SG11202003327UA - Ceramic, probe guiding member, probe card, and socket for package inspection - Google Patents
Ceramic, probe guiding member, probe card, and socket for package inspectionInfo
- Publication number
- SG11202003327UA SG11202003327UA SG11202003327UA SG11202003327UA SG11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA
- Authority
- SG
- Singapore
- Prior art keywords
- probe
- socket
- ceramic
- guiding member
- package inspection
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/515—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics
- C04B35/58—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides
- C04B35/583—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides based on boron nitride
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- C04B35/486—Fine ceramics
- C04B35/488—Composites
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- C04B35/62645—Thermal treatment of powders or mixtures thereof other than sintering
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- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G01R31/2896—Testing of IC packages; Test features related to IC packages
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- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/96—Properties of ceramic products, e.g. mechanical properties such as strength, toughness, wear resistance
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/96—Properties of ceramic products, e.g. mechanical properties such as strength, toughness, wear resistance
- C04B2235/9607—Thermal properties, e.g. thermal expansion coefficient
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Composite Materials (AREA)
- General Engineering & Computer Science (AREA)
- Thermal Sciences (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Ceramic Products (AREA)
- Compositions Of Oxide Ceramics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017203052 | 2017-10-20 | ||
PCT/JP2018/039052 WO2019078364A1 (ja) | 2017-10-20 | 2018-10-19 | セラミックス、プローブ案内部品、プローブカードおよびパッケージ検査用ソケット |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202003327UA true SG11202003327UA (en) | 2020-05-28 |
Family
ID=66173324
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202003327UA SG11202003327UA (en) | 2017-10-20 | 2018-10-19 | Ceramic, probe guiding member, probe card, and socket for package inspection |
Country Status (9)
Country | Link |
---|---|
US (1) | US11940466B2 (ko) |
EP (1) | EP3699160A4 (ko) |
JP (1) | JP6961008B2 (ko) |
KR (1) | KR102419954B1 (ko) |
CN (2) | CN115626828A (ko) |
PH (1) | PH12020550262A1 (ko) |
SG (1) | SG11202003327UA (ko) |
TW (1) | TWI683796B (ko) |
WO (1) | WO2019078364A1 (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7148472B2 (ja) * | 2019-09-27 | 2022-10-05 | 株式会社フェローテックマテリアルテクノロジーズ | セラミックス部品およびセラミックス部品の製造方法 |
WO2021206148A1 (ja) * | 2020-04-10 | 2021-10-14 | 株式会社フェローテックマテリアルテクノロジーズ | セラミックス、プローブ案内部品、プローブカードおよびパッケージ検査用ソケット |
KR102453341B1 (ko) | 2020-06-15 | 2022-10-11 | 현대모비스 주식회사 | 차량용 배터리 마운트 구조 |
KR102606892B1 (ko) * | 2021-06-15 | 2023-11-29 | (주)포인트엔지니어링 | 검사 소켓용 지지 플레이트, 검사 소켓용 소켓핀 및 이들을 구비하는 검사 소켓 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
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DE1289712C2 (de) * | 1965-08-11 | 1973-12-13 | Kempten Elektroschmelz Gmbh | Verdampfer fuer das Vakuumaufdampfen von Metallschichten auf Werkstoffe |
JPS59152269A (ja) * | 1983-02-08 | 1984-08-30 | 九州耐火煉瓦株式会社 | 窒化珪素系複合耐火物 |
JPS60260197A (ja) * | 1984-06-07 | 1985-12-23 | 島田理化工業株式会社 | マイクロ波吸収体 |
JP2621896B2 (ja) | 1988-01-13 | 1997-06-18 | 黒崎窯業株式会社 | 窒化けい素系複合セラミックスとその製造方法 |
DE3824849A1 (de) * | 1988-07-21 | 1990-01-25 | Kempten Elektroschmelz Gmbh | Unter druck gesinterte, polykristalline mischwerkstoffe auf basis von hexagonalem bornitrid, oxiden und carbiden |
JP3175483B2 (ja) | 1994-06-30 | 2001-06-11 | 日本鋼管株式会社 | 窒化ホウ素含有材料およびその製造方法 |
IT1284201B1 (it) | 1996-07-31 | 1998-05-08 | Sviluppo Materiali Spa | Piastre con riporti ceramici antiusura per macchine per colata conntinua di corpi piani sottili e procedimento per la loro |
JP3697942B2 (ja) | 1999-05-13 | 2005-09-21 | 住友金属工業株式会社 | セラミック加工部品とその製造方法 |
US6669871B2 (en) | 2000-11-21 | 2003-12-30 | Saint-Gobain Ceramics & Plastics, Inc. | ESD dissipative ceramics |
MY131225A (en) | 2001-04-03 | 2007-07-31 | Kureha Corp | Ic socket |
JP4400360B2 (ja) | 2003-09-25 | 2010-01-20 | 株式会社フェローテックセラミックス | 快削性セラミックスとその製造方法およびプローブ案内部品 |
TWI276618B (en) | 2003-09-25 | 2007-03-21 | Sumitomo Metal Ind | Machinable ceramic |
JP4927318B2 (ja) | 2004-02-16 | 2012-05-09 | 株式会社クレハ | 機械加工用素材 |
CN101115956B (zh) * | 2004-10-28 | 2010-12-08 | 圣戈本陶瓷及塑料股份有限公司 | 陶瓷点火器 |
JP2006169015A (ja) | 2004-12-13 | 2006-06-29 | National Institute Of Advanced Industrial & Technology | 窒化ホウ素分散複合セラミックス及びその製造方法 |
JP5036271B2 (ja) | 2006-10-16 | 2012-09-26 | 株式会社ニッカトー | ジルコニア質導電性焼結体 |
JP4371158B2 (ja) | 2007-08-10 | 2009-11-25 | 株式会社フェローテックセラミックス | 黒色系快削性セラミックスとその製法および用途 |
JP5506246B2 (ja) * | 2009-05-28 | 2014-05-28 | 日本発條株式会社 | セラミックス部材、プローブホルダ及びセラミックス部材の製造方法 |
JP5750243B2 (ja) * | 2010-07-14 | 2015-07-15 | 日本発條株式会社 | セラミックス部材、プローブホルダ及びセラミックス部材の製造方法 |
JP5670806B2 (ja) * | 2011-04-01 | 2015-02-18 | 日本特殊陶業株式会社 | セラミック基板及びその製造方法 |
JP5998787B2 (ja) | 2011-12-02 | 2016-09-28 | Toto株式会社 | 半導電性セラミックス焼結体 |
CN103626498B (zh) * | 2013-12-13 | 2015-07-08 | 山东鹏程陶瓷新材料科技有限公司 | 氮化硼基陶瓷喷嘴及其制备方法 |
US9944561B2 (en) * | 2014-03-10 | 2018-04-17 | Sumitomo Osaka Cement Co., Ltd. | Dielectric material and electrostatic chucking device |
-
2018
- 2018-10-19 WO PCT/JP2018/039052 patent/WO2019078364A1/ja active Search and Examination
- 2018-10-19 SG SG11202003327UA patent/SG11202003327UA/en unknown
- 2018-10-19 KR KR1020207014182A patent/KR102419954B1/ko active IP Right Grant
- 2018-10-19 US US16/757,168 patent/US11940466B2/en active Active
- 2018-10-19 TW TW107137022A patent/TWI683796B/zh active
- 2018-10-19 JP JP2019548833A patent/JP6961008B2/ja active Active
- 2018-10-19 CN CN202211369294.6A patent/CN115626828A/zh active Pending
- 2018-10-19 CN CN201880068292.9A patent/CN111247115A/zh active Pending
- 2018-10-19 EP EP18868747.9A patent/EP3699160A4/en active Pending
-
2020
- 2020-04-13 PH PH12020550262A patent/PH12020550262A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20200072524A (ko) | 2020-06-22 |
TWI683796B (zh) | 2020-02-01 |
KR102419954B1 (ko) | 2022-07-12 |
WO2019078364A1 (ja) | 2019-04-25 |
EP3699160A4 (en) | 2021-08-18 |
CN111247115A (zh) | 2020-06-05 |
EP3699160A1 (en) | 2020-08-26 |
CN115626828A (zh) | 2023-01-20 |
TW201922673A (zh) | 2019-06-16 |
US11940466B2 (en) | 2024-03-26 |
JP6961008B2 (ja) | 2021-11-05 |
US20200241047A1 (en) | 2020-07-30 |
JPWO2019078364A1 (ja) | 2020-11-19 |
PH12020550262A1 (en) | 2021-03-01 |
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