SG11202003327UA - Ceramic, probe guiding member, probe card, and socket for package inspection - Google Patents
Ceramic, probe guiding member, probe card, and socket for package inspectionInfo
- Publication number
- SG11202003327UA SG11202003327UA SG11202003327UA SG11202003327UA SG11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA SG 11202003327U A SG11202003327U A SG 11202003327UA
- Authority
- SG
- Singapore
- Prior art keywords
- probe
- socket
- ceramic
- guiding member
- package inspection
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/515—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics
- C04B35/58—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides
- C04B35/583—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides based on boron nitride
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- C04B35/486—Fine ceramics
- C04B35/488—Composites
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- C04B35/62645—Thermal treatment of powders or mixtures thereof other than sintering
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- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G01R31/2896—Testing of IC packages; Test features related to IC packages
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- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/96—Properties of ceramic products, e.g. mechanical properties such as strength, toughness, wear resistance
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/96—Properties of ceramic products, e.g. mechanical properties such as strength, toughness, wear resistance
- C04B2235/9607—Thermal properties, e.g. thermal expansion coefficient
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017203052 | 2017-10-20 | ||
PCT/JP2018/039052 WO2019078364A1 (en) | 2017-10-20 | 2018-10-19 | Ceramic, probe-guiding part, probe card and socket for inspecting package |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202003327UA true SG11202003327UA (en) | 2020-05-28 |
Family
ID=66173324
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202003327UA SG11202003327UA (en) | 2017-10-20 | 2018-10-19 | Ceramic, probe guiding member, probe card, and socket for package inspection |
Country Status (9)
Country | Link |
---|---|
US (1) | US11940466B2 (en) |
EP (1) | EP3699160A4 (en) |
JP (1) | JP6961008B2 (en) |
KR (1) | KR102419954B1 (en) |
CN (2) | CN111247115A (en) |
PH (1) | PH12020550262A1 (en) |
SG (1) | SG11202003327UA (en) |
TW (1) | TWI683796B (en) |
WO (1) | WO2019078364A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7148472B2 (en) * | 2019-09-27 | 2022-10-05 | 株式会社フェローテックマテリアルテクノロジーズ | Ceramic part and method for manufacturing ceramic part |
WO2021206148A1 (en) * | 2020-04-10 | 2021-10-14 | 株式会社フェローテックマテリアルテクノロジーズ | Ceramic, probe-guiding part, probe card and socket for inspecting package |
KR102453341B1 (en) | 2020-06-15 | 2022-10-11 | 현대모비스 주식회사 | Vehicle battery mount structure |
KR102606892B1 (en) * | 2021-06-15 | 2023-11-29 | (주)포인트엔지니어링 | Supporting plate for electrical test socket, socket pin for electrical test socket, and electrical test socket |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1289712C2 (en) * | 1965-08-11 | 1973-12-13 | Kempten Elektroschmelz Gmbh | Evaporator for vacuum evaporation of metal layers on materials |
JPS59152269A (en) * | 1983-02-08 | 1984-08-30 | 九州耐火煉瓦株式会社 | Silicon nitride composite refractories |
JPS60260197A (en) * | 1984-06-07 | 1985-12-23 | 島田理化工業株式会社 | Microwave absorber |
JP2621896B2 (en) * | 1988-01-13 | 1997-06-18 | 黒崎窯業株式会社 | Silicon nitride-based composite ceramics and method for producing the same |
DE3824849A1 (en) * | 1988-07-21 | 1990-01-25 | Kempten Elektroschmelz Gmbh | PRESSURIZED POLYCRYSTALLINE MIXING MATERIALS BASED ON HEXAGONAL BORNITRIDE, OXIDES AND CARBIDES |
JP3175483B2 (en) | 1994-06-30 | 2001-06-11 | 日本鋼管株式会社 | Boron nitride-containing material and method for producing the same |
IT1284201B1 (en) | 1996-07-31 | 1998-05-08 | Sviluppo Materiali Spa | PLATES WITH ANTI-WEAR CERAMIC FILLINGS FOR MACHINES FOR CONNTINUAL CASTING OF THIN FLAT BODIES AND PROCEDURE FOR THEIR |
JP3697942B2 (en) * | 1999-05-13 | 2005-09-21 | 住友金属工業株式会社 | Ceramic processed parts and manufacturing method thereof |
US6669871B2 (en) | 2000-11-21 | 2003-12-30 | Saint-Gobain Ceramics & Plastics, Inc. | ESD dissipative ceramics |
CN1311594C (en) | 2001-04-03 | 2007-04-18 | 株式会社吴羽 | IC socket |
JP4400360B2 (en) * | 2003-09-25 | 2010-01-20 | 株式会社フェローテックセラミックス | Free-cutting ceramics, manufacturing method thereof, and probe guide parts |
TWI276618B (en) * | 2003-09-25 | 2007-03-21 | Sumitomo Metal Ind | Machinable ceramic |
JP4927318B2 (en) | 2004-02-16 | 2012-05-09 | 株式会社クレハ | Material for machining |
WO2006050201A2 (en) * | 2004-10-28 | 2006-05-11 | Saint-Gobain Corporation | Ceramic igniters |
JP2006169015A (en) * | 2004-12-13 | 2006-06-29 | National Institute Of Advanced Industrial & Technology | Boron nitride dispersed composite ceramic and method of manufacturing the same |
JP5036271B2 (en) | 2006-10-16 | 2012-09-26 | 株式会社ニッカトー | Zirconia conductive sintered body |
JP4371158B2 (en) * | 2007-08-10 | 2009-11-25 | 株式会社フェローテックセラミックス | Black-based free-cutting ceramics and their production and use |
JP5506246B2 (en) * | 2009-05-28 | 2014-05-28 | 日本発條株式会社 | Ceramic member, probe holder, and method for manufacturing ceramic member |
JP5750243B2 (en) * | 2010-07-14 | 2015-07-15 | 日本発條株式会社 | Ceramic member, probe holder, and method for manufacturing ceramic member |
JP5670806B2 (en) | 2011-04-01 | 2015-02-18 | 日本特殊陶業株式会社 | Ceramic substrate and manufacturing method thereof |
JP5998787B2 (en) | 2011-12-02 | 2016-09-28 | Toto株式会社 | Semiconductive ceramic sintered body |
CN103626498B (en) * | 2013-12-13 | 2015-07-08 | 山东鹏程陶瓷新材料科技有限公司 | Boron nitride based ceramic nozzle and preparation method thereof |
WO2015137270A1 (en) | 2014-03-10 | 2015-09-17 | 住友大阪セメント株式会社 | Dielectric material and electrostatic chucking device |
-
2018
- 2018-10-19 JP JP2019548833A patent/JP6961008B2/en active Active
- 2018-10-19 CN CN201880068292.9A patent/CN111247115A/en active Pending
- 2018-10-19 EP EP18868747.9A patent/EP3699160A4/en active Pending
- 2018-10-19 KR KR1020207014182A patent/KR102419954B1/en active IP Right Grant
- 2018-10-19 TW TW107137022A patent/TWI683796B/en active
- 2018-10-19 WO PCT/JP2018/039052 patent/WO2019078364A1/en active Search and Examination
- 2018-10-19 CN CN202211369294.6A patent/CN115626828A/en active Pending
- 2018-10-19 US US16/757,168 patent/US11940466B2/en active Active
- 2018-10-19 SG SG11202003327UA patent/SG11202003327UA/en unknown
-
2020
- 2020-04-13 PH PH12020550262A patent/PH12020550262A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
EP3699160A1 (en) | 2020-08-26 |
KR102419954B1 (en) | 2022-07-12 |
US11940466B2 (en) | 2024-03-26 |
CN111247115A (en) | 2020-06-05 |
CN115626828A (en) | 2023-01-20 |
TWI683796B (en) | 2020-02-01 |
PH12020550262A1 (en) | 2021-03-01 |
EP3699160A4 (en) | 2021-08-18 |
US20200241047A1 (en) | 2020-07-30 |
WO2019078364A1 (en) | 2019-04-25 |
TW201922673A (en) | 2019-06-16 |
JP6961008B2 (en) | 2021-11-05 |
KR20200072524A (en) | 2020-06-22 |
JPWO2019078364A1 (en) | 2020-11-19 |
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