SG77708A1 - Low moment/high coercivity pinned layer for magnetic tunnel juction sensors - Google Patents
Low moment/high coercivity pinned layer for magnetic tunnel juction sensorsInfo
- Publication number
- SG77708A1 SG77708A1 SG1999003850A SG1999003850A SG77708A1 SG 77708 A1 SG77708 A1 SG 77708A1 SG 1999003850 A SG1999003850 A SG 1999003850A SG 1999003850 A SG1999003850 A SG 1999003850A SG 77708 A1 SG77708 A1 SG 77708A1
- Authority
- SG
- Singapore
- Prior art keywords
- juction
- sensors
- pinned layer
- magnetic tunnel
- high coercivity
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3929—Disposition of magnetic thin films not used for directly coupling magnetic flux from the track to the MR film or for shielding
- G11B5/3932—Magnetic biasing films
Landscapes
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
- Thin Magnetic Films (AREA)
- Measuring Magnetic Variables (AREA)
- Mram Or Spin Memory Techniques (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/138,120 US6052263A (en) | 1998-08-21 | 1998-08-21 | Low moment/high coercivity pinned layer for magnetic tunnel junction sensors |
Publications (1)
Publication Number | Publication Date |
---|---|
SG77708A1 true SG77708A1 (en) | 2001-01-16 |
Family
ID=22480505
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1999003850A SG77708A1 (en) | 1998-08-21 | 1999-08-07 | Low moment/high coercivity pinned layer for magnetic tunnel juction sensors |
Country Status (6)
Country | Link |
---|---|
US (1) | US6052263A (zh) |
JP (2) | JP2000067418A (zh) |
KR (1) | KR100336733B1 (zh) |
CN (1) | CN1109330C (zh) |
MY (1) | MY117184A (zh) |
SG (1) | SG77708A1 (zh) |
Families Citing this family (76)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6542342B1 (en) * | 1998-11-30 | 2003-04-01 | Nec Corporation | Magnetoresistive effect transducer having longitudinal bias layer directly connected to free layer |
US6624987B1 (en) | 1999-05-31 | 2003-09-23 | Nec Corporation | Magnetic head with a tunnel junction including metallic material sandwiched between one of an oxide and a nitride of the metallic material |
US6219209B1 (en) * | 1999-07-29 | 2001-04-17 | International Business Machines Corporation | Spin valve head with multiple antiparallel coupling layers |
US6259586B1 (en) * | 1999-09-02 | 2001-07-10 | International Business Machines Corporation | Magnetic tunnel junction sensor with AP-coupled free layer |
US6611405B1 (en) * | 1999-09-16 | 2003-08-26 | Kabushiki Kaisha Toshiba | Magnetoresistive element and magnetic memory device |
JP3891540B2 (ja) * | 1999-10-25 | 2007-03-14 | キヤノン株式会社 | 磁気抵抗効果メモリ、磁気抵抗効果メモリに記録される情報の記録再生方法、およびmram |
US6560077B2 (en) * | 2000-01-10 | 2003-05-06 | The University Of Alabama | CPP spin-valve device |
DE20007001U1 (de) * | 2000-04-15 | 2000-07-27 | Anton Hummel Verwaltungs Gmbh, 79183 Waldkirch | Stecker mit einer Hülse |
JP2001307307A (ja) * | 2000-04-19 | 2001-11-02 | Tdk Corp | トンネル磁気抵抗効果素子、薄膜磁気ヘッド、磁気ヘッド装置及び磁気ディスク装置 |
JP3618654B2 (ja) | 2000-09-11 | 2005-02-09 | 株式会社東芝 | 磁気抵抗効果素子、磁気ヘッド及び磁気記録再生装置 |
US20020044391A1 (en) | 2000-11-15 | 2002-04-18 | Masayoshi Hiramoto | Magneto-resistive element magnetic head, and magnetic recording and reproduction apparatus |
KR100396602B1 (ko) * | 2000-12-12 | 2003-09-02 | 엘지전자 주식회사 | 탄소나노튜브를 이용한 터널접합 자기저항 소자 |
US6724586B2 (en) * | 2001-03-27 | 2004-04-20 | Hitachi Global Storage Technologies Netherlands B.V. | Bias structure for magnetic tunnel junction magnetoresistive sensor |
TWI222630B (en) * | 2001-04-24 | 2004-10-21 | Matsushita Electric Ind Co Ltd | Magnetoresistive element and magnetoresistive memory device using the same |
US6706402B2 (en) * | 2001-07-25 | 2004-03-16 | Nantero, Inc. | Nanotube films and articles |
US6919592B2 (en) * | 2001-07-25 | 2005-07-19 | Nantero, Inc. | Electromechanical memory array using nanotube ribbons and method for making same |
US6835591B2 (en) * | 2001-07-25 | 2004-12-28 | Nantero, Inc. | Methods of nanotube films and articles |
US6643165B2 (en) | 2001-07-25 | 2003-11-04 | Nantero, Inc. | Electromechanical memory having cell selection circuitry constructed with nanotube technology |
US6574130B2 (en) | 2001-07-25 | 2003-06-03 | Nantero, Inc. | Hybrid circuit having nanotube electromechanical memory |
US7566478B2 (en) * | 2001-07-25 | 2009-07-28 | Nantero, Inc. | Methods of making carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US6657825B2 (en) * | 2001-08-02 | 2003-12-02 | International Business Machines Corporation | Self aligned magnetoresistive flux guide read head with exchange bias underneath free layer |
JP4780878B2 (ja) * | 2001-08-02 | 2011-09-28 | ルネサスエレクトロニクス株式会社 | 薄膜磁性体記憶装置 |
US7440479B2 (en) * | 2001-09-06 | 2008-10-21 | Brown University | Magneto-optoelectronic switch and sensor |
US6992870B2 (en) * | 2001-10-25 | 2006-01-31 | Tdk Corporation | Magneto-resistive device, and magnetic head and head suspension assembly using same |
US7176505B2 (en) * | 2001-12-28 | 2007-02-13 | Nantero, Inc. | Electromechanical three-trace junction devices |
US6784028B2 (en) | 2001-12-28 | 2004-08-31 | Nantero, Inc. | Methods of making electromechanical three-trace junction devices |
US6888705B2 (en) * | 2002-01-18 | 2005-05-03 | Hitachi Global Storage Technologies Netherlands B.V. | High linear density tunnel junction flux guide read head with in-stack longitudinal bias stack (LBS) |
US6757144B2 (en) | 2002-01-18 | 2004-06-29 | International Business Machines Corporation | Flux guide read head with in stack biased current perpendicular to the planes (CPP) sensor |
US6754056B2 (en) * | 2002-01-18 | 2004-06-22 | International Business Machines Corporation | Read head having a tunnel junction sensor with a free layer biased by exchange coupling with insulating antiferromagnetic (AFM) layers |
US6735112B2 (en) * | 2002-02-06 | 2004-05-11 | Micron Technology, Inc. | Magneto-resistive memory cell structures with improved selectivity |
US6961225B2 (en) * | 2002-02-20 | 2005-11-01 | International Business Machines Corporation | Magnetoresistance sensor having an antiferromagnetic pinning layer with both surfaces pinning ferromagnetic bias layers |
DE10214159B4 (de) * | 2002-03-28 | 2008-03-20 | Qimonda Ag | Verfahren zur Herstellung einer Referenzschicht für MRAM-Speicherzellen |
US6801412B2 (en) | 2002-04-19 | 2004-10-05 | International Business Machines Corporation | Method and apparatus for improved pinning strength for self-pinned giant magnetoresistive heads |
US7335395B2 (en) * | 2002-04-23 | 2008-02-26 | Nantero, Inc. | Methods of using pre-formed nanotubes to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
WO2003092084A1 (fr) * | 2002-04-23 | 2003-11-06 | Matsushita Electric Industrial Co., Ltd. | Element magnetoresistif, procede de fabrication associe, tete magnetique, memoire magnetique et dispositif d'enregistrement magnetique utilisant un tel element |
US6781798B2 (en) | 2002-07-15 | 2004-08-24 | International Business Machines Corporation | CPP sensor with dual self-pinned AP pinned layer structures |
JP2004071897A (ja) * | 2002-08-07 | 2004-03-04 | Sony Corp | 磁気抵抗効果素子及び磁気メモリ装置 |
US6960397B2 (en) * | 2003-01-29 | 2005-11-01 | Korea Chungang Educational Foundation | Magnetoresistance device |
JP2004289100A (ja) * | 2003-01-31 | 2004-10-14 | Japan Science & Technology Agency | Cpp型巨大磁気抵抗素子及びそれを用いた磁気部品並びに磁気装置 |
KR20040083934A (ko) | 2003-03-25 | 2004-10-06 | 주식회사 하이닉스반도체 | 마그네틱 램의 형성방법 |
JP3961497B2 (ja) * | 2003-04-18 | 2007-08-22 | アルプス電気株式会社 | Cpp型巨大磁気抵抗効果ヘッド |
JP3974587B2 (ja) * | 2003-04-18 | 2007-09-12 | アルプス電気株式会社 | Cpp型巨大磁気抵抗効果ヘッド |
JP3961496B2 (ja) * | 2003-04-18 | 2007-08-22 | アルプス電気株式会社 | Cpp型巨大磁気抵抗効果ヘッド |
US7230804B2 (en) * | 2003-05-02 | 2007-06-12 | Hitachi Global Storage Technologies Netherlands B.V. | Method and apparatus for providing a magnetic tunnel transistor with a self-pinned emitter |
US7916435B1 (en) | 2003-05-02 | 2011-03-29 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetic tunnel transistor having a base structure that provides polarization of unpolarized electrons from an emitter based upon a magnetic orientation of a free layer and a self-pinned layer |
US7474510B1 (en) * | 2004-01-08 | 2009-01-06 | Seagate Technology Llc | Disk drive head reset for parked head using closely spaced magnet |
US7366009B2 (en) * | 2004-01-10 | 2008-04-29 | Honeywell International Inc. | Separate write and read access architecture for a magnetic tunnel junction |
US7221545B2 (en) * | 2004-02-18 | 2007-05-22 | Hitachi Global Storage Technologies Netherlands B.V. | High HC reference layer structure for self-pinned GMR heads |
US7190560B2 (en) * | 2004-02-18 | 2007-03-13 | Hitachi Global Storage Technologies Netherlands B.V. | Self-pinned CPP sensor using Fe/Cr/Fe structure |
JP4963007B2 (ja) * | 2004-07-05 | 2012-06-27 | 独立行政法人産業技術総合研究所 | 光誘導磁化反転を用いた高速不揮発性光メモリ素子およびその動作方法 |
JP4008478B2 (ja) * | 2005-07-13 | 2007-11-14 | Tdk株式会社 | 磁界検出素子、基体、ウエハ、ヘッドジンバルアセンブリ、ハードディスク装置、および磁界検出素子の製造方法 |
JP4573736B2 (ja) * | 2005-08-31 | 2010-11-04 | 三菱電機株式会社 | 磁界検出装置 |
JP4444241B2 (ja) * | 2005-10-19 | 2010-03-31 | 株式会社東芝 | 磁気抵抗効果素子、磁気ランダムアクセスメモリ、電子カード及び電子装置 |
US7821747B2 (en) * | 2006-02-10 | 2010-10-26 | Hitachi Global Storage Technologies Netherlands B.V. | Method and apparatus for providing improved pinning structure for tunneling magnetoresistive sensor |
US7746603B2 (en) * | 2006-12-19 | 2010-06-29 | Hitachi Global Storage Technologies Netherlands B.V. | CPP Magnetoresistive head with different thickness free layers for improved signal to noise ratio |
US8174800B2 (en) * | 2007-05-07 | 2012-05-08 | Canon Anelva Corporation | Magnetoresistive element, method of manufacturing the same, and magnetic multilayered film manufacturing apparatus |
JP4593601B2 (ja) * | 2007-08-03 | 2010-12-08 | キヤノンアネルバ株式会社 | 汚染物質除去方法、半導体製造方法、及び薄膜形成加工装置 |
JP5150284B2 (ja) | 2008-01-30 | 2013-02-20 | 株式会社東芝 | 磁気抵抗効果素子およびその製造方法 |
JP5361201B2 (ja) | 2008-01-30 | 2013-12-04 | 株式会社東芝 | 磁気抵抗効果素子の製造方法 |
US20110163400A1 (en) * | 2008-03-06 | 2011-07-07 | Fuji Electric Holdings Co., Ltd. | Ferromagnetic tunnel junction element and method of driving ferromagnetic tunnel junction element |
US8629518B2 (en) * | 2009-07-02 | 2014-01-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Sacrifice layer structure and method for magnetic tunnel junction (MTJ) etching process |
JP2011123944A (ja) * | 2009-12-10 | 2011-06-23 | Hitachi Global Storage Technologies Netherlands Bv | Tmrリード・ヘッドの製造方法及びtmr積層体 |
CN102023244A (zh) * | 2010-10-26 | 2011-04-20 | 江苏多维科技有限公司 | 独立封装的电表传感器 |
US8829901B2 (en) * | 2011-11-04 | 2014-09-09 | Honeywell International Inc. | Method of using a magnetoresistive sensor in second harmonic detection mode for sensing weak magnetic fields |
US8590138B2 (en) * | 2012-02-24 | 2013-11-26 | Tdk Corporation | Method of manufacturing thermally-assisted magnetic recording head |
US9524765B2 (en) | 2014-08-15 | 2016-12-20 | Qualcomm Incorporated | Differential magnetic tunnel junction pair including a sense layer with a high coercivity portion |
US10483320B2 (en) | 2015-12-10 | 2019-11-19 | Everspin Technologies, Inc. | Magnetoresistive stack with seed region and method of manufacturing the same |
CN105572609B (zh) * | 2015-12-18 | 2018-09-25 | 中国人民解放军国防科学技术大学 | 一种可调量程的多铁异质磁场传感器及量程调节方法 |
KR102566954B1 (ko) | 2016-08-04 | 2023-08-16 | 삼성전자주식회사 | 자기 메모리 소자 및 그 제조 방법 |
US10802087B2 (en) | 2018-09-11 | 2020-10-13 | Honeywell International Inc. | Spintronic accelerometer |
US10876839B2 (en) | 2018-09-11 | 2020-12-29 | Honeywell International Inc. | Spintronic gyroscopic sensor device |
US10871529B2 (en) | 2018-09-11 | 2020-12-22 | Honeywell International Inc. | Spintronic mechanical shock and vibration sensor device |
WO2020106552A1 (en) * | 2018-11-19 | 2020-05-28 | Everspin Technologies, Inc. | Magnetoresistive stack with seed region and method of manufacturing the same |
US11500042B2 (en) | 2020-02-28 | 2022-11-15 | Brown University | Magnetic sensing devices based on interlayer exchange-coupled magnetic thin films |
US11380840B2 (en) | 2020-03-20 | 2022-07-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory cell with magnetic access selector apparatus |
US20240142549A1 (en) * | 2021-03-31 | 2024-05-02 | Mitsubishi Electric Corporation | Magnetic sensor element, magnetic sensor, and magnetic sensor device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5206590A (en) * | 1990-12-11 | 1993-04-27 | International Business Machines Corporation | Magnetoresistive sensor based on the spin valve effect |
US5159513A (en) * | 1991-02-08 | 1992-10-27 | International Business Machines Corporation | Magnetoresistive sensor based on the spin valve effect |
US5341261A (en) * | 1991-08-26 | 1994-08-23 | International Business Machines Corporation | Magnetoresistive sensor having multilayer thin film structure |
US5583725A (en) * | 1994-06-15 | 1996-12-10 | International Business Machines Corporation | Spin valve magnetoresistive sensor with self-pinned laminated layer and magnetic recording system using the sensor |
JPH0877519A (ja) * | 1994-09-08 | 1996-03-22 | Fujitsu Ltd | 磁気抵抗効果型トランスジューサ |
US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
US5764567A (en) * | 1996-11-27 | 1998-06-09 | International Business Machines Corporation | Magnetic tunnel junction device with nonferromagnetic interface layer for improved magnetic field response |
US5768069A (en) * | 1996-11-27 | 1998-06-16 | International Business Machines Corporation | Self-biased dual spin valve sensor |
US5828529A (en) * | 1997-04-29 | 1998-10-27 | International Business Machines Corporation | Antiparallel pinned spin valve with read signal symmetry |
US5966012A (en) * | 1997-10-07 | 1999-10-12 | International Business Machines Corporation | Magnetic tunnel junction device with improved fixed and free ferromagnetic layers |
US5898547A (en) * | 1997-10-24 | 1999-04-27 | International Business Machines Corporation | Magnetic tunnel junction magnetoresistive read head with sensing layer as flux guide |
US5898548A (en) * | 1997-10-24 | 1999-04-27 | International Business Machines Corporation | Shielded magnetic tunnel junction magnetoresistive read head |
US5880913A (en) * | 1997-10-27 | 1999-03-09 | International Business Machines Corporation | Antiparallel pinned spin valve sensor with read signal symmetry |
US5898549A (en) * | 1997-10-27 | 1999-04-27 | International Business Machines Corporation | Anti-parallel-pinned spin valve sensor with minimal pinned layer shunting |
US5920446A (en) * | 1998-01-06 | 1999-07-06 | International Business Machines Corporation | Ultra high density GMR sensor |
-
1998
- 1998-08-21 US US09/138,120 patent/US6052263A/en not_active Expired - Lifetime
-
1999
- 1999-07-15 KR KR1019990028648A patent/KR100336733B1/ko not_active IP Right Cessation
- 1999-07-19 MY MYPI99003032A patent/MY117184A/en unknown
- 1999-07-20 CN CN99110657A patent/CN1109330C/zh not_active Expired - Lifetime
- 1999-08-07 SG SG1999003850A patent/SG77708A1/en unknown
- 1999-08-11 JP JP11227028A patent/JP2000067418A/ja active Pending
-
2004
- 2004-03-18 JP JP2004078732A patent/JP4841112B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR20000016943A (ko) | 2000-03-25 |
JP4841112B2 (ja) | 2011-12-21 |
CN1109330C (zh) | 2003-05-21 |
CN1245952A (zh) | 2000-03-01 |
US6052263A (en) | 2000-04-18 |
KR100336733B1 (ko) | 2002-05-13 |
MY117184A (en) | 2004-05-31 |
JP2000067418A (ja) | 2000-03-03 |
JP2004266284A (ja) | 2004-09-24 |
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