面層的光散射,及厚膜光敏電阻器發展過 程中不準確的持性,也造成在接觸墊上方的厚膜光敏電阻 器罩的扭曲變形。對多層的液態光敏電阻器而言,一些冽 如因為長時間的烘烤所造成的光敏電阻 > 的硬化及邊緣焊 珠成形的等等因素都可能造成在接镯墊上方的光敏電阻器 罩形狀的杻曲變形。依上所論,结果的焊接塊通常不覆蓋 (請先KI讀背面之注意事項再填寫本頁) 經濟部十处標爷局13;工消'>^合作|1印皙 塊待介確過表, II 形 的 SJ3C。 , 了 行片此 供所 塊 焊蝕刻為進基因 成法 接 是侵蝕 。要屆 η : 形方 焊 3 方被结需整部性 可種 成 原下是聯常在基靠 的此 形 的塊ft子通生的可 良用 在 要接通電,發塊的 改利 可 主焊 層的層 地接面 經及 種 III對金 間金勻 焊方 種, 一 二的冶之冶均小兩 一法 供 第 中方塊方法縮硪 供方 提 的程下接下無常锞 提的 於 部過塊焊塊常通¾於塊 在 基刻接各接經刻子 在接 的 的蝕焊壞焊刻蝕電述的焊 。目 塊學 ,破的蝕度的概目的塊脑 接化述以要為過结明個用接 一 焊的所 ,需因種鞴發一所焊另 「.小層上 間不是這塊 的結的的 ¾縮金如 之有這 ,接 明聯良明 觸能冶 ,塊所 ,而淳 發置改發 接一OJ的說接去刻然T本設經本 想方地焊除蝕 。泜 子的 整 下定於保度面洚 電成 •5t_ •打— 200417 A 6 B6 五、發明說明(4) 過程中深留焊接塊基部的方法:. (锜先閱請背面之注意事峭再填寫本頁) 不發明的又一値目的在於減少在形成焊接塊的過程中 對焊接塊下部的浸蝕: 本發明的又一値目的在於降低介於焊接塊及其下方的 接辑塾之間的不良對齊:, .訂· 根據本發明,利用軟焊或在独刻介於焊接墊之間的在 焊接塊下方冶金層之前先熔融焊接塾,達成上述目的。介 於焊接塊下方冶金層與焊接塊之間的夾層因此披形成在焊 接塊及接觸墊之間,在焊接塊的基部上,在蝕刻在焊接壤 下方冶金1之前,:,依上所論,至少介於焊接塊及接觸墊之 間的淳接J·鬼下万<&…五.層的部刀· ί皮磚爱為/「於澤接凉丨、方占 金層及焊接塊之間的夾層,在蝕刻在焊接塊下方冶金層之 前:最好,焊接塊下方冶金層包括铜製頂層及使用鉛一錫 焊钭時,所有銅製頂層被轉愛為銅及錫製的夾層。 •線. 金屬間的夾層可抵抗被用來蝕刻焊接塊下方冶金層的 蝕刻液3因此,焊接塊下方冶金層可以被移動於接鶚墊之 間,而同時保持冶金層在焊接塊的基部。依上所論,用本 1明的方:去來莖主焊接埤’1 t産主最量的澍涅凄魂荃部 的浸蝕,因此保持了焊接塊基部的尺寸,而接镯墊也不會 波暴露3焊接塊聯结的電子及機娀的可靠度也被強(匕。 本發明降低焊接墊及位於其下方接觸墊之間的不良對 齊,fc容忍在畫出塊接塊累積層的形狀中的杻曲變形。待 定地說,一連缥的焊接塊下方冶金層詖形成在接觸墊及徹 -7 - ^ 'xc;^ ν : n ·.> *ι 200417 A6 B6 五、發明説明(Jr ) 電子基片二者之上,介於接觸墊之間。焊料阻隔(d a π s) 形成在焊接塊下方冶金層上,介於接觸墊之間,焊料阻隔 暴露該焊接塊下方冶金層在接觸墊之上。被暴露的在接觸 墊上的該焊接塊下方冶金層界定焊接塊基部的位置。在軟 焊的過程中,焊接料會回收或擴散至這些區域, 焊料阻隔(d a m s或s t q p s )最好是從一薄膜層(约為 1微米或更小的等级),如一薄層的鉻(約為1 5 0 0徹 米),其有效地附著於焊接塊下方冶金層3應用習用的積 韹電路攝影刻印法,準確地對齊焊料阻隔到其下方的接觸 墊:最好利用1 i f t - a f f技術來形成焊料阻隔的形狀:當然 也可以用具他《ί影刻印技術來形成焊科®隔的形狀3 經濟部屮处櫺个局SC工消';'合作;1卬製 (請先閱讀背面之注意事項再填寫本頁) 焊接累積區域被形成在焊料阻隔上。這些區域(可以 是厚膜光敏電阻器,約為5 0徹米的等级)僅需累積焊接 體積。他們不需被用作對齊目的,因為焊料阻隔提供精確 對齊3依上所論,厚膜焊接累積區域的不良對齊及杻曲變 形不會縮小在接镯塾上方的焊接塊基部。焊接塾被電鍍到 在接觸墊上方的基片上,在焊接塊下方冶金層部分由焊接 S湯暴31的遙域及焊接累堊域二f上:然後.可以涂去焊 接累積區域。 然後,在移走介於接觸墊之間的焊接塊下方冶金層之 前,焊料被熔化以形成一焊接塊,這値焊接塊有一片介於 焊接塊及在接觸墊附近的焊接塊的基部的焊接塊下方冶金 層之間的金属間夾層。舉例而言,在該焊接塊下方冶金層 A6 B6 20041?
五、發明説《I (請先聞讀背面之注意事邛再填寫本頁) •襄· •訂…:
經濟部屮史標"勾W工^"合作沁印W 的最上方的成分是銅且使用 铜/錫金1間夾1 s在軟焊 的_向灌敎及焊科的未厍滿 焊料阻隔及焊接塊下方 庚用至少一種轴刻液,這種 及電子的可靠 圖式簡介 圖1至圖5是敗據本發
小於蝕 绖被形 液的影 成的混 來刻 \R 下方冶 «箸保 及電子 此 接墊及 玻形或 :¾ 、丨工: ν〇 -·;·^\ U〆 塊邊緣 論,本 形改善 刻焊接 成在焊 鎏。持 合物可 , 這 金.1的 存诨接 的可靠 外,吾 焊接塊 在每茴
π m 'M 及在焊 發明産 了機滅 塊及焊 接塊的 定地說 以波用 些独刻 明所得 独刻或 塊的基 性: 人fc發 下方;台 焊接塊 :旱接宽 接塊下 生一種 接塊上 基部, ,由氫 來蝕刻 液部不 到的焊 焊接墊 部的幾 現,在 金罾二 基部處 々Γ7 ‘·(- 方的接 新的焊 傳統鉛 過程中 ,及控 冶金層 註刻液 方冶金 焊接塊 氣化銨 銅,氫 會影謇 接魂的 不良對 何形狀 /錫焊 ,焊料 制焊接 被蝕刻 独刻金 層。即 便比較 及少量 氯馥基 铜/旻 基部不 齊/杻 ,本發 料時, 阻隔防 塊基部 以隔绝 =¾ 3B Ttr
* 13J 然金驀 不容易 的過氧 蝕刻液 金蜀間 羞a為 曲變形 明才能 本發明的軟焊步驟中,介於焊 者之間有側向活動。依前論, 的金1間夾層延伸過每画焊接 一 s部:渣蕕吾部提洪對淳m 獨墊的邊综二者的保護,ί衣前 接塊外形,這種新的焊接塊外 度, 明,在一徹電子基片上,形成 9- 便形成一 止焊接塊 的尺寸。 焊接塊, 層的速度 間夾層已 受到蝕刻 化氫所混 可以被甩 夾層d 對焊接魂 而變小3 強化機減 A6 B6 20041^ 五、發明説明(Ί) 焊接塊的過程中,該微電子基片的橫剖面視圖3 圖6是依據本發明所形成的一値焊接塊的描瞄電子顯 微鏡相片3 最佳實施例詳述 以下将配合所附圖式,更詳細地說明本發明,圖式所 示的是本發明的最佳實施例。然而,本發明可以許多不同 形式來實施,因此本發明不應該局限於圖式中的實施例, 實施例被用來使本發明所掲示的内容連貫及完整,且將充 分傳達本發明的範蹯给熟於此技S者。在所有的圖式中, 相同的參數指的是相同的元件。 請參考_ 1 ,如函所示,一礅電子基片1 ύ的上S有 一些接镯墊1 2。習於此技《者應該了解微電子基片1 ◦ 可以是一積體電@晶Η , —電子電路板或徹電子套装板, 或任何一種需要電子及機滅聯结的基片。本發明是利用習 知的技術來安装接觸Ml 2至基片10上面,因此,不持 別介紹二者之間的聯结關偽。接觸墊通常是鋁,因為鋁常 被用來製作積體電路晶片,雖然,其他金屬及金屬複合物 C可G波甩來製5積違電路及其也基片: 圖1也頴示一鈍化電介質1 4被安排在基片1 0上, 其鈍化電介質1 4的形狀正可以暴露接觸墊1 2 ,使用傳 統的等離子態或反應式鐵蝕刻或其他習知畫圖形的技術。 —tr ; 一連缥的在焊接塊下方冶金層1 6 •安基片1 0的上 方,焊接塊下冶金層1 6的部分覆蓋在接觸墊1 2上面, -1 0- ^ ;·5. ^ ^ ''ifCNS ' ^ ν?〇; Λ (請先閱讀计面之注素事項再填寫本頁) •装· .訂. 200417 A6 36 五、诠明説明(y ) 焊接塊T方冶金層L 3的其他部分則介於這些接獨墊1 2 之間,熟於此技藝者*該十分了解,該焊接塊下方冶金.層 1 6通常包含一(底部:;鉻層(约1 0 0 0埃厚)靠近基 Η 1 0及接镯墊1 2 ,其功能是作為該焊接塊下方冶金層 35黏合1及障礙,一頂銅層徽米厚)通常凌吊 經濟部屮失標苓局^:工^''合作^卬54: ο 用棟 在暴 ,上约最焊部的産因脱以這 ο 利接 排 -分 2.¥成的的¾來是 一 可在 ο 以焊 安間部 1 用 形缥要薄法這用 ,排 1 可該 被 之的墊利的連需 舆刻 ,利層安 ^明成 。8 2 方獨以 8 一不 .蝕形 。隔波 (, 發形绍 1 i 上接可 1 成去 Π- 影變 展阻將 層本來介層 M2在明層形除丨 攝曲發料塊 0 , 別止鐲 1 接發隔面來 1 路扭的焊接 \ 間塗待阻接墊直本阻上術 隔電及精的焊 络之噴此接於鐲的 。料的技沮護齊更方後 的層或在焊7>接 6 蓋焊 6 刻 抖 漬對 及 上以 相銅 發不或 ,在 1S,, 1 蝕 用良合 2 ί 定及蒸文隔面 6 層所隔層或 的 利不黏1溝 1 層如本阻Χ1 金 S 阻金雜 栗 -的 的墊的 及鉻諸 ,钭 6.1冶 1 钭;έ脫3下低佳 >觸8 , 該 ,此焊 i 金方隔焊方 HE 的之較較"、在 1 1於1因 一 € 冶下沮钛下利.1較有 ,位層 金介技 , -茧方塊v-參或塊再^相以射接隔 接而位 6 2(ο下接$鉻接後有器可散直阻 揮排定 la 万塊焊波的焊然 具阻案光走料 可安 膜層考 F 接該未 埃 該 ,生電 画 的移焊 1 被薄屬 ® 塊焊 ,分 ο 在 1 荖敏的低來於 為丨的金諳接該之部 ο 先隔而光膜較術介 作厚统方 焊出言的 5 是阻 ,膜薄有技到 來埃傳下 該露變方 1 好料分厚生 為離得 (锖先閱讀背面之注意事項再填寫木頁) •襄· •打:: " t :Λ ri ^ s ! r\·^
20041V A6 B6 五、诠明説明("/ ) 痼部位)之間的對齊,及其下方的接觸墊1 2。 請參考圖3,在焊料阻隔18上面形成焊料累積區域 2 8 3這些區域可以是厚膜光敏電阻器。即然焊料累積區 域披用來累積焊料體,且不需被用來與接觸墊1 2對齊, 它1_門之間不良的對齊及扭曲菱形不會縮小焊接塊的基部。 請繼缠參考圖3 ,在基片1 0上方形成焊料墊20, 通常是用電鍍的方式來實施。在電鍍的過程中,填滿焊料 累積區域中空間2 8需要體積。焊料墊2 0可以被容纳在 焊料阻隔1 8之間的溝中,或被允許延伸過焊料阻隔,如 圖3所示。然後,焊料累積區域2 8可被移走3 現圧請参考圖4 ,汪移走7「於接觸兹1 £之間的該焊 ϋ訂龍M20 —熳’』詩 痼焊接塊24的基部形成介於金屬中間的夾層2 2。焊接 塊下方冶金層1 6最頂部的成分是銅時(厚約1微米)且 使用傳統的鉛一錫焊料(錫所佔重量比約為百分之五), 則焊接塊下方冶金層1 6所形成的的介於金屬中間的夾層 2 2是三銅化錫3熟於此技藉者應該了解一薄層的焊接塊 下方冶金,116 :通常其底部是鉻層及定相的铭一铜1, 圖4未顯示)可保持在介於金屬間夾層2 2及接觸墊1 2 之間的接觸墊1 2上面。 為了確保在該焊接塊下方冶金層1 6頂層的銅能幾乎 轉變成金屬間夾層2 2 ,丨軚焊最好以高於焊料熔點的溫度 來進行1— 2分鐘。在定相的絡一銅區域的不轉變的銅防 -1 2- (請先閑讀计面之注意事項再填寫本頁) ,策· * J^:: 20041? A 6 B6 五、S'明說明>:!C ) 止淳科塊脫雞詻站合1,所以,tt強it 了结溝的整_性:. 在軟焊的過程干,焊接阻隔1 3防止焊料的刨向擴散及跨 越,所以,1£控制了诨接塊基部的尺可:钦焊可以在空氣 中進行或是在諸如氖氣的化學鈍氣流通的環境中來進行, 通常是有助熔液,&可以在諸如氫氣的降泜的流通環境中 來進行,通常不芾肋溶液:如熟於此技藝者所知一般,Μ 該在蝕刻該焊接塊下方冶金層1 6及焊料阻隔1 8之前, 清除肋熔液殘渣(如杲産生): 圖4也漂示,在軟焊的過程中,在焊料2 0及焊接塊 下方冶金層1 6之間存在一制向的相互作弔:依上所論, 菝形职圧每涸焊接魂F面的βi .¾中周的夾/¾ s :s —召 或脊2 6 ,每個唇或脊2 6通常浞焊接塊延伸數微米:,1 或脊2 6可能波用來指3拫據本發明所形成的焊接塊,因 為,若介於各画接蕷M L 2 2間的焊接塊下方冶金層1 6 在軟焊的過程之前已绖波移走,則焊料20與焊接塊下方 冶金層1 6之間的_向相互作用不會發生:唇或脊2 6也 對焊接塊的基部提供更高程度的保護3 it因此産生了一種 S; ra S -Ϊ* 3 IS :¾ ^W*S. U _·*'«- « -J - r 广 J-·、 ^ ^ 請参考麗15,介於各接獨墊12之間3¾焊钭狙塥13 及焊接塊下方冶金層1 6被移走,而保留波軟焊過的if f斗 塊2 4的基部;,即然介於焊接塊2 4及接镯墊1 2之間的 焊接塊下方冶金層1 6的頂層的銅已經波轉變為介於金屬 中間的夾層,便可以移走介於各(固接獨Μ ί 2之間的焊科 (锖先閱讀计面之注奇事項再填寫本頁) •策* ,訂…· 把濟郎中丸檔·;'ι^Μ工^^合作汴卬製 夂 A ' 今:5 r jq 3 ,.r 20041? A6 B6 經濟部屮央i?-f-ri3工消'(''合作认卬" 五、發明災明(丨/ ) 阻隔13及留下來的焊接塊下方冶金層16,而不會除去 介於金屬中間的夾層3 —種蝕刻液或數種蝕刻液被用來蝕 刻介於金屬間的夾層2 2及焊料阻隔1 8及焊接塊下方冶 金層1 6,蝕刻介於金屬間的夾層2 2的速度必須小於蝕 刻焊钭姐隔i 3及焊料塊下方冶金層1 6的速度。最好, 這些蝕刻液在移走焊料阻隔1 8及焊接塊下方冶金層1 6 的同時,不會蝕刻介於金靥中間的夾層2 2。 舉例而言,若以鉻來做成焊料阻隔18,氫氛酸基蝕 刻ί夜,諸如 T r a n s e n e C S E 4 7 3可作為一有效的蝕刻液,而 由多量氫攱證及少5過氣化氫(通常其濃度高於在銅蝕刻 液甲的過化物的濃度)所混成的混合物是有效的3多S 蝕刻液可被用來除去定相的鉻一銅層及底部的鉻層3這些 蝕刻液中没有任何一種能夠蝕刻銅/錫金屬間夾層,也沒 有任何一種能夠蝕刻焊接塊2 4至一種可脱離的程度。熟 於此技ϋ者將明白,在蝕刻銅的過程中,可以保持整®設 置在蝕刻液中一段時間,直到完全除去介於焊接塊2 4之 間的銅3熟於此技ϋ者也将明白,本發明tfc可以使用其他 的Η刻衮及其他的通程來除走不霈的部分 依上所論,本發明提供一種較為優良的焊接塊製造過 程。發生在厚膜光敏電阻$的攝影蝕刻過程中的瑕疵無法 降低對齊的程度。此外,在蝕刻焊接塊下方冶金層1 6的 過程中,本發明也降低或避免蝕刻焊接塊24的基部3所 以,本發明能保留焊接塊2 4基部的幾何形狀。事實上, -14- (請先閱讀计面之注意事頊再填寫本頁) .¾. •訂:· · 線 200417 A 6 B6 五、發明説明(/ i ) 本發明的製程更進一步在厍接塊的基部形成一唇2 3,以 保護焊接塊2 4 ,因此,強化了電子及機滅兩方面的可靠 度:.圖6是利周一掃瞄’電子顯微篾對液據本發明所産生的 一焊接塊2 4所抬的掃瞄電子頭激照片,圖6顯示焊接塊 2 4 , 1 2 6 及基 Η 1 0 : 熟於此技ϋ者将明白,本發明利用在除去介於接辑墊 1 2之間的焊接塊下方冶金層1 6之前軟焊焊料2 0 ,不 受不良對齊/扭曲爰形的影銮,而能夠對焊料塊2 4的基 部産生較少的侵註:舉例而言,在某些微電子基片的設計 中,設計者所設計出來的焊接塊的基部可能大於接镯墊, 因此,焊抖塊與接獨墊,2間的封齊就相對地不重要。焊接 塊與接觸對之間的不良對齊或扭曲變形可以被忍受, 本文將在以下説一種簡化的而又能容忍介於焊接塊及 接獨墊之間的不良對齊或杻曲愛形:,焊接塊下方冶金層可 .以包含與上述者相同的底部鉻層,定相的鉻/銅層及頂部 的銅層。然而,在上述的頂部銅層之上再設一第二鉻層: 如上述般來形成及畫出一焊钭累積層,例如厚摸光敏電阻 is , 3: a s , τ形或上;i右專嵙阻隔響_ 然後,移動第二鉻層至焊料累積層的穴中,再液上述 方式來電鍍焊料3移走焊钭累積1之後,軟焊這些焊料, 以形成一介於金屬中間的夾層並如上述般保護焊接塊的基 部3介於接镯墊之間的第二鉻層避免波軟焊的焊料跨越3 第二鉻層可能無法被精確地對齊到接觸墊,但由於基片的 -1 5 - ί請先聞讀背面之注意事邛再填寫本頁) •装· .訂:: 經濟部屮史|?平砀嵙工^';'合作;1卬" 艮吆:·\ ?、t ..七 3 1 ',!/〇丨:;' τ !卜-1 了十,
2〇〇4iV A6 B6 五、發明說明(ί $ ) 設計,這樣的不良對齊相對就不是很重要。由於除去介於 接觸墊之間的焊接塊下方冶金層之前軟焊這些焊料,蝕刻 焊接塊下方冶金層的過程中,焊接塊的基部仍然被保護。 上述說明及所附圖式掲示本發明的數種較佳實施例, 雖然本文使用了待定的名詞,這些名詞僅被用來描述而不 被用來限制本發明,本發明的範醻應由以下的申請專利範 圍來界定。 (請先閱讀背面之注意事項再填寫本頁) •51· .打:: 經濟部屮丸標';'1-局負工消';*合作;-1卬" -1 6 衣饫分又t T丨Π (D's)甲1規巧Π1 η X ?Q7公弩)

Claims (1)

  1. B7 C7 D7 20041? 六、申請專利範圍 (請先閱讀背面之注急事項再塡寫本頁) 1 . 一種在一基片上面的接觸墊上面形成焊接塊的方法, 這種方法包括一列步驟: 在該接觸墊上面,及在該基片上於該接觸墊之間,形 成一焊接塊下方冶金層;然後 在該焊接塊下方冶金層上面介於該接觸墊之間形成焊 钭阻隔,該焊料阻隔讓該焊接塊下方冶金層暴露在該接觸 墊之外;然後 在該焊料阻隔上面形成焊科累積區域,該焊料累積區 / V,!- 域讓焊接a下方冶金層暴露在該接觸墊之外;然後 在該接諝塾之上形成焊钭μ,該焊料墊是在該接鶚墊 上面的焊接塊下方冶金;1的工面,該焊料Μ被該焊料阻隔 及該焊料累積區域所暴露;然後 軟焊該焊料塾以形成焊料塊,每個焊料塊有一介於該 焊接塊下方冶金層及該接觸塾附近的該焊科之間的金屬間 夾層;然後 利用至少一種蝕刻液來蝕刻介於該接觸墊之間的該焊 料阻隔及該焊接塊下方冶金層,該蝕刻液蝕刻該金屬間夾 .5的速度小於蝕刻該焊料姐隔1該辱接塊下方冶金1的速 度,藉此降低對該接觸墊附近的該焊接塊基部的浸蝕。 經濟部中央標準局貝工消费合作杜印髮 2 .如申請專利範圍第1項所述的方法,其中該形成 一焊接塊下方冶金層的步驟是在該基片上形成一鈍化層, 介於該接觸塾之間。 3.如申請專利範圍第1項所述的方法,其中該形成 B7 C7 D7 2004^ 六、申請專利範圍 (諸先閲讀背面之注意事項再填寫本頁) 一焊接塊下方冶金層的步驟所形成的該焊接塊下方冶金層 包括:該基片及該接觸墊附近的一鉻層,在該鉻層上面的 一介於鉻/銅之間的定相的夾層及在該絡/,銅夾層上面的 一銅層。 4 .如申請專利範圍第1項所述的方法,其中該形成 焊料阻隔的步驟包括下列步驟: 在該基片上面形成一薄膜焊料阻隔層,部分介於該接 觸墊之間且部分在該接觸墊之上;及 移走該薄膜焊料阻隔層在該接觸塾上方的部分。 5. 如申請專利範圍第4項所述的方法,其中該移走 該薄膜焊料阻隔層的部分的步驟包括移走在該接辑塾上方 的該焊料阻隔層的步驟。 6. 如申諳專利範圍第1項所述的方法,其中該形成 焊料的步驟包括鍍焊料至該接觸之上,在該焊接塊下方冶 金層上面,該焊接,塊下方冶金層被該焊料阻隔及該焊料累 積區域所暴露。 7. 如申請專利範圍第1項所述的方法,其中該軟焊 的步驟包括熔(t該焊科墊的步驟。 I ®濟部中央揉準爲貝工消費合作社印* 8. 如申請專利範圔第4項所述的方法,其中該軟焊 的步驟更包括軟焊該焊料塾以在該金屬間夾層之中形成一 唇的步驟。 9. 如申請專利範圍第1項所述的方法,其中該焊料 包括鉛/錫焊料,其中該焊接塊下方冶金層包括銅,且其 本纸張尺度適用中國®家樣準(CNS) T 4说格(210 X 297公釐) 經濟部中央標準局S工消费合作社印K A: 200417 C7 D7 六、申請專利範園 中該軟焊步驟包括軟焊該焊料墊以形成具有一銅/錫間金 屬夾層的焊接塊的步驟。 10. 如申請專利範圍第1項所述的方法,其中該形 成焊料累積區域的步驟包括在該焊料阻隔上面形成厚膜焊 料累積區域,以便在該形成焊科阻隔的步驟中包含該焊料 墊,的步驟。 11. 一種在一基片上面的接觸墊上面形成焊接塊的 方法,這種方法包括一列步驟: 在該接觸墊上面,及在該基片上於該接觸墊之間,形 成一焊接塊下方冶金層;然後 在該接觸墊Z上的該焊接塊下方冶金層上面形成焊料 區,介於該接觸墊之間的該焊接塊下方冶金層不承接任何 焊料;然後 利用軟焊該焊料,使在該接觸墊之上的該焊接塊下方 冶金層的部分轉變成介於該焊科塊下方冶金層及該焊料二 者之間的夾層,的步驟;然後 在該接觸墊之上形成焊料M,該焊料Μ是在該接觸墊 上面的焊接塊下方冶金荖的上面,該焊钭該焊钭阻隔 及該焊料累積區域所暴露;然後 軟焊該焊料墊以形成焊科塊,毎値焊料塊有一介於該 焊接塊下方冶金層及該接觸墊附近的該焊料之間的金屬間 夾層;然後 移走介於該接觸墊之間的該焊料阻隔及該焊接塊下方 本纸張ϋϋ用中3®家揉準(CNS)甲4觇洛(2U1 X 297二兮) ------------------------裝-------tr-------線 (請先閲讀背面之注意事項再塡寫本頁) 經濟部t央揉準房典工消费合作社印K 20041? Z C7 __D7 六、申請專利範面 冶金層,而保留該焊接塊下方冶金層在該接觸墊之上的部 分,藉此降低對該接觸墊附近的該焊接塊基部的侵蝕。 12. 如申請專利範圍第1 1項所述的方法,其中該 形成一焊接塊下方冶金層的步铤是在該基片上形成一鈍化 層,介於該接觭墊之間D 13. 如申請專利範_第1 1項所述的方法,其中該 形成一焊接塊下方冶金層的步驟所形成的該焊接塊下方冶 金層包括:該基片及該接觸墊附近的一鉻層,在該鉻層上 面的一介於鉻/銅之間的定相的夾層及在該鉻/銅夾層上 面的一銅層。 14. 如甲請專利範圍第1 i項所述的方法,其中該 形成該焊料的步驟包括鍍焊料至該接觸墊上面的該焊接塊 下方冶金層上面。 1 5.如申請專利範圍第1 1項所述的方法,其中該 形成焊料的步驟包括在該接觴上面的該焊接塊下方冶金層 上面形成焊料,而\不在該接觸墊之間形成焊料。 16. 如申請專利範圍第1 1項所述的方法,其中該 軟焊的步驟包括熔化該焊料墊的步驟。 17. 如申請專利範臞第1 1項所述的方法,其中該 轉變步更包括在利用軟焊該焊料而該金羼間夾層形成一唇 的步驟。 18. 如申請專利範圍第11項所述的方法,其中該 焊料包括鉛/錫焊料,其中該焊接塊下方冶金層包括銅, 夂纸張尺適用中围同家橒準(CNS〉ψ 1規格(210 X 297公兮) --------------------------裝------,玎------線 (請先閱讀背面之:玉意事項再填寫本頁> 20041'V c: D7 六、申請專利範圍 (請先閲讀背面之注意事項再填寫本頁) 且其中該轉變步驟包括使在該接觸墊上方的該焊接塊下方 冶金層轉變成一銅/錫間金屬夾層的焊接塊的步驟。 19. 如申請專利範圍第15項所述的方法,其中該 形成焊料的步驟包括下列步驟: 在介於該接镯墊之間的該焊接塊下方冶金層上面形成 焊料累積區域,該焊料累積區域使該焊接塊下方冶金層暴 露在該接觸墊之外;然後 在該接觸墊的上方的該焊接塊下方冶金層上面形成焊 料,該焊料累積區域不存在於該接觸墊之間。 20. 如申請專利範圍第13項所述的方法,其中該 肜顷一焊接塊τ万冶金層的步驟更a括在該_層上面形成 一第二鉻層的步驟,且其中該形成焊料的步驟包括下列步 驟: 在介於該接獨Μ之間的該焊接塊下方冶金層上面形成 焊料累積區域,該焊料累積區域使該焊接塊下方冶金層暴 露在該接觸墊之外;然後 移走在該接觸墊上方的該第二鉻層;然後 在孩接想墊的上方的該焊接塊下方冶金歴上面形成焊 料,該焊料累積區域不存在於該接觸墊之間3 經濟部中央標準局Λ工消费合作社印* 2 1 . —種供一徹電子基Η所用的内部聯結条統,該 条統包括: 在該基片上的多痼接觸墊; 多値焊接塊,每一個焊接塊被安排在在一値對應的該. 本纸張尺度適用中as家樣準(CNS)甲4規格(210 X 297公釐) 〇 0041'^ Α7 Β7 C7 D7 六、申請專利範圍 娌濟部中央標準渴員工消费合作社印製 夾至 基且 基數 基墊與 該 應 唇上 基 間展 C 子塊 子展 子觸至 , 對 形墊 子 屬延墊電接 電延 電接展 統 痼 國觸 電 金外觸徹焊 撤外 微該延 糸 一 該接 微 的向接一錫 一向 一一外 結 在 ,的 一 間塊該供 I 供塊 供每向· 聯 排 辱結 供 之接護的鉛。的接 的在塊 部 安 形聯 的 墊焊保述是層述焊 述是接 内 披 圓塊 述 觸該此所塊夾所該 所塊焊 的 塊 的接 所 接從藉項接間項從. 項接該 用 接 有焊 項 該唇以 1 焊屬 1 唇 1 焊從 。所 焊 都形 5 的該 ,2 該金 2 該 2 該是方H.-該 部球 2 應,方第中錫第中 第中唇上基 墊画 基該 第 對唇上圍其 \ 圍其 圍其該的子 辑一 的與。圍 其 一的範 ,銅範 , 範·中墊電 接每 塊至墊範 塊括墊利統 一利统 利统其觸徹 傾 , 接展觸利 接包* 專条是專条 專条 且接一 多塊 及焊延接專 焊層接請結層請结 請结塊該供 的接;形外該請 該夾該申聯夾申聯 申聯接的種 上焊面球塊護申 •,値間的如部間如部 如部焊结一 片形上該接保如 面毎属塊.内JB.内 ·内形聯 ·:基球墊値焊此 . 上於金接 2 的金 3 的 4 的球塊 5 括該® 觸 一形藉 6 墊介該焊 2 用該 2 用 。2 用的接 2 包在多接每球以 2 觸 ·該 所中 所米 所面焊 統 該 該, 接 層與 片其 片{»片上該 条 的 從方 ------------------------裝------ΤΓ------線 {請先閲讀背面之注意^項再填寫本頁> 本紙張尺度適明伞闻两家堞翠(CNS)甲.1祁JM'210 X 297公牮) ,0041^ 申請專利範圍 A7 B7 C7 D7 錫 。基向 I 唇子塊 鉛形電接 形圓微焊 球的一形 是層供球 塊夾的該 接間述從 焊屬所唇 形金項形 球錫 5 圓 該 \ 2 該 中銅第中 其一圍其 , 是範 , 統唇利统 条 形專条 结圓請結 聯該申聯 。 部中如部米 内其 .内徹 的且 7 的數 用塊 2 用展 所接 所延 Η 焊 Η 外 ------------------------裝------#------線 (請先閱讀背面之注意事項再塡寫本頁) 缦濟部中央櫺準局員工消费合作社印製 本纸張尺Λ適用士 19¾家浮準(CNS)甲4规济(2U1 X 297 Α兮)
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DE69221627T2 (de) 1998-01-08
CA2116766C (en) 1999-02-16
KR940702644A (ko) 1994-08-20
KR0186061B1 (ko) 1999-04-15
WO1993006620A1 (en) 1993-04-01
JPH07502147A (ja) 1995-03-02
DE69221627D1 (de) 1997-09-18
CA2116766A1 (en) 1993-04-01
EP0603296A1 (en) 1994-06-29
EP0603296B1 (en) 1997-08-13
ES2106194T3 (es) 1997-11-01
US5162257A (en) 1992-11-10
ATE156935T1 (de) 1997-08-15
US5293006A (en) 1994-03-08

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