SG96628A1 - Integrated microcontact pin and method for manufacturing the same - Google Patents

Integrated microcontact pin and method for manufacturing the same

Info

Publication number
SG96628A1
SG96628A1 SG200103696A SG200103696A SG96628A1 SG 96628 A1 SG96628 A1 SG 96628A1 SG 200103696 A SG200103696 A SG 200103696A SG 200103696 A SG200103696 A SG 200103696A SG 96628 A1 SG96628 A1 SG 96628A1
Authority
SG
Singapore
Prior art keywords
integrated
manufacturing
same
microcontact
pin
Prior art date
Application number
SG200103696A
Other languages
English (en)
Inventor
Yoshida Haruo
Maeda Yasuhiro
Miyagawa Yoshihide
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG96628A1 publication Critical patent/SG96628A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200103696A 2000-06-15 2001-06-05 Integrated microcontact pin and method for manufacturing the same SG96628A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000179423A JP2001356136A (ja) 2000-06-15 2000-06-15 集積化マイクロコンタクトピン及びその製造方法

Publications (1)

Publication Number Publication Date
SG96628A1 true SG96628A1 (en) 2003-06-16

Family

ID=18680701

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200103696A SG96628A1 (en) 2000-06-15 2001-06-05 Integrated microcontact pin and method for manufacturing the same

Country Status (7)

Country Link
US (1) US6590479B2 (de)
JP (1) JP2001356136A (de)
KR (1) KR20010112837A (de)
CN (1) CN1330401A (de)
DE (1) DE10128387A1 (de)
SG (1) SG96628A1 (de)
TW (1) TW502357B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109490737A (zh) * 2018-10-26 2019-03-19 中电科仪器仪表有限公司 微波半导体器件频率扩展多参数自动测试通用方法及装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6770822B2 (en) * 2002-02-22 2004-08-03 Bridgewave Communications, Inc. High frequency device packages and methods
KR100789196B1 (ko) * 2002-05-10 2007-12-31 앤디 첸 반도체 테스트 부재의 테스트 플레이트 분할장치
US7310239B1 (en) * 2004-02-20 2007-12-18 Silicon Pipe, Inc. IC packaging interposer having controlled impedance or optical interconnections and an integral heat spreader
JP4556023B2 (ja) * 2004-04-22 2010-10-06 独立行政法人産業技術総合研究所 システムインパッケージ試験検査装置および試験検査方法
US7081672B1 (en) * 2005-03-07 2006-07-25 Lsi Logic Corporation Substrate via layout to improve bias humidity testing reliability
JP4740765B2 (ja) * 2006-02-24 2011-08-03 エルピーダメモリ株式会社 半導体装置及びその製造方法
US7629541B2 (en) * 2006-06-19 2009-12-08 Endicott Interconnect Technologies, Inc. High speed interposer
WO2009011244A1 (ja) * 2007-07-17 2009-01-22 Nhk Spring Co., Ltd. プローブユニット
US8581113B2 (en) 2007-12-19 2013-11-12 Bridgewave Communications, Inc. Low cost high frequency device package and methods
JP5788767B2 (ja) * 2011-11-07 2015-10-07 株式会社日本マイクロニクス プローブブロックとそれを備えるプローブカード並びにプローブ装置
JP6535347B2 (ja) * 2014-01-17 2019-06-26 ヌボトロニクス、インク． ウエハースケールのテスト・インターフェース・ユニット：高速および高密度の混合信号インターコネクトおよびコンタクタのための低損失および高絶縁性の装置および方法
KR102607955B1 (ko) * 2023-07-14 2023-12-01 미르텍알앤디 주식회사 메쉬형 핀 및 다양한 크기의 블레이드 핀을 포함하는 하이브리드형 테스트 소켓

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
US6072190A (en) * 1995-11-22 2000-06-06 Advantest Corp. Micro contact pin structure with a piezoelectric element and probe card using the same

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4083052A (en) * 1976-06-16 1978-04-04 Sangamo Electric Company Electronic tachograph
US4153988A (en) * 1977-07-15 1979-05-15 International Business Machines Corporation High performance integrated circuit semiconductor package and method of making
JP2688444B2 (ja) * 1989-12-06 1997-12-10 株式会社日立製作所 半導体ｌｓｉ検査装置
JPH0425777A (ja) * 1990-05-21 1992-01-29 Berishisu Inc Ｉｃテスタ用ｉｃ接続装置、該接続装置を構成するテストボードおよびテストヘッド
JPH1130630A (ja) * 1997-07-10 1999-02-02 Tokyo Kasoode Kenkyusho:Kk 探針用プローブ及びプローブカード
JPH1187440A (ja) * 1997-09-05 1999-03-30 Micronics Japan Co Ltd プローブカード
US6028497A (en) * 1998-01-28 2000-02-22 Trw Inc. RF pin grid array
KR20000002377A (ko) * 1998-06-19 2000-01-15 윤종용 메모리 모듈 테스트 장치
KR200247134Y1 (ko) * 1998-11-12 2001-11-16 신순철 인쇄회로기판검사장치
JP2001133514A (ja) * 1999-11-05 2001-05-18 Mitsubishi Electric Corp Ｄｕｔボード及びそれを用いるテスト方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6072190A (en) * 1995-11-22 2000-06-06 Advantest Corp. Micro contact pin structure with a piezoelectric element and probe card using the same
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109490737A (zh) * 2018-10-26 2019-03-19 中电科仪器仪表有限公司 微波半导体器件频率扩展多参数自动测试通用方法及装置

Also Published As

Publication number Publication date
US6590479B2 (en) 2003-07-08
DE10128387A1 (de) 2002-03-07
US20010054510A1 (en) 2001-12-27
TW502357B (en) 2002-09-11
JP2001356136A (ja) 2001-12-26
KR20010112837A (ko) 2001-12-22
CN1330401A (zh) 2002-01-09

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