SG11201901202UA - Inspection device and inspection methods - Google Patents

Inspection device and inspection methods

Info

Publication number
SG11201901202UA
SG11201901202UA SG11201901202UA SG11201901202UA SG11201901202UA SG 11201901202U A SG11201901202U A SG 11201901202UA SG 11201901202U A SG11201901202U A SG 11201901202UA SG 11201901202U A SG11201901202U A SG 11201901202UA SG 11201901202U A SG11201901202U A SG 11201901202UA
Authority
SG
Singapore
Prior art keywords
inspection
methods
inspection device
inspection methods
Prior art date
Application number
SG11201901202UA
Inventor
Kejun Kang
Jianping Cheng
Zhiqiang Chen
Ziran Zhao
Junli Li
Xuewu Wang
Zhi Zeng
Ming Zeng
Yi Wang
Qingjun Zhang
Jianping Gu
Xi Yi
Bicheng Liu
Guangming Xu
Yongqiang Wang
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of SG11201901202UA publication Critical patent/SG11201901202UA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01V5/22—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01V5/222—
    • G01V5/281—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
SG11201901202UA 2016-12-07 2017-09-28 Inspection device and inspection methods SG11201901202UA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201611116487.5A CN108169254A (en) 2016-12-07 2016-12-07 Check equipment and inspection method
PCT/CN2017/103972 WO2018103434A1 (en) 2016-12-07 2017-09-28 Inspection device and inspection method

Publications (1)

Publication Number Publication Date
SG11201901202UA true SG11201901202UA (en) 2019-03-28

Family

ID=59997247

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201901202UA SG11201901202UA (en) 2016-12-07 2017-09-28 Inspection device and inspection methods

Country Status (7)

Country Link
US (1) US20180156741A1 (en)
EP (1) EP3333594A1 (en)
JP (1) JP6896062B2 (en)
KR (1) KR102187231B1 (en)
CN (1) CN108169254A (en)
SG (1) SG11201901202UA (en)
WO (1) WO2018103434A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109283588B (en) * 2018-11-01 2024-04-19 同方威视技术股份有限公司 Method and device for reconstructing particle track, and inspection method and inspection device
US11408836B2 (en) * 2019-04-01 2022-08-09 General Electric Company Method for inspecting components using computed tomography
KR102325017B1 (en) * 2020-03-16 2021-11-10 한국해양과학기술원 Method for identifying cargo based on deep-learning and apparatus performing the same
KR102539659B1 (en) * 2021-08-09 2023-06-08 주식회사 나노엑스코리아 System and method for determining the material of an object using x-ray
CN114359569B (en) * 2022-03-09 2022-06-03 中国科学院地质与地球物理研究所 Rock bedding recognition method, device, equipment and storage medium
CN116577358B (en) * 2023-05-18 2024-01-23 杭州宇称电子技术有限公司 Painting and calligraphy cultural relic pigment imaging method based on X-ray K-absorption edge and application thereof

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7366282B2 (en) * 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US7633062B2 (en) * 2006-10-27 2009-12-15 Los Alamos National Security, Llc Radiation portal monitor system and method
US7470905B1 (en) * 2007-01-04 2008-12-30 Celight, Inc. High Z material detection system and method
CN101435783B (en) * 2007-11-15 2011-01-26 同方威视技术股份有限公司 Method and apparatus for recognizing substance
CN102203637B (en) * 2008-08-27 2015-05-06 洛斯阿拉莫斯国家安全股份有限公司 Imaging based on cosmic-ray produced charged particles
US9310323B2 (en) * 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
PL2430396T3 (en) * 2009-05-16 2020-11-16 Rapiscan Systems, Inc. Systems and methods for automated, rapid detection of high-atomic-number materials
JP2012163473A (en) * 2011-02-08 2012-08-30 Niigata Univ Nondestructive component analysis device
JP2014523522A (en) * 2011-06-07 2014-09-11 アトミック エナジー オブ カナダ リミテッド Detection of high atomic number materials using cosmic ray muon tomography
AU2013324154B2 (en) * 2012-08-21 2017-02-23 Decision Sciences International Corporation Primary and secondary scanning in muon tomography inspection
CA3115336C (en) * 2013-04-29 2023-06-27 Decision Sciences International Corporation Muon detector array stations
CN103308937A (en) * 2013-06-26 2013-09-18 清华大学 Two-dimensional-read high-position high-time-resolution detector
AU2015264759B2 (en) * 2014-02-26 2018-07-26 Decision Sciences International Corporation Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons
CN104165896B (en) * 2014-08-18 2017-03-22 公安部第一研究所 Liquid goods safety inspection method and device
CN104181178B (en) * 2014-08-18 2016-08-17 公安部第一研究所 A kind of channel-type Double-visual angle X-ray liquid article safety check system
US10191180B2 (en) * 2014-12-12 2019-01-29 Lingacom Ltd. Large scale gas electron multiplier and detection method
JP2016180664A (en) * 2015-03-24 2016-10-13 株式会社東芝 Image processing device, image processing system, and image processing method
CN105549103B (en) * 2016-01-22 2018-11-16 清华大学 The method, apparatus and system of inspection Moving Objects based on cosmic ray
CN105700029B (en) * 2016-01-22 2018-11-16 清华大学 The method, apparatus and system of check object based on cosmic ray

Also Published As

Publication number Publication date
CN108169254A (en) 2018-06-15
JP2019532266A (en) 2019-11-07
EP3333594A1 (en) 2018-06-13
KR20190028524A (en) 2019-03-18
WO2018103434A1 (en) 2018-06-14
JP6896062B2 (en) 2021-06-30
US20180156741A1 (en) 2018-06-07
KR102187231B1 (en) 2020-12-04

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