SG48526A1 - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
SG48526A1
SG48526A1 SG1997001251A SG1997001251A SG48526A1 SG 48526 A1 SG48526 A1 SG 48526A1 SG 1997001251 A SG1997001251 A SG 1997001251A SG 1997001251 A SG1997001251 A SG 1997001251A SG 48526 A1 SG48526 A1 SG 48526A1
Authority
SG
Singapore
Prior art keywords
integrated circuit
semiconductor integrated
semiconductor
circuit
integrated
Prior art date
Application number
SG1997001251A
Other languages
English (en)
Inventor
Ltd Hitachi
Hiroshi Toyoshima
Masashige Harada
Tomohiro Nagano
Yoji Nishio
Atsushi Hiraishi
Kunihiro Komiyaji
Hideharu Yahata
Kenichi Fukui
Hirofumi Zushi
Takahiro Sonodo
Haruko Kawachino
Sadayuki Morita
Original Assignee
Hitachi Ulsi Eng Corp
Ltd Hitachi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ulsi Eng Corp, Ltd Hitachi filed Critical Hitachi Ulsi Eng Corp
Publication of SG48526A1 publication Critical patent/SG48526A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/065—Differential amplifiers of latching type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/08—Control thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Amplifiers (AREA)
  • Static Random-Access Memory (AREA)
  • Logic Circuits (AREA)
SG1997001251A 1996-04-17 1997-04-17 Semiconductor integrated circuit SG48526A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP9499296 1996-04-17
JP33658796A JP3597655B2 (ja) 1996-04-17 1996-12-17 半導体集積回路

Publications (1)

Publication Number Publication Date
SG48526A1 true SG48526A1 (en) 1998-04-17

Family

ID=26436224

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997001251A SG48526A1 (en) 1996-04-17 1997-04-17 Semiconductor integrated circuit

Country Status (7)

Country Link
US (3) US5854562A (zh)
JP (1) JP3597655B2 (zh)
KR (1) KR100517843B1 (zh)
CN (1) CN1116683C (zh)
MY (1) MY116889A (zh)
SG (1) SG48526A1 (zh)
TW (1) TW332290B (zh)

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KR100430973B1 (ko) * 1995-06-09 2004-09-10 지멘스 악티엔게젤샤프트 2개의전기값을비교하기위한회로
US6037890A (en) * 1997-09-30 2000-03-14 Intel Corporation Ultra high speed, low power, flash A/D converter utilizing a current mode regenerative comparator
JP3488612B2 (ja) * 1997-12-11 2004-01-19 株式会社東芝 センス増幅回路
US6215331B1 (en) * 1998-02-02 2001-04-10 Agere Systems Inc. Method and apparatus for separately controlling the sensing and reset phases of a sense amp/regenerative latch
JP3416063B2 (ja) * 1998-10-29 2003-06-16 インターナショナル・ビジネス・マシーンズ・コーポレーション センスアンプ回路
US6144231A (en) * 1998-11-23 2000-11-07 Goldblatt; Jeremy Mark High speed dynamic latch comparator
KR100297324B1 (ko) * 1998-12-16 2001-08-07 김영환 반도체 집적회로의 증폭기
US6424181B1 (en) * 1999-02-17 2002-07-23 Elbrus International Limited High-speed low-power sense amplifying half-latch and apparatus thereof for small-swing differential logic (SSDL)
US6351155B1 (en) * 1999-02-17 2002-02-26 Elbrus International Limited High-speed sense amplifier capable of cascade connection
US6400186B1 (en) * 1999-04-21 2002-06-04 Compaq Information Technologies Group, L.P. Settable digital CMOS differential sense amplifier
US6252429B1 (en) * 1999-05-24 2001-06-26 International Business Machines Corporation Method and apparatus for improving device matching and switching point tolerance in silicon-on-insulator cross-coupled circuits
US6687175B1 (en) 2000-02-04 2004-02-03 Renesas Technology Corporation Semiconductor device
US6396309B1 (en) * 2001-04-02 2002-05-28 Intel Corporation Clocked sense amplifier flip flop with keepers to prevent floating nodes
KR100394573B1 (ko) * 2001-05-31 2003-08-14 삼성전자주식회사 반도체 메모리장치의 센스앰프회로
US6617926B2 (en) * 2001-06-29 2003-09-09 Intel Corporation Tail current node equalization for a variable offset amplifier
KR100434509B1 (ko) * 2002-08-07 2004-06-05 삼성전자주식회사 동기식 리셋 또는 비동기식 리셋 기능을 갖는 감지증폭기
KR100518559B1 (ko) * 2003-02-26 2005-10-04 삼성전자주식회사 센스 앰프 회로 및 이를 구비한 비트 비교 회로.
JP3874733B2 (ja) * 2003-02-28 2007-01-31 富士通株式会社 高速入力信号の受信回路
WO2004097543A1 (ja) * 2003-04-25 2004-11-11 Semiconductor Energy Laboratory Co. Ltd. 半導体装置
DE10345549B3 (de) * 2003-09-30 2005-04-28 Infineon Technologies Ag Integrierte Speicherschaltung
JP4370507B2 (ja) * 2003-11-27 2009-11-25 エルピーダメモリ株式会社 半導体集積回路装置
US20050162193A1 (en) * 2004-01-27 2005-07-28 Texas Instruments Incorporated High performance sense amplifiers
US7046045B2 (en) * 2004-05-25 2006-05-16 Kabushiki Kaisha Toshiba SOI sense amplifier with cross-coupled bit line structure
US7053668B2 (en) * 2004-05-25 2006-05-30 Kabushiki Kaisha Toshiba SOI sense amplifier with cross-coupled body terminal
US20050264322A1 (en) * 2004-05-25 2005-12-01 Takaaki Nakazato SOI sense amplifier with pre-charge
EP1727147B1 (fr) * 2005-05-23 2011-07-13 STMicroelectronics (Crolles 2) SAS Amplificateur de lecture pour mémoire dynamique
US7800411B1 (en) * 2006-01-30 2010-09-21 National Semiconductor Corporation System and method for providing a strobed comparator with reduced offset and reduced charge kickback
JP2007227990A (ja) 2006-02-21 2007-09-06 Oki Electric Ind Co Ltd タイミング生成回路及びそれを用いたデジタル／アナログ変換器
US20080054973A1 (en) * 2006-09-06 2008-03-06 Atmel Corporation Leakage improvement for a high-voltage latch
KR100864626B1 (ko) * 2007-04-02 2008-10-22 주식회사 하이닉스반도체 반도체 메모리 소자와 그의 구동 방법
US20110227639A1 (en) * 2010-03-19 2011-09-22 Qualcomm Incorporated Method and Apparatus for Suppressing Bitline Coupling Through Miller Capacitance to a Sense Amplifier Interstitial Node
WO2012003506A2 (en) 2010-07-02 2012-01-05 Nuvotronics, Llc Three-dimensional microstructures
US9065163B1 (en) 2011-12-23 2015-06-23 Nuvotronics, Llc High frequency power combiner/divider
US8952752B1 (en) 2012-12-12 2015-02-10 Nuvotronics, Llc Smart power combiner
CN103617808A (zh) * 2013-12-06 2014-03-05 广东博观科技有限公司 一种sram的读取、缓存电路和方法
US9355734B2 (en) * 2014-03-04 2016-05-31 Silicon Storage Technology, Inc. Sensing circuits for use in low power nanometer flash memory devices
US9640231B1 (en) * 2016-02-03 2017-05-02 Qualcomm Incorporated Shared sense amplifier
CN107306129B (zh) * 2016-04-18 2020-09-29 台湾类比科技股份有限公司 集成电路的输出级电路
KR102679071B1 (ko) * 2016-11-24 2024-07-01 에스케이하이닉스 주식회사 버퍼 회로, 이를 이용하는 반도체 장치 및 시스템
US9911471B1 (en) * 2017-02-14 2018-03-06 Micron Technology, Inc. Input buffer circuit
CN107800413B (zh) * 2017-11-20 2020-04-21 北京华大九天软件有限公司 一种低失调高速动态比较器
CN109119112B (zh) * 2018-07-19 2021-04-13 深圳大学 一种提高读写稳定性的存储单元电路与存储装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5838873B2 (ja) * 1980-10-15 1983-08-25 富士通株式会社 センス回路
US4843264A (en) * 1987-11-25 1989-06-27 Visic, Inc. Dynamic sense amplifier for CMOS static RAM
JPH0727717B2 (ja) * 1988-07-13 1995-03-29 株式会社東芝 センス回路
JPH05298887A (ja) * 1992-04-17 1993-11-12 Oki Electric Ind Co Ltd 半導体記憶装置
US5508644A (en) * 1994-09-28 1996-04-16 Motorola, Inc. Sense amplifier for differential voltage detection with low input capacitance
US5526314A (en) * 1994-12-09 1996-06-11 International Business Machines Corporation Two mode sense amplifier with latch
EP0726578A1 (en) * 1995-02-09 1996-08-14 International Business Machines Corporation Multiple reference sense amplifier
US5506524A (en) * 1995-03-01 1996-04-09 Lin; Jyhfong Low-voltage low-power dynamic folded sense amplifier
KR0164385B1 (ko) * 1995-05-20 1999-02-18 김광호 센스앰프회로
US6002270A (en) * 1995-11-09 1999-12-14 Spaceborne, Inc. Synchronous differential logic system for hyperfrequency operation
US5903171A (en) * 1997-05-29 1999-05-11 Winbond Electronics Corporation Sense amplifier with integrated latch and level shift

Also Published As

Publication number Publication date
CN1167324A (zh) 1997-12-10
KR100517843B1 (ko) 2005-12-09
MY116889A (en) 2004-04-30
CN1116683C (zh) 2003-07-30
KR970071829A (ko) 1997-11-07
JPH103791A (ja) 1998-01-06
US5854562A (en) 1998-12-29
US6271687B1 (en) 2001-08-07
TW332290B (en) 1998-05-21
US6046609A (en) 2000-04-04
JP3597655B2 (ja) 2004-12-08

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