SG98424A1 - Dicing method - Google Patents
Dicing methodInfo
- Publication number
- SG98424A1 SG98424A1 SG200005089A SG200005089A SG98424A1 SG 98424 A1 SG98424 A1 SG 98424A1 SG 200005089 A SG200005089 A SG 200005089A SG 200005089 A SG200005089 A SG 200005089A SG 98424 A1 SG98424 A1 SG 98424A1
- Authority
- SG
- Singapore
- Prior art keywords
- dicing method
- dicing
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/024—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with the stock carried by a movable support for feeding stock into engagement with the cutting blade, e.g. stock carried by a pivoted arm or a carriage
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/023—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a cutting blade mounted on a carriage
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3043—Making grooves, e.g. cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Dicing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26033399A JP4347960B2 (ja) | 1999-09-14 | 1999-09-14 | ダイシング方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG98424A1 true SG98424A1 (en) | 2003-09-19 |
Family
ID=17346544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200005089A SG98424A1 (en) | 1999-09-14 | 2000-09-07 | Dicing method |
Country Status (5)
Country | Link |
---|---|
US (1) | US6498075B1 (ja) |
JP (1) | JP4347960B2 (ja) |
DE (1) | DE10044463B4 (ja) |
SG (1) | SG98424A1 (ja) |
TW (1) | TW490752B (ja) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4731050B2 (ja) * | 2001-06-15 | 2011-07-20 | 株式会社ディスコ | 半導体ウエーハの加工方法 |
JP3621908B2 (ja) * | 2001-10-11 | 2005-02-23 | 松下電器産業株式会社 | ベアチップ実装方法および実装システム |
US6703318B1 (en) * | 2002-10-29 | 2004-03-09 | Silicon Storage Technology, Inc. | Method of planarizing a semiconductor die |
JP4408361B2 (ja) * | 2003-09-26 | 2010-02-03 | 株式会社ディスコ | ウエーハの分割方法 |
JP2006073690A (ja) * | 2004-09-01 | 2006-03-16 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
JP4018096B2 (ja) * | 2004-10-05 | 2007-12-05 | 松下電器産業株式会社 | 半導体ウェハの分割方法、及び半導体素子の製造方法 |
JP2006140341A (ja) | 2004-11-12 | 2006-06-01 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
JP4571870B2 (ja) * | 2005-02-02 | 2010-10-27 | 株式会社ディスコ | 露光装置 |
JP4677331B2 (ja) | 2005-11-30 | 2011-04-27 | エルピーダメモリ株式会社 | 島状の分散構造を備えた半導体チップおよびその製造方法 |
JP2008060164A (ja) * | 2006-08-29 | 2008-03-13 | Disco Abrasive Syst Ltd | ウエーハのレーザー加工方法 |
JP2008105114A (ja) * | 2006-10-24 | 2008-05-08 | Disco Abrasive Syst Ltd | ハブブレードおよび切削装置 |
US8053279B2 (en) * | 2007-06-19 | 2011-11-08 | Micron Technology, Inc. | Methods and systems for imaging and cutting semiconductor wafers and other semiconductor workpieces |
TW201007830A (en) * | 2008-08-15 | 2010-02-16 | Zen Voce Corp | Jump-cut method for arrayed workpiece |
JP5672242B2 (ja) | 2009-12-24 | 2015-02-18 | 株式会社村田製作所 | 電子部品の製造方法 |
JP6066591B2 (ja) * | 2012-06-12 | 2017-01-25 | 株式会社ディスコ | 切削方法 |
CN104108139B (zh) * | 2013-04-18 | 2015-12-09 | 中芯国际集成电路制造(上海)有限公司 | 一种mems晶圆的切割方法 |
JP6211884B2 (ja) * | 2013-10-10 | 2017-10-11 | 株式会社ディスコ | ウェーハの加工方法 |
JP2016127232A (ja) * | 2015-01-08 | 2016-07-11 | 株式会社ディスコ | ウェーハの加工方法 |
JP7258416B2 (ja) | 2018-12-06 | 2023-04-17 | 株式会社ディスコ | 被加工物の加工方法、デバイスチップの製造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10177975A (ja) * | 1996-10-18 | 1998-06-30 | Fujitsu Ltd | ダイシングブレード、前記ダイシングブレードを使ったダイシング方法、および半導体装置の製造方法 |
US5913104A (en) * | 1996-11-26 | 1999-06-15 | Micron Technology, Inc. | Method and apparatus to hold integrated circuit chips onto a chuck and to simultaneously remove multiple integrated circuit chips from a cutting chuck |
US6150240A (en) * | 1998-07-27 | 2000-11-21 | Motorola, Inc. | Method and apparatus for singulating semiconductor devices |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0186201B1 (en) * | 1984-12-27 | 1992-12-30 | Disco Abrasive Systems, Ltd. | Semiconductor wafer dicing machine |
US4787362A (en) * | 1986-10-20 | 1988-11-29 | Thermocarbon, Inc. | Abrasive blade having a polycrystalline ceramic core |
US5952725A (en) * | 1996-02-20 | 1999-09-14 | Micron Technology, Inc. | Stacked semiconductor devices |
US6250192B1 (en) * | 1996-11-12 | 2001-06-26 | Micron Technology, Inc. | Method for sawing wafers employing multiple indexing techniques for multiple die dimensions |
JPH1140521A (ja) * | 1997-05-20 | 1999-02-12 | Seiko Instr Inc | 半導体チップの製造方法 |
SG99277A1 (en) * | 1998-02-05 | 2003-10-27 | Texas Instr Singapore Pte Ltd | Partial semionductor wafer processing with multiple cuts of random sizes |
-
1999
- 1999-09-14 JP JP26033399A patent/JP4347960B2/ja not_active Expired - Lifetime
-
2000
- 2000-09-07 SG SG200005089A patent/SG98424A1/en unknown
- 2000-09-08 DE DE10044463A patent/DE10044463B4/de not_active Expired - Lifetime
- 2000-09-12 US US09/660,261 patent/US6498075B1/en not_active Expired - Lifetime
- 2000-09-13 TW TW089118739A patent/TW490752B/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10177975A (ja) * | 1996-10-18 | 1998-06-30 | Fujitsu Ltd | ダイシングブレード、前記ダイシングブレードを使ったダイシング方法、および半導体装置の製造方法 |
US5913104A (en) * | 1996-11-26 | 1999-06-15 | Micron Technology, Inc. | Method and apparatus to hold integrated circuit chips onto a chuck and to simultaneously remove multiple integrated circuit chips from a cutting chuck |
US6150240A (en) * | 1998-07-27 | 2000-11-21 | Motorola, Inc. | Method and apparatus for singulating semiconductor devices |
Also Published As
Publication number | Publication date |
---|---|
DE10044463A1 (de) | 2001-06-07 |
TW490752B (en) | 2002-06-11 |
JP2001085365A (ja) | 2001-03-30 |
JP4347960B2 (ja) | 2009-10-21 |
DE10044463B4 (de) | 2009-07-09 |
US6498075B1 (en) | 2002-12-24 |
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