TW200401462A - Light-emitting diode device geometry - Google Patents
Light-emitting diode device geometry Download PDFInfo
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- TW200401462A TW200401462A TW092116487A TW92116487A TW200401462A TW 200401462 A TW200401462 A TW 200401462A TW 092116487 A TW092116487 A TW 092116487A TW 92116487 A TW92116487 A TW 92116487A TW 200401462 A TW200401462 A TW 200401462A
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- semiconductor layer
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- 239000004065 semiconductor Substances 0.000 claims abstract description 124
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 238000004519 manufacturing process Methods 0.000 claims abstract description 3
- 239000000463 material Substances 0.000 claims description 25
- 229910000679 solder Inorganic materials 0.000 claims description 23
- 229910002601 GaN Inorganic materials 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 14
- 238000005476 soldering Methods 0.000 claims description 9
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 6
- 239000007769 metal material Substances 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 5
- 238000003466 welding Methods 0.000 claims description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 3
- 229910052733 gallium Inorganic materials 0.000 claims description 3
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 229920006395 saturated elastomer Polymers 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000002019 doping agent Substances 0.000 description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 238000001451 molecular beam epitaxy Methods 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- -1 ... Shao Chemical class 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 238000003892 spreading Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 206010061218 Inflammation Diseases 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 235000010627 Phaseolus vulgaris Nutrition 0.000 description 1
- 244000046052 Phaseolus vulgaris Species 0.000 description 1
- 229910052778 Plutonium Inorganic materials 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 230000036760 body temperature Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 230000004054 inflammatory process Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- OYEHPCDNVJXUIW-UHFFFAOYSA-N plutonium atom Chemical compound [Pu] OYEHPCDNVJXUIW-UHFFFAOYSA-N 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28575—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0016—Processes relating to electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
- Y10S257/918—Light emitting regenerative switching device, e.g. light emitting scr arrays, circuitry
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Led Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Semiconductor Lasers (AREA)
Description
200401462 玖、發明說明: 【發明所屬之技術領域】 近來,諸多的注意力係已針對於丨丨〗_v氮化物為基礎 勺半導體且尤其疋氮化鎵為基礎(GaN-based)的半導體, 針對藍光、綠光、與紫外光的發光二極體(LED, Ught emittlng diode)應用。一個重要的理由係在於,氮化鎵為 基礎的LED係已經發現為表現於室溫之有效率的發光。 —般而言,GaN為基礎的LED包含一多層結構,於其 、i ” p型之GaN為基礎的半導體層係堆疊於一基板(最 為s遍為於一監寶石(sapphire)基板,n型為基礎的 半導體層為接觸於基板),且—透光的金屬電極層係形成 於p型半導體層。於某些實施例中,—活性(aetive)區域( 例如:其可為一單或多量子井(Quantum well)結構)係沉積 於P型與n型半導體層之間。一般而纟,多層結構之各層 係具有一四邊之平坦的頂表面。 體層之一個角隅或邊緣, (即:焊接墊)係沉積於該 、因為基板係通常為由一電氣絕緣材料(諸如:藍寶石)組 成,Ρ側與II側的電氣接點係通常均為作成於裝置之頂側 般而5,裝置之頂側的一部分係蝕刻以暴露
°玄P側接點係藉著形成金屬材料之一 電極層之頂表面而作成。 【發明内容】 種半導體發光二極 本發明係一種半導體裝置,諸如一 200401462 " )包3.基板、與於基板上的一 n型半導體層, 型半導體層具有-平坦的頂表面。該裝置亦包二 :於η型半導體層的一主要部分之_p型半導體層、與延 於p型半導體層的頂表面之—p電極層。該ρί!半導體 層與Ρ電極層係未延伸⑨以半導體層的一暴露區域,該 暴露區域係鄰近於η型半導體層之平坦的頂表面之至少一 邊緣^ — η電極焊接墊係設置於η型半導體層的暴露區 二^一第二焊接墊係設置於ρ電極層上,第二焊接墊係較 為覆蓋Ρ電極層之-面積’其約為對應於ρ電極層之平 坦的頂表面之幾何中心。 一—根據另一個層面,於ρ電極層之焊接墊可包含用於固 疋電氣互連件(諸如一焊接線)之一中央區域、以及其突 X中央區域之至少一個指狀區域。概括而言,指狀區 域具有其延伸為遠離該中央區域之H、與其實質為小 於該長度之一寬度。於一個實施例,指狀區域之長度:寸 係延伸為概括平行⑨η型半導體層之„邊緣。於另一個實 施例’焊接墊包括二個指狀區域’其延伸為遠離該中央區 域且為概括垂直於彼此。 根據又一個層面,η電極之焊接墊可包含用於固定一 電氣互連件(諸如一焊接線)之一中央區域、以及其突出自 ::央區域之至少一個指狀區域。概括而纟,指狀區域具 ,/、延伸為遠離該中央區域之一長度、與其實質為小於該 瓦度之-寬度。指狀區域係概括延㈣鄰近於^型半導體 層之-或多個邊緣。概括而纟,指狀區域係延伸為鄰近: 200401462 n型半導體層的外周邊之不超過約為5〇%。 典型而言,於p電極層上的焊接墊與於η型半導體層 上的焊接墊係各為由一或多種金屬(諸如:金、鈦、銘、铜 '鉑、與鈀)之一金屬材料所作成。於某些實施例,各個 焊接墊係可為由一實質相同的材料所作成。 本發明之裝置的幾何構造係提供於LED之活性層的電 流注入之改善的均勻性,且因此造成改善的裝置效率。特 別而g,P焊接墊之指狀突出部係有利於電流散佈於p電 極層之整個面積。此係有助於降低該裝置之操作電壓,且 改善裝置效率。此外,n焊接墊之指狀突出部係改善於η 型半導體層之電流散佈,其進而有助於降低操作電壓且改 善裝置效率。 本發明之前述以及其他目的、特點與優點係將為顯明 ,藉由本發明之較佳實施例的以下較為特定說明,如於隨 附圖式所示,其中,類似的參考符號係指於不同圖式之相 同構件。該等圖式係無須依比例繪製,而是強調於說明本 發明之理念。 【實施方式】 本發明之較佳實施例的說明係如後。 本發明係概括關於半導體裝置,且尤指半導體發光二 極體(LED)。於特定的實施例,本發明之LE])包括至少一層 之GaN為基礎的半導體材料。如運用於本文,術語“ ο』 為基礎(GaN-based)的半導體材料,’包括其可為式子 IrMlyGa卜x_yN所代表之一種半導體材料,其中:osxs! 10 200401462 ’ 0 ^ y $ 1,且 X+y S 1。 現在參考第一圖,一 GaN為基礎的LED係顯示於示意 的橫截面。LED裝£ 100包括一基板1〇1,其於此例係包含 一藍寶石基板。一層之11型GaN為基礎的半導體材料 係直接在基板101之上方。n型半導體層丨〇2係較佳為摻 雜以一 η型摻雜劑,諸如:矽(Si)、鍺(Ge)、硒(Se)、硫 (S)、或碲(Te)。呈現為n型導電性之一未摻雜的GaN為基 礎的材料係亦可運用。 & 一活性區域1 03係在n型半導體層丨〇2之上方,且隨籲 後為一層之p型半導體材料1〇4。一般而言,一活性區: 包含:半導體材料之一區域,具有一域帶間隙(band , 其為小於活性區域之各側的半導體層之域帶間隙。較大的 域帶間隙之η型與ρ型半導體材料係建立電位障壁於活性 區域之二側且引起載體(即:電洞與電子)為限定於活性區域 ,於其載體可結合以發光。 於此實施例,活性區域103包含:交替堆疊的ΙηΑ〜_ xN/GaN層之一個多量子井結構。一層之^州為基礎的 n 半導體材料104係在活性區域1 〇3之上方。 將可瞭解的是,除了多量子井結構之外,活性區域 103亦可包含單-量子井結構。此外,於其他的實施例, 活性區域係可整個除去,且n型與p型的半導體材料1〇2 、1 0 4係可作成直接為接觸於彼此。 一 ρ型GaN為基礎的半導體層1〇4係在活性區域1〇3 之上方。一般*言’ 一ρ型GaN為基礎的半導體材料係其 11 200401462 包括- P型摻雜劑之1化鎵為基礎 氮化鎵為基礎的半導體材料 +導體材料。用於 ' P型推雜南丨f 认 (accepted)包括:第二族(Gmjp⑴以亦稱為一受體 、鈹、鎮、約、錄、與鎖 “ H鑛、鋅 典型而言,於氮化鎵為基礎遂Ρ型摻雜劑係鎂與鋅。 不勺丞礎的+導體材 有氫原子之氣體化合物係孰 之成長期間,含 釋放的氮原子(其主要為二該半導體材料。所 材料,且結合。型摻雜劑而抑制其:^ 氮化鎵為基礎的半導體材料之導電性〜改善Ρ型 鐘或更多。捕捉料導_之質子係==7 負電極,因而活化p型摻雜劑之炎自::枓而抽取至 案第1〇/1 27,345號h或者, ".美國專利申請 材料之導電性係可改二=的"體 溫度在攝氏600度以上而持浐 、氮軋裱境且 國專利第5, 306, 662號)。Λ、》鐘或更多者(參閱:美 -二電=5係直接在。型半導體,1〇4之上方。 又而吕,Ρ型電極係由—或多種金屬(諸如··金、錄、翻 、紹、錫、銦、鉻 '與敍” 材料俜沉積方〜D却本:一、'屬材料所形成。該金屬 火二:!例?導體層之實議個頂表面,且係^ 之广措同 大於攝氏450幻,較佳為於-含有氧氣 ϋ P電極層105係較佳為光透射性⑴ght :=s::,意謂著:其為能夠於其透射至”之發射 叙為基礎的半導體裝置之光線’且典型為透射大約 12 200401462 為50%或更多之發射自該氮化鎵為基礎的半導體裝置之光 線。 P電極層105係較佳為形成與p型半導體層之—歐姆 接觸(ohmic contact)於二個材料為接觸之一區域,俾使其 流通於二層之間的介面之電流係約為正比於二層之間的電 位差異。 υ 第一圖之LED更包括-n焊接墊⑽與—p焊接塾 1〇7,以提供電氣接觸至該裝置。n烊接墊iG6係由其為沉 積於η型半㈣層1G2的—暴露表面之__或多種金屬(諸如 .金、鈦、銘 '銦、翻、與麵)的金屬材料所形成。該η型 ::暴露表面係通常為藉著姓刻該裳置之上層以暴 Π體層的—區域而製成。一般而言,該η型半導體層的 暴蕗區域係鄰近於該層之平 、 曰(十坦頂表面的至少一個邊緣。 錄二蟬接t 1G7係由其為沉積於Ρ電極I 105之一或多 種金屬(諸如:金、欽、I呂 ^ 一 形成。 鉑、與鈀)的一金屬材料所 現在參考第二圖,根摅太 ™ 據本發明之-半導體LED 100的 俯視圖係顯示。該裝置係具 的 邊。該四個側邊係概括為對庫; 括為矩形的四個側 面的四個側邊(未顯示)。_ 千一頂表 主要部分,而未覆蓋其鄰近:矩::^ 一區域。—Ρ谭接墊1〇7 之至少—個邊緣的 中心。 、、力為位於Ρ電極層105之幾何 Ρ焊接墊1 〇 7包括·用^m — 用方;固定一電氣互連件(例如:焊接 13 200401462 線)之一中央區域201、以及其突出自該中央區域2〇1之二 個指狀區4 202、203。-般而言,該等指狀區域具有其延 伸為遠離該中央區域之一長度、以及其實質為小於該長度 之-寬度。如於第二圖所顯示,一第一指狀區域2〇2係: 伸為遠離中央區域201且平行於矩形LED之—側邊,且一 第二指狀區域203係延伸為遠離中央區域2〇1且平行於 LED之另一侧邊。該二個指狀區域2〇2、2〇3係延伸為遠離 中央區域201且概括為以關於彼此之一垂直方向。
η ¥接墊106係設置為鄰近於矩形的led裝置之至 少-個邊緣。η焊接塾1G6係位於該裝置其未自p電極層 1〇5所覆蓋之-區域。—般而言,巧接墊係位於n型半導 體層之一暴露區域(未顯示)。 η焊接墊10 6包括··用於固定一電氣互連件(例如:焊 線)之一中央區域2〇4、以及其延伸為遠離該中央區域2 之二個指狀區域205、206。如於第二圖所顯示,中央區域 204係可位於該裝置之一角隅。該η焊接墊之一第—指狀 區域205係延伸沿著該裝置之一第一邊緣且於中央區曰域 204之一側,而該η焊接墊之一第二指狀區域2〇6係延伸 沿著該裝置之一第二邊緣且於中央區域2〇4之另一側。 第三圖顯示«置之另—種設計。在此,豸η焊接塾 之中央區域204係位於概括矩形的LED之一個角隅。—第 二指狀區域207係鄰接其對立於中央區域2〇4之第一指狀 區域206的it端,且延伸沿著一第二邊緣而朝向該裝置的 角隅,其為直接對立於中央區域2〇4所位在的角隅。該p
14 200401462 電極層105係延伸為實 覆蓋之其餘區域,且該 1 0 5之幾何中心。 質於該裝置其未由n桿接墊丨〇6所 Ρ焊接墊係設置於約為ρ電極層 …圖,又—個替代的實施例係顯示。在此,〇焊 接整之指狀區域205、206盥川7及&
Ub與207係延伸至矩形LED之三個 鄰邊的部分。 〇 /將可瞭解的是,對於P與η焊接墊之種種替代的設計 ,、可根據本發明而利用。一般而言,薄的指狀突出部係可 設置於η焊接墊或_塾(或是二者)以利於電流散佈與 均勾的電流流通於該裝置。典型而言,〇焊接塾之指狀區 域係延伸於LED晶片的總周邊之不超過约為5〇%。 根據本發明之-種製造UD裝置的方法係描述於後。 -般而言:半導體裝置層係可藉著一種汽相成長(⑽⑻ 方法而製把,4如:金屬有機化學汽相沉積(⑽CVD,㈣士。 organic chemical vapor deposition ^ ^ MOVPE) ^ 化學.汽相沉積⑽™, hydride c—1 vapor deP〇Sltl〇n)、或分子束外延(MBE, molecular beam ePitaXy)。接著,用於提供該n焊接墊工⑽之打型半導體 層的暴露區域係可為由—習用之電漿辅助的钱刻技術而界 定。 °亥n焊接墊1 Q6與p焊接墊1 G7係可藉著習用的金屬 沉積技術(例如:藉著電子束及/或電阻式加熱錢鍍之蒸發 )而开V成;!:于接塾之設計(即··中央區域與指狀區域)係可為 由一標準的光刻法與金屬圖案(蝕刻或發射(丨丨ft〇f f ))製程 15 200401462 而界定。對於 而同時界定。 P與η焊接墊各者, 指部可為如同中央區域 較佳實施例’ρ與η焊接塾係各為—個三層的金 屬堆疊而形成’豆包含藉著 匕3稭者電子束瘵發所沉積之一第一層 之把 苐—層之铭、與一第二声夕令。妙^么 層之金然後,該金屬堆 噓係退火於攝氏450度或更高之一溫度。 儘管本發明係已經關於其較佳實施例而特定顯示及說 明:熟悉此技藝人士將可瞭解的是,於形式與細節之種種 的?化係可作成於其,而未偏離由隨附的申請專利範圍所) 涵蓋之本發明的範缚。 【圖式簡單說明】 (一)圖式部分 第一圖係一種半導體發光二極體(LED)之示意的橫載面 圖; 第—圖係—種半導體LED的俯視圖,顯示與卜電氣 接點之幾何構形; 第三圖係一種半導體LED的俯視圖’顯示P-與η-電氣 接點之另一構形;及 第四圖係一種半導體led的俯視圖,顯示p—與η_電氣 接點之又一構形。 (二)元件代表符號 1 〇〇 led裝置 101 基板 102 η型半導體層 16 200401462 103 活性區域 104 p型半導體層(材料) 105 p電極層 106 η焊接墊 107 ρ焊接墊 201 中央區域 202、203 指狀區域 204 中央區域 205、206、207指狀區域 17
Claims (1)
- 200401462 拾、申請專利範圍: ι —種半導體裝置,包含: 一基板; 11型半導體層,於基板之上,該n型半導體層且有 一平坦的頂表面; Ρ型半導體層,延伸於η型半導體層之一主要部分 ,未延伸& η型半導體層之一暴露區域,其為位在鄰近於 該η型半導體層之平坦的頂表面之至少一個邊緣; —第一焊接墊,設置於!!型半導體層之暴露區域; 一電極層,延伸於Ρ型半導體層之上;及 一 7第二焊接塾,於電極層上,該焊接塾包含用於固定 -電氣互連件之一中央區域、以及其突出自該中央區域之 至少-個指狀區域’該指狀區域具有其延伸為遠離該中央 區域之一長度、與實質為小於該長度之一寬度。 、 2·如申請專利範圍f 1項之半導體裳置,其中,第, 知接墊係覆蓋該電極層之一面積,盆 ^ x 士 ,、妁為對應於該電極/ 之頂表面的幾何中心。 3.如申請專利範圍 極層包含複數個邊緣, 邊緣。 第1項之半導體裝置,其中,該電 且第二焊接墊係約為等距離於各個 裝置,其中,該η 觸,且第一焊接墊 4.如申請專利範圍第1項之半導體 型半導體層之相鄰邊緣係相交以形成角 係位在鄰近於一角隅。 5.如申請專利範圍第 項之半導體裝置 ,其中,該至 18 200401462 少·一個指狀區域之長唐尺& 度尺寸係延伸為概括平行於該n型半 導體層之一邊緣。 6·如申凊專利乾圍第】項之半導體裝置,其中,苐二 焊接墊包括二個指狀區肖,其延伸為遠離該中央區域且為 概括垂直於彼此。 1項之半導體裝置,其中,第一 7.如申請專利範圍第 焊接塾包括:用於固定一電氣互連件之一中央㈣、以及 其突出自I亥中央區域之至少一個指狀區域,該指狀區域具 有其延伸為遠離該中央區域之一長度、與其實質為小於該 長度之一寬度。 8.如申請專利範圍第7項之半導體裝置,其中,第— 焊接墊之至少一個指狀區域係延伸為鄰近於該n型半導體 層之一邊緣。 9.如申請專利範圍第8項之半導體裝置,其中,第— 太干接墊之一個指狀區域係延伸為鄰近於該η型半導體層之 超過一個邊緣。 10·如申請專利範圍第8項之半導體裝置,其中,第一 焊接塾包含二個指狀區域,包括:一第一指狀區域,其延 伸為鄰近於該η型半導體層之一邊緣,於該中央區域之一 側;以及,一第二指狀區域,其延伸為鄰近於該η型半導 體層之一邊緣,於該中央區域之另一側。 11.如申請專利範圍第8項之半導體裝置,其中,該至 ) 個指狀區域係延伸為鄰近於該η型半導體層的總外周 邊之不超過約為50%。 19 200401462 與第 12·如申請專利範圍第!項之半導體裝置 一焊接墊之至少一者包含一金屬材料。 其中,第一 如申請專利範圍第12項之 金屬材料包含··一纪層、於該飽層之: 紹層之上的一金層。 置,其中,該 銘層、與於該 如申請專利範圍第!項之半導體裝置 妾墊與第二焊接墊係由一實質相同的材料所構成。 15.如申請專利範圍第!項之半導體裳置,其中, 1半導體層與p型半導體層之至少一者包八. ^ 礎(GaN~based)的半導體材料。 化鎵為基 …6·::請專利範圍第1項之半導體裝置,更包含於該 +導體層與P型半導體層之間的—活性區域,該活性 區域係延伸於n型半導體層的一主要部分而未延伸於打型 半導體層之一暴露區域,其為位在鄰近於,亥η型半導體層 之平坦的頂表面之至少一個邊緣。 曰 20 1 7. 如申請專利範圍第1項之半導體裝置,其中,該活 性區域包含:一單或多量子井結構。 18. —種製造半導體裝置之方法,包含: 提供一基板; 提供一 η型氮化鎵為基礎的半導體層於基板上,該η 型半導體層具有一平坦的頂表面; 提供一 Ρ型氮化鎵為基礎的半導體層於基板上,該ρ 型半導體層係延伸於η型半導體層之一主要部分而未延伸 於η型半導體層之一暴露區域,其為位在鄰近於該η型半 200401462 導體層之平坦的頂表面之至. 〜主> ~個邊緣; 提供一第一焊接塾,% ¥从 叹置於η型半導體層之暴露區域. 提供一電極層,延伸於^ ^狎於ρ型半導體層之上;及 提供一第二焊接墊於電極$, 定-電氣互連件之—中…弟一繼包含用於固 5 , 干央&域、及其突出自該中央區域之 至少一個指狀區域,該指妝 ^日狀&域具有其延伸為遠離 區域之一長度、與實皙盔,+Λ 離4甲央 抆没興貫質為小於該長度之一寬度。 19.如申請專利範圍第J 8 墊係覆蓋該電極層之一面積, 表面的幾何中心。 項之方法,其中,第二焊接 其約為對應於該電極層之頂 2〇.如申請專利範圍第18項之方法,其中,該ρ型半 導體層與電極層係實質形成為於肖η型半導體層之整個平 坦的頂表面上’㈣ρ型半導體層與電極層之—部分係移 除以界定該η型半導體層之暴露區域。 21.如申請專利範圍第18項之方法,其中,該至少一 個扣狀區域之長度尺寸係延伸為概括平行於該η 層之-邊緣。 體 22.如申請專利範圍第18項之方法,其中,第二焊接 墊包括二個指狀區域,其延伸為遠離該中央區域且為概括 垂直於彼此。 23.如申請專利範圍第18項之方法,其中,第—焊接 墊包括:用於固定一電氣互連件之一中央區域、以及其突 出自該中央區域之至少一個指狀區域,該指狀區域具有其 延伸為遠離該中央區域之一長度、與其實質為小於該長度 21 200401462 之一寬度。 24. 如申請專利範圍第23項之方法,其t,第一焊接 墊之至少一個指狀區域係延伸為鄰近於該η型半導體層之 一邊緣。 25. 如申請專利範圍第24項之方法,其中,第一焊接 墊之一個指狀區域係延伸為鄰近於該η型半導體層之超過 一個邊緣。 26. 如申請專利範圍第23項之方法,其中,第一焊接 墊包含二個指狀區域,包括:一第〆指狀區域,其延伸為 鄰近於該η型半導體層之一邊緣,於該中央區域之一側; 以及,一第二指狀區域,其延伸為鄰近於該η型半導體層 之一邊緣’於該中央區域之另一侧。 捡壹、圖式: 如次頁 22
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-
2003
- 2003-06-17 WO PCT/US2003/019036 patent/WO2003107444A2/en not_active Application Discontinuation
- 2003-06-17 WO PCT/US2003/019035 patent/WO2003107443A2/en not_active Application Discontinuation
- 2003-06-17 AU AU2003251540A patent/AU2003251540A1/en not_active Abandoned
- 2003-06-17 AU AU2003251539A patent/AU2003251539A1/en not_active Abandoned
- 2003-06-17 TW TW092116486A patent/TW200400608A/zh unknown
- 2003-06-17 WO PCT/US2003/019034 patent/WO2003107442A2/en not_active Application Discontinuation
- 2003-06-17 TW TW092116487A patent/TW200401462A/zh unknown
- 2003-06-17 US US10/463,219 patent/US6847052B2/en not_active Expired - Fee Related
- 2003-06-17 AU AU2003251541A patent/AU2003251541A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI631697B (zh) * | 2012-02-17 | 2018-08-01 | 財團法人工業技術研究院 | 發光元件及其製造方法 |
Also Published As
Publication number | Publication date |
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WO2003107444A3 (en) | 2004-09-02 |
AU2003251539A1 (en) | 2003-12-31 |
TW200400608A (en) | 2004-01-01 |
WO2003107443A2 (en) | 2003-12-24 |
WO2003107442A3 (en) | 2004-09-02 |
AU2003251540A1 (en) | 2003-12-31 |
WO2003107444A2 (en) | 2003-12-24 |
AU2003251541A8 (en) | 2003-12-31 |
WO2003107443A3 (en) | 2004-09-02 |
AU2003251541A1 (en) | 2003-12-31 |
WO2003107442A2 (en) | 2003-12-24 |
US20040077135A1 (en) | 2004-04-22 |
US6847052B2 (en) | 2005-01-25 |
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